Abstract: An energy system for providing electrical energy to a device where the energy system includes: a first battery for providing a first electrical power over a first time period; a second battery for providing a second electrical power over a second time period, the second battery being a type different from a type of the first battery, the second power being greater than the first power and the second time period being smaller than the first time period; and a controller for controlling initiation of the first battery and the second battery at predetermined times to satisfy a specific power requirement of the device over a time period including the first and second time periods.

Abstract: In an information processing device according to the present invention, a statistics estimation unit estimates a value of a state quantity by using a statistical model constructed based on values of past state quantities of a target device. A physical estimation unit estimates a value of a state quantity by using a physical model constructed based on design data of the target device. A specification unit specifies a value to be used to manage the target device from the value estimated by the statistics estimation unit and the value estimated by the physical estimation unit based on deterioration of the target device with time.

Abstract: Creation and use of a digital twin instance (DTI) for a physical instance of the part. The DTI may be created by a model inversion process such that model parameters are iterated until a convergence criterion related to a physical resonance inspection result and a digital resonance inspection result is satisfied. The DTI may then be used in relation to part evaluation including through simulated use of the part. The physical instance of the part may be evaluated by way of the DTI or the DTI may be used to generate maintenance schedules specific to the physical instance of the part.

Abstract: Creation and use of a digital twin instance (DTI) for a physical instance of the part. The DTI may be created by a model inversion process such that model parameters are iterated until a convergence criterion related to a physical resonance inspection result and a digital resonance inspection result is satisfied. The DTI may then be used in relation to part evaluation including through simulated use of the part. The physical instance of the part may be evaluated by way of the DTI or the DTI may be used to generate maintenance schedules specific to the physical instance of the part.

Abstract: Automated circuit generation is disclosed. In some embodiments, parameters are received and a circuit schematic is generated automatically by software. In some embodiment, parameters are received and a circuit layout is generated automatically by software. In some embodiments, a design interface may be used to create a behavioral model of a circuit. Software may generate a circuit specification to generate a schematic. In various embodiments, circuit component values may be determined and generated. Certain embodiments pertain to automating layout of circuits. Software may receive parameters for functional circuit components and generate a circuit schematic and/or a layout. The present techniques are particularly useful for automatically generating analog circuits.

Abstract: Various embodiments provide for determining clock gates for decloning based on simulation and a satisfiability solver, which can be part of electronic design automation (EDA). In particular, some embodiments use a simulation process to quickly determine whether enable signals associated with two clock gates are logically equivalent using a random input vector to a circuit design and, if logically equivalent by the simulation process, use a satisfiability solver to determine a variable assignment (e.g., at least one vector) such that the enable signals are found to be non-equivalent.

Abstract: A system for performing operations including accessing an integrated circuit design that includes a clock tree interconnecting a clock source to a plurality of clock sinks. The operations include receiving a request to adjust a current timing offset of the clock tree to a target timing offset. The clock tree is modified by moving a terminal of the group from a first location in the clock tree to a second location in the clock tree to generate an updated clock tree. During modification, the first and second locations are analyzed to determine a load reduction and increase at the respective terminals. One or more neighboring clock tree instances are adjusted to compensate for the load reduction and increase. The operations include providing an indication that the clock tree has been updated and complies with the target timing offset.

Abstract: A method, involving determining a first distribution of a first parameter associated with an error or residual in performing a device manufacturing process; determining a second distribution of a second parameter associated with an error or residual in performing the device manufacturing process; and determining a distribution of a parameter of interest associated with the device manufacturing process using a function operating on the first and second distributions. The function may include a correlation.

Abstract: The technology disclosed relates to verifying metastability for a clock domain crossing (CDC) in a circuit design. The technology disclosed may include, for a destination clock domain in the circuit design, creating a circuit graph based, at least in part, on the circuit design. The circuit graph includes start points and stop points. The start points may be data inputs, clocks, and enables of the destination clock domain. The stop points may be synchronizer outputs of the destination clock domain and a source clock domain in the circuit design. The technology disclosed may also include traversing the circuit graph to mark all graph nodes that reside in a source-destination path of the CDC. Based on the marked graph nodes, the start points, and the stop points, the technology disclosed may also include propagating destination domain qualifiers on the circuit graph within an allowed sequential depth.

Abstract: A method (of fabricating a power grid (PG) arrangement in a semiconductor) includes: forming a first conductive layer including segments which are conductive, including forming first segments designated for a first reference voltage and second segments designated for a second reference voltage, and interspersing the first and second segments; relative to a first direction; and forming a second conductive layer over the first conductive layer, the second conductive layer including segments that are conductive, including forming third segments designated for the first reference voltage and fourth segments designated for the second reference voltage, interspersing the third and fourth segments relative to a second direction, the second direction being perpendicular to the first direction, and arranging the segments in the second conductive layer substantially asymmetrically including, relative to the first direction, locating each fourth segment substantially asymmetrically between corresponding adjacent ones of

Abstract: This validation processing device is provided with: a processing unit that performs model checking on a model to be checked; and a selection unit that selects, on the basis of the result of the model checking, one element from among elements that have undergone state change in a process leading to an unsafe event. The processing unit further performs model checking again on the model to be checked excluding the one element.

