Abstract: A power transmitting apparatus sets, on the basis of transmission power set with the power receiving apparatus, a first threshold for determining whether or not a foreign object exist, and a second threshold lower than the first threshold. The first and second threshold are set so that the difference between the first and second threshold values becomes larger as the set transmission power becomes larger. The power transmitting apparatus determines: that a foreign object exists in a case where the power loss is greater than the first threshold; that a foreign object does not exist in a case where the power loss is less than the second threshold; and that there is a possibility of a foreign object existing in a case where the power loss is between the first threshold and the second threshold.

Abstract: A monitor circuit (301) for monitoring changes in an input digital value of a register circuit comprises a data input (302) configured to receive a copy of the input digital value of said register circuit, and one or more triggering signal inputs (303) configured to receive one or more triggering signals. One or more triggering edges thereof define an allowable time limit before which a digital value must appear at a data input of said register circuit to become properly stored in said register circuit. The monitor circuit comprises a data event (DE) output (305), so that said monitor circuit is configured to produce a DE signal at said DE output (305) in response to a digital value at said data input (302) changing within a time window defined by said one or more triggering signals.

Abstract: In some embodiments of the present disclosure, a delay locked loop includes a coarse delay circuit configured to delay a reference clock signal to generate a first clock signal, a fine delay circuit configured to delay the first clock signal to generate a second clock signal, a first delay circuit configured to delay the second clock signal to generate a third clock signal, a second delay circuit configured to delay the first clock signal to generate a fourth clock signal, a third delay circuit configured to delay the fourth clock signal to generate a fifth clock signal, a phase detector configured to detect a phase difference between the reference clock signal and the fifth clock signal, and a controller configured to adjust, a first delay amount of the coarse delay circuit, a second delay amount of the fine delay circuit and a third delay amount of the third delay circuit.

Abstract: A level shifter circuit includes a first current mirror coupled between a power terminal and a ground terminal, a second current mirror coupled between the power terminal and the ground terminal, and a level shifter. The level shifter includes a first transistor coupled to the first current mirror and a second transistor coupled to the second current mirror. The first current mirror and the second current mirror control a state of the first transistor and the second transistor.

Abstract: A semiconductor device that can perform product-sum operation with low power is provided. The semiconductor device includes a switching circuit. The switching circuit includes first to fourth terminals. The switching circuit has a function of selecting one of the third terminal and the fourth terminal as electrical connection destination of the first terminal, and selecting the other of the third terminal and the fourth terminal as electrical connection destination of the second terminal, on the basis of first data. The switching circuit includes a first transistor and a second transistor each having a back gate. The switching circuit has a function of determining a signal-transmission speed between the first terminal and one of the third terminal and the fourth terminal and a signal-transmission speed between the second terminal and the other of the third terminal and the fourth terminal on the basis of potentials of the back gates. The potentials are determined by second data.

Abstract: A voltage conversion circuit is provided. The circuit includes a first input module and a second input module. The first input module is connected to a first voltage and has a first input terminal for receiving an input signal and outputting a conversion signal, a high level of the input signal is a second voltage which is less than the first voltage; The second input module is connected to the first input module and has a second input terminal and an output terminal, the second input terminal is configured to receive a sampling signal, and the second input module is configured to sample the conversion signal according to the sampling signal and output an output signal via the output terminal.

Abstract: Circuits, methods, and systems for generating data outputs based on sampled data inputs. One circuit includes a first clock-activated transistor electrically coupled to a first shared clock node, a second clock-activated transistor coupled to a second shared clock node, a third clock-activated transistor coupled to a third shared clock node, a plurality of flip-flops, a latch electrically coupled to the second shared clock node and the third shared clock node, and a first keeper sub-circuit electrically coupled to the third shared clock node and at least one of a first output or a second output of the latch. Each flip-flop of the plurality of flip-flops includes a latch electrically coupled to the second shared clock node and the third shared clock node and a first keeper sub-circuit electrically coupled to the third shared clock node and at least one of a first output or a second output of the latch.

Abstract: A system for count separation of objects comprises a controller, cameras adapted to detect each individual object in a stream of falling objects such that the controller can count the objects, a first receiving location adapted to directly receive the stream of falling objects, a second receiving location adapted to receive objects diverted from the stream of falling objects or to receive the stream of falling objects when the stream of falling objects is diverted from the first receiving location; a mechanical diverter having (a) a first position to not divert the stream of falling objects from the first receiving location and (b) a second position in to divert the stream of falling objects to the second receiving location, and an air blast diverter adapted (a) to divert specific objects or the stream of falling objects to the second location.

Abstract: An integrated circuit includes a clocking transistor, a first enabling transistor, a second enabling transistor, a branch-one transistor, a branch-two transistor, and a clock gating circuit. The first enabling transistor is coupled between the clocking transistor and a first node. The second enabling transistor is coupled between the clocking transistor and a second node. The branch-one transistor is coupled between a first power supply and the first node. The gate terminal of the branch-one transistor is electrically connected to the second node. The branch-two transistor is coupled between the first power supply and the second node. The gate terminal of the branch-two transistor is electrically connected to the first node. The clock gating circuit for generating a gated clock signal receives a latch output signal which is latched to a logic level of either a first node signal or a second node signal.

