Abstract: A system includes a sensor housing having a base portion, a lid portion, and a joining portion. The joining portion is configured to be wrapped around at least a portion of an electrical wire. The lid portion includes one end detachably coupled to a first end of the base portion and another end coupled to a second end of the base portion via the joining portion. A flexible coil sensor is disposed in the sensor housing; bonded substantially along the base portion and the joining portion and configured to generate a signal representative of a fault in the electrical wire. A processing device is disposed in the sensor housing and configured to detect and locate a fault in the electrical wire in response to the signal representative of the fault in the electrical wire generated by the flexible coil sensor.

Abstract: Initial calibration is performed only under normal-temperature environment, and accurate current control is performed under practical use temperature environment. A temperature sensor 171 is arranged close to a current detection resistor 126 having predetermined temperature characteristics. Resistance values are estimated in a calibration environment and a practical use environment, an actually measured load current in the calibration environment corresponding to a target load current is stored as control characteristic data, a corrected target current corresponding to the target load current is calculated, and a converted target current based on a change ratio of current detection resistance is controlled as a target current for current control. A resistance change amount by heat generation of the current detection resistor 126 which cannot be entirely detected by the temperature sensor 171 is corrected in control characteristic data, such that linearity of control characteristics is improved.

Abstract: According to one embodiment, a semiconductor module comprises a substrate, a first wiring, an electrode pad, a junction, an oscillator, and a detector. The first wiring is disposed on the substrate, and has a characteristic impedance Z0. The electrode pad is connected to the first wiring. The junction is disposed on the electrode pad, and has an impedance Z1. The oscillator is disposed in contact with the first wiring, and oscillates a pulse wave of a voltage toward the junction via the first wiring. The detector is disposed in contact with the first wiring, and detects an output wave of the pulse wave from the junction. The characteristic impedance Z0 and the impedance Z1 satisfy a following relationship (1), ? Z ? ? 0 - Z ? ? 1 Z ? ? 0 ? ? 0.05 .

Abstract: A circuit arrangement determines the closing instant of a valve with a coil that actuates an armature. The circuit has a voltage divider with at least three resistors connected to a measuring node of the coil and to ground. The first resistor is highly resistant in comparison with the other resistors of the voltage divider. A differential amplifier has its output connected to its inverting input via a fourth resistor and its non-inverting input receives a voltage from the voltage divider that represents the current in the coil. A parallel circuit of a capacitor and a resistor is connected between the inverting input and ground. A controllable switching element has a controlled path between the first resistor and the parallel circuit, and a control connection connected to the positive supply potential of the differential amplifier.

Abstract: Provided according to some embodiments of the present invention are electrical double layer (EDL) capacitive devices that include an insulating substrate defining a nanopore therethrough; a nanopore electrode exposed in a portion of the nanopore; and an electrolyte in contact with the nanopore electrode. Also provided are methods of using EDL capacitive devices according to embodiments of the invention to sequence polynucleotides or other polymers and/or to detect analytes.

Abstract: In one embodiment, the present invention includes an apparatus for contacting a plurality of contact locations of a semiconductor device. The apparatus includes a housing, a support member, a plurality of probe members, and an adhesive substance. The housing has a plurality of apertures that provides a low leakage pathway for high frequency signals to reach the semiconductor device through the plurality of probe members. The plurality of probe members are aligned on the support member and the adhesive substance secures the plurality of probe members to the supporting member. The housing, supporting member, and adhesive substance match in thermal expansion to reduce the error in alignment between the plurality of contact locations and the plurality of probe members over a temperature variance.

Abstract: A method of obtaining a material property of a pavement material from a microwave field generally includes generating a microwave frequency electromagnetic field of a first mode about the pavement material. The frequency response of the pavement material in the electromagnetic field can be measured, such as by a network analyzer. The measurement of the frequency response permits correlating the frequency response to a material property of the pavement material sample, such as the density. A method of correcting for the roughness of a pavement material divides the pavement into a shallow layer and a deep layer. Two planar microwave circuits measure the permittivity of the shallow and deep layer. The permittivities are correlated to correct for roughness. An apparatus for obtaining the density of a pavement sample includes a microwave circuit and a network analyzer. The network analyzer measures the frequency response to determine the density of the pavement material.

