Abstract: A method for factory analysis and/or maintenance, preferably including receiving factory information and/or associating metrics with factory components, and optionally including acting based on defect associations and/or operating factory machines. The method is preferably associated with one or more manufacturing systems and/or elements thereof.

Abstract: A system for the automated validation of a semi-anechoic chamber (SAC) is disclosed. The system includes a receive assembly and a transmit assembly, each configured to autonomously relocate within the SAC. The system also includes a local client communicatively coupled to the transmit assembly. The local client is configured to send a validation arrangement to the transmit assembly describing a validation location and a distance. The transmit assembly is configured to receive the validation arrangement, move the transmit assembly to the validation location and send an instruction to the receive assembly, the instruction describing the distance. The receive assembly is communicatively coupled to the transmit assembly and configured to receive the instruction and move the receive assembly such that a separation between the transmit and receive assemblies is restored to the distance. Each validation arrangement corresponds to a validation point. A plurality of validation points defines a test volume.

Abstract: Disclosed is a magnetometer architecture that couples one or more coils to a magnetic yoke to allow the reset of the magnetic yoke and one or more magnetic field sensors simultaneously after, for example, exposure to a large stray magnetic field. Also, disclosed is a magnetometer architecture that integrates separate magnetic pole pieces offset from the yoke that are each wound by a reset coil to allow reset of the one or more magnetic field sensors.

Abstract: Embodiments of the present application provide a time offset method and device for a test signal. When a signal source sends a test signal to a DUT on a test platform, the offset device can determine a time delay caused by impedance matching of the test signal to the DUT at the upper side of each test location, and conduct time offset for TCK signals sent by the signal source to different DUTs according to the time delay.

Abstract: A method for extracting a characteristic signal from a power frequency signal includes steps of: S1, detecting a voltage half-wave zero-crossing area in a single voltage cycle in the power frequency signal by a signal; superimposing a voltage modulation signal on the voltage half-wave zero-crossing area, and superimposing an instantaneous pulse on a current cycle in the power frequency signal corresponding to the voltage half-wave zero-crossing area; generating the characteristic signal with current cycles and voltage cycles; S2, demodulating whether there is the voltage modulation signal in the power frequency signal, if so, executing step S3; and S3, demodulating the characteristic signal to obtain the current modulation signal and the voltage modulation signal respectively; and determining whether data corresponding to the current modulation signal and date corresponding to the voltage modulation signal are predetermined data, wherein if so, the characteristic signal exists.

Abstract: An electrical prospecting signal transmission device capable of suppressing electromagnetic coupling interference, including a rectangular wave signal source, an output circuit for supplying power to the ground and a plurality of transmission channels. Each of the plurality of transmission channels includes an isolated driving circuit, a low-pass filter circuit and a power amplification circuit connected sequentially in series. The rectangular wave signal source is configured to generate a rectangular wave or a composite rectangular wave. A signal output terminal of the rectangular wave signal source is connected to an input terminal of the isolated driving circuit, and an output terminal of the power amplification circuit is connected to the output circuit to supply power to the ground.

Abstract: Systems and methods for identifying one or more points of interest in pipes or drain lines are described. Examples of points of interest include blockages caused by debris in the pipe or drain line. The systems are incorporated into drain cleaning machines. Also described are drain cleaning machines utilizing the systems.

Abstract: A wafer inspection method and inspection apparatus are provided. On a wafer having layout lines connecting electrode points of individual dies in series, the dies within a matrix range are inspected one after another in turn in a column/row control means by a first switch group and a second switch group of a probe card, so that each die is selectively configured in a test loop of a test process by turning on/off of a corresponding switch. Thus, after inspection of a die under inspection (a selected die) within the matrix range is complete, the column/row control means is used to switch to a next die to achieve fast switching. Accordingly, for the inspection procedure of each die within the matrix region, a conventional procedure of moving one after another in turn can be eliminated, significantly reducing the total test time needed and enhancing inspection efficiency.

Abstract: A device includes a control circuit, a scope circuit, a first logic gate and a second logic gate. The control circuit is configured to generate a first control signal according to a voltage signal and a delayed signal. The scope circuit is configured to generate a first current signal in response to the first control signal and the voltage signal. The first logic gate is configured to perform a first logical operation on the voltage signal and one of the voltage signal and the delayed signal to generate a second control signal. The second logical gate configured to perform a second logical operation on the second control signal and a test control signal to generate a second current signal.

