Abstract: A regulator circuit has a first non-operating state, a second non-operating state, and an operating state. The regulator circuit includes: a detection circuit that detects a magnitude of an output voltage of the regulator circuit, and outputs a feedback voltage that indicates a result of the detection to a feedback node; an operational amplifier circuit that compares the voltage of the feedback node with a reference voltage, and outputs a voltage that indicates a result of the comparison; and an output circuit that generates the output voltage according to the voltage output from the operational amplifier circuit. A state of the feedback node is different between the first non-operating state and the second non-operating state, and a transition time required to switch from the second non-operating state to the operating state is shorter than a transition time required to switch from the first non-operating state to the operating state.

Abstract: Some embodiments include apparatuses and methods having a conductive line, a memory cell string including memory cells located in different levels the apparatus, and a select circuit including a select transistor and a coupling component coupled between the conductive line and the memory cell string. Other embodiments including additional apparatuses and methods are described.

Abstract: A semiconductor device includes an initial buffer signal generation circuit and a buffer signal generation circuit. The initial buffer signal generation circuit includes an initial buffer circuit which is activated if an initialization operation terminates. The initial buffer signal generation circuit generates an initial buffer signal from an external control signal in response to a first reference voltage signal. The buffer signal generation circuit includes a buffer circuit which is activated in response to the initial buffer signal. The buffer signal generation circuit generates a buffer signal from the external control signal in response to a second reference voltage signal.

Abstract: A data storage device includes a controller and a memory. The controller includes a host interface and a memory interface. The controller performs a first operation on the memory through the memory interface at a first frequency associated with the host interface to determine a first data pattern. The controller performs a read operation on the memory through the memory interface at a second frequency to determine a second data pattern. The controller changes the first frequency by a predetermined amount until the first frequency is equal to a maximum operating frequency having an associated risk of a setup/hold violation that is below a predetermined probability.

Abstract: A magnetic random access memory (MRAM) sense amplifier circuit is provided that includes a pre-amplifier circuit that includes a data leg, a reference leg, and an operational amplifier. The data leg includes a first P-channel transistor and a first N-channel transistor that receives a local data bit bias voltage and outputs a data branch output voltage. The reference leg includes a second P-channel transistor and a second N-channel transistor. The transistors of the reference leg mismatch the transistors of the data leg due to device variations. The second N-channel transistor receives a global reference bit bias voltage, and outputs a reference voltage. The operational amplifier determines the difference between the data branch output voltage and the reference voltage, and generates an adjusted local data bit bias voltage that matches the global reference bit bias voltage to offset the mismatches that exist between the data leg and the reference leg.

Abstract: A system and method for utilizing a security key stored in non-volatile memory, and for generating a PUF-based data set on an integrated circuit including non-volatile memory cells, such as flash memory cells, are described. The method includes storing a security key in a particular block in a plurality of blocks of the non-volatile memory array; utilizing, in a security logic circuit coupled to the non-volatile memory array, the security key stored in the particular block in a protocol to enable access via a port by external devices or communication networks to data stored in blocks in the plurality of blocks; and enabling read-only access to the particular block by the security logic for use in the protocol, and preventing access to the particular block via the port.

Abstract: A controller includes an input/output circuit and a reference voltage generating circuit. The input/output circuit includes a plurality of receiving circuits. Each receiving circuit receives and processes one data bit and generates an output bit accordingly. The reference voltage generating circuit is coupled to the input/output circuit and includes a plurality of circuit units for providing a plurality of reference voltages. One of the circuit units is coupled to one of the receiving circuits to provide a reference voltage to the corresponding receiving circuit and the receiving circuit processes the data bit according to the received reference voltage.

Abstract: Multiple (multi-) level cell (MLC) non-volatile (NV) memory (NVM) matrix circuits for performing matrix computations with multi-bit input vectors are disclosed. An MLC NVM matrix circuit includes a plurality of NVM storage string circuits that each include a plurality of MLC NVM storage circuits each containing a plurality of NVM bit cell circuits each configured to store 1-bit memory state. Thus, each MLC NVM storage circuit stores a multi-bit memory state according to memory states of its respective NVM bit cell circuits. Each NVM bit cell circuit includes a transistor whose gate node is coupled to a word line among a plurality of word lines configured to receive an input vector. Activation of the gate node of a given NVM bit cell circuit in an MLC NVM storage circuit controls whether its resistance is contributed to total resistance of an MLC NVM storage circuit coupled to a respective source line.

Abstract: A memory module with multiple memory devices includes a buffer system that manages communication between a memory controller and the memory devices. The memory module additionally includes a command input port to receive command and address signals from a controller and, also in support of capacity extensions, a command relay circuit coupled to the command port to convey the commands and addresses from the memory module to another module or modules. Relaying commands and addresses introduces a delay, and the buffer system that manages communication between the memory controller and the memory devices can be configured to time data communication to account for that delay.

