Patents by Inventor Alexander Reznicek

Alexander Reznicek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190252260
    Abstract: A method of forming a semiconductor device that includes forming a vertically orientated channel in a semiconductor fin structure that is present on a supporting substrate; and depositing a doped amorphous semiconductor material on an upper surface of the semiconductor fin structure that is opposite a base surface of the semiconductor fin structure that is in contact with the supporting substrate. The method further includes recrystallizing the doped amorphous semiconductor material with an anneal duration for substantially a millisecond duration or less to provide a doped polycrystalline source and/or drain region at the upper surface of the semiconductor fin structure.
    Type: Application
    Filed: February 12, 2018
    Publication date: August 15, 2019
    Inventors: Alexander Reznicek, Shogo Mochizuki, Oleg Gluschenkov
  • Patent number: 10381349
    Abstract: A semiconductor device comprises a substrate, a first source/drain region on the substrate, a first channel region extending vertically with respect to the substrate from the first source/drain region, a second source/drain region on the first channel region, a third source/drain region on the second source/drain region, a second channel region extending vertically with respect to the substrate from the third source/drain region, a fourth source/drain region on the second channel region, a first gate region formed around from the first channel region, and a second gate region formed around the second channel region.
    Type: Grant
    Filed: August 29, 2017
    Date of Patent: August 13, 2019
    Assignee: International Business Machines Corporation
    Inventors: Karthik Balakrishnan, Bahman Hekmatshoartabari, Alexander Reznicek, Jeng-Bang Yau
  • Patent number: 10381438
    Abstract: A semiconductor structure including vertically stacked nFETs and pFETs containing suspended semiconductor channel material nanosheets having an isolation layer located between a pFET S/D structure and an nFET S/D region is provided together with a method of forming such a structure. The pFET S/D structure includes a pFET S/D SiGe region having a first germanium content and an overlying SiGe region having a second germanium content that is greater than the first germanium content.
    Type: Grant
    Filed: November 2, 2017
    Date of Patent: August 13, 2019
    Assignee: International Business Machines Corporation
    Inventors: Jingyun Zhang, Takashi Ando, Pouya Hashemi, Choonghyun Lee, Alexander Reznicek
  • Publication number: 20190245083
    Abstract: A self-limiting etch is used to provide a semiconductor base located between a semiconductor substrate and a semiconductor fin. The semiconductor base has an upper portion, a lower portion and a midsection. The midsection has a narrower width than the lower and upper portions. A bottom source/drain structure is grown from surfaces of the semiconductor substrate and the semiconductor base. The bottom source/drain structure has a tip region that contacts the midsection of the semiconductor base. The bottom source/drain structures on each side of the semiconductor fin are in close proximity to each other and they have increased volume. Reduced access resistance may also be achieved since the bottom source/drain structure has increased volume.
    Type: Application
    Filed: February 5, 2018
    Publication date: August 8, 2019
    Inventors: Alexander Reznicek, Shogo Mochizuki, Jingyun Zhang, Xin Miao
  • Patent number: 10374039
    Abstract: A resistive random access memory stack is formed on a surface of a faceted drain-side structure that is present on one side of a functional gate structure. The functional gate structure and the faceted drain-side structure are located on a topmost surface of a fully depleted semiconductor channel material layer. In some embodiments, the resistive random access memory stack includes a bottom electrode, a resistive switching layer and a top electrode. In other embodiments, the resistive random access memory stack includes a resistive switching layer and a top electrode. In such an embodiment, a drain-side metal semiconductor alloy of the faceted drain-side structure is used as the bottom electrode of the resistive random access memory device.
    Type: Grant
    Filed: April 25, 2018
    Date of Patent: August 6, 2019
    Assignee: International Business Machines Corporation
    Inventors: Pouya Hashemi, Takashi Ando, Alexander Reznicek
  • Patent number: 10374042
    Abstract: A semiconductor device includes at least one semiconductor fin on an upper surface of a substrate. The at least one semiconductor fin includes a channel region interposed between opposing source/drain regions. A gate stack is on the upper surface of the substrate and wraps around sidewalls and an upper surface of only the channel region. The channel region is a dual channel region including a buried channel portion and a surface channel portion that completely surrounds the buried channel.
