Abstract: Detection accuracy of a rotation angle of a sub-shaft is to be improved. In an absolute encoder according to an embodiment of the present invention, a second worm wheel part is a second driven gear, has a central axis orthogonal to a central axis of a first worm wheel part, and meshes with a second worm gear part. A support shaft rotatably supports the second worm wheel part. A magnet (Mq) rotates integrally with the support shaft. An angle sensor (Sq) is provided near the magnet (Mq) and detects a change in a magnetic flux generated from the magnet (Mq). A first bearing has an outer ring fixed at the second worm wheel part and an inner ring fixed at the support shaft. A second bearing has an inner ring fixed at the support shaft.

Abstract: The present invention relates to a vibration test jig for a cylindrical battery cell, including: a main body for accommodating a cylindrical battery cell; and a connection unit electrically connected to an electrode terminal of the cylindrical battery cell, wherein the connection unit includes: a connection member electrically connected to the electrode terminal and withdrawn to the outside of the main body; a support member for supporting the connection member; and a fixing member for fixing the support member on the main body. The vibration test jig enables the cylindrical battery cell mounted in the jig to be electrically connected to an external voltage and resistance measuring device through the connection unit. During a vibration test, an electrical state of the battery cell can be monitored in real time, and it can be checked whether and when an electrode tab is disconnected by using the measured voltage or resistance value.

Abstract: A magnetic sensor includes a substrate including a top surface, an insulating layer including an inclined surface, an MR element disposed on the inclined surface, a first insulating portion of an insulating material disposed on a part of the MR element, and a second insulating portion of an insulating material disposed on another part of the MR element at a position forward of the first insulating portion in a direction along the inclined surface, the direction being a direction away from the top surface of the substrate.

Abstract: A design-for-test circuit for evaluating a BTI effect is disclosed, the circuit includes a number of stress generators having logic circuits with input and output terminals. Each output terminal is connected to the grid of the device to be tested. In a stress mode, a stress input signal is selected from a frequency signal, a first direct current voltage, and a second direct current voltage, all stress output signals formed by all the stress generators comprise the first direct current voltage, a series of frequency signals with different duty cycles, and the second direct current voltage, and all the stress output signals are used in combination such that the stress times regarding the device under test within the same test time have different values, so as to evaluate the BTI effect of the device under test which has different values of the stress times.

Abstract: An evaluation and control unit for operating a wideband lambda sensor that has at least two electrical lines, the evaluation and control unit having at least two electrical terminals for electrical connection to the electrical lines of the wideband lambda sensor. Each of the electrical terminals has assigned to it a respective electrical switch via which each terminal is capable of being individually connected to at least one defined electrical potential. Each switch is voltage-resistant against the maximum short-circuit voltage that is to be expected at the respective terminal in case of fault. In addition, a method is described for the line-specific short-circuit diagnosis of the wideband lambda sensor (pinpointing).

Abstract: During rotation of a shaft of a downhole-type wellbore system, a first signal corresponding to an axial position of the rotating shaft is transmitted by a sensor. The shaft is axially levitated by a plurality of magnetic thrust bearings. A controller determines an amount of axial force to apply to the rotating shaft to maintain axial levitation of the rotating shaft based on the first signal. The controller transmits a second signal corresponding to the determined amount of axial force to the plurality of magnetic thrust bearings. The plurality of magnetic thrust bearings applies the amount of axial force on the rotating shaft to maintain the axial levitation of the rotating shaft based on the second signal.

Abstract: Disclosed is a device and method for monitoring a common mode voltage. There is provided the device for monitoring a common mode voltage including an input end connected to a node between an energy storage device and a power conversion device, a voltage divider that divides a voltage applied to the input end, a comparator that compares an output of the voltage divider and a reference voltage, and a controller that detects an abnormality in a voltage applied from the power conversion device to the energy storage device based on an output of the comparator.

Abstract: A gas sensor includes a substrate, a support layer, a base layer, a heater layer disposed on or above the base layer, a gas sensing layer that is disposed on or above one of the heater layer and the base layer and that has a gas concentration dependent electrical impedance, and a detection electrode that is electrically connected to the gas sensing layer and that detects the impedance of the gas sensing layer. The substrate has a cavity and an opening formed by the cavity. The support layer is disposed on the substrate so as to cover at least an entire periphery of the opening. The base layer is supported by the support layer above the cavity so as to be separated from the substrate. A portion of the support layer in contact with the cavity has a first phononic crystal structure structured by a plurality of regularly arranged through-holes.

Abstract: A wafer probe alignment system includes a test probe needle including a body having a tip that is configured to make contact with a surface of a wafer at a first tip position, wherein the body is deformable and includes a sensing area that undergoes a deformation in response to at least one force, including a lateral friction force, applied to the tip; at least one sensor configured to monitor the sensing area for deformation caused by a lateral friction force and generate at least one first sensor information representative of the lateral friction force; and a controller configured to control a position of the tip, wherein the controller is configured to receive the at least one first sensor information and reposition the tip to counteract the lateral friction force in order to maintain the tip at the first tip position.

Abstract: The present disclosure relates to a sensor assembly for simultaneously capturing an angular position and a torque of a rotatable shaft. The sensor assembly comprises, for determining the angular position, a main body, two additional bodies, which are arranged coupled for rotation on the main body, and two angle resolvers, which are arranged on a circuit board in the immediate vicinity of the additional bodies. In this arrangement, the angles of the additional bodies are determined by the angle resolvers and passed as an angle signal to an evaluation unit arranged on the circuit board. The sensor assembly further comprises a direct coating, which captures a torque signal from the rotating shaft and passes this signal over a connection line to the evaluation unit. The connection line has a section wound multiple times around the shaft to permit a rotation of the shaft by at least +/?900°.

