Patents by Inventor Ashutosh Malshe

Ashutosh Malshe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200174681
    Abstract: A data integrity check is performed on a data block of the memory component to obtain a reliability statistic for each of a set of sampled memory cells in the data block. A distribution statistic is determined based on the reliability statistic for each of the set of sampled memory cells. A subset of the data block is identified to be relocated to another data block of the memory component based on the distribution statistic. Data of the subset of the data block is relocated to the other data block.
    Type: Application
    Filed: December 4, 2018
    Publication date: June 4, 2020
    Inventors: Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Pavan Rayaprolu, Harish R. Singidi
  • Patent number: 10672452
    Abstract: Devices and techniques for temperature informed memory refresh are described herein. Temperature data can be updated in response to a memory component write performed under an extreme temperature. Here, the write is performed on a memory component element in the memory component. The memory component element can be sorted above other memory component elements in the memory component based on the temperature data. Once sorted to the top of these memory component elements, a refresh can be performed the memory component element.
    Type: Grant
    Filed: September 21, 2018
    Date of Patent: June 2, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Gianni Stephen Alsasua, Harish Reddy Singidi, Kishore Kumar Muchherla, Sampath Ratnam, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Renato Padilla, Jr.
  • Patent number: 10671298
    Abstract: Data to store at a storage system is received. The storage system includes data blocks and the plurality of blocks that include a first region corresponding to a first storage density and a second region corresponding to a second storage density that is less dense than the first storage density. The data is stored at the first region of the plurality of data blocks that corresponds to the first storage density. A write attribute related to storing the data at the first region of the plurality of data blocks is determined. Thereupon, the write attribute related to storing the data at the first region is stored in the second region of the plurality of data blocks that corresponds to the second storage density.
    Type: Grant
    Filed: March 6, 2018
    Date of Patent: June 2, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Kishore Kumar Muchherla, Harish R. Singidi, Ashutosh Malshe, Gianni S. Alsasua
  • Publication number: 20200159410
    Abstract: A region of a memory component is determined to include a type of memory. A frequency to perform an operation on the region of the memory component is determined based on the type of memory. The operation is performed on a memory cell at the region of the memory component at the determined frequency to transition the memory cell from a state associated with an increased error rate for data stored at the memory cell to another state associated with a decreased error rate for the data stored at the memory cell.
    Type: Application
    Filed: November 19, 2018
    Publication date: May 21, 2020
    Inventors: Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Harish R. Singidi, Ashutosh Malshe, Kishore Kumar Muchherla
  • Publication number: 20200159446
    Abstract: Various examples are directed to systems and methods of managing a memory device. The memory device may receive a read request describing a logical address at the memory device. The memory device may obtain a table entry associated with the logical address. The table entry comprises a physical address corresponding to the logical address and a write temperature data indicating a write temperature for the logical address. The memory device may determine a corrected threshold voltage for reading the physical address based at least in part on the write temperature data and read the physical address using the corrected threshold voltage.
    Type: Application
    Filed: November 16, 2018
    Publication date: May 21, 2020
    Inventors: Gianni Stephen Alsasua, Karl D. Schuh, Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Pavan Rayaprolu, Sampath Ratnam, Harish Reddy Singidi, Renato Padilla, JR.
  • Publication number: 20200160894
    Abstract: A variety of applications can include apparatus and/or methods of operating the apparatus that include a memory device having read levels that can be calibrated. A calibration controller implemented with the memory device can trigger a read level calibration based on inputs from one or more trackers monitoring parameters associated with the memory device and a determination of an occurrence of at least one event from a set of events related to the monitored parameters. The monitored parameters can include parameters related to a selected time interval and measurements of read, erase, or write operations of the memory device. Additional apparatus, systems, and methods are disclosed.
    Type: Application
    Filed: January 22, 2020
    Publication date: May 21, 2020
    Inventors: Kishore Kumar Muchherla, Ashutosh Malshe, Harish Reddy Singidi, Gianni Stephen Alsasua, Gary F. Besinga, Sampath Ratnam, Peter Sean Feeley
  • Publication number: 20200159426
    Abstract: Disclosed in some examples are memory devices which feature customizable Single Level Cell (SLC) and Multiple Level Cell (MLC) configurations. The SLC memory cells serve as a high-speed cache providing SLC level performance with the storage capacity of a memory device with MLC memory cells. The proportion of cells configured as MLC vs the proportion that are configured as SLC storage may be configurable, and in some examples, the proportion may change during usage based upon configurable rules based upon memory device metrics. In some examples, when the device activity is below an activity threshold, the memory device may skip the SLC cache and place the data directly into the MLC storage to reduce power consumption.