    Type: Grant
    Filed: August 31, 2015
    Date of Patent: August 6, 2019
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Jie Deng, Pranita Kerber, Qiqing C. Ouyang, Alexander Reznicek
  • Publication number: 20190237360
    Abstract: Structures and methods for making nanosheet structures with an electrically isolating feature associated therewith. The structure includes: a substrate, an epitaxial oxide layer over the substrate, a plurality of stacked nanosheets of semiconductor channel material over the epitaxial layer, and a source/drain semiconductor material located laterally adjacent and on each side of the plurality of stacked nanosheets of semiconductor channel material, where the plurality of nanosheets are decoupled from the source/drain semiconductor material by the epitaxial oxide layer.
    Type: Application
    Filed: February 1, 2018
    Publication date: August 1, 2019
    Inventors: Alexander REZNICEK, Xin MIAO, Joshua RUBIN
  • Publication number: 20190237336
    Abstract: A method of forming gate structures to a nanosheet device that includes forming at least two stacks of nanosheets, wherein each nanosheet includes a channel region portion having a gate dielectric layer present thereon. The method may further include forming a dual metal layer scheme on the gate dielectric layer of each nanosheet. The dual metal layer scheme including an etch stop layer of a first composition and a work function adjusting layer of a second composition, wherein the etch stop layer has a composition that provides that the work function adjusting layer is removable by a wet etch chemistry that is selective to the etch stop layer.
    Type: Application
    Filed: January 30, 2018
    Publication date: August 1, 2019
    Inventors: Junli Wang, Alexander Reznicek, Shogo Mochizuki, Joshua Rubin
  • Publication number: 20190237561
    Abstract: A method of introducing strain in a channel region of a FinFET device includes forming a fin structure on a substrate, the fin structure having a lower portion comprising a sacrificial layer and an upper portion comprising a strained semiconductor layer; and removing a portion of the sacrificial layer corresponding to a channel region of the FinFET device so as to release the upper portion of the fin structure from the substrate in the channel region.
    Type: Application
    Filed: April 5, 2019
    Publication date: August 1, 2019
    Inventors: Kangguo Cheng, Bruce B. Doris, Ali Khakifirooz, Darsen D. Lu, Alexander Reznicek, Kern Rim
  • Patent number: 10366984
    Abstract: An electrical device including a vertical transistor device connected to a vertical diode. The vertical diode connected transistor device including a vertically orientated channel. The vertical diode connected transistor device also includes a first diode source/drain region provided by an electrically conductive surface region of a substrate at a first end of the diode vertically orientated channel, and a second diode source/drain region present at a second end of the vertically orientated channel. The vertical diode also includes a diode gate structure in electrical contact with the first diode source/drain region.
    Type: Grant
    Filed: December 4, 2017
    Date of Patent: July 30, 2019
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Karthik Balakrishnan, Pouya Hashemi, Alexander Reznicek
  • Patent number: 10366988
    Abstract: A semiconductor structure includes a plurality of semiconductor material fins located on a surface of a substrate. At least one gate structure straddles over a portion of each semiconductor material fin. Unmerged source-side epitaxial semiconductor material portions are located on an exposed surfaces of each semiconductor material fin and on one side of each gate structure and unmerged drain-side epitaxial semiconductor portions are located on other exposed surfaces of each semiconductor material fin and on another side of each gate structure. An etch stop structure is located between each unmerged source-side and drain-side epitaxial semiconductor material portions. Each etch stop structure includes a bottom material portion that has a higher etch resistance in a specific etchant as compared to an upper material portion of the etch stop structure.