Abstract: Techniques for testing connectivity between a first integrated circuit (IC) and a second IC of an electronics package are described. An example technique involves controlling a switch(es) in the first IC to configure a bias direction of a photodiode of the second IC to forward biased. A connectivity test between the first and second ICs is performed, when the photodiode is forward biased. Another technique involves controlling a switch(es) in the first IC to configure a bias direction of a photodiode in the second IC to reverse biased. A first voltage is measured at an input of a transimpedance amplifier (TIA) in the first IC when the photodiode is reverse biased. The switch(es) are controlled to change the bias direction of the photodiode to forward biased. A second voltage is measured at the input of the TIA when the photodiode is forward biased.

Abstract: An electrical system with conductive and insulating layers for application to a surface of a garment is disclosed. The electrical system includes a first insulating layer for attaching to a garment, a second insulating layer, and an electrically conductive layer encapsulated between the first insulating layer and the second insulating layer. The first and second insulating layers have a predetermined minimum voltage withstand and a predetermined minimum resistance.

Abstract: A semiconductor burn-in oven includes a housing having a chamber, a heating device, testing circuitry having circuit connectors, and a seating assembly. The seating assembly includes a main frame, a main frame actuator connected to the main frame, a plurality of hook members connected to the main frame, and a hook driver. The main frame actuator is configured to drive movement of the main frame along a first axis between an extended position and a retracted position. The hook driver is configured to pivot each of the hook members about a pivot axis between a receiving position and a latching position. Board connectors of burn-in boards supported within the chamber are driven to seat with the circuit connectors when the burn-in boards are latched by the hook members in their latching position and the main frame is moved from the extended position to the retracted position.

Abstract: A sheet connector according to the present invention has: a first insulating layer having a first surface positioned on one side in the thickness direction, a second surface positioned on the other side, and a plurality of first through-holes passing through between the first surface and the second surface; and a plurality of first conductive layers arranged on the inner wall surfaces of the first through-holes. First ends of the first conductive layers on the first surface side project from the first surface.

Abstract: A spark discharge detection device includes a discharge detector, a waveform extension circuit, and determination circuit. The discharge detector includes a metal electrode that detects discharge between an electrode and a sliding body that is in contact with and sliding surface of the electrode. The waveform extension circuit configured to extend a discharge waveform output from the discharge detector in a time direction. The determination circuit configured to determine that discharge has occurred in the sliding body when a signal value exceeds a first threshold and a time during which the signal value exceeds the first threshold is held for a time longer than a first time for the output of the waveform extension circuit.

Abstract: A device for testing a group of radio-frequency (RF) chip modules and a method for using the same is disclosed. The device includes a signal analyzer, a power divider, control ICs, a signal controller, and a power combiner. The power divider receives an RF signal and transmits RF input signals to the RF chip modules and the control ICs in response to the RF signal. The signal controller controls each control IC to adjust at least one of the power and the phase of the corresponding RF input signal, thereby generating an RF output signal. The power combiner receives the RF output signal from each control IC to generate a test signal. The signal analyzer receives the test signal and obtains RF properties corresponding to at least one of the power and the phase of each RF output signal.

Abstract: A mechanical arm includes a body and an operating arm. The operating arm includes a connector connected to the body, as well as a first adapting part and a second adapting part which are connected to the connector. The first adapting part is configured to mount a first operating mechanism for opening and closing the socket. The second adapting part is configured to mount a second operating mechanism for grabbing and releasing a semiconductor device. After the first adapting part drives the first operating mechanism to open the socket, the second adapting part is able to drive the second operating mechanism to put the semiconductor device into the socket or take the semiconductor device out from the socket.

Abstract: A system includes a plurality of thermally-coupled zones and a plurality of thermal control devices, each controllable to thermally control one of the plurality of zones, and a plurality of temperature sensors, each configured to measure temperature of one of the plurality of zones. The system includes a control circuit configured to receive a temperature measurement for each of the plurality of zones, collect the temperature measurements in a temperature vector in a real coordinate system, and transform the temperature vector to a normal coordinate system that provides a plurality of uncoupled equations. The control circuit is configured to determine, based on the plurality of uncoupled equations and a desired temperature gradient, a desired power vector in the normal coordinate system, transform the desired power vector to the real coordinate system to generate a power vector, and control the plurality of heaters in accordance with the power vector.

Abstract: A method and system for determining bale properties of crop material bales includes transmitting a first microwave signal through a bale of crop material located within an agricultural baler at a first frequency and transmitting a second microwave signal through the bale of crop material at a different second frequency and calculating, with at least one computing device, a phase angle displacement between the first and second microwave signals and determining, with the at least one computing device, a bale property of the bale of crop material based at least in part on the calculated phase angle differential.

Abstract: An inspection jig includes a first board, a probe unit including a probe, a second board located in parallel with the first board and electrically connected to the probe, an electrical connection portion electrically connecting the first board and the second board, and a board holding portion holding the second board in parallel with the first board in the thickness direction and holding the probe unit. The board holding portion includes a probe-side holding plate located on the probe unit side of the second board and a holding plate support portion that positions the probe-side holding plate at a position where the probe-side holding plate is in parallel with the first board in the thickness direction. The board holding portion holds the second board so that the first board and the second board are electrically connected via the electrical connection portion being sandwiched between the first board and second board.