Abstract: Systems and methods for weapon and destructive device detection based on electromagnetic field profile are disclosed herein. According to an aspect, a system includes one or more sensors configured to detect an electromagnetic field of one or more objects and to output an electrical signal representative of the electromagnetic field. The system also includes a computing device operably connected to the one or more sensors. Further, the computing device is configured to receive the electrical signal. The computing device is also configured to determine whether each of the one or more objects meets a predetermined electromagnetic field profile based on the electrical signal. Further, the computing device is configured to present a notification to a user in response to determining that one of the objects meet the predetermined electromagnetic field profile.

Abstract: A contact terminal includes a tubular body extending in an axial direction parallel to a central axis of the contact terminal and a bar-shaped conductor having conductivity. The conductor includes a protrusion protruding toward one side in the axial direction from the tubular body, and an insertion portion disposed inside from an outer periphery of the tubular body. The tubular body includes an end side notch provided along the axial direction on a peripheral surface of the one end portion in the axial direction of the tubular body, and a first circumferential notch connected to another side in the axial direction of the end side notch and provided along a circumferential direction away from the end side notch with respect to a first end portion in a circumferential direction of the end side notch.

Abstract: A socket is configured to electrically connect a first electric component including a first terminal and a second electric component including a second terminal that is different from the first terminal in arrangement, the socket including: a contact pin configured to electrically connect the first terminal and the second terminal; a base part where the contact pin is disposed; and a sheet member disposed to face a surface of the base part on a second electric component side, the sheet member including an upper electrode configured to make contact with the contact pin when in use, a lower electrode configured to make contact with the second terminal when in use, and a wiring configured to connect the upper electrode and the lower electrode disposed at different positions in plan view.

Abstract: A verification probe system is configured to verify an automated test platform and includes: an integrated circuit test probe assembly; and a moveable platform configured to position the integrated circuit test probe assembly proximate one of more conductive pins included within a test socket assembly of the automated test platform.

Abstract: An apparatus senses the proportion of FOG flowing with effluent from a sink to a p-trap. A pipe portion is connectable for use as a tailpipe for a sink with a first electrode within the pipe portion and a second electrode outside the pipe portion. Conductors connect the first and second electrodes to a capacitance sensor, so changes in capacitance between the electrodes caused by changes in proportions of FOG content in effluent from the sink can be detected and/or monitored. The monitoring can be remote and can cause an action when an excess FOG content is detected.

Abstract: Impedance flow cytometry apparatus comprises: a flow channel for carrying a flow of fluid comprising particles suspended in an electrolyte from an inlet to an outlet; a first electrode group and a second electrode group, each electrode group providing first and second current paths through fluid flowing in the flow channel; wherein each electrode group comprises: a first signal electrode to provide to the first current path a first electrical signal of frequency, magnitude and phase; a second signal electrode to provide to the second current path a second electrical signal of substantially equal frequency and magnitude as the first electrical signal and of opposite phase to the first electrical signal; and one or more measurement electrodes to detect current flow in the first current path and the second current path and produce a summed signal representing the sum of the current flow in the first current path and the current flow in the second current path; wherein the first electrode group produces a first s

Abstract: A method for determining a direct current component in an electric device that is connected to a high-voltage supply network. The method includes the following steps: acquiring operating noises of the electric device with the aid of acoustic sensors that are part of a portable unit and that provide acoustic signals at the output; breaking the acoustic signals down into their frequency components by a Fourier transformation, yielding a frequency spectrum; determining odd and even frequency components of the frequency spectrum in dependence upon a basic frequency of the high-voltage supply network and setting them in a ratio to one another; concluding that a direct current component is present if the ratio exceeds a predefined threshold value.

Abstract: A lightning damage assessment method for the carbon fiber reinforced polymer (CFRP) material considering non-linear impedance characteristic includes steps of: studying various influencing factors of the lightning damage of the CFRP material under the action of the single lightning current component; obtaining the law between the lightning damage of the CFRP material, including the lightning damage area and depth, and various influencing factors, including the peak value, the rising rate, the charge transfer amount, the specific energy of the single lightning current component, and the non-linear impedance characteristic of the CFRP; on the basis of the law, building the multi-factor assessment model of the lightning damage of CFRP material under the action of the single lightning current component; and obtaining mathematical expressions between the lightning damage of the CFRP material and the influencing factors.

Abstract: A device for electrically contacting a solar cell during the measurement of electrical characteristics of the solar cell, which has a plurality of finger electrodes on its surface, has at least one measuring strip that has at least one contact terminal for electrically contacting a solar cell test device and that extends between two measuring-strip end portions in a measuring-strip extension direction. The measuring strip has a plurality of loop-like or hook-like contact spring portions formed integrally with the measuring strip, which are positioned on the measuring strip along the measuring-strip extension direction. The contact has at least one finger electrode by spring-elastic mechanical contact, when the measuring strip is placed on the surface of the solar cell. A measuring frame includes opposing frame-edge struts, which engages, using the frame-edge struts, around an area that is greater than or equal to a solar cell to be measured, and in which the measuring strip is braced.

Abstract: A prober controlling device for bringing probe needles into contact with semiconductor chips, includes an input data acquiring unit configured to acquire input data including temperature data of at least one of a probe card and a card holder, a predicting unit configured to predict a position of a tip end of a probe needle based on the input data acquired by the input data acquiring unit, using a prediction model that receives input of the input data and outputs the position of the tip end of the probe needle, and a determining unit configured to determine whether or not to execute prediction by the predicting unit, based on input data used as teacher data for machine learning of the prediction model and the input data acquired by the input data acquiring unit, before the prediction by the predicting unit.

