Patents Examined by Roy M. Punnoose
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Patent number: 11536631Abstract: The invention relates to a fluid analysis module that comprises for blood analysis: a module housing with a fluid inlet port; at least one fluid sensor that is integrated within the module housing and comprises a sensor surface that is able to make a fluidic connection with the fluid inlet port; a chamber integrated within the module housing. The chamber can be brought into a fluidic connection with the sensor surface of the at least one fluid sensor.Type: GrantFiled: July 4, 2018Date of Patent: December 27, 2022Assignee: RESUSCITEC GMBHInventors: Christoph Benk, Juergen Grudke, Rainer Feldbruegge, Michael Borchardt
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Patent number: 11536644Abstract: A gas detection device manufactured by a semiconductor process includes a substrate, a microelectromechanical element, a light-emitting element, a particle-sensing element, a gas-sensing element, a driving-chip element and an encapsulation layer. The driving-chip element controls driving operations of the microelectromechanical element, the light-emitting element, the particle-sensing element and the gas-sensing element, respectively. When the microelectromechanical element is enabled to actuate transportation of gas, the gas is introduced into the gas detection device through an inlet aperture of the substrate. Scattered light spots generated by the light beam of the light-emitting element irradiating on suspended particles contained in the gas are received by the particle-sensing element to generate a detection datum of the suspended particles. The gas-sensing element detects the gas passing through and generates a detection datum of hazardous gas contained in the gas.Type: GrantFiled: May 26, 2021Date of Patent: December 27, 2022Assignee: MICROJET TECHNOLOGY CO., LTD.Inventors: Hao-Jan Mou, Ying-Lun Chang, Hsien-Chung Tai, Chin-Chuan Wu, Chi-Feng Huang, Yung-Lung Han, Chin-Wen Hsieh
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Patent number: 11530978Abstract: A positioning support (1) for positioning components to be inspected during their inspection by means of an optical control apparatus, comprising a chasing base (3) acting as interface to the optical control apparatus, a sliding base (5) able to slide along an axis “Y” in a plane of the chasing base perpendicular to the optical axis; a plate (7) able to slide along an axis “X” perpendicular to the axis “Y” in a plane parallel to said sliding base; jigs or bars (15) for positioning a plurality of components to be measured on said plate.Type: GrantFiled: April 15, 2019Date of Patent: December 20, 2022Assignee: Totems Position SARLInventor: Toni Orhanovic
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Patent number: 11530953Abstract: Methods and devices for measuring full or partial Mueller matrix information in a single shot are described. One single shot polarimeter includes a polarization filter that is positioned to receive collimated light from a light source and to produce light having different polarization states. The polarization filter includes at least four sections, where each section receives a portion of the collimated light and produces light of a particular polarization state, which is spatially separated from light produced by other sections of the polarization filter. An imaging component images the sections of the polarization filter onto a plane of a sample object. One or more optical elements receive the light from the sample object and image a section of the sample object onto a detector. The disclosed devices and methods enable the measurement of the Mueller matrix of the sample with high signal-to-noise ratios.Type: GrantFiled: January 25, 2021Date of Patent: December 20, 2022Assignee: ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONAInventor: Stanley Pau
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Patent number: 11530976Abstract: A particle analysis method and apparatus, including a spectrometry-based analysis of a fluid sample (1), comprises the steps of creating a sample light beam S and a probe light beam P with a light source device (10) and periodically varying a relative phase between the sample and probe light beams S, P with a phase modulator device (20), irradiating the fluid sample (1) with the sample light beam S, detecting the sample and probe light beams S, P with a detector device (40), and providing a spectral response of the at least one particle (3), wherein the light source device (10) comprises at least one broadband source, which has an emission spectrum covering a mid-infrared MIR frequency range, and the phase modulator device (20) varies the relative phase with a scanning period equal to or below the irradiation period of irradiating the at least one particle (3, 4).Type: GrantFiled: September 14, 2018Date of Patent: December 20, 2022Assignees: Max-Planck-Fesellschaft zur Foerderung der Wissenschaften e.V., Ludwig-Maximilians-Universitaet MuenchenInventors: Ferenc Krausz, Ioachim Pupeza, Mihaela Zigman Kohlmaier, Marinus Huber
