Patents Examined by Paul M. Gurzo
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Patent number: 6847034Abstract: A portion of at least one fiber is moved into an exterior annulus of a well between a tubular structure in the well and the wall of the borehole of the well such that the portion is placed to conduct a signal responsive to at least one parameter in the exterior annulus. One particular implementation uses fiber optic cable with a cementing process whereby flowing cementing fluid pulls the portion of the cable into the exterior annulus.Type: GrantFiled: September 9, 2002Date of Patent: January 25, 2005Assignee: Halliburton Energy Services, Inc.Inventors: Vimal V. Shah, Wallace R. Gardner, Paul F. Rodney, Neal G. Skinner
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Patent number: 6844543Abstract: This invention provides a system and method for measuring an energy differential that correlates to quantitative measurement of an amount mass of an applied localized material. Such a system and method remains compatible with other methods of analysis, such as, for example, quantitating the elemental or isotopic content, identifying the material, or using the material in biochemical analysis.Type: GrantFiled: May 9, 2003Date of Patent: January 18, 2005Assignee: The Regents of the University of CaliforniaInventors: Patrick G. Grant, Olgica Bakajin, John S. Vogel, Graham Bench
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Patent number: 6833551Abstract: An electron beam irradiation apparatus includes an electron beam system for directing electrons into an irradiation zone. The electron beam system and the irradiation zone are configured for irradiating outwardly exposed surfaces of a 3-dimensional article passing through the irradiation zone from different directions with the electrons from the electron beam system.Type: GrantFiled: March 12, 2002Date of Patent: December 21, 2004Assignee: Advanced Electron Beams, Inc.Inventor: Tzvi Avnery
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Patent number: 6831271Abstract: The present invention relates to a method for separating and enriching stable isotopes in gas phase using the principles of high field asymmetric waveform ion mobility spectrometry, substantially at atmospheric pressure (760 torr) and substantially at room temperature (298 K). Specifically, the method of the present invention may be used to separate and enrich isotopes of chlorine. Electrospray ionization may be used to generate a gaseous mixture of ions and the ion beam exiting the high field asymmetric waveform ion mobility spectrometer may be sampled into a mass spectrometer for isotope identification.Type: GrantFiled: May 9, 2001Date of Patent: December 14, 2004Assignee: National Research Council CanadaInventors: Roger Guevremont, Randy Purves, David Barnett
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Patent number: 6828569Abstract: Cleaning of optical components for use in a lithographic projection apparatus can be carried out by irradiating a space within the apparatus containing the optical component with UV or EUV radiation having a wavelength of less than 250 nm, in the presence of an oxygen-containing species selected from water, nitrogen oxide and oxygen-containing hydrocarbons. Generally, the space will be purged with an ozone-less purge gas which contains a small amount of the oxygen-containing species in addition to the usual purge gas composition. The technique can also be used in an evacuated space by introducing a low pressure of the oxygen-containing species into the space.Type: GrantFiled: November 19, 2001Date of Patent: December 7, 2004Assignee: ASML Netherlands B.V.Inventors: Willem Van Schaik, Bastiaan Matthias Mertens, Hans Meiling, Norbertus Benedictus Koster
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Patent number: 6822248Abstract: Fine positioning of a shaped or patterned charged particle beam without use of intrusive fiducial marks is achieved by providing a dithered shadow pattern, preferably in the form of a grid, within the shaped or patterned charged particle beam. Light output from fiducial marks preferably formed of a scintillating material is reduced when the dithered shadow pattern is incident on some or all of the fiducial marks. The timing of the incidence of the shadow pattern on fiducial marks indicates the position of the shaped or patterned charged particle beam such that correction of the beam position on the target can be corrected to a small fraction of system resolution. The dither pattern and repetition period is chosen to avoid interference with uniformity of beam illumination of the target. Feedback of position error thus provides phase locked position correction in real time and is suitable for mask making since the fiducial marks are not intrusive.Type: GrantFiled: March 15, 2001Date of Patent: November 23, 2004Assignee: International Business Machines CorporationInventors: Juan Ferrera, James G. Goodberlet, Timothy R. Groves, John G. Hartley, Mark K. Mondol, Mark L. Schattenburg, Henry I. Smith
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Patent number: 6822228Abstract: A laser device includes a target position, an optical component separated a distance J from the target position, and a laser energy source separated a distance H from the optical component, distance H being greater than distance J. A laser source manipulation mechanism exhibits a mechanical resolution of positioning the laser source. The mechanical resolution is less than a spatial resolution of laser energy at the target position as directed through the optical component. A vertical and a lateral index that intersect at an origin can be defined for the optical component. The manipulation mechanism can auto align laser aim through the origin during laser source motion. The laser source manipulation mechanism can include a mechanical index. The mechanical index can include a pivot point for laser source lateral motion and a reference point for laser source vertical motion.Type: GrantFiled: November 1, 2001Date of Patent: November 23, 2004Assignee: Bechtel BWXT Idaho, LLCInventors: Jill R. Scott, Paul L. Tremblay
