Abstract: A health signature of each switching device in a control system is estimated using system parameters such as a DC-link voltage, three-phase voltages, three-phase currents, and temperature. The switching devices can be implemented as transistors, and a health signature for each transistor may be an on-state resistance or an on-state voltage of the transistors. For example, the on-state resistance for a metal-oxide-semiconductor field-effect transistor (MOSFET) functions as a health signature. Alternatively, the on-state voltage is used as a health signature for an insulated-gate bipolar transistor (IGBT). Additionally, a junction temperature is estimated for each transistor. Using the estimated health signatures and the junction temperatures, the remaining useful life of each transistor is estimated.

Abstract: A power electronics module for a test arrangement for testing a power electronics controller includes: supply connections for supplying energy; at least one load connection for providing at least one electrical connection variable; a supply circuit for providing electrical control voltages; a selection circuit with circuit breakers for switching one of the electrical control voltages onto the at least one load connection of the power electronics module; and an interface for controlling the circuit breakers. The supply connections of the power electronics module are AC supply connections. The supply circuit is a multi-phase circuit for providing a plurality of phase voltages on a plurality of phase conductors. The selection circuit connects a phase conductor to the at least one load connection of the power electronics module.

Abstract: An antenna assembly for emitting microwaves comprises a dielectric hollow conductor element and a support element, wherein the hollow conductor element has an electrically conductive surface along a circumferential lateral face, the hollow conductor element has an electrically non-conductive emission face, and the hollow conductor element has a coupler receptacle. The support element contains a material having a modulus of elasticity of no less than 50 GPa. The support element surrounds the hollow conductor element at least along the lateral face. The hollow conductor element is fixed in the support element. The support element has an emission opening, and the emission face aligns with the emission opening. The hollow conductor element has a permittivity of no less than 8 at 2 GHz, the hollow conductor element containing a ceramic material, in particular aluminium oxide, zirconium oxide or titanium oxide.

Abstract: An over-the-air (OTA) test system is described. The OTA test system includes an antenna positioner with at least one test antenna. The OTA test system further including a DUT positioner, wherein the DUT positioner is configured to hold a device under test in a measurement zone. The antenna positioner is configured to rotate the at least one test antenna around the measurement zone by adapting an elevation angle of the test antenna. The DUT positioner is configured to tilt the device under test by a predefined angle with respect to a height direction of the OTA test system, thereby adapting an elevation angle of the device under test. Further, an OTA test method is described.

Abstract: Disclosed is an apparatus for inspecting a defect of a display panel. The apparatus for inspecting includes the display panel that displays an image, an input sensor that is disposed on the display panel and senses an input applied from outside, a sensor driving part that drives the input sensor, and an inspection part that is connected with the sensor driving part, sets a frequency of the input sensor to an inspection frequency, and detects the defect of the display panel based on a change in a jitter occurring when the input sensor is driven at the inspection frequency. The inspection frequency includes a harmonic frequency of a driving frequency of the display panel.

Abstract: The invention relates to a fault current detection device for an overhead power line. The fault current detection device is configured to apply a fault detection algorithm which includes a duration test and a return to normal test. The fault current detection device reports a fault current to a remote fault monitoring device only if both tests are passed. The fault monitoring device is configured to apply an alert ranking algorithm to determine which of a plurality of the fault current detection devices is closest to a fault. The alert ranking algorithm includes identifying or establishing a location of an upstream source associated with the fault current detection devices and classifying the fault current detection device which is the furthest downstream from the upstream source as the closest to the fault. A fault current detection method and a fault detection system and method are disclosed.

Abstract: The present disclosure relates to a shield box for testing a mobile telecommunication terminal in which an increase in temperature in a shield box is prevented in performing various tests on a mobile telecommunication terminal having multiple antennas in an Over The Air (OTA) method to perform a stable test. The shield box for testing a communication terminal of the present disclosure includes a shield box main body made of metal, having a jig entrance formed on the front side, and equipped with a vent which a plurality of vent holes of 1 to 10 mm in size are formed on the upper and rear sides, respectively; a test jig assembly installed to be able to enter and exit through the jig entrance while mounting a PCB for non-contact wireless connection in which a plurality of non-contact wireless connection parts that are wirelessly connected to a mobile telecommunication terminal and transmit and receive signals are arranged; and a ventilation fan mounted on the upper vent or the rear vent.

