Abstract: Impedance flow cytometry apparatus comprises: a flow channel for carrying a flow of fluid comprising particles suspended in an electrolyte from an inlet to an outlet; a first electrode group and a second electrode group, each electrode group providing first and second current paths through fluid flowing in the flow channel; wherein each electrode group comprises: a first signal electrode to provide to the first current path a first electrical signal of frequency, magnitude and phase; a second signal electrode to provide to the second current path a second electrical signal of substantially equal frequency and magnitude as the first electrical signal and of opposite phase to the first electrical signal; and one or more measurement electrodes to detect current flow in the first current path and the second current path and produce a summed signal representing the sum of the current flow in the first current path and the current flow in the second current path; wherein the first electrode group produces a first s

Abstract: A method for determining a direct current component in an electric device that is connected to a high-voltage supply network. The method includes the following steps: acquiring operating noises of the electric device with the aid of acoustic sensors that are part of a portable unit and that provide acoustic signals at the output; breaking the acoustic signals down into their frequency components by a Fourier transformation, yielding a frequency spectrum; determining odd and even frequency components of the frequency spectrum in dependence upon a basic frequency of the high-voltage supply network and setting them in a ratio to one another; concluding that a direct current component is present if the ratio exceeds a predefined threshold value.

Abstract: A lightning damage assessment method for the carbon fiber reinforced polymer (CFRP) material considering non-linear impedance characteristic includes steps of: studying various influencing factors of the lightning damage of the CFRP material under the action of the single lightning current component; obtaining the law between the lightning damage of the CFRP material, including the lightning damage area and depth, and various influencing factors, including the peak value, the rising rate, the charge transfer amount, the specific energy of the single lightning current component, and the non-linear impedance characteristic of the CFRP; on the basis of the law, building the multi-factor assessment model of the lightning damage of CFRP material under the action of the single lightning current component; and obtaining mathematical expressions between the lightning damage of the CFRP material and the influencing factors.

Abstract: A device for electrically contacting a solar cell during the measurement of electrical characteristics of the solar cell, which has a plurality of finger electrodes on its surface, has at least one measuring strip that has at least one contact terminal for electrically contacting a solar cell test device and that extends between two measuring-strip end portions in a measuring-strip extension direction. The measuring strip has a plurality of loop-like or hook-like contact spring portions formed integrally with the measuring strip, which are positioned on the measuring strip along the measuring-strip extension direction. The contact has at least one finger electrode by spring-elastic mechanical contact, when the measuring strip is placed on the surface of the solar cell. A measuring frame includes opposing frame-edge struts, which engages, using the frame-edge struts, around an area that is greater than or equal to a solar cell to be measured, and in which the measuring strip is braced.

Abstract: The present disclosure provides a differential measurement probe comprising a first support plate, a second support plate arranged in parallel to the first support plate, a first printed circuit probe tip that comprises a first contact section for contacting a device under test, and a second printed circuit probe tip that comprises a second contact section for contacting a device under test, wherein the first printed circuit probe tip and the second printed circuit probe tip are arranged between the first support plate and the second support plate and are mechanically supported by the first support plate and the second support plate.

Abstract: A prober controlling device for bringing probe needles into contact with semiconductor chips, includes an input data acquiring unit configured to acquire input data including temperature data of at least one of a probe card and a card holder, a predicting unit configured to predict a position of a tip end of a probe needle based on the input data acquired by the input data acquiring unit, using a prediction model that receives input of the input data and outputs the position of the tip end of the probe needle, and a determining unit configured to determine whether or not to execute prediction by the predicting unit, based on input data used as teacher data for machine learning of the prediction model and the input data acquired by the input data acquiring unit, before the prediction by the predicting unit.

Abstract: A detection method of a user of an apparatus is provided in which the apparatus is coupled to a charge variation sensor having a control unit and an electrode to detect an electric/electrostatic charge variation of the user. The detection method includes acquiring, through the electrode, a charge variation signal indicative of the presence of the user. A filtered signal is generated by filtering the charge variation signal. A feature signal is generated as a function of the filtered signal. A movement signal indicative of a movement of the user is generated as a function of the feature signal. A presence signal indicative of the presence of the user is generated as a function of the movement signal.

