Patents Examined by Thang X Le
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Patent number: 11789079Abstract: A measurement system is described. The measurement system includes a test-and-measurement (T&A) circuit and an error analysis circuit. The T&A circuit is configured to generate measurement data. The measurement data includes at least one of analysis data and configuration data. The analysis data is associated with an analysis of at least one input signal. The configuration data is associated with at least one of a physical measurement setup of the measurement system and measurement settings of the measurement system. The T&A circuit further is configured to generate a graphic representation of the measurement data. The error analysis circuit is configured to identify errors or anomalies associated with the measurement data based on the graphic representation. Further, a measurement method is described.Type: GrantFiled: March 24, 2021Date of Patent: October 17, 2023Assignee: Rohde & Schwarz GmbH & Co. KGInventor: Michael Feilen
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Patent number: 11789056Abstract: An electromagnetic stirrer including: a shaft body extending in a first direction; and a plurality of stirring blades disposed on the shaft body, in which the plurality of stirring blades include a first stirring blade and a second stirring blade, the first stirring blade and the second stirring blade are aligned from a reference position of the shaft body in the first direction in order of the first stirring blade and the second stirring blade, a shape of the first stirring blade and a shape of the second stirring blade are similar to each other, and a size of the first stirring blade is different from a size of the second stirring blade.Type: GrantFiled: July 15, 2020Date of Patent: October 17, 2023Assignee: TDK CORPORATIONInventors: Masataka Midori, Hiroshi Kurihara, Yutaka Sakai, Hiroyuki Nedate
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Patent number: 11782086Abstract: A method for obtaining board parameters of a printed circuit board, including the following steps: obtaining parameter information of a stripline on the printed circuit board; obtaining physical parameters of the stripline based on the parameter information of the stripline and a predetermined electromagnetic simulation application; calculating required board parameters of the printed circuit board based on the parameter information and the physical parameters of the stripline. In the present disclosure, the physical parameters of the stripline are obtained based on the physical nature of the stripline on the printed circuit board, and there is no need for fitting or adopting a hypothetical model in order to obtain board parameters corresponding to each frequency point of the stripline; the present disclosure is simple and straightforward during operation, and the obtained board parameters of the printed circuit board are highly accurate.Type: GrantFiled: July 8, 2022Date of Patent: October 10, 2023Assignee: Montage Electronics (Shanghai) Co., Ltd.Inventors: Wenjuan Zhang, Yu Zhong, Gang Yan, Zhongyuan Chang
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Patent number: 11782080Abstract: The present invention is a remotely controlled, automated shielding effectiveness test system for hardening against the effects of high altitude electromagnetic pulses. The system monitors and reports the on-going effectiveness of an enclosure that shields electronic devices and communications systems from electromagnetic pulses. The system reports provide information to a user to determine whether corrective action is needed for the enclosure to ensure continued protection of the electronic devices and communications systems within the enclosure. The system comprises providing a high-altitude electromagnetic pulse (HEMP) enclosure enclosing at least an electronic device, and an electronic testing apparatus for testing effectiveness of HEMP shielding of the enclosure; and performing a shielding effectiveness test by the apparatus on the enclosure, comprising a first compression sub-test, a second environment sub-test, and a third final shielding effectiveness sub-test.Type: GrantFiled: July 30, 2021Date of Patent: October 10, 2023Assignee: JaXon Engineering and Maintenance LLCInventors: Robert N Bogojevich, Chris T. Martin, Kelly L. Rice, David S. Robley, Blake L. Smith
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Patent number: 11774483Abstract: A method for measuring performance of at least one DUT in a reverberation chamber over a frequency band, the method including, iteratively: generating a fading scenario by the reverberation chamber; identifying at least one measurement sub-band included in the frequency band, wherein the at least one measurement sub-band complies with a gain flatness criterion; measuring performance of the at least one DUT in the at least one identified measurement sub-band, thereby generating at least one performance measurement result; accumulating the at least one performance measurement result; and determining measurement coverage and terminating the performance measurement in case the measurement coverage meets a coverage criterion.Type: GrantFiled: April 29, 2020Date of Patent: October 3, 2023Assignees: BLUETEST AB, GEFLE TESTTEKNIK ABInventors: Peder Malmlöf, Robert Rehammar
