Patents Examined by Paresh Patel
  • Patent number: 11067599
    Abstract: An embodiment of the present disclosure discloses a probe device including: a base, including a main body, a cavity formed in the main body, and a through hole defined in the main body and communicating with the cavity; a probe, including a main part, a probe head defined at one end of the main part, and a mounting portion defined at the other end of the main part, the mounting portion being inserted into the cavity via the through hole; and a conductive member, disposed in the cavity and defined on the mounting portion, allowing the mounting portion to be caught in the cavity. The conductive member is in contact with the probe device to release the charge of the probe accumulated during operation of the probe, when the probe device is not in operation.
    Type: Grant
    Filed: December 20, 2017
    Date of Patent: July 20, 2021
    Assignee: HKC CORPORATION LIMITED
    Inventor: Jianfeng Shan
  • Patent number: 11067602
    Abstract: To maintain the horizontalness of a probe card even, if the number of measured DUTs is increased. An electrical connecting apparatus according to the present, disclosure comprises a support member having a lower surface region in which a level part is formed and a wiring board provided adjacent to the lower surface of the support member, and to be connected to a testing device side. The electrical connecting apparatus comprises: a connection unit having multiple connection terminals; a probe substrate electrically connecting multiple probes to the connection terminals; multiple anchors arranged on the upper surface of the probe substrate; and multiple supports functioning as supports between corresponding ones of the anchors and the support member via the wiring board and the connection unit.
    Type: Grant
    Filed: November 8, 2019
    Date of Patent: July 20, 2021
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Toshiyuki Kudo, Takayuki Narumi, Yoshinori Kikuchi, Takao Yasuta
  • Patent number: 11067601
    Abstract: A high accuracy electrical test interconnect method employs a tester interface transfer block to enable the transfer of electrical contact from less accurate tester resource probes to target probes which are contained in the tester interface transfer block and can be positioned with high accuracy using the three dimensional printing to enable reliable contact with smaller test pads. The target probes can directly contact the tester resource probes or a transfer plate can be interposed between the target probes and the tester resource probes to allow positional adjustment of the target probes relative to the tester resource probes. This invention also includes the use of specialized shape target probes that can contact circuit board objects, such as vertical conductive surfaces and irregular shape test pads that have not been accessible with traditional methods.
    Type: Grant
    Filed: March 7, 2014
    Date of Patent: July 20, 2021
    Inventor: Donald DeMille
  • Patent number: 11060887
    Abstract: A magnetic detection sensor for being installed at an end of a cable with a pair of signal wires to detect a magnetic field from magnetic poles. The sensor includes a magnetic sensor including a detection section and a pair of lead frames, the detection section including a magnetic detection element for detecting the magnetic field from the magnetic poles, and the lead frames extending from the detection section and configured to output a detection signal of the detection section, a housing portion that houses the magnetic sensor, and a capacitor that is provided separately from the magnetic sensor and is housed in the housing portion. First joining portions respectively joining the pair of lead frames to the pair of signal wires and second joining portions respectively joining the pair of lead frames to a pair of lead wires of the capacitor are located inside the housing portion.
    Type: Grant
    Filed: May 10, 2019
    Date of Patent: July 13, 2021
    Assignee: HITACHI METALS, LTD.
    Inventors: Kazuhiko Tomita, Takashi Onimoto, Masaaki Imahori
  • Patent number: 11054490
    Abstract: A magnetic field detection device includes a base, a first yoke, and a magneto-resistive effect element. The first yoke is provided on the base, and includes first and second principal surfaces each extending along a first plane, and a first end surface coupling the first and second principal surfaces. The magneto-resistive effect element is provided on the base, and includes a magnetization free layer disposed at a position overlapped with the first yoke in a first direction along the first plane. The first end surface includes an inverted tapered surface inclined relative to the first plane and extending closer to a center point of the magnetization free layer as being away from the base in a second direction orthogonal to the first plane. A distance from the center point to a first edge is shorter than a distance from the center point to a second edge.
