Abstract: Provided are a monitoring device and method. A monitoring device includes a laser processor configured to emit a processing laser beam to perform a melting annealing process on a wafer; a laser monitor configured to emit a monitoring laser beam onto the wafer while the laser processor performs the melting annealing process, the laser monitor configured to measure reflectivity of the wafer; and a data processor configured to process data on the reflectivity measured by the laser monitor, and monitor one or more characteristics of the wafer based on the data on the reflectivity.

Abstract: A clamp sensor includes: a pair of clamp arms that construct a ring-shaped sensor in a closed state and rotate about a rotational shaft provided near base ends of the clamp arms so that other ends of the clamp arms come in to contact and move apart; and a pair of operating arms that extend from the base ends of the clamp arms and are capable, by rotating about the rotational shaft so as to approach each other, of shifting the clamp arms into an open state. The operating arms are formed in arc shapes where, when looking along an axial direction of the rotational shaft, an outer edge of one operating arm and an outer edge of the other operating arm are curved in a same direction.

Abstract: Load pull measurement arrangement having an active tuner with a signal generator providing a signal at a first frequency to a vector modulator. The vector modulator has an input for receiving control signals and is arranged to provide an injection signal at the first frequency based on the control signals. The active tuner further has a frequency multiplier receiving the injection signal and outputting a multiplied injection signal having a second frequency, the second frequency being an integer multiple of the first frequency. Furthermore, a millimeter wave extender has a frequency multiplier in the signal injection path connected to the device under test during operation.

Abstract: A stand-alone active thermal interposer device for use in testing a system-in-package device under test (DUT), the active thermal interposer device includes a body layer having a first surface and a second surface, wherein the first surface is operable to be disposed adjacent to a cold plate, and a plurality of heating zones defined across a second surface of the body layer, the plurality of heating zones operable to be controlled by a thermal controller to selectively heat and maintain respective temperatures thereof, the plurality of heating zones operable to heat a plurality of areas of the DUT when the second surface of the body layer is disposed adjacent to an interface surface of the DUT during testing of the DUT.

Abstract: A method for detecting errors or malfunctions in electrical or electronic components of circuits, wherein each of the circuits is located on a circuit board and wherein a plurality of circuit boards border one another on a circuit board panel, includes populating each of the circuit boards of the circuit board panel with electrical or electronic components corresponding to the circuits; for each of the analog, electrical or electronic components used for the construction of the circuits, placing a corresponding test component in an edge region of the circuit board panel; providing the analog, electrical or electronic test components placed in the edge region of the circuit board panel with test points; and checking for the correct function value and/or the correct poling of the analog, electrical or electronic test components provided with test points and located in the edge region of the circuit board panel.

Abstract: Embodiments of a device and method are disclosed. In an embodiment, a current sensing circuit includes first and second integrated resistors on a semiconductor die, a controllable current source configured to provide a reference current, and a current determination circuit. A resistance value of the second integrated resistor is a factor n larger than a resistance value of the first integrated resistor. A current drawn by a target circuit is configured to flow through the first integrated resistor, and the reference current is configured to flow through the second integrated resistor. The current determination circuit is configured to determine a value of the current drawn by the target circuit based on the value of the reference current when a first voltage at a terminal of the first integrated resistor is approximately equal to a second voltage at a terminal of the second integrated resistor.

Abstract: Presented is an electronic meter for supplying driving power to a battery module charged by wireless power transmission. The presented electronic meter includes a usage detection module for detecting energy usage of a consumer, a control module for generating meter data based on the energy usage detected by the usage detection module, a communication module for transmitting the meter data generated by the control module to a meter reading server or a repeater, a battery module composed of a secondary cell, and for supplying driving power to the usage detection module, the control module, and the communication module, and a wireless power receiving module for receiving power wirelessly from a wireless power transmission device to charge the battery module.

Abstract: A voltage sensing circuit includes voltage regulators, oscillator circuits, delay circuits, and a detector circuit. The detector circuit detects characteristics of signaling received from a first oscillator circuit and characteristics of signaling received from a second oscillator circuit. The detector circuit compares the detected characteristics of the signaling from the first oscillator circuit and the second oscillator circuit to determine whether the detected characteristics from the first oscillator circuit and the second oscillator circuit meet a particular criterion for providing voltage manipulation for the voltage sensing circuit.

Abstract: A current sensor is configured to detect a current flowing through an electrical conductor. The current sensor includes a core and a coil wound around the core. The core has a hollow configure to allow the electrical conductor to pass through the hollow. The core substantially has a C-shape haying a gap connected to the hollow. At least a part of the gap of the core is located inside the coil. This current sensor suppresses the influence of external noise.

Abstract: A circuital system that includes a differential low-pass filter having a differential output and operable in a first voltage domain. Some embodiments include a differential integrator including a differential input and a differential output, and operable in a second voltage domain different from the first voltage domain. Some embodiments include a pair of AC coupling capacitors coupling the differential output of the differential low-pass filter to the differential input of the differential integrator.

Abstract: The disclosure relates to technology for determining stress on integrated circuits. These include using ring oscillators formed on the integrated circuit, where one ring oscillator has its frequency dependent on the current flowing through its stages being limited by its NMOS devices and another ring oscillator has its frequency dependent on the current flowing through its stages being limited by its PMOS devices. This allows the stress on the integrated circuit to be determined in different directions along the integrated circuit. A temperature sensor can be used to compensate for temperature dependence on the frequencies of the ring oscillators.