Abstract: A testing device for testing an integrated circuit package is provided, including a printed circuit board, a testing socket, a conductive fastener, a cover, and a conductive element assembly. The printed circuit board includes a first metal layer formed on the bottom surface thereof. The testing socket is disposed above the printed circuit board. The conductive fastener is configured to secure the testing socket to the printed circuit board, wherein the conductive fastener is electrically connected to the first metal layer and the testing socket. The cover is disposed above the testing socket to form a space for accommodating the integrated circuit package between the cover and the testing socket, wherein the cover makes electrical contact with the integrated circuit package. The conductive element assembly is disposed between and electrically connected to the cover and the testing socket.

Abstract: The present disclosure relates to an IC chip holder capable of alleviating an impact if the IC chip holder is dropped or collides with another object. In the IC chip holder, an upper housing body is provided, on a side of electric contacts of an IC chip, with an elastic deformation portion capable of elastically deforming toward the inside of the upper housing body. Thus, since the elastic deformation portion elastically deforms toward the inside of the upper housing body, if the IC chip holder is dropped or collides with another object, the elastic deformation portion bends and the impact is alleviated. Thus, a possibility of the IC chip being damaged is reduced.

Abstract: The present application discloses a chip socket, a testing fixture and a chip testing method thereof. The chip socket includes a pedestal, a plurality of conductive traces, a plurality of clamp structures, and a plurality of electrical contacts. The plurality of conductive traces are formed in the pedestal. The plurality of clamp structures are conductive and disposed on the first surface of the pedestal, and at least one of the plurality of clamp structures is coupled to a corresponding conductive trace and configured to clamp a solder ball of a chip to be tested. The plurality of electrical contacts are disposed on the second surface of the pedestal, and at least one of the plurality of electrical contacts is coupled to a corresponding clamp structure through a corresponding conductive trace.

Abstract: Provided is a semiconductor chip test socket configured to be coupled to a test circuit board for testing a semiconductor chip and provided with an integrated circuit (IC) chip having unique information and an algorithm for counting the number of times the semiconductor chip test socket is used, such that the number of times the semiconductor chip test socket is used may be exactly counted, and the IC chip may be easily installed and removed and securely protected from external impacts.

Abstract: An arrangement for monitoring the operation of a machine intended to be tracked by a real-time locating system comprises: a tag intended to be arranged on the machine, the tag being configured to generate a wireless tag signal allowing determination of a position of the tag; and at least one detector intended to be arranged on the machine, the at least one detector being configured to detect at least one characteristic of a magnetic field generated by the machine. Detection of the at least one characteristic is indicative of the machine being operative. The arrangement makes it possible to obtain a detailed understanding of how the machine is used in a cost-effective manner. A real-time locating system comprising such an arrangement and a method for monitoring the operation of a machine are also disclosed.

Abstract: A system and method are disclosed for automatically operating a high voltage resonance circuit. An embodiment of the system includes one or more coils each coil can be an alternating current (AC) coil or a direct current (DC) coil. Ari embodiment of the system further includes a microprocessor that issues commands to control amplitude and frequency of pulses of the one or more coils to reach and maintain a resonant condition for water treatment. The microprocessor determines whether a coil is an AC coil or a DC coil by detecting whether a capacitor is connected in series with the coil. An embodiment of the system further includes one or more sensors that measure the quality of water and provide feedback to the microprocessor.

Abstract: A contact probe includes a first plunger, a second plunger, a coil spring, and a pipe; the first plunger includes a first slide portion that slides along the inner periphery of the pipe; the second plunger includes a second slide portion that slides along the inner periphery of the pipe; and the coil spring includes: a first attachment portion that is attached to the first plunger and tightly wound; a second attachment portion that is attached to the second plunger and tightly wound; a coarsely wound portion; a first contact portion including one end connected to the first attachment portion and another end connected to the coarsely wound portion and contacting the pipe; and a second contact portion including one end connected to the coarsely wound portion and another end connected to the second attachment portion and contacting to the pipe.