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Patent number: 11529098Abstract: A contact lens includes a contact lens body and a glucose detection sheet disposed on the contact lens body. The glucose detection sheet includes a glucose recognition layer, a photonic crystal array is provided in the glucose recognition layer, and the glucose recognition layer is configured to recognize glucose.Type: GrantFiled: June 18, 2020Date of Patent: December 20, 2022Assignees: BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD., BOE TECHNOLOGY GROUP CO., LTD.Inventor: Lin Zhu
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Patent number: 11526978Abstract: An image processing method includes the steps of lighting up at least a part of light emitting units of a light emitting device; capturing a plurality of detection images corresponding to a plurality of sections of the light emitting device respectively, wherein each section includes a plurality of lighted-up light emitting units, each detection image includes a plurality of light spots respectively corresponding to the light emitting units of the associated section, and every two adjacent sections have an overlap area including at least one lighted-up light emitting unit; and stitching the detection images of the adjacent sections together by taking the light spots corresponding to at least one lighted-up light emitting unit of the overlap area as alignment reference spots, so that the light emitting statuses of all the light emitting units are presented by a single image.Type: GrantFiled: December 10, 2020Date of Patent: December 13, 2022Assignee: MPI CORPORATIONInventors: Ping-Ying Wu, Yung-Chin Liu
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Patent number: 11519894Abstract: A corrosion monitoring system includes one or more objects coupled to respective portions of a transformer tank. The one or more objects are configured to corrode before the respective portions of the transformer tank. At least one optical sensor is coupled to each of the objects. The at least one optical sensor has an optical output that changes in response to strain of the object. An analyzer is coupled to the at least one optical sensor. The analyzer is configured to perform one or more of detecting and predicting corrosion of the transformer tank based on the output of the at least one optical sensor.Type: GrantFiled: January 18, 2021Date of Patent: December 6, 2022Assignees: Palo Alto Research Company Incorporated, Consolidated Edison Company of New York, Inc.Inventors: Mark Teepe, Todd Karin, Peter Kiesel, Ajay Raghavan, Jane Shin, Bradley Kittrell, Serena Lee
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Patent number: 11513056Abstract: A dual light source lens-free dielectrophoresis (DEP) flow cytometer for massively parallel single cell analysis. Each cells dielectric is inferred from measuring their altitude and subsequently velocity change due to DEP actuation in a microfluidic channel. Dual LED sources facilitate velocity measurement by producing two shadows for each cell passing through the channel. These shadows are detected using a linear optical array detector. Massively parallel analysis is possible as each pixel of the detector can independently analyze the passing cells. The DEP cytometer is composed of simple modular components and has the potential to be scaled to achieve a significantly high throughput label-free single-cell analyzer.Type: GrantFiled: October 2, 2020Date of Patent: November 29, 2022Assignee: University of ManitobaInventors: Douglas Thomson, Gregory Bridges, Elham Salimi, Azita Fazelkhah, Samaneh Afshar Delkhah, Nicholas Durham
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Patent number: 11506615Abstract: A system is described for inspecting a container having a top surface using light reflections and positional data. The system comprises a radiation source arranged such that the light beam projects radiation onto the top surface, wherein the radiation radiates along the outer edge of the container; a sensor, wherein the radiation is collected by the sensor reflected from the container using positional data, wherein the positional data is used to create a reference plane of the top of the top surface; and a processor operatively connected to the sensor, the processor integrates the positional data to detect defects in the container and creates a reference plane of a top surface of the container, wherein sensor captures the positional data of the container as the container moves on the conveyor; and the positional data is integrated using software to produce a 3D topographical map of the container.Type: GrantFiled: May 31, 2017Date of Patent: November 22, 2022Assignee: INDUSTRIAL DYNAMICS COMPANY, LTDInventor: Kendall Hudson