Abstract: In accordance with an embodiment, a circuit includes a plurality of comparators disposed on an integrated circuit, the plurality of comparators having inputs coupled to a monitored power supply line; and a voting circuit having inputs coupled to outputs of the plurality of comparators. An output of the voting circuit is configured to provide a signal indicative of a brown out condition of a power source coupled to the monitored power supply line.

Abstract: Systems and methods for identifying and managing stress conditions, risk state or aging state associated with capacitors associated with electrical equipment in an electrical power system are disclosed herein. In one aspect, a method for identifying and managing stress conditions, risk state or aging state associated with at least one capacitor includes detecting at least one of motion of and sounds associated with the at least one capacitor, and analyzing at least the detected at least one of motion of and sounds associated with the at least one capacitor to identify possible stress conditions, risk state or aging state associated with the at least one capacitor and associated components. In response to identifying possible stress conditions, risk state or aging state, probable impacts of the possible stress conditions, risk state or aging state on the at least one capacitor and associated components may be determined.

Abstract: An insulation resistance detection circuit is coupled to a positive end and a negative end of a DC power source, and is used to detect a positive insulation resistance between the positive end and a ground point and detect a negative insulation resistance between the negative end and the ground point. A detection unit sets a first estimated resistance and a second estimated resistance, and acquires a first voltage based on turning on the switch and acquires a second voltage based on turning off the switch. The detection unit calculates a third voltage and a fourth voltage according to the first estimated resistance and the second estimated resistance so as to detect the positive insulation resistance and the negative insulation resistance when the third voltage is equal to the first voltage and the fourth voltage is equal to the second voltage.

Abstract: Systems and methods for identifying one or more points of interest in pipes or drain lines are described. Examples of points of interest include blockages caused by debris in the pipe or drain line. The systems are incorporated into drain cleaning machines. Also described are drain cleaning machines utilizing the systems.

Abstract: The MEMS probe card of the invention belongs to the technical field of IC manufacturing industry, and specifically relates to the manufacturing of micro-electromechanical systems, testing of semiconductor bare chip and related key technologies; From top to bottom, the probe card comprises a stiffener, a PCB board, an adapter layer, a guide plate and a MEMS probe; the invention not only discloses a MEMS probe card, but also discloses a new manufacturing process of a MEMS probe card, including the structure of MEMS probe card, the etching equipment and method of guide plate-MEMS probe structure template, the probe positioning method of etching the guide plate-MEMS probe structure template, the manufacturing method of the guide plate-MEMS probe structure and the docking device and method of the guide plate-MEMS probe structure and the adapter layer to finally realize the manufacturing of a submicron-sized MEMS probe card.

Abstract: A rapid detection device for multi-channel sporadic transient partial discharge, comprising a CPU and several partial discharge detection circuits. The partial discharge detection circuits are connected to a plurality of ports of the CPU one to one, respectively. First, a partial discharge pulse signal is filtered and amplified by means of a partial discharge pulse signal processing module in the partial discharge detection circuits, and is then inputted to a comparator, and a reference voltage passes through the CPU and is sent to a reference voltage processing module for amplification, filtering and other processing, and then is inputted to the comparator, so that the comparator processes same according to the partial discharge pulse signal and the reference voltage and then inputs same to a trigger. Finally, according to a level signal at an output terminal of the trigger, the CPU determines whether partial discharge occurs in a circuit to be detected.