    Type: Grant
    Filed: March 13, 2018
    Date of Patent: July 6, 2021
    Assignee: TDK CORPORATION
    Inventors: Yoshiaki Tanaka, Tetsuya Hiraki, Kazuya Watanabe, Suguru Watanabe
  • Patent number: 11047882
    Abstract: Provided are a non-contact voltage measurement device and diagnosis system capable of acquiring the voltage of an electric wire without disconnecting the wire. The non-contact voltage measurement device (100) includes: a cylindrical fixing part (110) for holding an electric wire (10) by clipping the same from both sides; a first electrode (121) and a second electrode (122) provided on the inner peripheral surface of the electric-wire-holding side of the fixing part (110) so as to be separated by a distance (D2); a first measurement capacitor (C3) and a voltage division capacitor (C2) connected to the first electrode (121); a second measurement capacitor (C3?) connected to the second electrode (122); a terminal (131) for measuring the voltage (V1) applied to the first measurement capacitor (C3); and a terminal (132) for measuring the voltage (V2) applied to the second measurement capacitor (C3?).
    Type: Grant
    Filed: November 15, 2016
    Date of Patent: June 29, 2021
    Assignee: HITACHI, LTD.
    Inventors: Tetsuji Kato, Minori Nagata, Kohji Maki
  • Patent number: 11035881
    Abstract: A probe for measurements on a device under test with low source impedance is described. The probe has a resistor coupled in series between a probe tip and a probe cable connected to a measuring apparatus. The resistor having an impedance equal to a characteristic impedance of the probe cable or equal to the difference between the characteristic impedance of the probe cable and an output resistance of the device under test. Further, a measuring system and a test setup are described.
    Type: Grant
    Filed: April 21, 2017
    Date of Patent: June 15, 2021
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventor: Martin Peschke
  • Patent number: 11035808
    Abstract: A non-invasive NMR based apparatus for measuring a food attribute (moisture, sugar content) in food products comprises a magnetic chamber, an RF pulsing device attached to the magnetic chamber, a sensor receiver, and a data processing unit in communication with the sensor receiver. The pulsing device exposes the food ingredients/snacks to an RF field and produces an NMR response signal that is detected by the sensor receiver. The data processing unit quantitatively measures a food attribute of the food product based on the NMR response signal.
    Type: Grant
    Filed: October 31, 2018
    Date of Patent: June 15, 2021
    Assignee: Frito-Lay North America, Inc.
    Inventors: Rick W. Bajema, Jason Ballengee, Kevin Minard
  • Patent number: 11029336
    Abstract: A probe card for a testing apparatus of electronic devices comprises a testing head, which houses a plurality of contact elements extending along a longitudinal axis (H-H) between a first end portion and a second end portion, a support plate, onto which the first end portion is adapted to abut, and a flexible membrane which comprises a first face and a second and opposite face.
    Type: Grant
    Filed: August 12, 2019
    Date of Patent: June 8, 2021
    Assignee: TECHNOPROBE S.P.A.
    Inventors: Riccardo Vettori, Stefano Felici
  • Patent number: 11029337
    Abstract: A testing head comprises at least one guide provided with a plurality of guide holes, and a plurality of contact elements housed in the plurality of guide holes. Suitably, the at least one guide comprises a plurality of conductive layers, each conductive layer: including holes of a corresponding plurality of group of the plurality of guide holes and electrically connecting a corresponding group of contact elements housed in the guide holes of the group, contact elements of a group being adapted to carry a same type of signal. The at least one guide is a multilayer comprising a plurality of non-conductive layers, and the conductive layers are arranged on respective faces of a layer of the plurality of non-conductive layers.
    Type: Grant
    Filed: August 23, 2019
    Date of Patent: June 8, 2021
    Assignee: TECHNOPROBE S.P.A.
