Abstract: Techniques are disclosed for monitoring the performance of transient virtual volumes created for a virtual machine. Each transient virtual volume is created in response to a first trigger event, used by the virtualization environment solely to perform a single function supporting execution of the virtual machine, and deleted in response to a second trigger event. When creation of a current transient virtual volume is detected, and while the virtualization environment uses the current transient virtual volume to perform a single function supporting execution of the virtual machine, performance data is collected for the current transient virtual volume, and combined with performance data collected for at least one other, previously deleted transient virtual volume that was used solely to perform the same single function supporting execution of the same virtual machine. The combined performance data is represented as performance data for a single monitored virtual volume associated with the virtual machine.

Abstract: A method for analyzing power in a circuit includes identifying equivalent elements in a source netlist representing the circuit. Abstract elements are formed combining the equivalent elements of the source netlist. A reduced netlist is formed, substituting the abstract elements in the reduced netlist for the collective equivalent elements in the source netlist. Metrics or properties associated with equivalent elements of the source netlist are combined and associated, in the reduced netlist, with the abstract elements. The reduced netlist can be analyzed with results equivalent to analyzing the source netlist.

Abstract: A method for analyzing power in a circuit includes identifying equivalent elements in a source netlist representing the circuit. Abstract elements are formed combining the equivalent elements of the source netlist. A reduced netlist is formed, substituting the abstract elements in the reduced netlist for the collective equivalent elements in the source netlist. Metrics or properties associated with equivalent elements of the source netlist are combined and associated, in the reduced netlist, with the abstract elements. The reduced netlist can be analyzed with results equivalent to analyzing the source netlist.

Abstract: Techniques for visualizing performance of file-based VVols and block-based VVols for aiding in administration of a data storage system operating in a virtualization environment allow performance of these different types of VVols to be visualized side-by-side using a common set of performance metrics. Thus, in one embodiment, the performances of file-based and block-based VVols are both converted into a mutually-compatible format and rendered for display together on screen.

Abstract: Aspects of the present invention include a method, system and computer program product that provides for improved localized self-heating analysis during IC design. The method includes a processor for modeling a power characteristic and a thermal resistance characteristic for each one of a plurality of locations within a cell that is being designed into an integrated circuit; for performing a self-heating analysis to determine an amount of heat at each one of the plurality of locations within the cell; and for creating a thermal profile for the cell, wherein the thermal profile includes a maximum self-heating value for each of the plurality of locations within the cell and includes an average self-heating value for the cell, and wherein the maximum self-heating value and the average self-heating value are derived from the determined amount of heat at each one of the plurality of locations within the cell.

Abstract: Aspects of the present invention include a method, system and computer program product that provides for improved localized self-heating analysis during IC design. The method includes a processor for modeling a power characteristic and a thermal resistance characteristic for each one of a plurality of locations within a cell that is being designed into an integrated circuit; for performing a self-heating analysis to determine an amount of heat at each one of the plurality of locations within the cell; and for creating a thermal profile for the cell, wherein the thermal profile includes a maximum self-heating value for each of the plurality of locations within the cell and includes an average self-heating value for the cell, and wherein the maximum self-heating value and the average self-heating value are derived from the determined amount of heat at each one of the plurality of locations within the cell.

Abstract: A computer-implemented method for computing leakage power in a semiconductor device may include generating, via a processor, a process voltage temperature (PVT)-independent power model, generating, via the processor, a PVT-dependent power model based on the PVT-independent power model, and computing, via the processor, a leakage power based on the PVT-dependent power model.

Abstract: A system for post-silicon leakage characterization is configured to apply a rail voltage to a hardware component; cause the hardware component to operate at a particular frequency; cause a cooling device, coupled to the hardware component, to operate at a cooling capacity; run a workload on the hardware component after applying the rail voltage, causing the hardware component to operate at a particular frequency, and causing the cooling device to operate at a particular cooling capacity; discontinue the workload and clocks of the hardware component after a temperature of the hardware component has reached a steady high point; continuously measure temperature and leakage power of the hardware component after discontinuing the workload until the temperature of the hardware component has reached a steady low point; and adjust a power management procedure for the hardware component based on measured temperature and measured leakage power of the hardware component.

Abstract: A processor may receive a transistor level integrated circuit (IC) design to be modelled. The processor may determine that the transistor level IC design has a first stage and a second stage. The processor may determine a first cross-current effective capacitance of the first stage and a second cross-current effective capacitance of the second stage. The processor may then determine a cross-current effective capacitance for the transistor level IC design by accumulating the first and second cross-current effective capacitances.

Abstract: A method for analyzing power in a circuit includes identifying equivalent elements in a source netlist representing the circuit. Abstract elements are formed combining the equivalent elements of the source netlist. A reduced netlist is formed, substituting the abstract elements in the reduced netlist for the collective equivalent elements in the source netlist. Metrics or properties associated with equivalent elements of the source netlist are combined and associated, in the reduced netlist, with the abstract elements. The reduced netlist can be analyzed with results equivalent to analyzing the source netlist.