Abstract: The present invention provides a digitally displaying inspection system for ESD protection chip, which includes an LVDS connector, a display system, first, second, and the third data lines, a power supply, and a resistor. The first, second, and third data lines each have an end electrically connected to the LVDS connector and an opposite end electrically connected to the display system. The display system includes a logic operation module and a digital display module electrically connected to the logic operation module. The logic operation module is electrically connected to the first, second, and third data lines. When an ESD protection chip is electrically connected to the LVDS connector, the logic operation module samples signals on the first, second, and third data lines and drive, after carrying out logic operations, the digital display module to display character signs, which can identify if the ESD protection chip is incorrectly connected.

Abstract: A polarizing optical system (15, 16) is disposed perpendicular to an optical axis of incoming light from a light source (12), having the optical axis (12) as a center axis, and configured for polarization of incoming light to a prescribed reference state, an electro-optical device (17) is disposed perpendicular to the optical axis, having the optical axis as a center axis, and adapted, as a voltage to be measured is imposed thereon, to respond to the imposed voltage by polarizing light polarized by the polarizing optical system (15, 16), and an analyzer (18) is disposed perpendicular to the optical axis, having the optical axis as a center axis, and adapted for detection of light polarized by the electro-optical device (17), to irradiate a detector (21) configured for conversion of incoming light into an electric signal.

Abstract: A relay, in particular for high-current operation, having at least one coil and a movable armature which by the magnetic flux generated in the at least one coil permits or interrupts a current flow via two main contact terminals and having a current-measuring instrument for measuring at least one current flowing via the main contact terminals by at least one Hall sensor has a device around the main contacts for aligning the magnetic flux with the Hall sensor or sensors.

Abstract: The leakage resistance detection device includes a coupling capacitor having one terminal connected to an on-board high voltage device and another terminal connected to a repetitive signal output circuit, and measures a leakage resistance as a function of a transition time during which a monitoring voltage, which is a potential at the another terminal of the coupling capacitor to be charged/discharged in response to an operation of a charge/discharge switching element that operates in response to a repetitive pulse signal, changes from one predetermined voltage to reach another predetermined voltage. When the measured leakage resistance has become equal to or smaller than a predetermined limit leakage resistance, the leakage resistance detection device generates a resistance abnormality determination output.

Abstract: An electronic component testing device includes a first imaging device for imaging an upper-surface electrode of an electronic component before the electronic component is held by a holding part, a second imaging device for imaging a contact terminal provided to a testing head, a third imaging device for imaging a lower-surface electrode of the electronic component held by the holding part, and a fourth imaging device for imaging a testing socket. A control device controls the position adjustment part of the testing head to adjust the position of the holding part, and thereby controlling, based on images captured by the first and second imaging devices, a holding orientation when the holding part holds the electronic component, and controlling, based on the images captured by the third and fourth imaging devices, a holding orientation of the holding part in relation to the testing socket.

Abstract: Apparatus and method for partial discharge detection of turn-to-turn insulation in motor has a surge generator for generating a surge voltage to the windings of the motor by applying a pulse voltage, and a partial discharge current detector for detecting partial discharge currents between the winding turns of the motor. The surge generator generates in and between the windings of the motor the surge voltage that has the rise time and fall time corresponding to the rise time of the surge voltage observed at the motor terminal when the motor is driven by an inverter, and that is repeated at a frequency of 50 Hz to 20 kHz.