Abstract: A semiconductor memory device is provided. The semiconductor memory device includes a column selection circuit, a sensing circuit, an output circuit, and a verification circuit. The column selection circuit selects n-bit data from data read from a memory cell array according to a column selection signal and outputs the selected n-bit data to an n-bit data bus. The sensing circuit senses the n-bit data on the data bus in response to an activation signal. The output circuit selects m-bit data from the n-bit data sensed by the sensing circuit in response to an internal clock signal synchronized with a serial clock signal applied from outside and outputs the selected m-bit data from output terminals. The verification circuit compares the data sensed by the sensing circuit with the data output by the output circuit to verifying the correctness of read-out data.

Abstract: Systems, apparatuses and methods may provide for identifying a target sub-block of NAND strings to be partially or wholly erased in memory and triggering a leakage current condition in one or more target select gate drain-side (SGD) devices associated with the target sub-block. Additionally, the leakage current condition may be inhibited in one or more remaining SGD devices associated with remaining sub-blocks of NAND strings in the memory. In one example, triggering the leakage current condition in the one or more target SGD devices includes setting a gate voltage of the one or more target SGD devices to a value that generates a reverse voltage that exceeds a threshold corresponding to the leakage current condition.

Abstract: A device includes a memory and a controller coupled to the memory. The controller is configured to determine a temperature-based value of a search parameter in response to detecting that an error rate of a codeword read from the memory exceeds a threshold error rate. The controller is further configured to iteratively modify one or more memory access parameters associated with reducing temperature-dependent threshold voltage variation and to re-read the codeword using the modified one or more memory access parameters.

Abstract: A storage device and a data storing method thereof are provided. The storage device includes a data storage medium and the control unit. The data storage medium includes a data storage area with a plurality of first type of data blocks. When a data reading operation is executed on a current data block of the data storage medium, the control unit determines whether a read count of the current data block is greater than a first threshold, determines whether the current data block is one of the first type of data blocks and generate a determination result according to the result, the control unit selects a plurality of first type of data blocks and switches the selected data blocks to a fast mode. Finally, the control unit moves data stored in the current data block to the selected data blocks under fast mode.

Abstract: Provided herein may be a memory system and a method of operating the same. The memory system may include a controller configured to generate and output a first command for a program operation in response to a request from a host, and generate and output a second command for a read scan operation when the memory system is powered on after an abnormal power-off is detected; and a semiconductor memory device configured to perform the program operation on a page basis in response to the first command, perform the read scan operation in response to the second command, and perform a single read operation per page using a set read voltage during the read scan operation.

Abstract: A memory system includes a calibration engine, a memory, and a memory controller coupled to the memory by a channel used to transmit a plurality of commands from the memory controller to the memory. The memory controller estimates a total energy consumed based on the first plurality of commands in a first sampling period and determines a first temperature change of the memory based on the first total energy consumed. The memory controller transmits an impedance calibration command to the calibration engine if the first temperature change of the memory exceeds a first threshold. The calibration engine changes an impedance of an I/O terminal of the memory based on the calibration command.

Abstract: An operation method of a nonvolatile memory device for programming memory cells connected to a selected word line, the method including: performing a program operation; suspending the program operation after performing a first portion of the program operation; and resuming the program operation to perform a second portion of the program operation, wherein the program operation is resumed within a reference time after the program operation is suspended.

Abstract: A program method of a nonvolatile memory device that performs a plurality of program loops is provided. At least one of the plurality of program loops includes dividing a channel of a selected cell string into a first side channel and a second side channel during a first interval and a second interval, turning off a string selection transistor of the selected cell string by applying a string select line voltage of a first level during the first interval, and boosting a first voltage of the first side channel and a second voltage of the second side channel, and turning on the string selection transistor by applying the string select line voltage of a second level different from the first level during the second interval, and performing a hot carrier injection (HCI) program operation on a selected memory cell corresponding to the first side channel or the second side channel.

Abstract: The present disclosure illustrates a method of extending a lifetime of a solid state disk (SSD). The SSD includes a flash memory which is a multi-level cell (MLC) flash memory. The method includes steps of: setting a number of logic blocks of the SSD to be one-half of a number of physical blocks of the flash memory; reading, by a control unit of the SSD, a write/erase times of each of the physical blocks of the flash memory; and converting the physical block, of which a number of the write/erase times exceeds an upper limit of the write/erase times, from a multi-level storage format to a single-level storage format. A number of the logic blocks is a constant value.

Abstract: A semiconductor storage device includes a first bank that includes a first memory cell group and writes data into the first memory cell group upon receipt of a first command, a second bank that includes a second memory cell group and writes data into the second memory cell group upon receipt of the first command, and a delay controller that issues the first command for the first bank upon receipt of a second command, and issues the first command for the second bank after an interval of at least a first period.

Abstract: In an example, a portion of a memory array may be selected to be wear leveled based on how often the portion is or is to be accessed. The portion may be wear leveled.