Abstract: A concentration measurement device for measuring the concentration of a measured fluid within a measurement cell by detecting transmitted light that has passed through the measurement cell having a light incidence window and a light emission window disposed opposing to each other, comprising a reflected-light detector for detecting reflected light of the light incidence window.

Abstract: A detector for detecting diffracted radiation which has been diffracted by a regular structure; said detector comprises: a sensor for sensing at least a portion of said diffracted radiation, said sensor having a first region and a second region; a first coating configured to allow transmission of radiation with wavelengths within a first range of wavelengths; and a second coating configured to allow transmission of radiation with wavelengths within a second range of wavelengths; wherein said first coating coats said first region of said sensor, and said second coating coats said second region of said sensor, and wherein said first and second regions are different regions.

Abstract: A highly-reliable absorbance measuring device that enables highly-accurate measurement of absorbance, and a method thereof are provided. A liquid containing unit that can contain a chemical substance solution to be measured, a nozzle that communicates with a suction/discharge mechanism that sucks/discharges gas, a flow tube that includes a mouth part, which can be inserted into the liquid containing unit, at a lower end and that is detachably attached to the nozzle at an upper end, an emitting end that can emit measurement light, a light receiving end that can receive the light emitted from the emitting end, and a control unit are included. The control unit is configured to suck a prescribed amount of the chemical substance solution into the flow tube, and to lead absorbance on the basis of intensity of transmitted light acquired by emission of measurement light in a vertical direction into the flow tube.

Abstract: Prediction of a distribution of light in an illumination pupil of an illumination system includes identifying component(s) of the illumination system the adjustment of which affects this distribution and simulating the distribution based on a point spread function defined in part by the identified components. The point spread function has functional relationship with configurable setting of the illumination settings.

Abstract: The present invention provides a dust sensor comprising: a sensor module for receiving light scattered by dust particles and outputting an electric signal; a communication module for communicating with an external device; a memory for storing region information in association with particle density data; and a control unit for calculating a volume of the dust particles based on the signal output from the sensor module, obtaining the region information for a location where the dust sensor is installed via the communication module, retrieving the particle density data corresponding the obtained region information from the memory, calculating dust concentration using the retrieved particle density data and the calculated volume, and outputting the calculated dust concentration. The memory may store the region information in association with air quality reference data.

Abstract: Apparatus and associated methods relate to a particulate matter (PM) sensor assembly receiving a PM count value from an optical pulse counting sensor and selectively calibrating the sensor characteristics in response to recent published high-accuracy air-quality information within a local region that contains the sensor assembly. In an illustrative example, the air-quality information may be generated by various PM monitoring stations and published in data streams or collections, for example. The sensor assembly may select, for example, a specific regional PM mass density reference value from the received air-quality information associated with location information of the sensor assembly. Based on the published air-quality information, the sensor assembly may select a calibration curve from, for example, a set of predetermined calibration curves.

Abstract: A sensing device for measuring an offset along a longitudinal axis comprises a housing including a plurality of slots, two or more arrays of optical sensors aligned along the longitudinal axis, at least one of the arrays being offset along the longitudinal axis with respect to the other arrays and a microcontroller coupled to the two or more arrays of optical sensors and configured to determine a positional offset along the longitudinal axis at which light is detected by at least one of arrays of optical sensors. In some embodiments, each of the optical sensors of the arrays are positioned within the housing underneath one of the plurality of slots to reduce an angle of incidence of radiation received.

Abstract: The present invention provides a sensor combining a dust sensor and a gas sensor, comprising a light emitting unit for emitting light, a first light receiving unit for receiving scattered light which is emitted by the light emitting unit and scattered by dust to detect dust concentration, a mirror for changing a path of the emitted light which the light emitting unit emits, and a second light receiving unit for receiving the emitted light the path of which is changed by the mirror to detect gas concentration. An inflow section for introducing air into a detection space inside the sensor is formed in a Y-shaped tube in which a first inlet and a second inlet meet. The inflow section comprises a switch which selects a path through which air flows into the detection space out of the first inlet and the second inlet.

Abstract: An inspection apparatus, including: an objective configured to receive diffracted radiation from a metrology target having positive and negative diffraction order radiation; an optical element configured to separate the diffracted radiation into portions separately corresponding to each of a plurality of different values or types of one or more radiation characteristics and separately corresponding to the positive and negative diffraction orders; and a detector system configured to separately and simultaneously measure the portions.

Abstract: A comprehensive information detection system for a steel wire rope, having a detection device, a stroke metering device, a data acquisition and conversion workstation, an alarm controller, and a terminal control master station is provided. The detection device further specifically has a steel wire rope electromagnetic detection device, a steel wire rope machine vision damage recognition device, a steel wire rope machine vision diameter measurement device, and a damage location marking device. The comprehensive information detection system for a steel wire rope may perform comprehensive evaluation on the damage situation of the steel wire rope and refine damage data information, thereby comprehensively improving the refinement degree of detection and the detection accuracy.