Abstract: A semiconductor device includes: a data sampler configured to receive a data signal having a first frequency and to sample the data signal with a clock signal having a second frequency, higher than the first frequency, to output data for a time corresponding to a unit interval of the data signal; an error sampler configured to sample the data signal with an error clock signal having the second frequency and a phase, different from a phase of the clock signal, to output a plurality of pieces of error data for the time corresponding to the unit interval; and an eye-opening monitor (EOM) circuit configured to compare the data with each of the plurality of pieces of error data to obtain an eye diagram of the data signal in the unit interval.

Abstract: To suppress malfunctions in a shift register circuit. A shift register having a plurality of flip-flop circuits is provided. The flip-flop circuit includes a transistor 11, a transistor 12, a transistor 13, a transistor 14, and a transistor 15. When the transistor 13 or the transistor 14 is turned on in a non-selection period, the potential of a node A is set, so that the node A is prevented from entering into a floating state.

Abstract: An integrated circuit (IC) includes a first power supply node configured to have a first power supply voltage level, a second power supply node configured to have a second power supply voltage level separate from the first power supply voltage level, an n-well, a bias circuit, and a level shifter. The n-well contains first and second PMOS transistors including first source/drain (S/D) terminals coupled to the first power supply node, and third and fourth PMOS transistors including second S/D terminals coupled to the second power supply node. The bias circuit includes the first PMOS transistor including a third S/D terminal coupled to the n-well and a gate coupled to the second power supply node, and the third PMOS transistor including a fourth S/D terminal coupled to the n-well and a gate coupled to the first power supply node. The level shifter includes the second and fourth PMOS transistors.

Abstract: A fail-safe counter evaluator is provided to insure proper counting operations by fail-safe counters. The failsafe counter evaluator comprises a first microprocessor, a first counter, a second counter, a second microprocessor and a test channel. The first counter is configured as a counter in operation and disposed in the first microprocessor to receive externally generated count pulses. The second counter is disposed in the first microprocessor and configured to undergo a test. The test channel is configured to send an input test signal to the second counter based on test pulses from the second microprocessor. The first microprocessor and the second microprocessor are synchronized so that to coordinate a start and an end of the test. The second counter is evaluated after the test pulses have been sent to determine if the second counter is operating properly.

Abstract: An apparatus includes a plurality of transceiver circuits, each comprising one or more phase shifter circuits. The phase shifter circuits may be configured to make a phase change by switching at least one of a capacitance value and an inductance value in response to a control signal. A characteristic impedance and the phase of each phase shifter circuit are correlated such that after the phase change, a value of the characteristic impedance is maintained at a predefined value.

Abstract: Voltage level conversion circuits include PMOS pull-down devices or NMOS pull-up devices, and inverters with outputs that determine gate voltages of these devices. The inverters are powered by moving supply voltages, for example complementary supply voltages generated from a pair of cross-coupled inverters. The cross-coupled inverters may implement a data storage latch with the moving supply voltages generated from the internal data storage nodes of the latch.

Abstract: A sense amplifier including a first input transistor having a first input gate and a first drain/source terminal, a second input transistor having a second input gate and a second drain/source terminal, a latch circuit, and a first capacitor. The latch circuit includes a first latch transistor having a third drain/source terminal connected to the first drain/source terminal and a second latch transistor having a fourth drain/source terminal connected to the second drain/source terminal. The first capacitor is connected on one side to the first input gate and on another side to the fourth drain/source terminal to reduce a coupling effect in the sense amplifier.

Abstract: Shift register elements of a phase-mode bit-addressable sensing register sample varied AC or DC bias values provided to operational RQL circuitry on the RQL IC via clock resonators or DC bias lines. The shift register can be constructed of phase-mode D flip-flops and JTLs as data and clock lines. A method of using the sensing register includes shifting in a data bit pattern while a bias parameter (e.g., AC amplitude, DC value, or phase) is set to a nominal value; stopping the logical clock that controls the shifting of values through the sensing register, varying the bias parameter value, inputting one assertion SFQ pulse or reciprocal pulse pair into the logical clock, restoring the bias parameter to the nominal value, restarting the logical clock to shift out an output data bit pattern, and observing the output data bit pattern to determine the effect of the bias parameter value change.

Abstract: A circuit includes a first transistor whose gate is connected to a set terminal and whose source or drain is connected to an internal node, a second transistor connected such that one of a source and a drain is electrically connected to the internal node and the other one of the source and the drain is electrically connected to a reference voltage source, a third transistor connected such that a gate is connected to the internal node, one of a source and a drain is connected to a clock terminal, and the other one of the source and the drain is connected to a first output terminal, a bootstrap capacitor which is connected to the internal node and the first output terminal, and a stabilization circuit that suppresses a drop in potential at the internal node in a charging period of the bootstrap capacitor.

Abstract: A latch device includes a memory cell, a pair of write switches and an output terminal. The memory cell stores a latch data, and the pair of write switches is coupled to the memory cell through a first node and a second node. The pair of write switches holds the latch data stored in the memory cell when logic values of a first input signal and a second input signal are a predetermined logic value, and updates the latch data stored in the memory cell when the logic values of the first input signal and the second input signal are mutually exclusive logic values. The output terminal is coupled to at least one of the first node and the second node and outputs an output signal based on the latch data stored in the memory cell. An operation of the latch memory is also introduced.

Abstract: A semiconductor device includes an input, a level shifter, an output, and a switch module. The input is configured to receive an input signal in a first voltage domain. The level shifter is connected to the input and is configured to shift the input signal from the first voltage domain to a second voltage domain. The switch module is configured to connect one of the input and the level shifter to the output. A method of mitigating a delay between input and output signals of the semiconductor device is also disclosed.