Patents Examined by Sean M Luck
  • Patent number: 10585114
    Abstract: A scanning probe system with a probe comprising a cantilever extending from a base to a free end, and a probe tip carried by the free end of the cantilever. A first driver is provided with a first driver input, the first driver arranged to drive the probe in accordance with a first drive signal at the first driver input. A second driver is provided with a second driver input, the second driver arranged to drive the probe in accordance with a second drive signal at the second driver input. A control system is arranged to control the first drive signal so that the first driver drives the base of the cantilever repeatedly towards and away from a surface of a sample in a series of cycles. A surface detector arranged to generate a surface signal for each cycle when it detects an interaction of the probe tip with the surface of the sample.
    Type: Grant
    Filed: July 16, 2019
    Date of Patent: March 10, 2020
    Assignee: INFINITESIMA LIMITED
    Inventor: Andrew Humphris
  • Patent number: 10580634
    Abstract: The invention generally relates to systems and methods for relay ionization of a sample. In certain aspects, the invention provides systems that include an ion source that generates ions, a sample emitter configured to hold a sample, and a mass spectrometer. The system is configured such that the ions generated by the ion source are directed to interact with the sample emitter, thereby causing the sample to be discharged from the sample emitter and into the mass spectrometer.
    Type: Grant
    Filed: July 22, 2019
    Date of Patent: March 3, 2020
    Assignee: Purdue Research Foundation
    Inventors: Robert Graham Cooks, Anyin Li, Adam Hollerbach
  • Patent number: 10580613
    Abstract: Sample stage, e.g. for use in a scanning electron microscope. The sample stage includes a base, a sample carrier, and an actuator assembly arranged for moving the sample carrier in at least one direction substantially parallel to the base. The actuator assembly is arranged so as not to contribute to the mechanical stiffness of the sample stage from the sample carrier to the base.
    Type: Grant
    Filed: June 3, 2019
    Date of Patent: March 3, 2020
    Assignee: Phenom-World Holding B.V.
    Inventors: Gerhardus Bernardus Stamsnijder, Paul Cornelis Maria van den Bos, Ton Antonius Cornelis Henricus Kluijtmans, Sander Richard Marie Stoks, Adrianus Franciscus Johannes Hammen, Karel Diederick van der Mast
  • Patent number: 10578510
    Abstract: Embodiments include devices and methods for desorbing molecules from a chamber wall. In an embodiment, a desorption device includes several light emitting diodes (LEDs) mounted on a substrate having a wafer form factor. The LEDs may emit ultraviolet (UV) radiation, such as UV radiation in a UV C range. In an embodiment, the LEDs are thermally coupled to a heat exchanger, such as a thermoelectric cooling device. The emitted radiation may uniformly irradiate a chamber wall to desorb water molecules from the chamber wall. Other embodiments are also described and claimed.
    Type: Grant
    Filed: November 28, 2016
    Date of Patent: March 3, 2020
    Assignee: Applied Materials, Inc.
    Inventor: Ricardo M. Ramirez
  • Patent number: 10571375
    Abstract: The method is for quantification of sub-visible particles. A filter membrane is provided that has a plurality of pores defined therethrough. The pores are sealed with a sealant such as glycine or poly-vinyl alcohol (PVA). A sample droplet, containing liquid and sub-visible particles, is applied onto the filter membrane. The liquid dissolves the sealant in pores disposed directly below the sample droplet. The liquid flows through the pores in which the sealant has been dissolved and the sub-visible particles remain on top of the filter membrane. The particles are enumerated in an electron microscope.
    Type: Grant
    Filed: May 18, 2019
    Date of Patent: February 25, 2020
    Assignee: Intelligent Virus Imaging Inc.