Abstract: A method for analyzing power in a circuit includes identifying equivalent elements in a source netlist representing the circuit. Abstract elements are formed combining the equivalent elements of the source netlist. A reduced netlist is formed, substituting the abstract elements in the reduced netlist for the collective equivalent elements in the source netlist. Metrics or properties associated with equivalent elements of the source netlist are combined and associated, in the reduced netlist, with the abstract elements. The reduced netlist can be analyzed with results equivalent to analyzing the source netlist.

Abstract: A system and method for enabling the estimation and mitigation of self-heating in chip designs at a much earlier stage in a design flow. The system and method provides unique characterization of each standard cell in a library for its effective thermal resistance based on the topology and layout of the cell, and brings this per standard cell instance based delta-T to be available for the timing closure tools when completing a synthesized design. Thus, at the timing closure process, the generated design is free of self heating violations. The method computes a unique thermal resistance characterization on per standard cell manner—based on the topology, function and layout of the standard cell, and uses that to compute the deltaT per instance of the design. This information is presented to a violation mitigation tool which changes the power levels of the cells, logic function to mitigate the self heating violations.

Abstract: Techniques for visualizing performance of VVols for aiding in administration of a data storage system operating in a virtualization environment allow performance of these VVols to be visualized in a highly-flexible manner. Thus, in one embodiment, the performances of all VVols within a storage container are aggregated together for easy comparison among the aggregated performances of different storage containers.

Abstract: Systems, methods, and computer-readable media are disclosed for virtualizing memory compute function resources to improve resource utilization and system performance are disclosed. A virtualized hypervisor may be provided that is configured to instantiate a respective memory function controller of each memory controller present in a system/device. The virtualized hypervisor may be further configured to maintain the memory function controllers and their corresponding memory compute functionality as shareable resources that can be allocated to system components upon request. The virtualized hypervisor may allocate a memory function controller and its corresponding memory compute functionality to a system component, and may further provide the system component with an exclusive grant of memory compute pages that can be utilized by the allocated memory function controller to execute a memory compute function to perform one or more operations (e.g., one or more computations) on behalf of the system component.

Abstract: A processor may receive a transistor level integrated circuit (IC) design to be modelled. The processor may determine that the transistor level IC design has a first stage and a second stage. The processor may determine a first cross-current effective capacitance of the first stage and a second cross-current effective capacitance of the second stage. The processor may then determine a cross-current effective capacitance for the transistor level IC design by accumulating the first and second cross-current effective capacitances.

Abstract: A garment being worn by a user is optimized by altering a feature of a garment including texture, shape and size, while the garment is still being worn by the user.

Abstract: A system and method for enabling the estimation and mitigation of self-heating in chip designs at a much earlier stage in a design flow. The system and method provides unique characterization of each standard cell in a library for its effective thermal resistance based on the topology and layout of the cell, and brings this per standard cell instance based delta-T to be available for the timing closure tools when completing a synthesized design. Thus, at the timing closure process, the generated design is free of self heating violations. The method computes a unique thermal resistance characterization on per standard cell manner—based on the topology, function and layout of the standard cell, and uses that to compute the deltaT per instance of the design. This information is presented to a violation mitigation tool which changes the power levels of the cells, logic function to mitigate the self heating violations.

Abstract: A computer-implemented method includes receiving a unit, wherein each unit includes one or more blocks. The computer-implemented method further includes selecting one or more input pins for each of said one or more blocks. The computer-implemented method further includes assigning a numerical value to each of said one or more input pins to yield at least one numerical sequence. The computer-implemented method further includes, for each numerical sequence of the at least one numerical sequence, performing a check on the numerical sequence to yield a number of fails. The computer-implemented method further includes determining a simulation condition for power modeling of the unit based on optimizing a numerical sequence with respect to the number of fails. The computer-implemented method further includes determining a number of design errors of the unit based on the simulation condition. A corresponding computer system and computer program product are also disclosed.

Abstract: A processor may receive a transistor level integrated circuit (IC) design to be modelled. The processor may determine that the transistor level IC design has a first stage and a second stage. The processor may determine a first cross-current effective capacitance of the first stage and a second cross-current effective capacitance of the second stage. The processor may then determine a cross-current effective capacitance for the transistor level IC design by accumulating the first and second cross-current effective capacitances.

Abstract: A processor may receive a transistor level integrated circuit (IC) design to be modelled. The processor may determine that the transistor level IC design has a first stage and a second stage. The processor may determine a first cross-current effective capacitance of the first stage and a second cross-current effective capacitance of the second stage. The processor may then determine a cross-current effective capacitance for the transistor level IC design by accumulating the first and second cross-current effective capacitances.