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Patent number: 11774499Abstract: A relay diagnosis apparatus includes a first voltage detection circuit to generate first and second diagnosis voltages between positive and negative electrode terminals of a battery assembly and a chassis, respectively; and a controller to determine first and second insulation resistances between the positive and negative electrode terminals and the chassis, respectively, based on the first and second diagnosis voltages at first and second time points while respective relays are controlled into an off-state. The controller determines third and fourth insulation resistances between the positive and negative electrode terminals and the chassis, respectively, based on the first and second diagnosis voltages at third and fourth time points while the first and second relays are controlled into an on-state. The controller detects relay faults based on the insulation resistances.Type: GrantFiled: September 28, 2021Date of Patent: October 3, 2023Inventor: Jong-Il Park
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Patent number: 11768231Abstract: This application provides a current measurement circuit including: an amplification unit, configured to amplify an electrical signal from the sensor unit; a comparison unit, configured to obtain an initial pulse signal based on a voltage signal output by the amplification unit and a preset voltage; a delay unit, electrically connected to the comparison unit and configured to delay an output of the initial pulse signal to obtain a target pulse signal; a resistance unit, wherein two terminals of the resistance unit are electrically connected to an input terminal of the amplification unit and an output terminal of the delay unit respectively, and the resistance unit is configured to charge and discharge the amplification unit based on the target pulse signal; and a calculation unit, electrically connected to the delay unit and configured to calculate a target current based on the target pulse signal output by the delay unit.Type: GrantFiled: May 17, 2023Date of Patent: September 26, 2023Assignee: QITAN TECHNOLOGY LTD., CHENGDUInventors: Qiang E, Jin Wang, Xi Hu
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Patent number: 11768234Abstract: An insulation inspection device includes: a conveyance unit that conveys a laminated electrode in which a first separator, a first electrode plate, a second separator, and a second electrode plate are laminated; a pressure roll that presses the laminated electrode against the conveyance unit; a first terminal electrically connected to the first electrode plate; a second terminal electrically connected to the second electrode plate, further electrically connected to the conveyance unit when the first separator is disposed on the conveyance unit side, and further electrically connected to the pressure roll when the first separator is disposed on the pressure roll side; and an insulation inspection unit that applies a voltage to the laminated electrode to inspect insulation condition of the laminated electrode.Type: GrantFiled: March 25, 2021Date of Patent: September 26, 2023Assignees: PANASONIC HOLDINGS CORPORATION, TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Yasushi Taniguchi, Haruhisa Yagi, Noriyuki Maruyama, Noriaki Yamamoto, Takahiro Kuhara
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Patent number: 11761998Abstract: The present disclosure relates to a method for determining a conductivity value of a measurement medium using a conductivity sensor. The method includes providing a conductivity sensor with at least one transmitting unit, at least one receiving unit, and a control unit having a storage module, and transmitting a stimulation signal into the measurement medium at the transmitting unit by the control unit. The method also includes receiving a detection signal at the receiving unit, determining a signal quality indicator by the control unit based on the detection signal, and determining a conductivity signal corresponding to the detection signal. The method further includes storing the conductivity signal, determining a dynamic factor by the control unit based on the conductivity signal, filtering the conductivity signal using a filter function depending on the determined signal quality indicator and the dynamic factor, and outputting a filtered measured value of the filtered conductivity signal.Type: GrantFiled: September 12, 2022Date of Patent: September 19, 2023Assignee: Endress+Hauser Conducta GmbH+Co. KGInventors: Stefan Paul, Thomas Nagel