    Inventors: Rickard Nordstrom Nordstrom, Ida-Maria Sintorn, Lars Haag
  • Patent number: 10566169
    Abstract: A charged particle buncher includes a series of spaced apart electrodes arranged to generate a shaped electric field. The series includes a first electrode, a last electrode and one or more intermediate electrodes. The charged particle buncher includes a waveform device attached to the electrodes and configured to apply a periodic potential waveform to each electrode independently in a manner so as to form a quasi-electrostatic time varying potential gradient between adjacent electrodes and to cause spatial distribution of charged particles that form a plurality of nodes and antinodes. The nodes have a charged particle density and the antinodes have substantially no charged particle density, and the nodes and the antinodes are formed from a charged particle beam with an energy less than or equal to 500 keV.
    Type: Grant
    Filed: June 30, 2009
    Date of Patent: February 18, 2020
    Assignee: NexGen Semi Holding, Inc.
    Inventors: Mark Joseph Bennahmias, Michael John Zani, Jeffrey Winfield Scott
  • Patent number: 10556651
    Abstract: Anti-fouling lighting system (1) for preventing or reducing bio fouling on a fouling surface (1201) of an object (1200), by providing an anti-fouling light (211) via an optical medium (220) to said fouling surface, the anti-fouling lighting (1) system comprising: (a) a lighting module (200) comprising (i) a light source (210) configured to generate an anti-fouling light (211), and (ii) said optical medium (220) configured to receive at least part of the anti-fouling light (211), the optical medium (220) comprising an emission surface (222) configured to provide at least part of said anti-fouling light (211); and (b) a control system (300) configured to control an intensity of the anti-fouling light (211) as function of one or more of (i) a feedback signal related to a biofouling risk and (ii) a timer for time-based varying the intensity of the anti-fouling light (211).
    Type: Grant
    Filed: June 30, 2015
    Date of Patent: February 11, 2020
    Assignee: Kininklijke Philips N.V.
    Inventors: Bart Andre Salters, Roelant Boudewijn Hietbrink
  • Patent number: 10559455
    Abstract: The invention generally relates to mass spectrometry probes and systems for ionizing a sample. In certain embodiments, the invention provides a mass spectrometry probe including a substrate in which a portion of the substrate is coated with a material, a portion of which protrudes from the substrate.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: February 11, 2020
    Assignee: Purdue Research Foundation
    Inventors: Robert Graham Cooks, Depanjan Sarkar, Thalappil Pradeep, Rahul Narayanan
  • Patent number: 10557968
    Abstract: The present invention provides a marine cable device configured for preventing or reducing biofouling along its exterior surface, which during use is at least temporarily exposed to water. The marine cable device according to the present invention comprises at least one light source configured to generate an anti-fouling light and at least one optical medium configured to receive at least part of the anti-fouling light. The optical medium comprises at least one emission surface configured to provide at least part of said anti-fouling light on at least part of said exterior surface.
    Type: Grant
    Filed: December 14, 2015
    Date of Patent: February 11, 2020
    Assignee: Koninklijke Philips N.V.
    Inventors: Roelant Boudewijn Hietbrink, Bart Andre Salters
  • Patent number: 10551348
    Abstract: A spray area in which a large number of droplets of a liquid sample sprayed from a spray nozzle is separated from the tip of a needle electrode for corona discharge by a sufficiently large distance, with a grid electrode facing the needle electrode placed in between. Ring electrodes for creating an electric field which drives primary ions that should react with the sample and generate sample-derived ions are provided within an ion chamber between the grid electrode and the spray area. Primary ions generated by corona discharge within the space between the needle electrode and the grid electrode pass through the opening of the grid electrode, reach the spray area under the effect of the electric field, and ionize sample components. Since the droplets are prevented from adhering to the needle electrode, the corona discharge is maintained in a stable state.