Abstract: The present disclosure provides a differential measurement probe comprising a first support plate, a second support plate arranged in parallel to the first support plate, a first printed circuit probe tip that comprises a first contact section for contacting a device under test, and a second printed circuit probe tip that comprises a second contact section for contacting a device under test, wherein the first printed circuit probe tip and the second printed circuit probe tip are arranged between the first support plate and the second support plate and are mechanically supported by the first support plate and the second support plate.

Abstract: A detection method of a user of an apparatus is provided in which the apparatus is coupled to a charge variation sensor having a control unit and an electrode to detect an electric/electrostatic charge variation of the user. The detection method includes acquiring, through the electrode, a charge variation signal indicative of the presence of the user. A filtered signal is generated by filtering the charge variation signal. A feature signal is generated as a function of the filtered signal. A movement signal indicative of a movement of the user is generated as a function of the feature signal. A presence signal indicative of the presence of the user is generated as a function of the movement signal.

Abstract: A testing device for testing an integrated circuit package is provided, including a printed circuit board, a testing socket, a conductive fastener, a cover, and a conductive element assembly. The printed circuit board includes a first metal layer formed on the bottom surface thereof. The testing socket is disposed above the printed circuit board. The conductive fastener is configured to secure the testing socket to the printed circuit board, wherein the conductive fastener is electrically connected to the first metal layer and the testing socket. The cover is disposed above the testing socket to form a space for accommodating the integrated circuit package between the cover and the testing socket, wherein the cover makes electrical contact with the integrated circuit package. The conductive element assembly is disposed between and electrically connected to the cover and the testing socket.

Abstract: The present disclosure relates to an IC chip holder capable of alleviating an impact if the IC chip holder is dropped or collides with another object. In the IC chip holder, an upper housing body is provided, on a side of electric contacts of an IC chip, with an elastic deformation portion capable of elastically deforming toward the inside of the upper housing body. Thus, since the elastic deformation portion elastically deforms toward the inside of the upper housing body, if the IC chip holder is dropped or collides with another object, the elastic deformation portion bends and the impact is alleviated. Thus, a possibility of the IC chip being damaged is reduced.

Abstract: The present application discloses a chip socket, a testing fixture and a chip testing method thereof. The chip socket includes a pedestal, a plurality of conductive traces, a plurality of clamp structures, and a plurality of electrical contacts. The plurality of conductive traces are formed in the pedestal. The plurality of clamp structures are conductive and disposed on the first surface of the pedestal, and at least one of the plurality of clamp structures is coupled to a corresponding conductive trace and configured to clamp a solder ball of a chip to be tested. The plurality of electrical contacts are disposed on the second surface of the pedestal, and at least one of the plurality of electrical contacts is coupled to a corresponding clamp structure through a corresponding conductive trace.

Abstract: An arrangement for monitoring the operation of a machine intended to be tracked by a real-time locating system comprises: a tag intended to be arranged on the machine, the tag being configured to generate a wireless tag signal allowing determination of a position of the tag; and at least one detector intended to be arranged on the machine, the at least one detector being configured to detect at least one characteristic of a magnetic field generated by the machine. Detection of the at least one characteristic is indicative of the machine being operative. The arrangement makes it possible to obtain a detailed understanding of how the machine is used in a cost-effective manner. A real-time locating system comprising such an arrangement and a method for monitoring the operation of a machine are also disclosed.

Abstract: Provided is a semiconductor chip test socket configured to be coupled to a test circuit board for testing a semiconductor chip and provided with an integrated circuit (IC) chip having unique information and an algorithm for counting the number of times the semiconductor chip test socket is used, such that the number of times the semiconductor chip test socket is used may be exactly counted, and the IC chip may be easily installed and removed and securely protected from external impacts.

Abstract: A contact probe includes a first plunger, a second plunger, a coil spring, and a pipe; the first plunger includes a first slide portion that slides along the inner periphery of the pipe; the second plunger includes a second slide portion that slides along the inner periphery of the pipe; and the coil spring includes: a first attachment portion that is attached to the first plunger and tightly wound; a second attachment portion that is attached to the second plunger and tightly wound; a coarsely wound portion; a first contact portion including one end connected to the first attachment portion and another end connected to the coarsely wound portion and contacting the pipe; and a second contact portion including one end connected to the coarsely wound portion and another end connected to the second attachment portion and contacting to the pipe.

Abstract: The particle measurement device includes: an acquiring unit configured to acquire pad surface shape data indicating a surface shape of an electrode pad including a probe needle mark where a probe needle has contacted; a roughness calculating unit configured to calculate volume of a recessed portion recessed from a pad reference surface and volume of a protruding portion protruding from the pad reference surface based on the pad surface shape data; and a particle quantity calculating unit configured to calculate a particle quantity from a volume difference between the volume of the recessed portion and the volume of the protruding portion.

Abstract: A system and method are disclosed for automatically operating a high voltage resonance circuit. An embodiment of the system includes one or more coils each coil can be an alternating current (AC) coil or a direct current (DC) coil. Ari embodiment of the system further includes a microprocessor that issues commands to control amplitude and frequency of pulses of the one or more coils to reach and maintain a resonant condition for water treatment. The microprocessor determines whether a coil is an AC coil or a DC coil by detecting whether a capacitor is connected in series with the coil. An embodiment of the system further includes one or more sensors that measure the quality of water and provide feedback to the microprocessor.