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Patent number: 6815668Abstract: Method and apparatus for chromatographic high field asymmetric waveform ion mobility spectrometry, including a gas chromatographic analyzer section intimately coupled with an ionization section, an ion filter section, and an ion detection section, in which the sample compounds are at least somewhat separated prior to ionization, and ion filtering proceeds in a planar chamber under influence of high field asymmetric periodic signals, with detection integrated into the flow path, for producing accurate, real-time, orthogonal data for identification of a broad range of chemical compounds.Type: GrantFiled: March 5, 2001Date of Patent: November 9, 2004Assignee: The Charles Stark Draper Laboratory, Inc.Inventors: Raanan A. Miller, Erkinjon G. Nazarov, Gary A. Eiceman, Evgeny Krylov, Boris Tadjikov
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Patent number: 6815677Abstract: The present invention provides a scanning electron microscope that can obtain a high-precision SEM image and width measurement values, without damaging an object to be measured even at a high magnification. This scanning electron microscope irradiates a sample with an electron beam so as to detect secondary electrons released from the sample due to the irradiation. The scanning electron microscope also includes scan generators for detecting the secondary electrons at a frequency depending on a detection magnification for the sample. The present invention also provides a method of measuring a pattern size using the above scanning electron microscope.Type: GrantFiled: March 23, 2001Date of Patent: November 9, 2004Assignees: Fujitsu Limited, Kabushiki Kaisha ToshibaInventors: Kouichi Nagai, Takahiro Ikeda
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Patent number: 6815669Abstract: An asymmetric field ion mobility spectrometer for filtering ions via an asymmetric electric field, an ion flow generator propulsing ions to the filter via a propulsion field.Type: GrantFiled: February 21, 2002Date of Patent: November 9, 2004Assignee: The Charles Stark Draper Laboratory, Inc.Inventors: Raanan A. Miller, Markus Zahn
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Patent number: 6811327Abstract: A connection for an underwater acoustics system connecting elements of an antenna embedded in a leaktight first block of the system and an electro-optical transmitter embedded in a separate leaktight second block of the system. The antenna is electrically connected to a first part of a divisible transformer, which is also arranged in the leaktight first block. The electro-optical transmitter (e.g., vertical cavity surface emitting laser) is electrically connected to a second part of the divisible transformer, which is also arranged in the leaktight second block. The first part and the second part are anatomically separated, as are the first and second blocks within which they are contained, but have cores that can magnetically communicate with one another. By this configuration, the divisible transformer can communicate signals from the antenna to the electro-optical transmitter without compromising the leaktightness of the first or second blocks, thereby protecting the components.Type: GrantFiled: May 8, 2002Date of Patent: November 2, 2004Assignee: Thales Underwater Systems S.A.S.Inventor: Daniel Billet
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Patent number: 6809328Abstract: Erosion-resistive coatings are provided on critical plasma-facing surfaces of an electrical gas plasma head for an EUV source. The erosion-resistive coatings comprise diamond and diamond-like materials deposited onto the critical plasma-facing surfaces. A pure diamond coating is deposited onto the plasma exposed insulator surfaces using, for example, a chemical vapor deposition processes. The diamond coating is made conductive by selective doping with p-type material, such as, but not limited to, boron and graphite.Type: GrantFiled: December 20, 2002Date of Patent: October 26, 2004Assignee: Intel CorporationInventors: Manish Chandhok, Kramadhati V. Ravi, Robert Bristol, Melissa Shell
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Patent number: 6809318Abstract: A system for determining the ratio of mass to charge of an ion including a pulsed ionizer, a high pressure co-linear ion guide/accelerator, and a mass analyzer. The pulsed ionizer generates intact analyte ions from a sample of matter to be analyzed. The high pressure co-linear ion guide/accelerator is interfaced with the ion source for receipt of the intact ions of the sample. The ion guide/accelerator simultaneously dampens and linearly accelerates the intact ions in the substantial absence of fragmentation of the ions to provide a substantially continuous beam of the intact ions for mass analysis. The mass analyzer is connected to the ion guide/accelerator for receipt of the beam of ions and determines the mass to charge ratio of the intact ions.Type: GrantFiled: September 8, 2003Date of Patent: October 26, 2004Assignee: The Rockefeller UniversityInventors: Andrew Krutchinsky, Herbert Cohen, Markus Kalkum, Vadim Sherman, Brian Chait
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Patent number: 6810175Abstract: An apparatus and method for generating a mode-scrambled optical signal. A laser beam source directs an optical signal into a free end of a first segment of multimode fiber comprising a graded-index (GI) fiber core at an offset from the centerline of the core, generating an offset-launch condition. The first segment of multimode fiber is operatively coupled into a second segment of multimode fiber comprising a step-index (SI) fiber core. As the offset-launched optical signal passes through the first and second segments of multimode fiber, the optical signal is converted into a mode-scrambled optical signal having a substantially-filled numerical aperture.Type: GrantFiled: April 22, 2002Date of Patent: October 26, 2004Assignee: Terabeam CorporationInventors: Jun Shan Wey, Robert M. Pierce, Eric C. Eisenberg, Jorah R. Wyer