    Inventors: Roberto Crippa, Raffaele Vallauri
  • Patent number: 11029331
    Abstract: A semiconductor device includes a circuit board, a semiconductor package, and a contact interface. The semiconductor package is mounted on the circuit board. The semiconductor package includes a plurality of conductive bumps with a first pitch. The contact interface is electrically connected to the circuit board. The contact interface includes a plurality of first contact pads with a second pitch substantially the same as the first pitch. The first contact pads are separated from the conductive bumps.
    Type: Grant
    Filed: February 16, 2017
    Date of Patent: June 8, 2021
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Mill-Jer Wang, Chi-Che Wu, Hung-Chih Lin, Hao Chen
  • Patent number: 11022627
    Abstract: A probe 20 electrically connecting a first contact target to a second contact target includes a tubular barrel portion 50, a first plunger portion 60 partially inserted into a first end of the barrel portion 50 and electrically contacting the first contact target, and a second plunger portion 70 partially inserted into a second end of the barrel portion 50 and electrically contacting the second contact target. The barrel portion 50 includes a first barrel portion 51 having an inside diameter ?1i, and a second barrel portion 52 arranged inside the first barrel portion 51 and having an outside diameter ?2o. The first barrel portion 51 includes a first spring portion 151. The second barrel portion 52 includes a second spring portion 152. The first plunger portion 60 includes a main body portion 61 having a longer dimension than an inside diameter of the first barrel portion 51.
    Type: Grant
    Filed: January 17, 2018
    Date of Patent: June 1, 2021
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Mika Nasu
  • Patent number: 11022712
    Abstract: A multi-frequency platform for metal detection is disclosed. The transmission frequencies may be selected by the user or in an autonomous fashion. Further, the weighting of the frequencies may also be selected, either by the user or in an autonomous fashion. The ability to select transmission frequencies and weighting of the frequencies provides expanded detection capability, both in terms of the types of targets being sought and the types of ground conditions being experienced.
    Type: Grant
    Filed: June 21, 2018
    Date of Patent: June 1, 2021
    Assignee: First Texas Products, LLC
    Inventor: Carl W. Moreland
  • Patent number: 11019730
    Abstract: An electrical contact assembly includes an electrically nonconductive base, a first electrical contact supported by the base and a second electrical contact supported by the base such that the first contact and the second contact are separated by a space. The first electrical contact is configured to engage a first external conductive circuit element and the a second electrical contact is configured to engage a second external conductive circuit element. The first contact and the second contact are configured such that a portion of the first contact and a portion of the second contact converge as the base moves in a first direction relative to the first and second external conductive circuit elements and diverge as the base moves in a second direction relative to the first and second external conductive circuit elements.
    Type: Grant
    Filed: May 8, 2019
    Date of Patent: May 25, 2021
    Assignee: Honeywell Federal Manufacturing & Technologies, LLC
    Inventor: Stephen McGarry Hatch
  • Patent number: 11009525
    Abstract: An illustrative system disclosed herein includes a conductive probe that is adapted to hold a quantity of mercury, wherein the conductive probe includes a conductive body with an outlet and a mercury control system adapted to supply mercury to the conductive probe. In this example, the system also includes an image sensor that is adapted to obtain an image of a mercury droplet positioned on a surface of a material and a measurement system that is adapted to receive the image of the mercury droplet and calculate a contact area between the mercury droplet and the surface of the material based upon the image of the mercury droplet.
    Type: Grant
    Filed: May 14, 2020
    Date of Patent: May 18, 2021
    Assignee: GLOBALFOUNDRIES U.S. INC.
