Abstract: A system for inspecting a component includes a fixture for holding the component, a light source disposed on one side of the component, and an optical detector disposed on the other side of the component. The detector images a portion of the outer edges of the component. A translation stage is operative to move the light source and detector in unison along the length of the component. The component is rotated through a predetermined angle about its axis.

Abstract: A particulate matter sensing device includes a light source to generate a pulsed light at a first wavelength in response to a drive pulse. The device further includes one or more photodetectors. A thin-film filter is formed over the photodetectors and is tuned to be transparent to scattered light having a second wavelength substantially equal to the first wavelength. The scattered light is produced as a result of scattering of the pulsed light by the particulate matter. A charge collection circuit of the plurality of photodetectors electronically rejects background light.

Abstract: Gas analyzer or gas analysis method, in which beams of at least two different radiation sources are coupled into a Herriott cell containing a measurement gas and, after being reflected multiple times, are coupled out therefrom and detected, wherein the beams are aligned such that they strike mirrors in point patterns which extend along ellipses, where the different ellipses lie inside one another and have two shared vertices (co-vertices) on a shared axis of symmetry, whereas the other co-vertices (or vertices) do not coincide, the beams of at least two of the different radiation sources are coupled into the Herriott cell at differing points of the associated point pattern and/or are coupled into the Herriott cell such that they pass through the associated point patterns along the ellipses in opposite directions, and where all beams are coupled out at the point of one of the shared vertices.

Abstract: A method of measuring a concentration of NO2 in a gaseous mixture using a multimode laser beam that covers a tunable spectral range with a width of no more than 5 nm, wherein the multimode laser beam provides a high resolution transmittance spectrum at an absorption cross section of NO2 molecules, and a system for measuring the concentration of NO2 in the gaseous mixture. Various combinations of embodiments of the system and the method are provided.

Abstract: A high-speed method and system for inspecting and sorting a stream of unidentified mixed parts are provided. The system includes a pair of inspection stations each of which includes a vision-based robotic subsystem including a robot configured to pick up a self-supporting part and place the part on a fixtureless rotary stage. A second subsystem optically measures a profile and features of the part during part rotation. A processor is operable to compare the profile and features of the part with the profile and corresponding features of stored templates to identify a matching template. A mechanism including a part sorter directs unidentified parts and parts having an unacceptable geometric dimension or defect to a reject part area and directs identified parts having acceptable geometrical dimensions and no significant defects to good part areas.

Abstract: A method of measuring a concentration of NO2 in a gaseous mixture using a multimode laser beam that covers a tunable spectral range with a width of no more than 5 nm, wherein the multimode laser beam provides a high resolution transmittance spectrum at an absorption cross section of NO2 molecules, and a system for measuring the concentration of NO2 in the gaseous mixture. Various combinations of embodiments of the system and the method are provided.

Abstract: The present disclosure relates to a system and a method of detecting a defect of an optical film, and more particularly, to a system and a method of detecting a defect of an optical film, which obtain an image of a defect of an optical film projected onto a screen and detect the defect of the optical film. As an exemplary embodiment of the present disclosure, a system for detecting a defect of an optical film may be provided.

Abstract: A flow cytometer module configured to be integrated with a liquid handling system is provided herein. The flow cytometer module includes (a) a flow cell, (b) a first fluidic pathway, (c) an inlet configured to receive a sample introduction device of the liquid handling system including one or more samples, (d) a second fluidic pathway in fluid communication with the first fluidic pathway, (e) a laser interrogation device configured to examine the one or more samples at a laser interrogation point in the second fluidic pathway, and (f) a controller in communication with the liquid handling system and configured to cause the flow cytometer module to perform functions comprising: (i) recording data from the laser interrogation device corresponding to a plurality of events as the one or more samples pass the laser interrogation point, and (ii) transmitting the data corresponding to the plurality of events to the liquid handling system.

Abstract: An optical excitation system comprises a substrate (105) comprising at least one delivery means (104), for delivering analytes (109) into at least one region of interest (103), at least one radiation carrier (101) for directing at least one radiation beam from the at least one radiation carrier (101) into the at least one region of interest (103). The substrate (105) includes a thin lens system (120) comprising at least a first thin lens (121), for collimating radiation from the at least one region of interest (103) to a remote detection system (130). A particle sensor and sensing system comprising the excitation system are also provided, for example a modular particle sensor and modular sensing system, wherein the optical excitation system may be single use and disposable.

Abstract: Provided are spectrometers utilizing surface plasmons and surface plasmon resonance. The spectrometer includes a substrate including a region having a permittivity slope (varying permittivity), a dielectric spacer configured to correspond to the region having a permittivity slope, and a detector configured to face the region having a permittivity slope with the dielectric spacer therebetween. The region having a permittivity slope includes a region having a dopant concentration slope (varying concentration).