Abstract: The invention relates to a magnet assembly (10) for a sensor device for detecting a measurement variable characterizing a rotation state of a steering shaft of a motor vehicle, to a sensor device and to a motor vehicle, wherein the magnet assembly (10) has a sleeve (11) and a magnetic element (12), which is connected in a form-fitting manner to the sleeve (11), wherein the sleeve (11) is designed for connecting the magnet assembly (10) to a first part of the steering shaft and has at least one stop flange (11C), which extends outwards in the radial direction in a radial plane, for axially securing the magnetic element (12) in a first axial direction (A1), wherein the magnetic element (12) is arranged concentrically with respect to the sleeve (11) and, with its first end side (S1), is at least partially supported axially on the stop flange (11C) and is thereby secured in the first axial direction (A1).

Abstract: The particle measurement device includes: an acquiring unit configured to acquire pad surface shape data indicating a surface shape of an electrode pad including a probe needle mark where a probe needle has contacted; a roughness calculating unit configured to calculate volume of a recessed portion recessed from a pad reference surface and volume of a protruding portion protruding from the pad reference surface based on the pad surface shape data; and a particle quantity calculating unit configured to calculate a particle quantity from a volume difference between the volume of the recessed portion and the volume of the protruding portion.

Abstract: A voltage contrast defect analysis method including the following steps is provided. A voltage contrast defect detection is performed on a die to be tested by using an electron beam inspection machine to find out a defect address of a voltage contrast defect. A first scanning electron microscope image at the defect address of the die to be tested is obtained by using a scanning electron microscope. A first critical dimension of the first scanning electron microscope image at the defect address of the die to be tested is measured. The first critical dimension on the die to be tested is compared with a corresponding second critical dimension on a reference die where no voltage contrast defect occurs at the defect address to determine whether the first critical dimension and the second critical dimension are the same.

Abstract: A capacitive measuring system includes capacitive sensors and an evaluation circuit having a multiplexer, a synchronous rectifier, a sinusoidal signal generator, and a reference voltage divider. The capacitive sensors are acted on by a mono-frequency voltage signal generated by the sinusoidal signal generator, output signals of the capacitive sensors are transmitted in alternation to the synchronous rectifier via the multiplexer, and signal amplification of output signals of the synchronous rectifier are calibrated as a function of an activatable reference impedance. The synchronous rectifier is formed by a MOS semiconductor switch. A source-drain section of the MOS semiconductor switch forms a shunt that is controlled by the mono-frequency voltage signal. A channel of the multiplexer is provided for transmitting a calibration signal, generated by the reference voltage divider, to the synchronous rectifier alternately with the output signals of the capacitive sensors.

Abstract: A magnetic sensor includes a magnetic field converter, a magnetic field detector, and a plurality of shields aligned in a Y direction. The magnetic field converter includes a plurality of yokes. Each yoke has a shape elongated in the Y direction, and is configured to receive an input magnetic field component in a direction parallel to a Z direction and to output an output magnetic field component in a direction parallel to an X direction. The magnetic field detector includes a plurality of trains of elements. Each train of elements includes a plurality of MR elements that are aligned in the Y direction along one yoke and connected in series. Each shield has such a shape that its maximum dimension in the Y direction is smaller than its maximum dimension in the X direction.

Abstract: An underground investigation device includes a transmission unit configured to transmit a pulse wave, a reception unit configured to receive a reflected signal, a memory configured to store time waveform data of the reflected signal, a storage device having a larger capacity than a capacity of the memory, a control unit configured to transfer the time waveform data from the memory to the storage device, and a signal processing unit configured to generate underground investigation data based on the time waveform data in the storage device. The reception unit sets a measurement span for sampling the reflected signal by using, as a trigger, transmission of the pulse wave or reception of a reflected signal resulting from reflection by a ground surface, samples the reflected signal in the measurement span, and stores the time waveform data in the memory. The control unit transfers the time waveform data from the memory to the storage device after the measurement span.