Abstract: In some embodiments, a semiconductor wafer testing system is provided. The semiconductor wafer testing system includes a semiconductor wafer prober having one or more conductive probes, where the semiconductor wafer prober is configured to position the one or more conductive probes on an integrated chip (IC) that is disposed on a semiconductor wafer. The semiconductor wafer testing system also includes a ferromagnetic wafer chuck, where the ferromagnetic wafer chuck is configured to hold the semiconductor wafer while the wafer prober positions the one or more conductive probes on the IC. An upper magnet is disposed over the ferromagnetic wafer chuck, where the upper magnet is configured to generate an external magnetic field between the upper magnet and the ferromagnetic wafer chuck, and where the ferromagnetic wafer chuck amplifies the external magnetic field such that the external magnetic field passes through the IC with an amplified magnetic field strength.

Abstract: The invention relates to a method for determining a set-point voltage for a piezoelectric actuator system to achieve a desired optical response of the piezoelectric actuator system, such as an optical power. The method is based on a mathematical model, OP(V,T,n) describing a relationship between the applied voltage and the optical response. Calibration and use of the model involves determining a transition time count value. During use, e.g. at given intervals, the model is updated based on actual values of the temperature and the transition time count value. The set-point voltage required to achieve a desired optical response is determined based on the updated model and the set-point voltage is applied to the piezoelectric actuator.

Abstract: Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a flexible sideband support system comprises a load board, testing electronics coupled to the load board, a controller coupled to the testing electronics. The load board is configured to couple with a plurality of devices under test (DUTs), wherein the load board includes in-band testing ports and sideband testing ports. The testing electronics is configured to test the plurality of DUTs, wherein a portion of testing electronics are organized in sideband resource groups. The controller is configured to direct testing of the DUTs, wherein the controller is coupled to the testing electronics and the controller directs selective allocation of the testing electronics in the sideband resource groups to various testing operations of the DUTs.

Abstract: A manufacturing process for electrode of neuromodulation probe includes the steps of: preparing a plurality of the manufacturing fixtures for electrode of neuromodulation probe; preparing a plurality of the manufacturing fixtures for electrode in a surrounding manner by having the first-layer frames to be externally disposed side by side with the bevels of the two neighboring first-layer frames close to each other, so that the second-layer frames, the plurality of electrodes and the plurality of wires are enclosed thereinside; placing a cylinder amid the plurality of manufacturing fixtures for electrode to have the plurality of wires to surround the cylinder; having a fluid plastic to surround the cylinder by filling all the spaces between the plurality of wires and the plurality of electrodes, and waiting the fluid plastic to cure; removing the plurality of first-layer frames and the plurality of second-layer frames; and, pulling off the cylinder.

Abstract: Systems, methods, and apparatus for corona detection using audio data are provided. In one example embodiment, the method includes obtaining, by one or more computing devices, audio data during at least one time interval, the time interval including a plurality of time windows; partitioning, by the one or more computing devices, the audio data into a plurality of window audio data each corresponding to a respective one of said time windows; and determining, by the one or more computing devices, a signal indicative of a presence of corona based at least in part on at least one window audio data relative to a remainder audio data.

Abstract: The invention discloses a field detection device and system for achieving no maintenance of a gas density relay. The field detection device comprises a temperature adjusting mechanism and an intelligent control unit, wherein rise and fall of the temperature of the temperature adjusting mechanism are controlled by the intelligent control unit, thereby making the temperature of a temperature compensation component of the density relay rise and fall to complete the field detection of the gas density relay, and no maintainer is needed to operate on site, which achieves no maintenance of the gas density relay, and greatly improves the efficiency and reliable and safe running of power grids. The invention further provides a field detection method for supporting normal running of the field detection device above.

Abstract: A method and apparatus for configuring a conductive plane for electromagnetic compatibility test of equipment or device. A positioning object is fixed above the plane of a conductive plane, the positioning object contacts an equipment under test (EUT), and the distance from the EUT to the conductive plane is equal to the distance from the positioning object to the conductive plane plus the thickness of the positioning object, thereby avoiding an error in measurement caused by a change in the distance from the conductive plane to the EUT during each test. In addition, the device is portable, and the conductive plane does not need to be grounded, and may be applied to a production site or field in which no grounding is available.