Abstract: Apparatus and methods for measuring mode spectra for ion-exchanged glass substrates having a steep index region are disclosed. An interfacing fluid is provided between the coupling prism and the glass substrate. The interfacing fluid thickness is selected so that the variation in modal birefringence with fluid thickness is reduced to an acceptable level. The coupling prism can include a prism coating on the coupling surface so that the substrate-prism interface includes the prism coating. The coupling prism can also include stand-off members that serve to define the thickness of the interfacing fluid.

Abstract: Provided is a method for evaluating a pretreatment effect for organic solid waste based on fractal dimension, relating to biological conversion of organic solid waste. Samples of the organic solid waste are collected, and dried and broken up to obtain dried samples. The mixtures obtained are analyzed using a laser particle size analyzer, so as to measure a wave vector Q and a scattering intensity I of each of the mixtures. According to a fractal theory, the wave vector Q and the scattering intensity I obtained are analyzed using a data processing software to obtain a two-dimensional fractal dimension Df of each of the samples. Based on data from documents and experiments, a total organic carbon or an apparent activated energy is evaluated, so as to evaluate the pretreatment effects of samples of the organic solid waste.

Abstract: An apparatus to provide a label-free or native particle analysis comprises a light generating system producing first light pulses at a first wavelength and second light pulses at a second wavelength; and a flow cell coupled to the light generating system to convey particles for analysis. The light generating system is configured to chirp at least one of the first light pulses and the second light pulses to analyze the particles.

Abstract: Disclosed are a method and an apparatus for inspection of workpieces and products having curved and, in particular, spherical surfaces. The method is based on scanning inspected objects with a narrow probing beam of electromagnetic radiation and concurrently measuring the radiation scattered on the surface. The method and apparatus improve the detectability of features and imperfections on inspected surfaces by providing invariable parameters and conditions of scanning, robust mechanical stability of scanning systems, high positioning accuracy of the probing electromagnetic beam and efficient collection of the scattered radiation. The apparatus allows surface defect classification, determining defect dimensions and convenient automation of inspection.

Abstract: In the arrangement for determining the achievable adhesive strength before forming a connection having material continuity to a surface of a joining partner, a plurality of detectors are present and arranged that are configured for a spatially resolved spectral analysis of electromagnetic radiation within a wavelength interval and are connected to an electronic evaluation unit. They can detect radiation emitted from a broadband radiation source of a reflection incident on the surface of one of the joining partners, and/or after passing through joining partners transparent for the electromagnetic radiation on the detectors. A laterally and temporally homogeneous intensity of the electromagnetic radiation should be observed in this respect. The joining partner is formed from a material that does not 100% absorb the respective electromagnetic radiation and thus a transmission and/or reflection is possible.

Abstract: A method for scanning a microarray, including (a) providing a microarray to an optical scanner, wherein the microarray includes a surface having features having different target molecules; (b) scanning the surface in the x or y direction to acquire optical signals from the features at sequential regions of the surface, wherein the focus setting between the optical scanner and the surface is dynamically controlled in real time by repeatedly (i) adding a predetermined focal offset, thereby introducing an error in the focus setting, and (ii) adjusting the focus setting to reduce the error in the focus setting, thereby acquiring the optical signals from different regions at different degrees of focus such that a subset of the regions that are scanned have an introduced focus error; and (c) analyzing the optical signals that are obtained at the different degrees of focus to identify the different target molecules.

Abstract: Detection system comprising an examination region, a one-piece optical element including a focusing portion to concentrate light received from the examination region and a guiding portion to homogenize light received from the focusing portion, and a detector configured to detect homogenized light received from the guiding portion.

Abstract: A surface inspection system (10) for inspecting the surface of sheet elements (4) present in an inspection area (20). The system includes an image evaluation unit (18), a camera (12), a dark-field illuminator (14) and a bright-field illuminator (16). The image evaluation unit (18) subtracts a line image captured under bright-field illumination conditions from a line image captured under dark-field illumination conditions.

Abstract: Methods, apparatus, and assemblies are provided for a substrate carrier adapter insert including an adapter frame including a support rail adapted to support one or more substrates in a substrate carrier, a frame extension coupled to, or integral with, the adapter frame, and a mapping feature formed on the frame extension and disposed to be detected by a sensor for determining whether an adapter insert is present or absent in a substrate carrier. Numerous additional features are disclosed.

Abstract: The invention relates to a method for detecting a local change in refractive index of a dielectric medium located on the surface of an optical sensor, said optical sensor comprising for this purpose a waveguide comprising a region, called the active region, covered with at least one metallic layer in contact with the dielectric medium, said method comprising the following steps: a) emitting a light beam at the input of the waveguide so that this light beam can be propagated, within the waveguide, according to at least N propagation modes, where N is a natural integer such that N?2; b) measuring the intensity of at least one zone of the spatial distribution of the intensity of the light beam reflected by said active region of the optical sensor; and c) detecting the local change in the refractive index of the dielectric medium by means of a database supplying the link between the intensity of said at least one zone of the spatial distribution of the intensity of the light beam reflected by the active region o