Abstract: Electrical energy storage system (1), comprising at least two strings (STR1, STR2, STR3) interconnected in parallel connection, wherein the strings each have at least two electrical energy storage units (15) interconnected in series connection, characterized in that at least one first electrically conductive cross-connection (11) between electrical energy storage units (15) at an identical first electrical potential in the strings (STR1, STR2, STR3) interconnected in parallel connection is electrically conductively connected via at least one diode (12) to a means for detecting an electric current (13) and a controllable electrical energy source (14), wherein the diode (12) is not incorporated into the first electrically conductive cross-connection (11).

Abstract: A duty cycle is used in conjunction with a powered oscillator to electronically reduce the current draw by reducing the average current and thus reducing the sensor radiated emissions without altering an inductive position sensor. The duty cycle and the switching of the oscillation drive enable an on and an off cycling of the inductive position sensor such that an oversampling may occur without altering the hardware, but providing the improvements. As such, the inductive position sensor may only have an oscillation signal long enough to capture a stable sample and remain off for the duration of the sampling period. As such, a reduction in radiated emissions is achieved.

Abstract: An inspection apparatus comprises a light output unit configured to output first light having a first wavelength and second light having a second wavelength, a magneto-optical crystal arranged so that a reflection film faces a measurement target, a light detection unit configured to detect the first light and the second light, and a light guide optical system configured to guide the first light and the second light toward the magneto-optical crystal and the measurement target, and guide the first light reflected by the magneto-optical crystal and the second light reflected by the measurement target toward the light detection unit. The light guide optical system comprises an optical path switching element configured to perform switching between optical paths of a plurality of optical elements so that the first light and the second light are selectively incident on the light detection unit.

Abstract: This patent document discloses techniques and devices for sensing or measuring electric currents and/or temperature based on photonic sensing techniques. The optical sensors for sensing the current or temperature can be configured as a polarization-insensitive optical sensor in either an optical transmissive configuration or an optical reflective configuration.

Abstract: An apparatus (100) includes: an outer shell (211); an inner vessel (212) disposed within the outer shell; a cold head (260) having a first stage (261) disposed within the outer shell, and having a second stage (262) for contacting an interior of the inner vessel; a vent (215) extending from the interior of the inner vessel to the exterior of the outer shell; first and second heat exchangers (302a, 302b); a first thermal shield (213) disposed between the inner vessel and the outer shell; and a second thermal shield (214) disposed between the inner vessel and the first thermal shield. The first thermal shield is thermally connected to the first stage of the cold head and the first heat exchanger and is thermally isolated from the inner vessel and outer shell. The second thermal shield is thermally connected to the second heat exchanger and is thermally isolated from the inner vessel, outer shell, first thermal shield, and cold head.

Abstract: A magnet mounting apparatus including a cage, a magnet carriage and first actuator for use in testing Magnetic Tunnel Junction (MTJ) devices. The cage can be configured for mounting to an Automated Test Equipment (ATE). The magnet carriage can be configured for coupling to a wafer test magnet. The first actuator can be coupled between the cage and the magnet carriage. The first actuator can be configured to move the magnet carriage between a first position and a second position along a z-axis. The first position can be configured for locating the wafer test magnet within a predetermined proximity to a Device Under Test (DUT) wafer, and the second position can be configured for replacing a probe card.

Abstract: A test system for testing electric connections, in particular soldered connections, between electronic components and a printed circuit board to be tested, characterized in that the test system includes a subassembly, which is movably mounted in a housing of the test system, and a current and/or voltage source for energizing the circuit board to be tested, the current and/or voltage source being arranged in the housing of the test system in such a way as to be movable in at least two directions in space.

Abstract: Disclosed are a hybrid-type contact and a socket device for testing a semiconductor device, in which the hybrid-type contact includes a first contact unit integrally configured by rolling a predetermined shaped strip pattern formed by blanking a metal plate into a cylindrical shape, a second contact unit with conductivity and elasticity configured to be inserted into the first contact unit, and a molding portion of insulating elastic material configured to integrally fix the first contact unit and the second contact unit together, so as to compensate the disadvantages of conventional pin-type and rubber-type test socket devices, whereby it is easy to optimize the mechanical and electrical properties according to the requirements of the test device, and it is suitable for testing a fine pitch device.

Abstract: A semiconductor device inspection apparatus is an apparatus for inspecting a semiconductor device which is an object to be inspected based on a result signal which is output in accordance with input of a test pattern signal to the semiconductor device, the apparatus including: an ultrasonic transducer, disposed to face the semiconductor device, which generates ultrasonic waves; a stage for moving a relative position of the semiconductor device and the ultrasonic transducer; a stimulation condition control unit for controlling a condition of stimulation by the ultrasonic waves applied to the semiconductor device; and an analysis unit for generating a measurement image based on the result signal which is output from the semiconductor device.

Abstract: A meter includes prongs that detect the moisture content value of a tobacco product, and an electrical circuit of the meter receives this information and converts the moisture content value to a relative humidity value of the tobacco product. The relative humidity value is displayed as a numeral on a display sensor connected to the electrical circuit.