    Type: Application
    Filed: January 27, 2020
    Publication date: May 21, 2020
    Inventors: Kulachet Tanpairoj, Sebastien Andre Jean, Kishore Kumar Muchherla, Ashutosh Malshe, Jianmin Huang
  • Patent number: 10658047
    Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
    Type: Grant
    Filed: October 31, 2018
    Date of Patent: May 19, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, Jr., Michael Miller
  • Publication number: 20200152280
    Abstract: A processing device in a memory system determines that a first metric of a first memory unit on a first plane of a memory device satisfies a first threshold criterion. The processing device further determines whether a second metric of a second memory unit on a second plane of the memory device satisfies a second threshold criterion, wherein the second block is associated with the first block, and wherein the second threshold criterion is lower than the first threshold criterion. Responsive to the second metric satisfying the second threshold criterion, the processing device performs a multi-plane data integrity operation to determine a first reliability statistic for the first memory unit and a second reliability statistic for the second memory unit in parallel.
    Type: Application
    Filed: January 13, 2020
    Publication date: May 14, 2020
    Inventors: Kishore Kumar Muchherla, Ashutosh Malshe, Harish R. Singidi, Shane Nowell, Vamsi Pavan Rayaprolu, Sampath K. Ratnam
  • Publication number: 20200133843
    Abstract: An amount of valid data for each data block of multiple data blocks stored at a first memory is determined. An operation to write valid data of a particular data block from the first memory to a second memory is performed based on the amount of valid data for each data block. A determination is made that a threshold condition associated with when valid data of the data blocks was written to the first memory has been satisfied. In response to determining that the threshold condition has been satisfied, the operation to write valid data of the data blocks from the first memory to the second memory is performed based on when the valid data was written to the first memory.
    Type: Application
    Filed: October 30, 2018
    Publication date: April 30, 2020
    Inventors: Kishore Kumar Muchherla, Peter Sean Feeley, Sampath K. Ratnam, Ashutosh Malshe, Christopher S. Hale
  • Publication number: 20200135279
    Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
    Type: Application
    Filed: October 31, 2018
    Publication date: April 30, 2020
    Inventors: Harish Singidi, Kishore Muchherla, Ashutosh Malshe, Vamsi Rayaprolu, Sampath Ratnam, Renato Padilla, JR., Michael Miller
  • Publication number: 20200133585
    Abstract: A first data block of multiple data blocks is identified in a first portion of the memory component, the first data block being identified based on a read count associated with the first data block satisfies a first threshold criterion. A determination is made as to whether a second portion of the memory component has an amount of unused storage to store data stored at the first data block, wherein the second portion of the memory component is associated with a lower read latency than the first portion. In response to determining that the second portion of the memory component has the amount of unused storage to store the data stored at the first data block, data stored at the first data block in the first portion of the memory component is relocated to a second data block in the second portion of the memory component. An error rate is evaluated on each word line in the first data block.
    Type: Application
    Filed: October 30, 2018
    Publication date: April 30, 2020
    Inventors: Kishore Kumar Muchherla, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Harish R. Singidi, Peter Feeley
  • Publication number: 20200117557
    Abstract: A variety of applications can include apparatus and/or methods to preemptively detect detect one memory blocks in a memory device and handle these memory blocks before they fail and trigger a data loss event. Metrics based on memory operations can be used to facilitate the examination of the memory blocks. One or more metrics associated with a memory operation on a block of memory can be tracked and a Z-score for each metric can be generated. In response to a comparison of a Z-score for a metric to a Z-score threshold for the metric, operations can be performed to control possible retirement of the memory block beginning with the comparison. Additional apparatus, systems, and methods are disclosed.
    Type: Application
    Filed: October 12, 2018
    Publication date: April 16, 2020
    Inventors: Harish Reddy Singidi, Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Jianmin Huang, Xiangang Luo, Ashutosh Malshe
  • Publication number: 20200117538
    Abstract: Disclosed in some examples are techniques for handling parity data of a non-volatile memory device with limited cache memory. In certain examples, user data can be programmed into the non-volatile memory of the non-volatile memory device in data stripes, and parity information can be calculated for each individual data stripe within a limited capacity cache of the non-volatile memory device. The individual parity information can be swapped between a swap block of the non-volatile memory and the limited capacity cache as additional data stripes are programmed.