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Patent number: 11761975Abstract: An inductive rotational speed sensor, including: a coil body having a coil and connecting lines which at least partially extend axially or radially with respect to the coil windings; a casing formed from a plastics material and at least partially enclosing the coil body; and a fixing device for facilitating a configuration of the casing, the fixing device including: for radially extending connecting lines, a material core clearance in the casing so as to fix the electrical connecting lines at a mutual spacing when configuring the casing; or an anti-twist safeguard to prevent the coil body rotating relative to a tool used for configuring the casing while the latter is being configured, wherein the anti-twist safeguard partially protrudes from the casing, or extends at least up to an external surface of the casing. Also described is a related method.Type: GrantFiled: December 3, 2019Date of Patent: September 19, 2023Assignee: KNORR-BREMSE SYSTEME FUER NUTZFAHRZEUGE GMBHInventors: Klaus Lechner, Andre Kluftinger, Christoph Huber, Ines Fruhstorfer, Martin Buettner, Stefan Palzer
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Patent number: 11747372Abstract: One example discloses a differential-signal-detection circuit, comprising: an input stage configured to receive a differential input signal and to output a first differential output signal and a second differential output signal; a first comparator coupled to receive the first differential output signal and generate a first comparator output signal; a second comparator coupled to receive the second differential output signal and generate a second comparator output signal; and an output stage configured to receive the first and second comparator output signals and generate a differential-signal-detection signal.Type: GrantFiled: October 1, 2021Date of Patent: September 5, 2023Assignee: NXP USA, Inc.Inventors: Xiaoqun Liu, Siamak Delshadpour
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Patent number: 11747383Abstract: Embodiments of the present invention provide systems and methods for performing tests on a device under test (DUT) based on training data derived from a set of training DUTs using nearfield measurement data. Nearfield measurement data can be mapped to performance metrics that approximate performance metrics derived from the far-field measurement data. Nearfield measurements can then be performed on a DUT to generate second nearfield measurement data, and performance metrics of the DUT are generated using the second nearfield measurement data and the mapped performance metrics derived from the training DUTs.Type: GrantFiled: June 2, 2022Date of Patent: September 5, 2023Assignee: Advantest CorporationInventor: José Moreira
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Patent number: 11740273Abstract: A radiation susceptibility testing method includes transmitting radiation waves to a device under test, measuring the device under test to obtain a first voltage according to the radiation waves, outputting a reference voltage to a coupling device so that the coupling device generates a second voltage according to the reference voltage, adjusting the reference voltage to approximate the second voltage to the first voltage, storing the adjusted reference voltage, and outputting the second voltage to the device under test according to the adjusted reference voltage to simulate the impact of the radiation waves to the device under test.Type: GrantFiled: June 16, 2022Date of Patent: August 29, 2023Assignees: Inventec (Pudong) Technology Corp., Inventec CorporationInventors: Yung-Sen Lee, Yuan-Ho Chen
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Patent number: 11733287Abstract: A testing circuit includes a first circuit and a second circuit. The first circuit and second circuit have a first capacitor and a second capacitor. The first circuit is connected to a first transistor. The second circuit is connected to a second transistor. A first inductor has a first terminal connected to an input of the testing circuit and a second terminal connected to a source of the second transistor. A first diode has an anode connected to ground and a cathode connected to the second terminal of the first inductor. The second capacitor has a first terminal connected to a drain of the second transistor and a second terminal connected to ground. The first capacitor has a first terminal connected to the input of the testing circuit and a second terminal connected to ground.Type: GrantFiled: August 15, 2022Date of Patent: August 22, 2023Assignee: INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.Inventors: Jihua Li, Tao Zhang, Wenjie Lin