Abstract: A measurement circuit and a measurement method for measuring and updating a voltage resolution of an electronic atomizer circuit are provided. In the measurement circuit, a comparison unit is configured to compare a first preset value and a second preset value to obtain a voltage difference, an accumulation and subtraction unit is configured to perform counting according to a comparison result, and a control unit is configured to adjust the voltage difference between two compared voltage input terminals, thereby calculating a voltage resolution of the control unit, avoiding the impact of the actual error of the first constant current source and the unit resistor on the actual voltage resolution, and ensuring the measurement accuracy. In addition, an accurate to-be-measured voltage is calculated, and a measurement value of the to-be-measured voltage is corrected, to ensure the high measurement accuracy of the to-be-measured voltage and the output power.

Abstract: A manufacturing method of an electronic device and an electronic device are provided. The manufacturing method includes the following steps: providing a substrate; forming a plurality of signal lines and a testing circuit on the substrate, wherein the testing circuit includes a plurality of output channels electrically connected to at least a portion of the plurality of signal lines; performing a testing process; and optionally isolating the testing circuit from the at least a portion of the plurality of signal lines. The testing process includes: providing a signal; processing a plurality of testing signals by processing the signal via the testing circuit; and transmitting the plurality of testing signals to the at least a portion of the plurality of signal lines via the plurality of output channels. The plurality of output channels are less than the plurality of signal lines in quantity.

Abstract: A current testing device including a housing assembly, an electrical assembly and a circuit board assembly is disclosed herein. The housing assembly includes a housing that encloses the electrical assembly. The electrical assembly includes a battery, a microprocessor, a display, a keypad, a power button, an electrical port, and test cables. The microprocessor permits the user to simulate a fuse. The microprocessor has a memory in which a predetermined catalogue of fuses characteristics is stored. The user connects the test cables to a circuit board where the fuse is blown. The keypad allows the user to type the simulation characteristics while the display shows the results of the simulation.

Abstract: A testing apparatus for Data Storage Devices (DSDs) includes a chassis and at least one interface module configured to be removably inserted into the chassis and house a plurality of interface boards. Each interface board includes a DSD connector for connecting a DSD to the interface board and a backplane connector for connecting to a backplane for communicating with a respective computing unit. In one aspect, the at least one interface module includes a housing and a plurality of openings in a side of the housing with each opening configured to receive a respective interface board. A plurality of guide member pairs is positioned to guide respective interface boards when inserted into respective openings such that the backplane connector is located at a respective predetermined location for connecting to the backplane. In another aspect, the interface boards are removable from the interface module.

Abstract: Techniques for generating simulated waveforms for an electric meter include operating a meter in simulation mode without an external load device connected to the meter. Simulated waveforms are generated for a number of channels based on waveform component values. The waveforms are generated at a rate that corresponds to a sample rate of an analog to digital converter (ADC) of the meter. In simulation mode, the waveforms are provided to a meter firmware interface, instead of the waveform data obtained from the ADC.

Abstract: A semiconductor burn-in oven includes a housing including a burn-in chamber and an opening to the burn-in chamber surrounded by a front face, a heating device, testing circuitry, a door and a sealing mechanism. The door has an open position, in which the burn-in chamber is accessible through the opening, and a closed position, in which the door covers the opening. The sealing mechanism is configured to form a seal around the opening between an interior side of the door and the front face when the door is in the closed position. The sealing mechanism includes at least one sealing member having a recessed position, in which a gap extends between the front face and the interior side of the door, and a sealing position, in which the at least one sealing member closes the gap and forms the seal.

Abstract: A detection circuit and an integrated circuit. The detection circuit is used for detecting the drift or an open circuit of a first capacitor (C1) on a filtered second power source terminal (220), and the second power source terminal (220) is suitable for acquiring a power source voltage from an unfiltered first power source terminal (210) by means of a first resistor (R1), and is suitable for being coupled to a reference electric potential terminal (230) by means of the first capacitor (C1). The detection circuit comprises a second resistor (R2) and a second capacitor (C2) that are connected in series and coupled between the first power source terminal (210) and the reference electric potential terminal (230), wherein the second resistor (R2) and the second capacitor (C2) have the same time constant as the first resistor (R1) and the first capacitor (C1).

Abstract: A system for sensing a fuel cell of a vehicle may include: an analog digital converter (ADC) configured to receive a voltage of a fuel cell stack; a calculation unit configured to calculate a total number of cells of the fuel cell stack; and a control unit configured to acquire a voltage per a unit cell of the fuel cell stack based on output values of the ADC and the calculation unit.

Abstract: A measurement apparatus has a current sensor and at least one A/D converter, which current sensor has at least two channels (CH1, CH2), via which channels (CH1, CH2) the current sensor (30) respectively provides a measurement signal (CH1_SIG, CH2_SIG) characterizing the current. The at least two channels (CH1, CH2) include a first channel (CH1) and a second channel (CH2), which second channel (CH2) is designed to measure a greater maximum current than the first channel (CH1). Also described is a method for measuring a current flowing through a conductor by way of the measurement apparatus.