Patents Examined by Sean M Luck
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Patent number: 12142472Abstract: The invention generally relates to electrophoretic mass spectrometry probes and systems and methods of uses thereof. In certain aspects, the invention provides a mass spectrometry probe having a hollow body with a distal tip, an electrically conductive hollow conduit, and an electrode. The electrically conductive hollow conduit may be operably coupled to a reservoir and a power source, and the electrically conductive hollow conduit may be configured to transport a liquid sample into the hollow body and polarize the liquid sample as it flows through the electrically conductive hollow conduit and into in the hollow body. The electrode and the electrically conductive hollow conduit are disposed within the hollow body (e.g., at different heights within the hollow body).Type: GrantFiled: November 16, 2023Date of Patent: November 12, 2024Assignees: Purdue Research Foundation, AMGEN INC.Inventors: Robert Graham Cooks, Tawnya Flick
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Patent number: 12139436Abstract: A method of manufacturing a nozzle for a droplet generator for a laser-produced plasma radiation source is disclosed. The method comprises disposing a glass capillary in a throughbore of a metal fitting, heating the metal fitting; and applying a pressure to the glass capillary such that the glass capillary conforms to the shape of, and forms a direct glass-to-metal seal with, the throughbore. Also disclosed is a nozzle for a droplet generator for a laser-produced plasma radiation source, and the radiation source itself, wherein the nozzle comprises the glass capillary for emitting fuel as droplets and the metal fitting for coupling the glass capillary to a body of the droplet generator, the glass capillary being conformed to a shape of a throughbore of the metal fitting, and wherein the glass capillary forms a direct glass-to-metal seal with the throughbore.Type: GrantFiled: October 9, 2020Date of Patent: November 12, 2024Assignee: ASML Netherlands B.V.Inventors: Dietmar Uwe Herbert Trees, Edwin Johan Buis, Theodorus Wilhelmus Driessen, Benjamin Andrew Sams, Brandon Michael Johnson
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Patent number: 12128150Abstract: Provided is a compact ultraviolet irradiation device in which a degree of an adverse effect on the human body is suppressed. The ultraviolet irradiation device includes: a lamp house on the surface of which a light extraction surface is formed; an excimer lamp accommodated in the lamp house, a main emission wavelength of which belongs to a first wavelength band of 190-225 nm; an optical filter that is arranged on the light extraction surface and substantially transmits the ultraviolet light in the first wavelength band and substantially reflect the ultraviolet light of a wavelength of 240-300 nm; and a reflecting surface that is a surface located outside the luminous tube of the excimer lamp and inclined with respect to the light extraction surface, the reflecting surface exhibiting reflectivity with respect to the ultraviolet light in the first wavelength band.Type: GrantFiled: October 5, 2020Date of Patent: October 29, 2024Assignee: Ushio Denki Kabushiki KaishaInventor: Hideaki Yagyu
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Patent number: 12128441Abstract: A UV irradiation apparatus for coating systems that coat rigid or film-like workpieces, in particular furniture parts, having a transport apparatus for transporting workpieces provided with coating material from an inlet to an outlet through the UV irradiation apparatus, a UV light source arranged above the transport apparatus that irradiates the coated workpieces with UV light in an irradiation region between the inlet and the outlet, and a reflector or cover which shields the UV light source upward. A housing covers the irradiation region and the UV light source, which generally extends above the transport apparatus. A sensor of a measuring apparatus for direct or indirect automated measurement of radiant flux of the UV light source is arranged in the housing, and the sensor is in particular fitted fixed or movably on the housing or a holder. A method for quality assurance using this UV irradiation apparatus is also provided.Type: GrantFiled: May 9, 2022Date of Patent: October 29, 2024Assignee: Robert Bürkle GmbHInventor: Oliver Meisriemel
