Abstract: In a memory module including a plurality of DRAM chips which transmit/receive a system data signal with a predetermined data width and at a transfer rate and which transmit/receive an internal data signal having a larger data width and a lower transfer rate as compared with the system data signal, the transfer rate of the system data signal is restricted. Current consumption in DRAMs constituting the memory module is large, hindering speed increases. For this memory module, a plurality of DRAM chips are stacked on an IO chip. Each DRAM chip is connected to the IO chip by a through electrode, and includes a constitution for mutually converting the system data signal and the internal data signal in each DRAM chip by the IO chip. Therefore, wiring between the DRAM chips can be shortened, and DLL having a large current consumption may be disposed only on the IO chip.

Abstract: There is provided, for example, a write assist circuit for controlling the voltage level of a memory cell power supply line coupled to an SRAM memory cell to be written in the write operation. The write assist circuit reduces the voltage level of the memory cell power supply line to a predetermined voltage level, in response to a write assist enable signal that is enabled in the write operation. At the same time, the write assist circuit controls the reduction speed of the voltage level of the memory cell power supply line, according to the pulse width of a write assist pulse signal. The pulse width of the write assist pulse signal is defined in such a way that the greater the number of rows (or the longer the length of the memory cell power supply line), the greater the pulse width.

Abstract: Apparatuses and methods for controlling word lines and sense amplifiers in a semiconductor device are described. An example apparatus includes: a sub word line selection signal decoder which activates at least one of a plurality of sub word selection signals responsive to row address signals; a column segment selection signal decoder which activates at least one of a plurality of column segment signals responsive to a portion of column address signals and a portion of the row address signals; a column segment selection circuit which activates at least one of a plurality of column-subword selection signals responsive to the activated column segment signal and the activated sub word selection signal; and a sub word line driver which activates at least one of a plurality of sub word lines responsive to an activated main word line and the activated sub word selection signal.

Abstract: Apparatus for managing power in a data storage device, such as a solid state drive (SSD). In some embodiments, an energy management circuit supplies electrical power to a non-volatile memory (NVM). The energy management circuit has cascaded first and second E-Fuse switch circuits each with an input terminal and an output terminal. The second E-Fuse switch circuit receives input power from the first E-Fuse switch circuit used as a rail voltage for the device. The second E-Fuse switch circuit is configured to monitor the rail voltage, deactivate the first E-Fuse switch circuit responsive to the rail voltage falling below a predetermined threshold, and supply backup power to the device from a backup power source.

Abstract: A semiconductor storage device provided can increase a write margin and suppress increase of a chip area. The semiconductor storage device includes plural memory cells arranged in a matrix; plural bit-line pairs arranged corresponding to each column of the memory cells; a write driver circuit which transmits data to a bit-line pair of a selected column according to write data; and a write assist circuit which drives a bit line on a low potential side of the bit-line pair of a selected column to a negative voltage level. The write assist circuit includes first signal wiring; a first driver circuit which drives the first signal wiring according to a control signal; and second signal wiring which is coupled to the bit line on the low-potential side and generates a negative voltage by the driving of the first driver circuit, based on inter-wire coupling capacitance with the first signal wiring.

Abstract: Provided is a memory device, comprising a non-volatile memory, an energy store coupled to the non-volatile memory, and a power management module configurable to power up the non-volatile memory and provide read access to the non-volatile memory, in response to the energy store being charged to at least a first predetermined level. Provided also is a computational device that includes the memory device. Provided also is a method in which an energy store coupled to a non-volatile memory of a memory device is charged to at least a first predetermined level. The non-volatile memory is powered up and read access is provided to the non-volatile memory, in response to charging the energy store to at least the first predetermined level.

Abstract: In some examples, a memory device is configured with non-volatile memory array(s) having one or more associated volatile memory arrays. The memory device may include a non-destructive write mode configured to prevent access to the non-volatile memory array(s) during an initiation or calibration sequence performed by the memory device or an electronic device associated with the memory device to calibrate read and write access timing associated with the memory device.

Abstract: In a method of operating a memory device, a first write command, a first write address, and first write data are received by a first memory device through a channel. The first write command, received by the first memory device, is sensed by a controller. The controller is connected to the channel and controls a second memory device. The first memory device and the second memory device are different types of memory devices. When the first write command is sensed by the controller, a first write log is generated using the first write address and the first write data. The first write log is stored into a buffer.

Abstract: An integrated circuit can include multiple SRAM cells, each including at least two pull-up transistors, at least two pull-down transistors, and at least two pass-gate transistors, each of the transistors having a gate; at least one of the pull-up transistors, the pull-down transistors, or the pass-gate transistors having a screening region a distance below the gate and separated from the gate by a semiconductor layer, the screening region having a concentration of screening region dopants, the concentration of screening region dopants being higher than a concentration of dopants in the semiconductor layer, the screening region providing an enhanced body coefficient for the pull-down transistors and the pass-gate transistors to increase the read static noise margin for the SRAM cell when a bias voltage is applied to the screening region; and a bias voltage network operable to apply one or more bias voltages to the multiple SRAM cells.

Abstract: A method to program bitcells of a ROM array uses different programming cells for programming the bitcells with a first or second data item. A first bitcell is programmed by means of a selected programming cell, wherein the programming cell is selected in dependence on operating the memory array as a flipped or a non-flipped memory in multi-bank instance. All other bitcells located in the same column as the first bitcell and subsequent rows are programmed by selected programming cells, wherein the selection of the programming cells is dependent on operating the memory array as a flipped or a non-flipped memory in multi-bank instance and the programming state of the programming cells used for the previously programmed bitcells in the same column.