    Inventors: Jay Mody, Hemant Dixit
  • Patent number: 11009524
    Abstract: A rectangular probe includes two broad side surfaces and two narrow side surfaces each parallel to a longitudinal direction of the rectangular probe. The rectangular probe includes a middle segment, a first connecting segment and a second connecting segment respectively extending from two opposite ends of the middle segment, a first contacting segment and a second contacting segment respectively extending from the first and second connecting segments, and a stroke structure arranged on the middle segment, the first contacting segment, or the second contacting segment. A longitudinal thru-hole of the stroke structure is formed by penetrating through the two broad side surfaces. Two transverse grooves of the stroke structure are respectively recessed in the two broad side surfaces. The two transverse grooves are configured to move in two directions away from each other so as to reduce a length of the rectangular probe.
    Type: Grant
    Filed: January 2, 2020
    Date of Patent: May 18, 2021
    Assignee: CHUNGHWA PRECISION TEST TECH. CO., LTD.
    Inventors: Wen-Tsung Lee, Kai-Chieh Hsieh
  • Patent number: 11012068
    Abstract: The capacitive sensor apparatus includes: a sensor element disposed on the first surface of the mounting member; and a floating conductor that is disposed on the second surface of the mounting member and is electrically conductive, the floating conductor being electrically disconnected from the sensor element. The sensor element includes: a first electrode; and a second electrode in a shape of a ring surrounding an outer periphery of the first electrode and being electrically disconnected from the first electrode. The floating conductor overlaps at least the first electrode in a projection view seen from the first surface.
    Type: Grant
    Filed: February 11, 2019
    Date of Patent: May 18, 2021
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventor: Takateru Sawada
  • Patent number: 11002810
    Abstract: A passive magnetic flux focusing element having electrically conductive wires (1) or faces (2) containing an outer area defined by an outer (3), an inner (4) and connecting edges (5) forming a closed current loop enclosing a surface area penetrated by a time varying magnetic field flux and through induction sets up a time varying electrical current in the conducting loop thereby achieving a counter magnetic field to the penetrating field completely canceling the penetrating field in the interior of the loop, is characterized in that the element is part of an RF volume- or surface-coil arrangement adapted for receiving and/or transmitting RF signals. Such elements increase the sensitivity and the SNR in MRI and MR spectroscopy experiments due to an increased magnetic flux density by means of Lenz lenses, in combination with a conventional probe.
    Type: Grant
    Filed: January 29, 2020
    Date of Patent: May 11, 2021
    Assignee: Voxalytic GmbH
    Inventors: Joerg Funk, Peter While, Nils Spengler, Jan Korvink
  • Patent number: 11002805
    Abstract: A magnetic sensor includes a magnetic field converter, a magnetic field detector, and a plurality of shields aligned in a Y direction. The magnetic field converter includes a plurality of yokes. Each yoke has a shape elongated in the Y direction, and is configured to receive an input magnetic field component in a direction parallel to a Z direction and to output an output magnetic field component in a direction parallel to an X direction. The magnetic field detector includes a plurality of trains of elements. Each train of elements includes a plurality of MR elements that are aligned in the Y direction along one yoke and connected in series. Each shield has such a shape that its maximum dimension in the Y direction is smaller than its maximum dimension in the X direction.
    Type: Grant
    Filed: May 10, 2019
    Date of Patent: May 11, 2021
    Assignee: TDK CORPORATION
    Inventor: Keisuke Uchida
  • Patent number: 10989739
    Abstract: The present invention provides a probe card holder including a plate-shaped frame formed with an opening approximately the same size as the probe card, a plurality of card bottom surface holding portions that are provided around a peripheral edge of the opening in the frame and that hold a bottom surface of the probe card while biasing the bottom surface, and a plurality of card top surface supporting portions that support the top surface of the probe card. Each card bottom surface holding portion includes an L-shaped member with a base portion and a bottom surface supporting portion, a knob that is linked to a tip end portion of the base portion and a biasing member that is disposed between the knob and the top surface of the frame and that biases the bottom surface supporting member upward toward the bottom surface of the frame.
    Type: Grant
    Filed: September 9, 2019
    Date of Patent: April 27, 2021
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Hideki Hirota, Takao Yasuta, Takayuki Narumi, Yoshinori Kikuchi