Abstract: Apparatus is provided for determining the clearance between a member and a casing surface over and relative to which the member moves, e.g. in a gas turbine engine. The apparatus includes a main waveguide and a reference element that is provided at a position intermediate the proximal and distal ends, or at the distal end, of the waveguide. The transmitter/receiver is arranged to transmit an electromagnetic signal through the main waveguide and receive (i) a first portion of the electromagnetic signal reflected from the reference element, (ii) a second portion of the electromagnetic signal reflected from the casing surface, and (iii) a third portion of the electromagnetic signal reflected from the member, allowing the relative positioning of the reference element, the casing surface and the member to be simultaneously determined.

Abstract: An electrical interconnection integrated device is described, comprising: a plurality of electrical terminals connectable to an integrated electronic circuit on a chip common to said interconnection device; at least an inside electrical device provided with a respective input connected to a first terminal of said plurality and a respective output; a fault detecting logic module having a first input connected to said output of the inner electrical device and provided with a detecting terminal for supplying a fault detecting signal.

Abstract: System and method for determining closure of an electronic device. The electronic device may include a top portion and a bottom portion, and may be connecting via a hinge or other closing mechanism. The top portion and/or the bottom portion may include one or more capacitive sensors which provide signals corresponding to physical contact and a controller coupled to the one or more capacitive sensors. The controller may operate to receive the signals from the one or more capacitive sensors, determine if the electronic device has been closed based on the received signals, and initiate a sequence of events corresponding to the closure of the electronic device. The sequence of events may result in the device entering a low power state.

Abstract: A sensor temperature compensation circuit that includes a sensor and non-linear temperature compensation circuit that compensates for non-linear temperature dependencies in offset and/or gain generated by the sensor. For instance, to at least partially compensate for offset temperature dependencies, a summer adds two offset compensation signals, the ratio of the second to the first being a function of temperature. The summed signal may then be multiplied by a function of temperature. The summed signal may then be used to provide the non-linear temperature compensation to the offset. Alternatively or in addition, to at least partially compensate for gain temperature dependencies, a summer adds two gain compensation signals, the ratio of the second to the first being a function of temperature. The summed signal may then be multiplied by a function of temperature. The summed signal may then be used to provide non-linear temperature compensation to the gain.

Abstract: Low cost millimeter wave imagers using two-dimensional focal plane arrays based on backward tunneling diode (BTD) detectors. Two-dimensional focal arrays of BTD detectors are used as focal plane arrays in imagers. High responsivity of BTD detectors near zero bias results in low noise detectors that alleviate the need for expensive and heat generating low noise amplifiers or Dicke switches in the imager. BTD detectors are installed on a printed circuit board using flip chip packaging technology and horn antennas direct the waves toward the flip chip including the BTD detectors. The assembly of the horn antennas, flip chips, printed circuit board substrate, and interconnects together work as an imaging sensor. Corrugated surfaces of the components prevent re-radiation of the incident waves.

Abstract: An apparatus, system, and method for lightning strike protection and verification are provided. In one embodiment, the apparatus includes at least one fastener extending through both the structure and substructure to secure the structure and substructure together. The apparatus also includes an insert disposed between the substructure and at least a portion of the fastener, where the insert includes dielectric and magnetizable material such that the insert is capable of reducing the incidence of sparking between at least one component associated with the fastener and the substructure.

Abstract: A micromechanical device may include one or more piezoresistive elements whose electrical resistance changes in response to externally or internally induced strain. The present invention leverages the piezoresistive properties of such devices to sense the positional state of the device. A sensing circuit may be integrated into the device that senses an electrical resistance of at least a portion of the micromechanical device and provides information regarding the positional state of the micromechanical device. The micromechanical device may be a compliant device that includes relatively flexible members such as mechanical beams or ribbons. The positional states may be continuous positional states (such as the position of an actuator) or discreet positional states (such as the positional state of a bistable memory device). In certain embodiments, the micromechanical device is a threshold detector that latches to a particular stable configuration when an applied force exceeds a selected value.

Abstract: Low cost millimeter wave imagers using two-dimensional focal plane arrays based on backward tunneling diode (BTD) detectors. Two-dimensional focal arrays of BTD detectors are used as focal plane arrays in imagers. High responsivity of BTD detectors near zero bias results in low noise detectors that alleviate the need for expensive and heat generating low noise amplifiers or Dicke switches in the imager. BTD detectors are installed on a printed circuit board using flip chip packaging technology and horn antennas direct the waves toward the flip chip including the BTD detectors. The assembly of the horn antennas, flip chips, printed circuit board substrate, and interconnects together work as an imaging sensor. Corrugated surfaces of the components prevent re-radiation of the incident waves.

Abstract: An electric field object sensing system uses a charge pumping circuit to provide a voltage over a capacitor that varies dependent upon the capacitive coupling between a transmitter electrode and a receiver electrode. The output of the charge pump is preferably fed to a high impedance read-out means, such as an analog-digital converter (ADC). The system is preferably implemented in CMOS and integrated in control circuits of electronic products.

Abstract: The “discrete frequency stir” (DFS) method provides improved mode stir testing of electromagnetic characteristics of an enclosure/cavity. Adequate sampling of the electric field inside the enclosure/cavity is provided by electronic perturbation or “stirring” of the field with a short duration, continuous wave, radiated source where the wave frequency is stepped in small steps across a frequency range of interest. The frequency steps are selected to be at least slightly larger than the resonant mode bandwidth associated with the given enclosure/cavity in order to provide statistically independent measurements. A stirring bandwidth is selected to encompass a statistically significant number of these measurement samples while maintaining adequate frequency resolution. A statistical evaluation of the measured field is then performed over this stirring bandwidth.

