Abstract: Apparatuses and methods including anti-fuses and for reading and programming same are disclosed herein. An example apparatus may include an anti-fuse element comprising first, second, and third transistors coupled in series between first and second nodes such that the second transistor is between the first and third transistors. The second transistor is configured to be operated such that a punch-through current flows through the second transistor to indicate that the anti-fuse element has been programmed.

Abstract: Certain aspects of the present disclosure provide apparatus and methods for performing memory read operations. One example method generally includes precharging a plurality of memory columns during a precharging phase of a read access cycle. The method also includes sensing first data stored in a first memory cell of a first memory column of the plurality of memory columns during a memory read phase of the read access cycle, and sensing second data stored in a second memory cell of a second memory column of the plurality of memory columns during the same memory read phase of the read access cycle.

Abstract: The present disclosure provides a testing method for reading current of static random access memory, the method comprising: for each basic static random access memory cell, coupling a gate of a first pull-down transistor to a first bit line; setting a word line and the first bit line at a high potential; and sensing current of the first bit line. The testing method provided in the present disclosure can also be applied to static random access memory cells arranged in matrices, so as to efficiently complete the tests for the reading current of the static random access memory in batches.

Abstract: A memory system includes a memory controller; and a memory device including a memory cell array, which includes a plurality of bit lines and a plurality of blocks. Each block includes a plurality of word lines, and each word line includes a plurality of phase-change random access memory (PRAM) cells connected, respectively, to the plurality of bit lines. The memory controller is configured to buffer write requests each including write data and is configured to perform a write operation that includes a reset phase and a subsequent set phase. The reset phase includes erasing the PRAM cells included in first word lines from among the plurality of word lines included in a selected block, from among the plurality of blocks, and the set phase includes, after the reset phase, writing the write data from the buffered write requests to the PRAM cells of the first word lines.

Abstract: Nonvolatile memory devices, operating methods thereof, and memory systems including the same. A nonvolatile memory device may include a memory cell array and a word line driver. The memory cell array may include a plurality of memory cells. The word line driver may be configured to apply word line voltages to a plurality of word lines connected to the plurality of memory cells, respectively. Magnitudes of the word line voltages may be determined according to locations of the plurality of word lines.

Abstract: A system for a nonvolatile memory for broad temperature range applications. The system includes a memory organized into an addressable memory range and comprising a plurality of memory arrays comprising memory cells wherein each memory array is configured for operation over a different temperature range, and a buffer for receiving a data word and an associated address for writing into the memory. A temperature sensor is used for sensing a current temperature of operation of the memory. A write controller is coupled to the buffer, the temperature sensor and the memory. The write controller is operable to perform a write operation that includes accessing a temperature value from the temperature sensor, selecting a selected memory array of the plurality of memory arrays that is configured for operation at the temperature value, and writing the data word, at the associated address, to the selected memory array.

Abstract: The present disclosure includes apparatuses and methods related to performing compare and/or report operations using sensing circuitry. An example method can include charging an input/output (IO) line of a memory array to a voltage. The method can include determining whether data stored in the memory array matches a compare value. The determination of whether data stored matches a compare value can include activating a number of access lines of the memory array. The determination can include sensing a number of memory cells coupled to the number of access lines. The determination can include sensing whether the voltage of the IO line changes in response to activation of selected decode lines corresponding to the number of memory cells.

Abstract: A decoding method, a memory control circuit unit, and a memory storage device are provided. The method includes: configuring a plurality of read voltage categories, wherein the read voltage categories respectively have a plurality of representative read voltage sets; reading a first physical programming unit according to the representative read voltage sets and executing a decoding operation to obtain a plurality of decoded information; choosing a first read voltage category according to the plurality of decoded information; and reading the first physical programming unit according to the first read voltage sets in the first read voltage category and executing the decoding operation.

Abstract: The present disclosure includes apparatuses and methods related to performing a greater vector determination in memory. An example apparatus comprises a first group of memory cells coupled to a sense line and to a number of first access lines and a second group of memory cells coupled to the sense line and to a number of second access lines. The example apparatus comprises a controller configured to operate sensing circuitry to compare a value of a first element stored in the first group of memory cells to a value of a second element stored in the second group of memory cells to determine which of the value of the first element and the value of the second element is greater.

Abstract: A semiconductor device includes a clock gating tree comprising a first clock gating stage and a second clock gating stage. The first clock gating stage is configured to receive an activate detection signal and to activate clocking events in the second clock gating stage in response to the activate detection signal. The clocking events are not activated in the absence of the activate detection signal.

Abstract: An anti-fuse device includes a program transistor and a read transistor. The program transistor executes a program via insulation breakdown of a gate insulating layer. The read transistor is adjacent to the program transistor and reads the state of the program transistor. At least one of a first gate electrode of the program transistor or a second gate electrode of the read transistor is buried in a substrate.

