Abstract: In connection with data pin timing calibration with a strobe signal, examples provide for determination of pass/fail status of a pin from multiple pass/fail results in a single operation. Determination of pass/fail results for multiple pins based on multiple applied trim offsets can be made in parallel. Accordingly, a time to determine pass/fail results from multiple trim values for a pin can be reduced, which can enable faster power-up of NAND flash devices.

Abstract: A resistance-switchable material containing: an insulating support; and a complementary resistance switchable filler dispersed in the insulating support, wherein the complementary resistance switchable filler has a spherical core-shell structure containing: a spherical conductive core containing a conductive material; and an insulating shell formed on the surface of the core and containing an insulating material. The resistance-switchable material is capable of exhibiting complementary resistive switching characteristics with improved reliability and stability as symmetrical uniform filament current paths are formed in respective resistive layers adjacent to two electrodes with the conductive core of the complementary resistance-switchable filler at the center due to the electric field control effect by the spherical complementary resistance-switchable filler.

Abstract: A storage device including a nonvolatile memory device including memory blocks and a controller connected with the nonvolatile memory device through data input and output lines and a data strobe line may be provided. The nonvolatile memory device and the controller may be configured to perform training on the data input and output lines by adjusting a delay of a data strobe signal sent through the data strobe line and adjust delays of the data input and output lines based on the training result.

Abstract: A semiconductor circuit of the disclosure includes a first circuit that is able to generate, on the basis of a voltage at a first node, an inverted voltage of the voltage at the first node, and apply the inverted voltage to a second node, a second circuit that is able to generate, on the basis of a voltage at the second node, an inverted voltage of the voltage at the second node, and apply the inverted voltage to the first node, a first transistor that is turned ON to couple the first node to a third node, a second transistor that is turned ON to supply a first direct-current voltage to the third node, and a first storage section that is coupled to the third node and includes a first storage device that is able to take a first resistance state or a second resistance state.

Abstract: The present disclosure includes apparatuses and methods related to performing logic operations. An example apparatus comprises sensing circuitry including a sense amplifier and a compute component. A controller is coupled to the sensing circuitry and is configured to cause storing of a first operand in a first compute component storage location, transfer of the first operand to a second compute component storage location, and performance of a logical operation between the first operand in the second compute component storage location and a second operand sensed by the sense amplifier.

Abstract: A memory device includes: a plurality of data pads; a data distribution circuit suitable for distributing data received through some data pads of the plurality of data pads to a first data bus, and distributing data received through the other data pads to a second data bus, in a first mode; a first channel region suitable for storing data obtained by copying the data of the first data bus at a predetermined ratio of 1:N where N is an integer equal to or more than 2; and a second channel region suitable for storing data obtained by copying the data of the second data bus at the predetermined ratio of 1:N.

Abstract: In an example, a portion of a memory array may be selected to be wear leveled based on how often the portion is or is to be accessed. The portion may be wear leveled.

Abstract: A memory device that includes a plurality of memory cells arranged in rows and columns, a plurality of bit lines each connected to one of the columns of memory cells, and a plurality of differential sense amplifiers each having first and second inputs and an output. For each of the differential sense amplifiers, the differential sense amplifier is configured to generate an output signal on the output having an amplitude that is based upon a difference in signal amplitudes on the first and second inputs, the first input is connected to one of the bit lines, and the second input is connected to another one of the bit lines. Alternately, one or more sense amplifiers are configured to detect signal amplitudes on the bit lines, and the device includes calculation circuitry configured to produce output signals each based upon a difference in signal amplitudes on two of the bit lines.

Abstract: Embodiments of the invention relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to preserve states of memory elements in association with data operations using variable access signal magnitudes for other memory elements, such as implemented in third dimensional memory technology. In some embodiments, a memory device can include a cross-point array with resistive memory elements. An access signal generator can modify a magnitude of a signal to generate a modified magnitude for the signal to access a resistive memory element associated with a word line and a subset of bit lines. A tracking signal generator is configured to track the modified magnitude of the signal and to apply a tracking signal to other resistive memory elements associated with other subsets of bit lines, the tracking signal having a magnitude at a differential amount from the modified magnitude of the signal.

Abstract: In a method for operating a semiconductor memory device including a plurality of memory blocks, the method includes: receiving a read command for a first memory block among the plurality of memory blocks; referring to a block read count value corresponding to the first memory block; determining whether the block read count value has reached a first threshold value; and performing a read operation on the first memory block, based on the determined result.

Abstract: A data storage device includes a non-volatile memory and a controller coupled to the non-volatile memory. The controller is operable to measure a first threshold voltage (Vt) of a memory cell under a first parameter at a read temperature and measure a second Vt of the memory cell under a second parameter at the read temperature in which the first parameter is different from the second parameter. A Vt correction term for the memory cell is determined based upon the first Vt measurement and the second Vt measurement. A read Vt of the memory cell is adjusted by using the Vt correction term.