    Type: Application
    Filed: October 12, 2018
    Publication date: April 16, 2020
    Inventors: Harish Reddy Singidi, Xiangang Luo, Jianmin Huang, Kishore Kumar Muchherla, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Sampath Ratnam
  • Publication number: 20200098421
    Abstract: Devices and techniques for temperature informed memory refresh are described herein. Temperature data can be updated in response to a memory component write performed under an extreme temperature. Here, the write is performed on a memory component element in the memory component. The memory component element can be sorted above other memory component elements in the memory component based on the temperature data. Once sorted to the top of these memory component elements, a refresh can be performed the memory component element.
    Type: Application
    Filed: September 21, 2018
    Publication date: March 26, 2020
    Inventors: Gianni Stephen Alsasua, Harish Reddy Singidi, Kishore Kumar Muchherla, Sampath Ratnam, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Renato Padilla, JR.
  • Publication number: 20200097211
    Abstract: Systems and methods are disclosed, comprising a memory device comprising multiple groups of memory cells, the groups comprising a first group of memory cells and a second group of memory cells configured to store information at a same bit capacity per memory cell, and a processing device operably coupled to the memory device, the processing device configured to adjust a scan event threshold for one of the first or second groups of memory cells to a threshold less than a target scan event threshold for the first and second groups of memory cells to distribute scan events in time on the memory device.
    Type: Application
    Filed: September 21, 2018
    Publication date: March 26, 2020
    Inventors: Gianni Stephen Alsasua, Harish Reddy Singidi, Peter Sean Feeley, Ashutosh Malshe, Renato Padilla, JR., Kishore Kumar Muchherla, Sampath Ratnam
  • Publication number: 20200097402
    Abstract: A memory system includes a memory array having a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: select a garbage collection (GC) source block storing valid data, and designate a storage mode for an available memory block based on the valid data, wherein the storage mode is for configuring memory cells in the available memory block as cache memory that stores a number of bits less than maximum storage capacities thereof for subsequent or upcoming data writes.
    Type: Application
    Filed: November 27, 2019
    Publication date: March 26, 2020
    Inventors: Kishore Kumar Muchherla, Peter Feeley, Ashutosh Malshe, Daniel J. Hubbard, Christopher S. Hale, Kevin R. Brandt, Sampath K. Ratnam, Yun Li, Marc S. Hamilton
  • Patent number: 10586602
    Abstract: Devices and techniques for read voltage calibration of a flash-based storage system based on host IO operations are disclosed. In an example, a memory device includes a NAND memory array having groups of multiple blocks of memory cells, and a memory controller to optimize voltage calibration for reads of the memory array. In an example, the optimization technique includes monitoring read operations occurring to a respective block, identifying a condition to trigger a read level calibration based on the read operations, and performing the read level calibration for the respective block or a memory component that includes the respective block. In a further example, the calibration is performed based on a threshold voltage to read the respective block, which may be considered when the threshold voltage to read the respective block is evaluated within a sampling operation performed by the read level calibration.
    Type: Grant
    Filed: June 10, 2019
    Date of Patent: March 10, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Ashutosh Malshe, Kishore Kumar Muchherla, Harish Reddy Singidi, Peter Sean Feeley, Sampath Ratnam, Kulachet Tanpairoj, Ting Luo
  • Patent number: 10573357
    Abstract: A variety of applications can include apparatus and/or methods of operating the apparatus that include a memory device having read levels that can be calibrated. A calibration controller implemented with the memory device can trigger a read level calibration based on inputs from one or more trackers monitoring parameters associated with the memory device and a determination of an occurrence of at least one event from a set of events related to the monitored parameters. The monitored parameters can include parameters related to a selected time interval and measurements of read, erase, or write operations of the memory device. Additional apparatus, systems, and methods are disclosed.
    Type: Grant
    Filed: December 21, 2018
    Date of Patent: February 25, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Kishore Kumar Muchherla, Ashutosh Malshe, Harish Reddy Singidi, Gianni Stephen Alsasua, Gary F. Besinga, Sampath Ratnam, Peter Sean Feeley
  • Patent number: 10553290
    Abstract: A processing device in a memory system determines that a first read count of a first data block on a first plane of a memory component satisfies a first threshold criterion. The processing device further determines whether a second read count of a second data block on a second plane of the memory component satisfies a second threshold criterion, wherein the second block is associated with the first block, and wherein the second threshold criterion is lower than the first threshold criterion. Responsive to the second read count satisfying the second threshold criterion, the processing device performs a multi-plane scan to determine a first error rate for the first data block and a second error rate for the second data block in parallel.
    Type: Grant
    Filed: October 30, 2018
    Date of Patent: February 4, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Kishore Kumar Muchherla, Ashutosh Malshe, Harish R. Singidi, Shane Nowell, Vamsi Pavan Rayaprolu, Sampath K. Ratnam