Abstract: A memory device includes a voltage generator that provides a read voltage to a selected word line and provides a pass voltage to a plurality of unselected word lines, and a deterioration level detection circuit. The selected word line and the unselected word lines are connected to a plurality of memory cells. The deterioration level detection circuit detects a deterioration level of memory cells connected to the selected word line based on data of memory cells that receive the read voltage. The memory cells connected to the selected word line and the memory cells that receive the read voltage are included in the plurality of memory cells. The voltage generator changes the pass voltage provided to the unselected word lines based on the deterioration level.

Abstract: The invention is directed to a resistive memory device comprising a control unit for controlling a memory cell of the memory device. The memory cell includes a first terminal, a second terminal and a phase change segment comprising a phase-change material. The phase change segment is arranged between the first terminal and the second terminal. The phase change material is antimony. The phase change segment retains an amorphous region during a write operation. The control unit, during the write operation, applies an electrical programming pulse to the terminals to cause a portion of the phase change segment to transition from a crystalline phase to an amorphous phase comprising the amorphous region. A trailing edge duration of the electrical programming pulse is adjusted based on ambient temperature to prevent re-crystallization of the amorphous region. Shorter trailing edge durations are used at increasing ambient temperatures.

Abstract: To accurately read data in a storage device provided with a cell having a variable resistance value. In a reference cell circuit, a resistance value changes to a predetermined initial value when an initialization signal exceeding a predetermined reversal threshold is input. A reference side signal source inputs a reference side read signal of a predetermined value not exceeding the predetermined reversal threshold to the reference cell circuit after the initialization signal is input to the reference cell circuit when there is an instruction to read with respect to a memory cell. A cell side signal source inputs a cell side read signal of the predetermined value to the memory cell after the initialization signal is input. A comparison unit compares a reference signal output from the reference cell circuit into which the reference side read signal has been input, and a cell signal output from the memory cell into which the cell side read current has been input, and acquires the comparison result as read data.

Abstract: Embodiments of memory block erasure are described herein. An aspect includes determining a first word line set consisting of a first plurality of word lines. Another aspect includes activating the first plurality of word lines, such that a respective memory cell that is connected to each of the first plurality of word lines is erased by the activation of the first plurality of word lines. Another aspect includes determining a second word line set, wherein the second word line set consists of the first word line set and a second plurality of word lines. Another aspect includes simultaneously activating the first plurality of word lines and the second plurality of word lines, such that a respective memory cell that is connected to each of the second plurality of word lines is erased by the activation of the first plurality of word lines and the second plurality of word lines.

Abstract: A memory array with memory cells arranged in rows and columns. Each memory cell includes source and drain regions with a channel region there between, a floating gate disposed over a first channel region portion, and a second gate disposed over a second channel region portion. A plurality of bit lines each extends along one of the columns and is electrically connected to the drain regions of a first group of one or more of the memory cells in the column and is electrically isolated from the drain regions of a second group of one or more of the memory cells in the column. A plurality of source lines each is electrically connected to the source regions of the memory cells in one of the columns or rows. A plurality of gate lines each is electrically connected to the second gates of memory cells in one of the columns or rows.

Abstract: A semiconductor device includes a control circuit configured to generate a data reset signal which is enabled in response to a reset signal and first and second transfer control signals which are sequentially enabled in synchronization with a divided clock in response to a read signal and a trigger circuit configured to drive a driving signal depending on a logic level of latch data in synchronization with delayed clocks in response to the first and second transfer control signals, the driving signal having a fixed logic level based on the data reset signal being enabled.

Abstract: A memory device includes a memory cell array storing input data, a clock generator circuit generating first clocks and second clocks using a reference clock, a phase information generator circuit comparing a phase of the reference clock and a phase of at least one of the first clocks and the second clocks and generating phase information as a comparison result, an intermediate data generator circuit serializing a part of input data provided from the memory cell array based on the first clocks to generate first data, serializing a remaining part of the input data to generate second data, and selectively swapping the first data and the second data using the phase information to generate intermediate data, and an output data generator circuit serializing the intermediate data using the second clocks, to output output data through one output data line.

Abstract: The subject technology performs the following in a storage system including memory dies, where each memory die includes its own temperature sensor. The subject technology determines a temperature of each of the memory dies based on a temperature reading from each memory die's temperature sensor. The subject technology determines whether data is hot data or cold data, where hot data is more likely to be changed after it is written than cold data. In response to determining that the data is hot data, the subject technology stores the data in a memory die with a relatively higher temperature than another one of the memory dies. Further, in response to determining that the data is cold data, the subject technology stores the data in a memory die with a relatively cooler temperature than another one of the memory dies.

Abstract: A memory system includes: a first cell array including a plurality of memory cells; and a second cell array including a plurality of memory cells; and an address operation circuit suitable for generating a first cell array address, the first cell array address used for accessing at least one first cell in the first cell array, by adding a first value to an address, and generating a second cell array address, the second cell array address used for accessing at least one second cell in the second cell array, by adding a second value to the address.