Abstract: A magnetic sensor device comprises a substrate, first and second magnetic sensors, and one or more inductors are disposed over the substrate and are controlled by a magnetic sensor controller having a control circuit. The control circuit controls the first magnetic sensor to measure a first magnetic field and the second magnetic sensor to measure a second magnetic field under presence of a fifth magnetic field generated by the inductors. The control circuit controls the first magnetic sensor to measure a third magnetic field and the second magnetic sensor to measure a fourth magnetic field under presence of a sixth magnetic field generated by the inductors, the fifth magnetic field and the sixth magnetic field being different. The control circuit calculates a relative sensitivity matching value converting magnetic field values measured by the second magnetic sensor to a comparable magnetic field value measured by the first magnetic sensor.

Abstract: An assessment device for a lighting system, the device comprising: an input terminal which corresponds to an output terminal of a driver; an output terminal which corresponds to an input terminal of a light engine; a voltage regulator configured to provide power to the microcontroller, wherein the microcontroller is configured to sample an LED+ line voltage and an LED? line voltage with respect to a ground; and wherein the device is independent of the driver and the light engine.

Abstract: A method, system and computer readable medium for determination of distance to an electrical fault within a device. A signal generator excites the device with an electrical input signal. The device comprises an open circuited electrical transmission line. A frequency domain analyzer analyzes part of the signal reflected from the device for determination of the locations of resonant frequency of the signal within the device. A computer calculates the distance to the fault within the device, based on the resonant frequency. The distance to the fault is one quarter wavelength distance into the device at the resonant frequency. A frequency sweeper sweeps the frequency of the input signal and repeated calculation of the distance to the fault made at a plurality of resonant frequencies during the frequency sweep confirms the distance to the fault by convergence of the result of the repeated calculations to substantially the same location.

Abstract: A method for detecting soft faults in a transmission line includes the following steps: acquiring a measurement, called time-domain reflectogram, of a signal characteristic of the reflection of a reference signal previously injected into the line, determining the difference between the time-domain reflectogram and a time-domain reflectogram measured previously for the same line or an identical line of similar characteristics, in order to obtain a corrected time-domain reflectogram, applying a plurality of independent transformations to the corrected time-domain reflectogram in order to obtain a plurality of independent transformed reflectograms, converting the transformed reflectograms into a plurality of mutually independent probabilities of occurrence of a fault, applying a data merging method to the probabilities of occurrence of a fault to deduce therefrom a unified value of the probability of occurrence of a fault.

Abstract: A probe card assembly is provided as follows. A tile fixing substrate is disposed on a printed circuit board. A plurality of ceramic tiles is detachably attached to the tile fixing substrate. Each of the plurality of ceramic tiles comprises a plurality of probes. A plurality of alignment marks is fixed to the tile fixing substrate.

Abstract: A method of determining an error condition in a magnetic field sensor can include receiving a first bridge signal, the first bridge signal generated by a first full bridge circuit. The method can also include receiving a second bridge signal, the second bridge signal generated by a second full bridge circuit. The method can also include determining a bridge separation from the first bridge signal and the second bridge signal. The method can also include comparing a function of the bridge separation to a threshold value. The method can also include generating an error signal indicative of the error condition or not indicative of the error condition in response to the comparing.

Abstract: A modular RF measuring device has a motherboard arranged centrally within the device so as to define a front side and a rear side, the front side and the rear side each comprising module interfaces.

Abstract: A rotary encoder may include a magnetic encoder disc having a plurality of magnetic features added to the disc by additive manufacturing distributed over a surface of the encoder disc, wherein the disc is configured for attachment to the end of a rotatable shaft, or a cylindrical metallic encoding feature having a plurality of magnetic features added to the cylindrical encoder by additive manufacturing distributed over the surface of the cylindrical encoding feature, wherein the encoding feature is capable of attachment to an outer diameter of the rotatable shaft. The encoder additionally includes a magnetic sensor positioned adjacent to the end of the rotatable shaft to detect magnetic signals from the magnetic features on the disc and/or positioned over the surface of the rotatable shaft to detect magnetic signals from the magnetic features on the encoding feature.

Abstract: A magnetic field sensor comprises a substrate, a first coil supported by the substrate and configured to carry a first current in a first direction to generate a first magnetic field, and a second coil supported by the substrate and nested within the first coil to form a gap between the first and second coils, the second coil configured to carry a second current in a second, opposite direction to generate a second magnetic field. A plurality of magnetic field sensing elements is configured to detect the first and second magnetic fields. A switching network is coupled to the plurality of magnetic field sensing elements and configured to connect the plurality of magnetic field sensing elements to form a first bridge circuit having a first arrangement of the magnetic field sensing elements and a second bridge circuit having a second arrangement of the magnetic field sensing elements.

Abstract: A point stick module has a sensing device, a rank unit and a signal processing device. The sensing device outputs multiple sensing signals in response to operations done by a user. The rank unit provides a rank signal to represent a rank of the sensing device. The signal processing device is coupled to the sensing device and the rank unit to receive the multiple sensing signals and the rank signal, wherein the signal processing device selects a parameter according to the rank signal.