    Type: Grant
    Filed: November 17, 2014
    Date of Patent: February 4, 2020
    Assignee: SHIMADZU CORPORATION
    Inventors: Motohide Yasuno, Ryo Fujita
  • Patent number: 10551347
    Abstract: A method of mass spectrometry is disclosed comprising isolating a group of different ions derived from chemical compounds in the same class, wherein the different ions have different mass to charge ratios and ion mobilities. The step of isolating comprises temporally separating the ions according to their ion mobility in an ion mobility separator; and mass filtering the ions according to mass to charge ratio with a mass filter. The mass to charge ratios transmitted by the mass filter are varied as a function of time such that said different ions derived from chemical compounds in the same class are transmitted by the mass filter and other ions are not transmitted by the mass filter.
    Type: Grant
    Filed: November 11, 2014
    Date of Patent: February 4, 2020
    Assignee: MICROMASS UK LIMITED
    Inventors: John Brian Hoyes, Steven Derek Pringle, Farnoush Salarzaei, Jason Lee Wildgoose
  • Patent number: 10533961
    Abstract: Determining a property of a layer of an integrated circuit (IC), the layer being formed over an underlayer, is implemented by performing the steps of: irradiating the IC to thereby eject electrons from the IC; collecting electrons emitted from the IC and determining the kinetic energy of the emitted electrons to thereby calculate emission intensity of electrons emitted from the layer and electrons emitted from the underlayer calculating a ratio of the emission intensity of electrons emitted from the layer and electrons emitted from the underlayer; and using the ratio to determine material composition or thickness of the layer. The steps of irradiating IC and collecting electrons may be performed using x-ray photoelectron spectroscopy (XPS) or x-ray fluorescence spectroscopy (XRF).
    Type: Grant
    Filed: November 2, 2016
    Date of Patent: January 14, 2020
    Assignee: NOVA MEASURING INSTRUMENTS, INC.
    Inventors: Wei Ti Lee, Heath Pois, Mark Klare, Cornel Bozdog
  • Patent number: 10535498
    Abstract: An ion implantation system is provided having one or more conductive components comprised of one or more of lanthanated tungsten and a refractory metal alloyed with a predetermined percentage of a rare earth metal. The conductive component may be a component of an ion source, such as one or more of a cathode, cathode shield, a repeller, a liner, an aperture plate, an arc chamber body, and a strike plate. The aperture plate may be associated with one or more of an extraction aperture, a suppression aperture and a ground aperture.
    Type: Grant
    Filed: August 14, 2018
    Date of Patent: January 14, 2020
    Assignee: Axcelis Technologies, Inc.
    Inventors: Neil K. Colvin, Tseh-Jen Hsieh, Paul B. Silverstein
  • Patent number: 10529538
    Abstract: To expose a desired feature, focused ion beam milling of thin slices from a cross section alternate with forming a scanning electron image of each newly exposed cross section. Milling is stopped when automatic analysis of an electron beam image of the newly exposed cross section shows that a predetermined criterion is met.
    Type: Grant
    Filed: January 29, 2019
    Date of Patent: January 7, 2020
    Assignee: FEI Company
    Inventors: Scott Edward Fuller, Jason Donald, Termsupt Seemuntchaiboworn
  • Patent number: 10522327
    Abstract: A charged particle beam specimen inspection system is described. The system includes an emitter for emitting at least one charged particle beam, a specimen support table configured for supporting the specimen, an objective lens for focusing the at least one charged particle beam, a charge control electrode provided between the objective lens and the specimen support table, wherein the charge control electrode has at least one aperture opening for the at least one charged particle beam, and a flood gun configured to emit further charged particles for charging of the specimen, wherein the charge control electrode has a flood gun aperture opening.
    Type: Grant
    Filed: July 25, 2018
    Date of Patent: December 31, 2019
    Assignee: Applied Materials Israel Ltd.