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Patent number: 6806481Abstract: The invention relates to a rectangular frame system with one to two discoid radiation filters, as well as a tanning module with such a frame system. The rectangular frame system has an upper plate, a lower plate and two to three margin members, two margin members being opposite one another and joining the upper plate to the lower plate, the upper plate having a first opening whose perimeter describes a circle, an ellipse, a rectangle or a polygon, and the lower plate has a rectangular second opening, the second opening having a greater area than the first opening, and at least two double spring clips are arranged at the two opposite margin members, which border on side of the frame system at which no margin member is provided, such that between the lower plate and the double spring clips a first radiation filter is clamped.Type: GrantFiled: November 20, 2001Date of Patent: October 19, 2004Assignee: Heraeus Noblelight GmbHInventors: Bernd Ullrich, Ullrich Berger, Ernst Smolka, Jörn Jahnke, Stefan Greif
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Patent number: 6803566Abstract: An automated electrospray based sampling system and method for analysis obtains samples from surface array spots having analytes. The system includes at least one probe, the probe including an inlet for flowing at least one eluting solvent to respective ones of a plurality of spots and an outlet for directing the analyte away from the spots. An automatic positioning system is provided for translating the probe relative to the spots to permit sampling of any spot. An electrospray ion source having an input fluidicly connected to the probe receives the analyte and generates ions from the analyte. The ion source provides the generated ions to a structure for analysis to identify the analyte, preferably being a mass spectrometer. The probe can be a surface contact probe, where the probe forms an enclosing seal along the periphery of the array spot surface.Type: GrantFiled: April 16, 2002Date of Patent: October 12, 2004Assignee: UT-Battelle, LLCInventor: Gary J. Van Berkel
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Patent number: 6803591Abstract: Disclosed is a medical particle irradiation apparatus comprising a rotating gantry 1 including an irradiation unit 4 emitting particle beams; an annular frame 16 located within and supported by the rotating gantry 1 such that it can rotate relative to the rotating gantry 1; an annular frame 15 fixedly located opposite the annular frame 16; an anti-corotation mechanism 34 being in contact with both the annular frames 16 and 15 to prevent the annular frame 16 from rotating together with the rotating gantry 1 during rotation of the rotating gantry 1; and a flexible moving floor 17 interposed between the annular frames 15 and 16, the flexible moving floor 17 being engaged with the annular frames 15 and 16 in such a manner as to move freely such that its bottom is substantially level and that it moves as the rotating gantry rotates.Type: GrantFiled: May 1, 2003Date of Patent: October 12, 2004Assignees: Hitachi, Ltd., Hitachi Setsubi Engineering Co., Ltd.Inventors: Yutaka Muramatsu, Hidehito Asano, Wataru Sagawa, Hiroshi Akiyama, Tsutomu Yamashita
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Patent number: 6800853Abstract: In the electron microscope in accordance with the present invention, the electron beam is scanned during a SEARCH mode for searching for a field of view of interest to obtain a TEM image. The state of excitation of the condenser lens does not vary when the mode of operation is switched from the SEARCH mode to a PHOTO mode.Type: GrantFiled: November 16, 2001Date of Patent: October 5, 2004Assignee: Jeol Ltd.Inventor: Yoshihiro Ohkura
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Patent number: 6797965Abstract: A charged particle beam apparatus includes a charged particle source which generates a charged particle beam, a condenser lens which converges the charged particle beam, a deflector which deflects the charged particle beam to scan a sample with the charged particle beam, an objective lens which converges the charged particle beam on the surface of the sample, a sample position imaginary variation detection part which detects an imaginary variation of a sample position caused by variation of the focal position of the charged particle beam due to variation in the potential of the sample, and a sample position imaginary variation compensation part which compensates for the detected imaginary variation of the sample position.Type: GrantFiled: September 24, 2002Date of Patent: September 28, 2004Assignee: Kabushiki Kaisha ToshibaInventor: Hideaki Abe
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Patent number: 6797952Abstract: According to the invention, in selecting an analyzed area of a scanning atom probe (SAP), there is adopted a method of using a tip of the lead-out electrode of SAP as a scanning probe of a scanning tunneling microscope (STM) and drawing a surface shape of a sample to thereby select the analyzed area and with regard to the tip of the lead-out electrode of SAP, there is formed an exclusive probe in a needle-like shape by a CVD micromaching technology or a lithographic method using focused ion beam in order to promote accuracy of the scanning probe of STM. Further, a conical dome of a conductive material is formed at the tip of the conical electrode mechanically formed by using a CVD fabricating method using focused ion beam and the tip is shaped by sputter etching to thereby form the lead-out electrode near to an ideal shape.Type: GrantFiled: July 26, 2002Date of Patent: September 28, 2004Assignees: SII NanoTechnology Inc., Kanazawa Institute of TechnologyInventors: Takashi Kaito, Osamu Nishikawa, Takaya Yagyu