    Type: Grant
    Filed: August 14, 2015
    Date of Patent: July 30, 2019
    Assignee: International Business Machines Corporation
    Inventors: Sanjay C. Mehta, Alexander Reznicek
  • Publication number: 20190229204
    Abstract: A vertical transistor structure is provided that includes a bottom source/drain structure that includes a doped semiconductor buffer layer that contains a first dopant species having a first diffusion rate, and an epitaxial doped semiconductor layer that contains a second dopant species that has a second diffusion rate that is less than the first diffusion rate. During a junction anneal, the first dopant species readily diffuses from the doped semiconductor buffer layer into a pillar portion of a base semiconductor substrate to provide the bottom source/drain extension and bottom source/drain junction. No diffusion overrun is observed. During the junction anneal, the second dopant species remains in the epitaxial doped semiconductor layer providing a low resistance contact. The second dopant species does not interfere with the bottom source/drain extension and bottom source/drain junction due to limited diffusion of the second dopant species.
    Type: Application
    Filed: March 29, 2019
    Publication date: July 25, 2019
    Inventors: Alexander Reznicek, Shogo Mochizuki
  • Publication number: 20190229205
    Abstract: A vertical transistor structure is provided that includes a bottom source/drain structure that includes a doped semiconductor buffer layer that contains a first dopant species having a first diffusion rate, and an epitaxial doped semiconductor layer that contains a second dopant species that has a second diffusion rate that is less than the first diffusion rate. During a junction anneal, the first dopant species readily diffuses from the doped semiconductor buffer layer into a pillar portion of a base semiconductor substrate to provide the bottom source/drain extension and bottom source/drain junction. No diffusion overrun is observed. During the junction anneal, the second dopant species remains in the epitaxial doped semiconductor layer providing a low resistance contact. The second dopant species does not interfere with the bottom source/drain extension and bottom source/drain junction due to limited diffusion of the second dopant species.
    Type: Application
    Filed: March 29, 2019
    Publication date: July 25, 2019
    Inventors: Alexander Reznicek, Shogo Mochizuki
  • Publication number: 20190229021
    Abstract: A semiconductor device includes a plurality of stacked gate regions spaced apart from each other on a substrate, a plurality of first epitaxial source/drain regions between the plurality of stacked gate regions, wherein the first epitaxial source/drain regions extend from sides of the plurality of stacked gate regions in a first doped region, a plurality of second epitaxial source/drain regions between the plurality of stacked gate regions and positioned over the first epitaxial source/drain regions, wherein the second epitaxial source/drain regions extend from sides of the plurality of stacked gate regions in a second doped region, and a contact region extending through a second epitaxial source/drain region of the plurality of second epitaxial source/drain regions to a first epitaxial source/drain region of the plurality of first epitaxial source/drain regions.
    Type: Application
    Filed: April 3, 2019
    Publication date: July 25, 2019
    Inventors: Takashi Ando, Pouya Hashemi, Choonghyun Lee, Alexander Reznicek, Jingyun Zhang
  • Publication number: 20190229195
    Abstract: A semiconductor structure is provided including a strained silicon germanium alloy fin that can be employed as a channel material for a FinFET device and having a gate spacer including a lower portion that fills in a undercut region that lies adjacent to the strained silicon germanium alloy fin and beneath raised source/drain (S/D) structures and silicon pedestal structures that can provide improved overlay capacitance.
    Type: Application
    Filed: March 29, 2019
    Publication date: July 25, 2019
    Inventors: Karthik Balakrishnan, Kangguo Cheng, Pouya Hashemi, Alexander Reznicek
  • Patent number: 10361199
    Abstract: A complementary metal oxide semiconductor (CMOS) vertical transistor structure with closely spaced p-type and n-type vertical field effect transistors (FETs) is provided. After forming a dielectric material portion contacting a proximal sidewall of a first semiconductor fin for formation of a p-type vertical FET and a proximal sidewall of a second semiconductor fin for formation of an n-type vertical FET, a first gate structure is formed contacting a distal sidewall of the first semiconductor fin, and a second gate structure is formed contacting a distal sidewall of the second semiconductor fin. Because no gate structures are formed between the first and second semiconductor fins, the p-type vertical FET is spaced from the n-type FET only by the dielectric material portion.