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Patent number: 11506587Abstract: A liquid droplet and solid particle sensing device is provided that can measure the average droplet size in a spray. The present device uses a swirling flow to draw a particulate or a spry into the device for sizing and counting. The swirling flow is configured to keep all the particles away from the walls of the device and to concentrate them at the center of a flow channel to pass through the center of a light beam for high sensitivity and repeatability of the measurement.Type: GrantFiled: June 29, 2022Date of Patent: November 22, 2022Inventors: Alireza Hashemi, Mehrnoosh Houshmand, Anis Mirzaei, Hamid Reza Layegh Pour
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Patent number: 11506593Abstract: Methods for classifying fluorescent flow cytometer data are provided. In some instances, methods include processing the flow cytometer data with a supervised algorithm configured to cluster the fluorescent flow cytometer data into distinct populations according to the relationship of data points to relevant threshold values. In embodiments, methods include determining a measure of spillover spreading by calculating spillover spreading coefficients and combining them in a spillover spreading matrix. In some embodiments, populations of fluorescent flow cytometer data are adjusted to subtract the magnitude of spillover spreading. In embodiments, spillover spreading adjusted populations are partitioned after potential partitions are evaluated relative to the threshold values. In embodiments, partitioned populations of fluorescent flow cytometer data are classified (i.e., phenotyped) according to a hierarchy. Systems and computer-readable media for classifying fluorescent flow cytometer data are also provided.Type: GrantFiled: January 20, 2021Date of Patent: November 22, 2022Assignee: Becton, Dickinson and CompanyInventor: Richard Lee Halpert
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Patent number: 11506757Abstract: A projection optical system includes: a surface-emitting light source configured to emit light at an intensity in a Gaussian distribution; and an optical element configured to perform uniformization, at least in one direction and in a range of a projection angle, of the intensity of the light emitted from the surface-emitting light source. In the optical element, an incident surface on which the light is incident is sectioned into a plurality of regions having refractive actions different from each other, and among the plurality of regions, at least outermost regions on which outer edge portions, of the light, in the direction in which the uniformization is performed are incident, are planes that are each tilted, from a state of being parallel to a light emitting surface of the surface-emitting light source, to the direction in which the uniformization is performed.Type: GrantFiled: February 16, 2022Date of Patent: November 22, 2022Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.Inventor: Kimihiro Murakami
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Patent number: 11486814Abstract: A system and a method for sorting particles are provided. An example of a particle sorting system includes an array that includes a number of microfluidic ejectors. An optical sensor is focused on the array. A controller is used to identify a target particle proximate to a microfluidic ejector, and activate the microfluidic ejector to eject the target particle into a collection vessel.Type: GrantFiled: October 1, 2018Date of Patent: November 1, 2022Assignee: Hewlett-Packard Development Company, L.P.Inventors: Fausto D'Apuzzo, Viktor Shkolnikov, Yang Lei
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Patent number: 11480515Abstract: An optical method of characterizing an object comprises providing an object to be characterized, the object having at least one nanoscale feature; illuminating the object with coherent plane wave optical radiation having a wavelength larger than the nanoscale feature; capturing a diffraction intensity pattern of the radiation which is scattered by the object; supplying the diffraction intensity pattern to a neural network trained with a training set of diffraction intensity patterns corresponding to other objects with a same nanoscale feature as the object to be characterized, the neural network configured to recover information about the object from the diffraction intensity pattern; and making a characterization of the object based on the recovered information.Type: GrantFiled: June 12, 2020Date of Patent: October 25, 2022Assignees: University of Southampton, Nanyang Technological UniversityInventors: Nikolay Ivanovich Zheludev, Nikitas Papasimakis, Jun-Yu Ou, Tanchao Pu, Sergei Kurdiumov, Eng Aik Chan, Carolina Rendón-Barraza