Abstract: Compensating for signal loss, including determining a first expected loss at a first frequency and a second expected loss at a second frequency at a receiver associated with a first lane of a PCB; calculating an expected rate of change of signal loss between the first and the second frequencies based on the first and the second expected losses; calculating a first measured loss of a first signal transmitted at the first frequency and a second measured loss of a second signal transmitted at the second frequency from a transmitter to the receiver along the first lane of the PCB; calculating a measured rate of change of signal loss between the first and second frequencies based on the first and the second measured losses; comparing the measured rate of change with the expected rate of change; compensating a gain of a signal transmitted from the transmitter to the receiver.

Abstract: During the semiconductor testing process, in order to decrease a temperature difference between a predetermined temperature and a measured temperature, the present disclosure provides a wafer probing testing apparatus and a final testing apparatus for semiconductor testing. The wafer probing testing apparatus comprises a printed circuit board, a probe head, a heater, a thermal sensor and a thermal controller. The final testing apparatus comprises a printed circuit board, a socket, a heater, a thermal sensor and a thermal controller. Due to the arrangement of the thermal sensor, the heater and the thermal controller, the temperature difference of the predetermined temperature may be decreased, and the cost during the semiconductor testing can also be reduced.

Abstract: The present disclosure discloses a zero-crossing detection circuit, including: a zero-crossing judgment module, having a first end and a second end, wherein the first end is connected to a power supply and the second end is grounded; a photoelectric coupler, connected to the zero-crossing judgment module; an optocoupler driving module, connected to the photoelectric coupler; and an energy storage capacitor, wherein the energy storage capacitor is configured to provide excitation power for the photoelectric coupler and the optocoupler driving module.

Abstract: An electronic device, according to one embodiment disclosed in the present disclosure, may be configured to: form a beam in any one direction of a first direction and directions rotated by a first angle on the basis of the first direction; control a device under test (DUT) so as to emit a designated signal by using the formed beam; and check antenna performance of the DUT at least on the basis of intensity measured from a signal measuring device. In addition, various embodiments inferred from the specification are also possible.

Abstract: A detector that detects or oscillates an electromagnetic wave, the detector including a plurality of antennas having a rectifying element, wherein the plurality of arranged antennas at least include: a first antenna having a first resonant frequency; and a second antenna having a second resonant frequency that differs from the first resonant frequency.

Abstract: A system for over-the-air testing of a device under test includes a measurement antenna, a reference antenna, a device under test capable of wirelessly transmitting and/or receiving complex radio frequency signals, and an analyzer. The analyzer has at least two ports, wherein the reference antenna is connected with a first port of the analyzer. The measurement antenna is connected with a second port of the analyzer. The analyzer is capable of determining a phase difference and a power ratio of radio frequency signals received via the measurement antenna and the reference antenna. The analyzer is capable of performing an IQ analysis on complex radio frequency signals. Further, a method of over-the-air testing of a device under test is disclosed.

Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.

Abstract: A method for determining an orientation of a movable device. The method includes the steps: determining an extent of the change of the orientation on the basis of data of at least one first sensor unit, comparing the extent to a predetermined threshold value, if the threshold value is exceeded, switching on a second sensor unit if it is in a switched-off state and determining the orientation with the aid of the first sensor unit and the second sensor unit, at an undershoot of the threshold value or if the extent is equal to the threshold value, switching off the second sensor unit, if it is in a switched-on state, and ascertaining the orientation with the aid of the first sensor unit.

Abstract: An inductive sensor (10) has a substrate (20), on which multiple transmitter/receiver coils (31, 32, 33) are arranged side by side. It can be operated in such a way that the transmitter/receiver coils (31, 32, 33) are each stimulated independently of one another at a frequency of more than 100 MHz.

Abstract: A method for detecting a loss or an undervoltage condition of phase of an electric converter unit, wherein the method comprises: determining an extremum value, such as a maximum and/or a minimum value, of a phase voltage of the electric converter unit for at least one fundamental period of the phase voltage, and comparing the extremum value to a first threshold value, and if, based on the comparison, a first threshold criterion related to the first threshold value is satisfied, then determining the loss or the undervoltage condition of phase.

Abstract: An interferometric radioimager provides real-time, high-fidelity radioimaging of high voltage breakdown (HVB) both internal and external to electrical components at sub-nanosecond and sub-millimeter resolution and has an ability to resolve multiple/spatially-extensive HVB simultaneously. Therefore, radioimaging can be used to screen for early life weakness/failure and enable non-destructive screening of defective electrical components. In particular, radioimaging can detect precursors to catastrophic HVB, allowing for early detection of weakness in critical electrical components. Radioimaging can also be used to track HVB and pinpoint defects in electrical components real time, including transformers, capacitors, cables, switches, and microelectronics.