Abstract: Systems and methods are provided for testing partially completed three-dimensional ICs. Example methods may incorporate one or more of the following features: design for testing (DFT); design for partial wafer test; design for partial probing; partial IC probecards; partial IC test equipment; partial IC quality determinations; partial IC test optimization; and partial test optimization. Other aspects may also be included. Systems and methods incorporating these features to test partially completed three-dimensional ICs may result in saved time and effort, and less scraped material, as the partial device is not built any further when a bad partial device is detected. This results in lower costs and higher yield.

Abstract: A multi-layer tamper detection arrangement for use with an input device comprising tamper-response electronics and memory. The multi-layer sensor arrangement comprises a flexible circuit assembly configured for connection to the input device. The flexible circuit assembly comprises an outer layer comprising a first tamper-responsive conductor circuit and a first inner layer disposed beneath the outer layer. The first inner layer comprises at least one switch, a removal detection circuit, and a foreign conductor detection circuit. The at least one switch is configured to close the removal detection circuit when the at least one switch is actuated, and the foreign conductor detection circuit is normally open. The first tamper-responsive conductor circuit, the removal detection circuit, and the foreign conductor detection circuit are configured for electrical communication with the tamper-response electronics of the input device.

Abstract: A current sensor for detecting a first electric current flowing through a current path includes a sensor chip, a coil, a current control circuit, and an output circuit. The sensor chip includes a magnetoresistive element and is adopted to be located near the current path. The coil applies a bias magnetic field to the magnetoresistive element. The current control circuit supplies a second electric current to the coil. The second electric current periodically changes in polarity. The output circuit outputs a difference between a first voltage and a second voltage. The first voltage is generated by the magnetoresistive element, when the second electric current flowing through the coil has a positive polarity. The second voltage is generated by the magnetoresistive element, when the second electric current flowing through the coil has a negative polarity.

Abstract: An apparatus and method for determining a status of a power unit in a portable terminal are provided. The apparatus includes a power unit for supplying power to a internal circuit, a resistor located between the power unit and the internal circuit, and a voltage determination unit for determining an amount of a current consumption by the internal circuit by considering a difference between a first voltage between the power unit and the resistor and a second voltage between the resistor and the internal circuit, and for determining status information of the power unit by compensating for a voltage drop of the first voltage in accordance with the amount of the current consumption.

Abstract: A disclosed electromagnetic survey system includes one or more streamer(s) having multiple electromagnetic sensors and motion sensing units. Each motion sensing unit has one or more accelerometer(s) to measure motion perpendicular to an axis of the streamer, and a rotation sensor to measure rotation about the axis. The measurements of the accelerometer are adjusted based on measurements from the rotation sensor. The survey system also includes one or more processor(s) that determine, for each electromagnetic sensor, a motion signal based on the adjusted measurements. A described electromagnetic survey method includes processing acceleration and rotational motion measurements to obtain an orientation of motion sensing units as a function of time. The measured acceleration is manipulated based on the orientation to obtain one or more velocity signal(s) for each motion sensing unit. Interpolation is performed on the velocity signals to determine at least one velocity signal for each electromagnetic sensor.

Abstract: A test handler comprises a package support for holding an electronic device in a certain orientation and for transporting the electronic device to a testing station for testing the electronic device. An orientation correction device is actuable and operative to engage the package support and to rotate the package support so as to change the orientation of the electronic device.

Abstract: An automatic switching mechanism is controlled by a probe card independent from a tester without limitation of the number of control signals from the tester. A probe card and an inspection apparatus include probes to be brought into contact with electrodes of inspection targets and a power supply channel electrically connecting the probes to a tester. The automatic switching mechanism divides each of the power supply channels into a plurality of power supply wiring portions, which are respectively connected to the probes; and shuts off the power supply wiring responsive to electrical fluctuation such as overcurrent. An electrical fluctuation detection mechanism detects an electrical fluctuation due to a defective product among the inspection targets. A control mechanism, responsive to detection of an electrical fluctuation, shuts off the power supply wiring portion if the electrical fluctuation is caused by the automatic switching mechanism.