Abstract: Aspects of DDR and thyristor memory cell RAMs are optimally combined for high-speed data transfer into and out of RAMs. After a Read operation in which data from a selected row of memory cells in an array are latched, a Burst operation selectively moves the latched data from the array or latches external data. At the same time as the Burst data transfer, all the memory cells of the selected row are turned off or on by a write operation. In the following Write-Back & Pre-charge operation, the latched data bits which are complementary to the memory cell state of the Burst write operation are written back into the corresponding memory cells in the selected row. As part of a DDR-like activation cycle, data can be transferred to and from the memory cell array RAM at high-speed.

Abstract: Disclosed is a memory device which includes a first memory cell connected to a word line and a first bit line, a second memory cell connected to the word line and a second bit line, and a row decoder selecting the word line, a row decoder configured to select the word line, and a column decoder. A first distance between the row decoder and the first memory cell is shorter than a second distance between the row decoder and the second memory cell. The column decoder selects the first bit line based on a time point when the first memory cell is activated.

Abstract: The present disclosure includes apparatuses and methods related to performing logic operations. An example apparatus comprises sensing circuitry including a sense amplifier and a compute component. A controller is coupled to the sensing circuitry and is configured to cause storing of a first operand in a first compute component storage location, transfer of the first operand to a second compute component storage location, and performance of a logical operation between the first operand in the second compute component storage location and a second operand sensed by the sense amplifier.

Abstract: A device includes memory cells, a first reference switch, a second reference switch, a first reference storage unit, a second reference storage unit, and an average current circuit. The memory cells are each configured to store corresponding bit data. The first reference switch and the second reference switch are turned on when a word line is activated. The first reference storage unit generates a first signal having a first logic state when the first reference switch is turned on. The second reference storage unit generates a second signal having a second logic state when the second reference switch is turned on. The average current circuit averages the first signal and the second signal to generate a reference signal to be compared with a current indicating the bit data of one memory cell, in order to determine a logic state of the bit data of the memory cell.

Abstract: In a control device which outputs control instructions at a constant cycle to each of a plurality of networks for executing a predetermined process according to the control instructions, a time (a required time) from when the control instruction is output to each of the plurality of networks until the predetermined process is executed is acquired for each of the plurality of networks. Among the plurality of required times, a difference (a shift time) between a short required time (required time of mounting head) and a long required time (required time of moving device) is calculated. When the shift time has elapsed after outputting the control instruction to the network of the moving device, the control instruction is output to the network of the mounting head.

Abstract: A data processing system includes a processing unit that forms a base die and has a group of through-silicon vias (TSVs), and is connected to a memory system. The memory system includes a die stack that includes a first die and a second die. The first die has a first surface that includes a group of micro-bump landing pads and a group of TSV landing pads. The group of micro-bump landing pads are connected to the group of TSVs of the processing unit using a corresponding group of micro-bumps. The first die has a group of memory die TSVs. The subsequent die has a first surface that includes a group of micro-bump landing pads and a group of TSV landing pads connected to the group of TSVs of the first die. The first die communicates with the processing unit using first cycle timing, and with the subsequent die using second cycle timing.

Abstract: The invention relates to a capacitive matrix arrangement that comprises an active medium, which is arranged in a layer between word lines and bit lines whose crossing points have capacitor cells, selectable by actuation of the word lines and bit lines, arranged at them with the interposed active medium, and to an actuation method, wherein the invention is based on the object of combining active actuation of capacitive elements in a matrix with the advantages of passive actuation. This is achieved by virtue of the word lines having a specific variable Debye length, i.e. consisting of a material with a variable mobile charge carrier concentration, and being arranged between the active medium and a non-active dielectric. The actuation is effected by controlling the action of an electrical field.

Abstract: Provided herein may be a storage device and a method of operating the same. A storage device for protecting the storage device from physical movement may include a nonvolatile memory device, a sensor unit configured to collect information about physical movement of the storage device, and a memory controller configured to perform a device lock operation of protecting data in the nonvolatile memory device, based on a sensor value acquired from the sensor unit.

Abstract: Systems and methods to perform post-packaging repair of previously repaired data groups are disclosed. The devices may have an array of addressable rows or columns of memory cells, which can be activated. Upon identification of defect in a memory cell row or column, a repair in which the memory cell may be deactivated and a secondary row may be activated in its place may be performed. Volatile and non-volatile storage elements may be used to store the defective memory addresses. Logic circuitry in the device may match a requested address with the stored addresses and generate logic signals that trigger activation of a repaired row in place of the defective row or column. Moreover, defective rows or columns that have been previously repaired once may be further repaired. To that end, logic circuitry implementing a trumping mechanism may be used to prevent activation of multiple data rows or columns for addresses that were repaired multiple times.