Abstract: A differential current sensing circuit architecture is used with an integrated circuit NVM memory block in which a selected memory cell and a related complementary memory cell are accessed at the same time for reading. The circuit architecture is used not only for normal operations for reading the logic states of a selected memory cell and its complementary memory cell after programming, but also for reading the logic states of a selected memory cell and its complementary memory cell before programming for the detecting of faults in memory cells.

Abstract: To provide enhanced data storage devices and systems, various systems, architectures, apparatuses, and methods, are provided herein. In a first example, a resistive random access memory (ReRAM) array is provided. The ReRAM array includes a plurality of memory cells each comprising resistive memory material formed into a layer of a substrate, with resistance properties of the resistive memory material corresponding to data bits stored by the memory cells. The ReRAM array also includes a plurality of interconnect features each comprising conductive material between adjacent memory cells formed into the layer of the substrate, and gate portions coupled onto the memory cells and configured to individually alter the resistance properties of the resistive memory material of associated memory cells responsive to at least voltages applied to the gate portions.

Abstract: A method of controller optimization utilizing over-sampling read (OSR) in a memory device includes performing a first internal read at a predetermined threshold level and transferring the first internal read measurement to the controller, performing a second internal read in a range that is between the predetermined threshold level plus a first predetermined value and the predetermined threshold level minus a second predetermined value, and determining whether a cell level falls in the range and transferring the second internal read measurement to the controller.

Abstract: Examples include a resistive random access memory (RRAM) array to support a redundant column. Some examples include an RRAM cell at a cross point of a column line and a row line of the RRAM array. A first column line may be coupled to a first input of a first current-steering multiplexer and the first current-steering multiplexer may have an output coupled to a first current sense amplifier and a select input coupled to a first column select signal. A second column line may be coupled to a second input of the first current-steering multiplexer and coupled to a first input of a second current-steering multiplexer. The second current-steering multiplexer may have an output coupled to a second current sense amplifier and a select input coupled to a second column select signal. A third column line may be coupled to a second input of the second current-steering multiplexer.

Abstract: According to one embodiment, there is provided a non-volatile semiconductor storage device including a non-volatile memory, a monitoring section, a determining section, and a notification processing section. The non-volatile memory includes a plurality of memory cells driven by word lines and a voltage generating section that generates a read voltage to be applied to the word lines. The monitoring section monitors a change in a threshold distribution of the plurality of memory cells upon performing a read processing to read data from the plurality of memory cells by applying the read voltage to the word lines. The determining section determines a degree of deterioration of the non-volatile memory in accordance with a monitoring result by the monitoring section. The notification processing section notifies a life of the non-volatile memory in accordance with a determining result by the determining section.

Abstract: A memory device for generating a mapping between one or more unusable columns and one or more backup columns within a memory. The memory includes a plurality of memory cells for storing data. The memory also includes a plurality of columns including a first subset of the plurality of memory cells. Each of the plurality of columns belongs to one of a plurality of data chunks. The memory further includes one or more backup columns including a second subset of the plurality of memory cells. The memory device also includes a controller communicatively coupled to the memory and configured to perform operations including identifying unusable columns, detecting a condition associated with each data chunk, and generating a mapping between the backup columns and the unusable columns based on the condition such that each of the backup columns is mapped to a different unusable column.

Abstract: An SRAM with a first bitcell array having a first density and a first access speed, and a second bitcell array having a second density larger than the first density and a second access speed less than the first access speed. The SRAM further includes a first set of wordline drivers coupled to the first bitcell array, a second set of wordline drivers coupled to the second bitcell array, and a row decoder coupled to both the first and second bitcell arrays.

Abstract: Described is an apparatus which comprises: a bit-line (BL) read port; a first local bit-line (LBL) coupled to the BL read port; a second LBL; and one or more clipper devices coupled to the first and second LBLs. The apparatus allows for low swing bit-line to be used for large signal memory arrays. The low swing operation enables reduction in switching dynamic capacitance. The apparatus also describes a split input NAND/NOR gate for bit-line keeper control which achieves lower VMIN, higher noise tolerance, and improved keeper aging mitigation. Described is also an apparatus for low swing write operation which can be enabled at high voltage without degrading the low voltage operation.

Abstract: Technology is described for keeping current (e.g., peak power supply current or ICC) in a non-volatile memory system within a target while maintaining high throughput. Programming conditions are adaptively changed at the sub-codeword level in order to keep power supply current of the memory system within a target. In one embodiment, a chunk of data that corresponds to a sub-codeword is written while consuming lower than normal programming current in order to keep power supply current within a target. The relatively low programming current may increase the expected raw BER. However, other portions of the codeword can be written with a higher than normal programming current, which results in a lower expected bit raw error rate for the memory cells that store that portion.

Abstract: A memory array includes an N×M array of memory cells, each memory cell having a first transistor connected to a first terminal and a second transistor connected in parallel to the first transistor and a second terminal, where the first and second transistors share a common floating gate and a common output node. Each memory cell further includes an access transistor connected in series to the common output node and a low voltage terminal, the access transistor configured to trigger hot-carrier injection to the common floating gate to change a voltage of the common floating gate. The first transistor is an n-type transistor and the second transistor is a p-type transistor.