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Patent number: 12125667Abstract: A charged particle beam device includes a plurality of detectors configured to detect one or more signal charged particle beams caused by irradiation on a sample with one or more primary charged particle beams, and a control system. The control system is configured to measure an intensity distribution of the one or more signal charged particle beams detected by the plurality of detectors, and correct the intensity distribution by using a correction function. The control system is configured to generate an image based on the corrected intensity distribution.Type: GrantFiled: September 20, 2019Date of Patent: October 22, 2024Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Yasuhiro Shirasaki, Makoto Sakakibara, Momoyo Enyama, Hajime Kawano, Akira Ikegami
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Patent number: 12123816Abstract: Apparatus and methods are disclosed for vibration-free cryogenic cooling, suitable for TEM and other analytic equipment. A thermal battery includes one or more of: a cryocooler, a thermal switch, a thermal cold storage reservoir, and a cold finger. The thermal reservoir is mounted outside a sample chamber. The cold finger provides thermal coupling between the reservoir and a sample holder inside the sample chamber. In varying embodiments, sample holder and sample temperatures are regulated by a heater or by an inline variable thermal resistor. Cyclic phased operation includes cooling the reservoir, decoupling the cryocooler from the reservoir, and temperature-regulated passive vibration-free thermal energy extraction from sample to reservoir. The described system delivers a stand time of 12 hours at 20 K. Temperature regulation, a hybrid thermal switch, damping of thermal fluctuations, and material selection are described.Type: GrantFiled: June 21, 2021Date of Patent: October 22, 2024Assignee: FEI CompanyInventors: Ronald Lamers, Hans Persoon, Alphons Theophile Augusta Maria de Waele, Theo Ruijl, Hugo van Leeuwen
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Patent number: 12126349Abstract: An accelerometer/gravitometer based on coherent oscillatory matterwaves (COMW). The accelerometer includes a pair of COMW generator systems, each with an oscillator and a respective resonator to stabilize the oscillator output. One of the resonators can be aligned with acceleration, while the other is transverse to the acceleration. The COMW generator outputs can be compared to derive a measurement of acceleration.Type: GrantFiled: March 6, 2022Date of Patent: October 22, 2024Assignee: ColdQuanta, Inc.Inventor: Dana Zachary Anderson
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Patent number: 12125603Abstract: The present invention relates to assemblies and method for obtaining a container comprising 212Pb on the walls obtained from a 212Pb precursor isotope source. The invention provides an improved system and method for producing 212Pb high purity without the need for processing, with high yields, and which safely and efficiently can be transported to the locations where it is to be used.Type: GrantFiled: December 4, 2020Date of Patent: October 22, 2024Assignee: Sciencons ASInventor: Roy H. Larsen
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Patent number: 12106957Abstract: In some examples, an infrared emitter is provided with a heating layer sandwiched by top and bottom optical layers that allow only narrow-band infrared light to pass through. A reflective layer may be further provided below the bottom optical layers. This configuration greatly reduces the energy loss and can be manufactured with simple method and low cost.Type: GrantFiled: April 21, 2021Date of Patent: October 1, 2024Assignee: Taiwan Nano & Micro-Photonics Co., Ltd.Inventors: Ching-Fuh Lin, Chung-Hua Chao, Po-Chuan Yang
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Patent number: 12106926Abstract: Aspects of the present disclosure describe an atomic oven including a cathode, an anode that comprises a source material, and a power supply that provides a voltage between the cathode and the anode, wherein applying the voltage causes multiple electrons from the cathode to ablate the source material from the anode or locally heat the anode to cause source material to evaporate from the anode and, in both case, to produce a stream of ablated or evaporated particles that passes through an opening in the cathode.Type: GrantFiled: July 19, 2023Date of Patent: October 1, 2024Assignee: IonQ, Inc.Inventors: Kai Hudek, Jason Madjdi Amini