    Inventors: Gilad Erel, Michal Avinun-Kalish, Stefan Lanio
  • Patent number: 10520527
    Abstract: The present disclosure relates to in situ transmission electron microscope (TEM) holders with improved stability and electrical sensitivity. The holders feature a front bearing seal and a rear bearing seal which allow the holders to achieve high sensitivity, high stability, large range of motion and high vacuum isolation. The bearings use a PEEK insulating disk as a pivot point for translation and tilting motion, and use O-rings to dampen vibrations, provide electrical and vacuum insulation, and to set a grabbing force between the bearing and the probe.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: December 31, 2019
    Assignees: The Regents of the University of California, The Regents of the University of Michigan
    Inventors: Xiaoqing Pan, Thomas F. Blum, Mingjie Xu, Jake Jokisaari, Wilbur Bigelow
  • Patent number: 10515792
    Abstract: The invention generally relates to systems and methods for ejection of ions from an ion trap. In certain embodiments, systems and methods of the invention sum two different frequency signals into a single summed signal that is applied to an ion trap. In other embodiments, an amplitude of a single frequency signal is modulated as the single frequency signal is being applied to the ion trap. In other embodiments, a first alternating current (AC) signal is applied to an ion trap that varies as a function of time, while a constant radio frequency (RF) signal is applied to the ion trap.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: December 24, 2019
    Assignee: Purdue Research Foundation
    Inventors: Robert Graham Cooks, Dalton Snyder
  • Patent number: 10499861
    Abstract: A self-shielded and computer controlled system for performing non-invasive stereotactic radiosurgery and precision radiotherapy using a linear accelerator mounted within a two degree-of-freedom radiation shield coupled to a three-degree of freedom patient table is provided. The radiation shield can include an axial shield rotatable about an axial axis and an oblique shield independently rotatable about an oblique axis, thereby providing improved range of trajectories of the therapeutic and diagnostic radiation beams. Such shields can be balanced about their respective axes of rotation and about a common support structure to facilitate ease of movement. Such systems can further include an imaging system to accurately deliver radiation to the treatment target and automatically make corrections needed to maintain the anatomical target at the system isocenter.
    Type: Grant
    Filed: September 6, 2018
    Date of Patent: December 10, 2019
    Assignee: Zap Surgical Systems, Inc.
    Inventors: Younes Achkire, Raymond Wilbur, John Adler, Manoocher Birang, Radhika Mohan Bodduluri, Hui Zhang, Tom McDermott, Chris Lee, Kaustubh Sonawale, Cesare Jenkins
  • Patent number: 10497548
    Abstract: In a method and apparatus for electron ionization liquid chromatography mass spectrometry (EI-LC-MS) analysis liquid chromatograph output solvent flow is directed together with spray formation gas into a spray formation and vaporization chamber for forming spray droplets which are vaporized to form vaporized sample compounds at a pressure equal to or greater than ambient pressure. A minor portion is conveyed into a heated flow restriction capillary that directly connects the spray formation and vaporization chamber and a non-fly-through electron ionization ion source of a mass spectrometer located inside a vacuum chamber. A major portion is released to atmosphere so that it does not enter the flow restriction capillary and therefore does not reach the non-fly-through electron ionization ion source.
    Type: Grant
    Filed: May 1, 2019
    Date of Patent: December 3, 2019
    Assignee: AVIV AMIRAV
    Inventor: Aviv Amirav
  • Patent number: 10497535
    Abstract: A charged particle beam device includes: a charged particle source configured to emit a charged particle beam; an acceleration electric power source connected to the charged particle source and configured to accelerate the charged particle beam; a second objective lens configured to focus the charged particle beam onto a sample; and a second detector. The second objective lens is positioned on the opposite side of the sample from where the charged particle beam is incident on the sample. The second detector is configured to receive at least one of: an electromagnetic wave that the sample emits upon receiving the charged particle beam, and an electromagnetic wave that the sample reflects upon receiving the charged particle beam. The second detector carries out a detection of the received electromagnetic wave(s).
    Type: Grant
    Filed: November 29, 2016
    Date of Patent: December 3, 2019
    Assignee: Matsusada Precision, Inc.
    Inventors: Kazuya Kumamoto, Sadayoshi Matsuda