Abstract: A method for generating a fault tree of a multi-component system is provided. The multicomponent system includes a logical-functional system layer and a physical system layer as different layers of abstraction. The physical system layer may correspond, for example, to software and/or hardware implementing the functional aspects of the logical-functional system layer. The method first provides a logical-functional fault tree for the logical-functional system layer and a physical fault tree for the physical system layer, the latter having elements corresponding to elements in the logical-functional fault tree. Next, a mixed-layer fault tree is generated by combining aspects of both fault trees in a systematic way. The disclosed is particularly relevant for analyzing safety-critical systems. However, the present concepts are not limited to these applications and may be applied to general use cases where fault tree analysis is applicable.

Abstract: Examples of synchronized parallel tile computation techniques for large area lithography simulation are disclosed herein for solving tile boundary issues. An exemplary method for integrated circuit (IC) fabrication comprises receiving an IC design layout, partitioning the IC design layout into a plurality of tiles, performing a simulated imaging process on the plurality of tiles, generating a modified IC design layout by combining final synchronized image values from the plurality of tiles, and providing the modified IC design layout for fabricating a mask. Performing the simulated imaging process comprises executing a plurality of imaging steps on each of the plurality of tiles. Executing each of the plurality of imaging steps comprises synchronizing image values from the plurality of tiles via data exchange between neighboring tiles.

Abstract: A method of manufacturing an integrated circuit includes generating a layout of a first and a second cell, adjusting a first spacing between an adjacent pair of routing tracks in a first set of routing tracks to be equal to a second spacing, adjusting a third spacing between an adjacent pair of routing tracks in a second set of routing tracks to be equal to a fourth spacing, placing a first pair of conductive patterns on the first set of routing tracks, placing a second pair of conductive patterns on the second set of routing tracks, forming a first set of conductive structures based on the first pair of conductive patterns, and forming a second set of conductive structures based on the second pair of conductive patterns. The first and second cell have a same cell height that is a non-integer multiple of a minimum pitch.

Abstract: A computing system implementing a design verification system can elaborate a mixed-signal circuit design having a complex sandwich hierarchy using a standard digital solver and a standard analog solver, as opposed to a tightly coupled custom elaboration engine. The design verification system can parse the mixed-signal circuit design to identify analog design blocks and flatten the analog design blocks into the structural proxy blocks having parameter connections to digital design blocks in the mixed-signal circuit design. The design verification system can replace an analog portion of the mixed-signal circuit design with the structural proxy blocks and elaborate the structural proxy blocks and digital design blocks associated with a digital portion of the mixed-signal circuit design. The design verification system can elaborate the analog portion of the mixed-signal design and simulate the elaborated analog portion with an analog simulator and the elaborated digital portion with a digital simulator.

Abstract: Disclosed is cell-aware defect characterization by considering inter-cell timing. Also disclosed is a method and apparatus that determines whether a defect can be detected in a standard library cell used to design an integrated circuit. A defect detection table is generated that indicates whether particular defects can be detected with particular combinations of input logic states and under varying load conditions. Results are merged to provide a single metric for each combination of input and output logic states that indicates one of three possible results for each defect: (1) whether the defect can be detected under all load conditions, (2) whether the defect can be detected only under some load conditions; or (3) whether the defect cannot be detected for the particular combination of input logic states regardless of the load conditions.

Abstract: The present disclosure relates to a computer-implemented method for mixed signal design verification. Embodiments may include receiving, using a processor, an electronic circuit design and compiling and elaborating the electronic circuit design. Embodiments may also include simulating the electronic circuit design and updating, during the simulating, a System Verilog User-Defined Resolution function (“SV-UDR”) associated with the electronic circuit design.

Abstract: Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Abstract: A method is disclosed including: generating, based on design information for an integrated circuit, a circuit design that includes an initial power delivery network (PDN) for the integrated circuit; performing a pre-layout simulation to the circuit design that includes the initial power delivery network, to determine whether the circuit design meets a predetermined specification; and when the circuit design meets the predetermined specification, generating a power delivery network layout of the integrated circuit, and generating, after the power delivery network layout is generated, a circuit layout of the integrated circuit.

Abstract: Systems and methods for managing operations for generating a plurality of designs of an integrated circuit chip are described. One of the methods includes receiving a request with a specification of the integrated circuit chip from a requester account, receiving a plurality of requests from a plurality of community member accounts for viewing the specification, and providing access to the specification to the plurality of community member accounts. The method further includes receiving a plurality of instances of the acceptance from the plurality of community member accounts for creating the plurality of designs, providing access to a plurality of resources to the plurality of community member accounts, and receiving a plurality of design files having the plurality of designs from the plurality of community member accounts. The method includes providing access to the plurality of designs to the requester account for approval or disapproval of the plurality of designs.