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Patent number: 12094682Abstract: According to one embodiment, there is provided an analysis method by a scanning transmission electron microscope including a dark field detector that detects dark field images by irradiating a sample with electron beams and detecting electron beams that are transmitted through or scattered from the sample, and an electron beam detector that detects electron diffraction images at radiation points of the electron beams among the electron beams that are transmitted through the sample or scattered from detecting the electron beams transmitted through a hollow portion of the dark field detector. The analysis method includes scanning a plurality of the radiation points set in an attention area by sequentially radiating electron beams at preset incidence angles, and performing detection of dark field images of the attention area and detection of NBD images at each of the plurality of radiation points at the same time.Type: GrantFiled: March 1, 2022Date of Patent: September 17, 2024Assignee: KIOXIA CORPORATIONInventor: Takeshi Owaki
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Patent number: 12087542Abstract: Disclosed herein is a method comprising depositing a first amount of electric charges into a region of a sample, during a first time period; depositing a second amount of electric charges into the region, during a second time period; while scanning a probe spot generated on the sample by a beam of charged particles, recording from the probe spot signals representing interactions of the beam of charged particles and the sample; wherein an average rale of deposition during the first time period, and an average rate of deposition during the second time period are different.Type: GrantFiled: November 1, 2021Date of Patent: September 10, 2024Assignee: ASML Netherlands B.V.Inventors: Yixiang Wang, Frank Nan Zhang
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Patent number: 12087462Abstract: A radiopaque processing medium comprising a plurality of radiopaque particles and a non-radiopaque processing medium. The plurality of radiopaque particles is added to the non-radiopaque processing medium to increase a bulk density of the processing medium thereby forming the radiopaque processing medium. The radiopaque processing medium allows excess process media to be located and characterized during X-ray inspection of an electronic device on which the radiopaque processing medium was used. The radiopaque processing medium may also be used to locate and identify flaws/defects of the electronic device based on the location of excess radiopaque processing medium. The radiopaque processing medium may also be used as an underfill material to reinforce electronic chips soldered to the electronic device.Type: GrantFiled: May 3, 2024Date of Patent: September 10, 2024Assignee: Honeywell Federal Manufacturing & Technologies, LLCInventor: Louis Diamond
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Patent number: 12080513Abstract: An improved apparatus and method for enhancing an image, and more particularly an apparatus and method for enhancing an image through cross-talk cancellation in a multiple charged-particle beam inspection are disclosed. An improved method for enhancing an image includes acquiring a first image signal of a plurality of image signals from a detector of a multi-beam inspection system. The first image signal corresponds to a detected signal from a first region of the detector on which electrons of a first secondary electron beam and of a second secondary electron beam are incident. The method includes reducing, from the first image signal, cross-talk contamination originating from the second secondary electron beam using a relationship between the first image signal and beam intensities associated with the first secondary electron beam and the second secondary electron beam. The method further includes generating a first image corresponding to first secondary electron beam after reduction.Type: GrantFiled: August 8, 2020Date of Patent: September 3, 2024Assignee: ASML Netherlands B.V.Inventors: Wei Fang, Lingling Pu, Bo Wang, Zhonghua Dong, Yongxin Wang
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Patent number: 12080442Abstract: An optical trap for laser cooling and trapping atoms. Three pairs of laser beams are directed to cross in a vacuum chamber at a common intersection volume, wherein each pair is formed by two counterpropagating beams. Rather than having a mutually orthogonal arrangement in which each beam pair forms an angle ? of 45° to a reference axis, z, these angles are instead between 5°???40°. Moreover, in each beam pair, the counterpropagating beams are not precisely aligned in a common path, as in a conventional magneto-optical trap, but are slightly misaligned by respective misalignment angles [?, ?, ?] of typically 0.1° to 2°. The misalignment angles and beam widths are however selected so that a common intersection volume for all six beams is maintained. This provides an all-optical trap in which laser cooling and trapping of atoms takes place without a magnetic field being present.Type: GrantFiled: August 14, 2023Date of Patent: September 3, 2024Assignee: UNIVERSITY OF SOUTHAMPTONInventors: Andrei-Aurel Dragomir, Matthew David Himsworth