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Patent number: 11733315Abstract: An apparatus for detecting a stacking direction of internal electrodes of a multilayer capacitor includes a capacitor moving unit having a supply unit in which a plurality of multilayer capacitors are continuously supplied ad moving the supplied multilayer capacitors in one direction, a sensor unit including a coil, installed on the capacitor moving unit, and detecting inductance of the coil when each of the multilayer capacitors approaches the coil to determine a stacking direction of internal electrodes of the multilayer capacitor based on the detected inductance of the coil, and a separating unit installed on the capacitor moving unit and separating a multilayer capacitor selected as an unsuitable multilayer capacitor by the sensor unit.Type: GrantFiled: May 16, 2022Date of Patent: August 22, 2023Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.Inventors: Soo Hwan Son, Se Hun Park, Byeong Cheol Moon, Young Ghyu Ahn
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Patent number: 11733290Abstract: Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a flexible sideband support system comprises a load board, testing electronics coupled to the load board, a controller coupled to the testing electronics. The load board is configured to couple with a plurality of devices under test (DUTs), wherein the load board includes in-band testing ports and sideband testing ports. The testing electronics is configured to test the plurality of DUTs, wherein a portion of testing electronics are organized in sideband resource groups. The controller is configured to direct testing of the DUTs, wherein the controller is coupled to the testing electronics and the controller directs selective allocation of the testing electronics in the sideband resource groups to various testing operations of the DUTs.Type: GrantFiled: March 8, 2021Date of Patent: August 22, 2023Assignee: Advantest CorporationInventors: Srdjan Malisic, Chi Yuan, Seth Craighead
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Patent number: 11733291Abstract: The present application discloses a chip socket for testing a semiconductor chip. The chip socket includes a pedestal and a fastener. The pedestal accommodates a chip to be tested. The fastener includes a top body and a base body. The top body includes a probing window, wherein a first opening area of the probing window at an outer surface of the top body is larger than a second opening area of the probing window at an inner surface of the top body. The base body is attached to the pedestal and locked to the top body when the top body covers the base body and clamps the chip. When the top body covers the base body, the probing window reveals a surface of the chip, allowing a probe to contact the surface of the chip through the probing window.Type: GrantFiled: June 8, 2022Date of Patent: August 22, 2023Assignee: NANYA TECHNOLOGY CORPORATIONInventor: Yi-Kai Chao
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Patent number: 11726131Abstract: The present disclosure provides a detection system that includes a first sensing device configured for sensing an acoustic wave and an electromagnetic wave and generating a first combined signal and a signal processing device configured to determine the occurrence and properties of an electrical discharge.Type: GrantFiled: July 20, 2021Date of Patent: August 15, 2023Assignee: ABB Schweiz AGInventors: Kai Hencken, Holger Kaul, Jörg Gebhardt, Yannick Maret, Andrej Krivda
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Patent number: 11719737Abstract: A sensing arrangement for detection of electrical discharges in an electrical apparatus is described. The sensing arrangement includes an acoustic sensor and a signal enhancing structure with a funnel region. The acoustic sensor is positioned outside the funnel region on an apex side of the funnel region. An electrical switchgear is described. The electrical switchgear includes a sensing arrangement for detection of electrical discharges in an electrical apparatus. The sensing arrangement includes an acoustic sensor and a signal enhancing structure with a funnel region.Type: GrantFiled: May 7, 2021Date of Patent: August 8, 2023Assignee: ABB Schweiz AGInventors: Jörg Gebhardt, Holger Kaul, Kai Hencken
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Patent number: 11719731Abstract: Provided are a method, apparatus and system for measuring a resistance parameter of a grounding system, and a monitoring network. The method comprises: inputting a driving current into a plurality of sections of a grounding system path (S602), wherein the grounding system path comprises at least a grounded apparatus, a grounding body, and a downlead connecting the grounded apparatus and the grounding body; measuring response voltages generated by the plurality of sections, and acquiring a response current flowing through the downlead (S604); and determining a resistance parameter of the grounding system path according to the driving current, the response voltages and the response current (S606).Type: GrantFiled: June 24, 2020Date of Patent: August 8, 2023Assignee: KINGMORE UNION (BEIJING) SCIENCE & TECHNOLOGY DEVELOPMENT CO., LTD.Inventor: Kaimao Zhou