    Type: Grant
    Filed: November 14, 2017
    Date of Patent: July 23, 2019
    Assignee: International Business Machines Corporation
    Inventors: Karthik Balakrishnan, Kangguo Cheng, Pouya Hashemi, Alexander Reznicek
  • Patent number: 10361301
    Abstract: A vertical fin field effect transistor including a doped region in a substrate, wherein the doped region has the same crystal orientation as the substrate, a first portion of a vertical fin on the doped region, wherein the first portion of the vertical fin has the same crystal orientation as the substrate and a first portion width, a second portion of the vertical fin on the first portion of the vertical fin, wherein the second portion of the vertical fin has the same crystal orientation as the first portion of the vertical fin, and the second portion of the vertical fin has a second portion width less than the first portion width, a gate structure on the second portion of the vertical fin, and a source/drain region on the top of the second portion of the vertical fin.
    Type: Grant
    Filed: October 13, 2017
    Date of Patent: July 23, 2019
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Karthik Balakrishnan, Kangguo Cheng, Pouya Hashemi, Alexander Reznicek
  • Patent number: 10361306
    Abstract: A semiconductor structure is provided in which gallium-doped sacrificial epitaxial or polycrystalline germanium layer is formed on a silicon germanium substrate having a high percentage of germanium followed by annealing to diffuse the gallium into the silicon germanium substrate. The germanium layer is selectively removed to expose the surface of a gallium-doped silicon germanium region within the silicon germanium substrate. The process has application to the formation of electrically conductive regions within integrated circuits such as source/drain regions and junctions without the introduction of carbon into such regions.
    Type: Grant
    Filed: August 3, 2017
    Date of Patent: July 23, 2019
    Assignee: International Business Machines Corporation
    Inventors: Mona Abdulkhaleg Ebrish, Oleg Gluschenkov, Shogo Mochizuki, Alexander Reznicek
  • Patent number: 10361277
    Abstract: Low resistivity, wrap-around contact structures are provided in nanosheet devices, vertical FETs, and FinFETs. Such contact structures are obtained by delivering dopants to source/drain regions using a highly conformal, doped metal layer. The conformal, doped metal layer may be formed by ALD or CVD using a titanium tetraiodide precursor. Dopants within the conformal, doped metal layer are delivered during the formation of wrap-around metal silicide or metal germano-silicide regions. Dopant segregation at silicide/silicon interfaces or germano-silicide/silicon interfaces reduces contact resistance in the wrap-around contact structures. A contact metal layer electrically communicates with the wrap-around contact structures.
    Type: Grant
    Filed: March 12, 2018
    Date of Patent: July 23, 2019
    Assignee: International Business Machines Corporation
    Inventors: Praneet Adusumilli, Adra V. Carr, Alexander Reznicek, Oscar van der Straten
  • Patent number: 10361131
    Abstract: A semiconductor device includes a plurality of stacked gate regions spaced apart from each other on a substrate, a plurality of first epitaxial source/drain regions between the plurality of stacked gate regions, wherein the first epitaxial source/drain regions extend from sides of the plurality of stacked gate regions in a first doped region, a plurality of second epitaxial source/drain regions between the plurality of stacked gate regions and positioned over the first epitaxial source/drain regions, wherein the second epitaxial source/drain regions extend from sides of the plurality of stacked gate regions in a second doped region, and a contact region extending through a second epitaxial source/drain region of the plurality of second epitaxial source/drain regions to a first epitaxial source/drain region of the plurality of first epitaxial source/drain regions.
    Type: Grant
    Filed: December 12, 2018
    Date of Patent: July 23, 2019
    Assignee: International Business Machines Corporation
    Inventors: Takashi Ando, Pouya Hashemi, Choonghyun Lee, Alexander Reznicek, Jingyun Zhang