Abstract: A micromechanical device may include one or more piezoresistive elements whose electrical resistance changes in response to externally or internally induced strain. The present invention leverages the piezoresistive properties of such devices to sense the positional state of the device. A sensing circuit may be integrated into the device that senses an electrical resistance of at least a portion of the micromechanical device and provides information regarding the positional state of the micromechanical device. The micromechanical device may be a compliant device that includes relatively flexible members such as mechanical beams or ribbons. The positional states may be continuous positional states (such as the position of an actuator) or discreet positional states (such as the positional state of a bistable memory device). In certain embodiments, the micromechanical device is a threshold detector that latches to a particular stable configuration when an applied force exceeds a selected value.

Abstract: The device (1) allows the detection of small quantities of electrical charge (Qs) utilised for recognition of the gybridisation process of a single strand of DNA. It comprises a chip (2) in which is integrated an MOS device having a floating gate (7) a first portion (7a) of which extends in facing relation to a recess (8) formed in a surface of the chip (2) and accessible from outside the chip (2) and operable to retain an electrical charge (Qs) to be measured bound to it. A second portion (7b) of the gate (7) of the MOS device is coupled to a control electrode, (10) of the chip (2) by means of a capacitor (12) of predetermined value within the chip (2).

Abstract: A radar system is disclosed. The radar system comprises an antenna mounting apparatus coupled to the aircraft, and an antenna rotatably coupled to the mounting apparatus. The antenna is configured to rotationally orientate for an azimuth scan and electronically orientate for a tilt scan.

Abstract: A system and method for testing devices. The system includes a plurality of pads and a decoder coupled to a plurality of devices. The decoder is configured to receive a plurality of selection signals from the plurality of pads and select a device from the plurality of devices based on at least information associated with the plurality of selection signals. Additionally, the system includes one or more pads connected to the selected device. At least one of the one or more pads is not connected to any of the plurality of devices other than the selected device. The one or more pads are used for testing the selected device.

Abstract: An apparatus adapted to detect a particle present on a bevel of a wafer. The apparatus includes a substrate support and a sensor housing adapted to receive an edge of the wafer. The sensor housing includes one or more probe electrodes and one or more position sensors. The apparatus also includes a translatable stage coupled to the sensor housing. The translatable stage is adapted to control the distance between the bevel of the wafer and the one or more position sensors. The apparatus further includes electrical circuitry electrically coupled to the substrate support and the one or more probe electrodes and adapted to generate an electric field between the bevel of the wafer and the one or more probe electrodes, detection circuitry electrically coupled to the electrical circuitry, and a processor adapted to process electrical signals and thereby detect the particle present on the bevel of the wafer.

Abstract: A chemical impedance detector having several electrodes situated on or across a dielectric layer of a substrate. The electrodes may be across or covered with a thin film polymer. Each electrode may have a set of finger-like electrodes. Each set of finger-like electrodes may be intermeshed, but not in contact, with another set of finger-like electrodes. The thin-film polymer may have a low dielectric constant and a high porous surface area. The chemical impedance detector may be incorporated in a micro fluid analyzer system.

Abstract: A vector network analysis system and a method of measuring use offset stimulus signals to stimulate a balanced device under test (DUT) to determine performance parameters. The system includes an offset stimulus source that provides a plurality of stimulus signals and a vector network analyzer. At least one stimulus signal is offset from another stimulus signal of the plurality in one or both of frequency and time-varying phase. The offset stimulus source includes a first signal source and a second signal source that respectively provides the offset stimulus signals. The method of measuring includes generating the offset stimulus signals and applying the offset stimulus signals to a balanced port of the DUT to stimulate the DUT. The performance parameters are determined from measurements of the offset stimulus signals and one or more response signals from the stimulated DUT.

Abstract: An integrated circuit has an analog output circuit for outputting an analog signal and a leadless terminal for connecting an output line of the analog output circuit to a circuit board by soldering, and measures and transfers an analog output voltage of the leadless terminal in a state in which it is mounted on the circuit board. A measuring unit has a switching unit for connecting the analog output circuit to the measuring unit upon failure diagnosis, and an AD converter for measuring the analog output voltage of the leadless terminal in a failure diagnosis state obtained by the switching unit; and causes the analog output voltage of the leadless terminal to be determined whether it is a normal voltage or an abnormal voltage by transferring the voltage measured by the AD converter to a determination unit through serial transfer.

Abstract: A method of operating a passenger screening kiosk system to perform at least one verify a passenger's identity, detect the presence of an explosive material, and detect the presence of a metallic material includes initiating a prompt to be issued by the passenger screening kiosk system to prompt the passenger to enter the passenger screening kiosk system, prompting the passenger to enter the passenger screening kiosk system, and determining whether the passenger is within the passenger screening kiosk system.

Abstract: A wall detector (1) for detecting an object (3) embedded in a substrate (2) includes a detection antenna (5) for introducing broadband, high-frequency alternating electric fields (9) of a measurement frequency (fM) in the substrate (2); a measurement system (6) connected to the detection antenna (5) for measuring the delayed interaction of the alternating fields (9) with the object (3), a calculation device (7) for detecting the object (3) based on the measurement signal and for determining the associated depth information, and a permittivity measurement device (8) with at least one auxiliary potential plate (11) for measuring the permittivity measurement signal of the substrate at a permittivity measurement frequency (fp) that is a lower than the measurement frequency; and an associated measurement method.