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Patent number: 11472234Abstract: An automated tread analysis system and methods for using are described. The automated tread analysis system may include a sensing system having a plurality of cameras providing a plurality of sequential two-dimensional images. The automated tread analysis system may also include an analysis system configured to provide at least one surface model of a first object via photogrammetry using the plurality of sequential two-dimensional images. The automated tread system may execute processing software reading data corresponding to the at least one surface model of the first object. The surface model may correspond to a current condition of the first object. The processing software executed by the user system may analyze the at least one surface model of the first object and provide at least one indicative wear metric based on the analysis of the surface model of the first object.Type: GrantFiled: August 3, 2020Date of Patent: October 18, 2022Assignee: Tireaudit.com, Inc.Inventors: Jack M. Zoken, Alper Yilmaz
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Patent number: 11467096Abstract: A system, apparatus, and method for remotely detecting defects in a structure may proceed non-destructively. A mobile sensing platform may place sensors in a desired positioning relative to the structure. The desired position may include a non-contacting relation between the sensors and structure. The mobile sensing platform may project laser beams onto the structure and sense backscattered light via the sensors. Variations in the backscattered light may correspond to motion of the structure, such as vibrations. By calculating the frequency and amplitude of the vibrations, defects in the structure may be detected. By correcting for noise, such as that associated with acceleration of the mobile sensing platform, accuracy and precision of defect detection may be enhanced.Type: GrantFiled: December 17, 2021Date of Patent: October 11, 2022Assignee: ADVANCED SYSTEMS AND TECHNOLOGIES, INC.Inventor: Vladimir Markov
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Patent number: 11467594Abstract: The invention discloses a robot network structure suitable for an unstructured environment and a sensing system. The robot network structure is a basic unit or superposition of multiple basic units. An upper structure of the basic unit comprises at least two first nodes, and a lower structure comprises at least two second nodes which are not coplanar with the at least two first nodes. All the first nodes and all the second nodes form a three-dimensional network structure through connecting rods.Type: GrantFiled: March 14, 2020Date of Patent: October 11, 2022Assignee: SOUTHERN UNIVERSITY OF SCIENCE AND TECHNOLOGYInventors: Chaoyang Song, Fang Wan
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Patent number: 11460400Abstract: Apparatuses for measuring sample materials (such as tissue samples) and associated methodologies and instrumentation involve a spectroscopy system or device configured with a sample measuring device (e.g., an attenuated total reflection infrared (ATR-IR) sample measuring device) including a crystal defining a sample receiving surface/interface operatively connected to an IR source and an IR detector. The sample receiving surface/interface facilitates assessing presence (and optionally, amount) of a fixative (e.g., formaldehyde) in sample materials, tissue samples for example. Measurements are taken at one or multiple locations within a sample placement structure/area, which can be provided in the form of a probe or a raised piercing structure containing one or more ATR-IR (or other) sample measuring devices.Type: GrantFiled: July 7, 2020Date of Patent: October 4, 2022Assignee: SAKURA FINETEK U.S.A., INC.Inventors: Amit D. Shah, Cristina R. Flores
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Patent number: 11443420Abstract: There is provided a system and method of generating a metrology recipe usable for examining a semiconductor specimen, comprising: obtaining a first image set comprising a plurality of first images captured by an examination tool, obtaining a second image set comprising a plurality of second images, wherein each second image is simulated based on at least one first image, wherein each second image is associated with ground truth data; performing a first test on the first image set and a second test on the second image set in accordance with a metrology recipe configured with a first parameter set, and determining, in response to a predetermined criterion not being met, to select a second parameter set, configure the metrology recipe with the second parameter set, and repeat the first test and the second test in accordance with the metrology recipe configured with the second parameter set.Type: GrantFiled: December 28, 2020Date of Patent: September 13, 2022Assignee: Applied Materials Israel Ltd.Inventors: Roman Kris, Grigory Klebanov, Einat Frishman, Tal Orenstein, Meir Vengrover, Noa Marom, Ilan Ben-Harush, Rafael Bistritzer, Sharon Duvdevani-Bar