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Patent number: 12057290Abstract: A method includes operating a multiple particle beam system at different working points. The numerical aperture can be set for each of the working points in such a way that the resolution of the multiple particle beam system is optimal. In the process, the beam pitch between adjacent individual particle beams on the sample to be scanned is kept constant as a boundary condition. There are no mechanical reconfigurations of the system whatsoever for the purposes of varying the numerical aperture.Type: GrantFiled: January 11, 2022Date of Patent: August 6, 2024Assignee: Carl Zeiss MultiSEM GmbHInventors: Hans Fritz, Ingo Mueller
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Patent number: 12057303Abstract: A method of mass spectrometry is disclosed comprising: a) providing temporally separated precursor ions; b) mass analyzing separated precursor ions, and/or product ions derived therefrom, during a plurality of sequential acquisition periods, wherein the value of an operational parameter of the spectrometer is varied during the different acquisition periods; c) storing the spectral data obtained in each acquisition period along with its respective value of the operational parameter; d) interrogating the stored spectral data and determining which of the spectral data for a precursor ion or product ions meets a predetermined criterion, and determining the value of the operational parameter that provides this mass spectral data as a target operational parameter value; and e) mass analyzing again the precursor or product ions whilst the operational parameter is set to the target operational parameter value.Type: GrantFiled: June 2, 2023Date of Patent: August 6, 2024Assignee: Micromass UK LimitedInventors: Martin Raymond Green, Jason Lee Wildgoose, Keith Richardson
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Patent number: 12046447Abstract: In one embodiment, a multi-charged-particle-beam writing method includes dividing a data path into a plurality of first blocks based on at least either one of each of a plurality of input/output circuits and a plurality of wiring groups, and calculating a first shift amount for multiple beams for each of the plurality of first blocks. The data path is for inputting control data to a cell array on a blanking aperture array substrate. The control data is for controlling ON/OFF of each beam of the multiple beams. Each of the plurality of wiring groups includes a plurality of pieces of wiring connected to the plurality of input/output circuits and grouped together based on inter-wiring distance. The first shift amount is due to at least one of an electric field and a magnetic field for each of the plurality of first blocks. An irradiation position or a dose of the multiple beams is corrected based on the first shift amount, and irradiation is performed.Type: GrantFiled: August 11, 2022Date of Patent: July 23, 2024Assignee: NuFlare Technology, Inc.Inventors: Taku Yamada, Takahito Nakayama
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Patent number: 12040153Abstract: An ion gun of the invention includes: an anode; a magnetic pole that has an inner surface facing the anode, a slit provided at a position corresponding to the anode, and an inner inclined surface that extends from an end of the inner surface to the slit and that forms a part of the slit; and a cover that covers at least the inner surface and the inner inclined surface, is formed of an electroconductive and non-magnetic material, and is detachable from the magnetic pole.Type: GrantFiled: July 21, 2020Date of Patent: July 16, 2024Assignee: ULVAC, INC.Inventor: Takumi Yuze
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Patent number: 12037091Abstract: The invention provides an anti-fouling lighting system configured for preventing or reducing biofouling on a fouling surface of an object, by providing an anti-fouling light via an optical medium to said fouling surface, the anti-fouling lighting system comprising: a lighting module comprising a light source configured to generate an anti-fouling light, and said optical medium configured to receive at least part of the anti-fouling light, the optical medium comprising an emission surface configured to provide at least part of said anti-fouling light; and comprising silicone that includes particles of, for example, silica, glass, or mica, wherein a density of the particles in the silicone increases from within the optical medium towards the emission surface.Type: GrantFiled: May 31, 2023Date of Patent: July 16, 2024Assignee: Koninklijke Philips N.V.Inventors: Bart Andre Salters, Roelant Boudewijn Hietbrink