Abstract: A flow cell has: a flow path in which a specimen fluid and a sheath fluid flow; a specimen flow path that introduces the specimen fluid into the flow path; a first sheath flow path and a second sheath flow path that introduce the sheath fluid into the flow path; and a merging portion at which the specimen flow path, the first sheath flow path and the second sheath flow path merge together. The specimen flow path is provided on a central flow line of the flow path. At the merging portion, the first sheath flow path and the second sheath flow path face directions intersecting the central flow line of the flow path, and are disposed at positions that are offset in a depth direction of the flow path.

Abstract: Some embodiments of the invention include a probe body of an optical probe assembly. The probe assembly may be designed for measuring a surface of an object while being carried by a probe head of a coordinate measuring machine. The probe body comprising a coupling unit at a first end of the probe body designed for providing coupling of the probe body to the probe head of a coordinate measuring machine and a light guiding element for transmitting original source light supplied by the probe head from the coupling unit to a second end of the probe body.

Abstract: This disclosure discloses a method of creating a three-dimensional image of a sample using snapshot optical tomography. The method includes generating a plurality of beams incident on the sample simultaneously, acquiring a field image at a plane not conjugate to the sample plane using off-axis digital holography, extracting amplitude data and phase data for the field image, restoring the sharpness by backpropagating the field image using the extracted amplitude and phase data, acquiring a background image, extracting amplitude data and phase data for the background image, and reconstructing a three-dimensional image of the sample with the backpropagated field image and the background image. The method also includes arranging more than one imaging chains to remove the missing angle artefacts in optical tomography. Also disclosed are systems for performing the method.

Abstract: The present invention relates to a flow cell (10) comprising a fluid inlet (16) and a fluid outlet (18) separated by a sample flow-through chamber (12) comprising at least one UV-transparent window (22?), wherein the at least one UV-transparent window (22?) is made of a polymer material and has been subjected to Gamma radiation sterilisation. In one aspect, the flow cell is combustible.

Abstract: A particle analyzer (1) includes a measurement cell (2) and a measurement section (10). The particle analyzer (1) further includes a migration section. The migration section includes magnets (3a and 3b), electrodes (4a, 4b, and 4c), a power source (5), and a laser light source (6). The migration section causes migration of particles contained in a medium loaded into the measurement cell (2) by at least two of a magnetophoresis method, a dielectrophoresis method, an electromagnetophoresis method, and a photophoresis method. The measurement section (10) performs determination of a physical quantity of the particles and determination of a migration rate of the particles.

Abstract: A particle imaging device comprises a flow cell, a light source, an irradiation optical system configured to form a light sheet on the flow cell, a light collecting optical system and an imaging element. The sheet surface of the light sheet is perpendicular to the exterior side surface of the flow cell to which the light is entered from the light source. The sheet surface of the light sheet is inclined at a predetermined angle that is not perpendicular to the flow direction of the sample.

Abstract: Provided in one example is an analyte detection package that includes a chamber, a surface-enhanced luminescence analyte stage within the chamber, and a lens integrated as part of the package to focus radiation onto the analyte stage.

Abstract: Various embodiments for detecting defects on a wafer are provided. One method includes acquiring output generated by an inspection system for a wafer during an inspection process that is performed after at least first and second process steps have been performed on the wafer. The first and second process steps include forming first and second portions, respectively, of a design on the wafer. The first and second portions of the design are mutually exclusive in space on the wafer. The method also includes detecting defects on the wafer based on the output and determining positions of the defects with respect to the first and second portions of the design. In addition, the method includes associating different portions of the defects with the first or second process step based on the positions of the defects with respect to the first and second portions of the design.

Abstract: The present invention is a sample analyzer 100 that makes it possible to accurately analyze a sample even when the sample is such as one in a state where particles are cross-linked, or one containing foreign bodies and that calculates an autocorrelation function from a detection signal obtained by irradiating a sample with inspection light L1, and from the autocorrelation function, analyzes the sample. In addition, the sample analyzer 100 includes: an autocorrelation function determination part 53 that determines whether or not the displacement amount of an autocorrelation function serving as a comparison target from an autocorrelation function serving as a reference is within a predetermined range; and a sample analysis part 54 that analyzes the sample with use of an autocorrelation function of which the displacement amount is determined by the autocorrelation function determination part 53 to be within the predetermined range.

Abstract: A system and method are disclosed for inspecting a component having a length, a width, and an axis. The system includes a fixture for holding the component, a light source disposed on one side of the component, and an optical detector disposed on the other side of the component. In the preferred embodiment, the detector has a field of view wider than the width of the component, thereby enabling the detector to image a portion of the outer edges of the component. A translation stage is operative to move the light source and detector in unison along the length of the component and a processor, in communication with the detector and the translation stage, is operative to: a) receive electrical signals representative of the outer profile imaged by the detector; b) move the translation stage incrementally along the length of the component; and c) record the outer profile imaged by the detector at each increment and form a composite profile of the component.