Patents by Inventor Atsushi Miyamoto

Atsushi Miyamoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160127636
    Abstract: There is provided an image processing apparatus including a display configured to display a captured image and a representative icon, wherein the representative icon indicates a range of a focus area of the displayed image and the range encompasses a center of focus point located at an initial position within the displayed image, and a processor configured to adjust the range of the focus area of the displayed image according to a size of the representative icon.
    Type: Application
    Filed: May 2, 2014
    Publication date: May 5, 2016
    Applicant: SONY CORPORATION
    Inventors: Katsuhisa Ito, Atsushi Miyamoto, Kengo Hayasaka, Hironori Mori
  • Patent number: 9317918
    Abstract: An apparatus for medical diagnostic imaging assistance includes memory that stores first feature information representing the feature of a lesion mask or non-lesion mask, a sampling unit that acquires a plurality of samples by making sampling form the memory based on the first feature information, a machine-learning unit that generates a first discrimination condition corresponding to each of samples by carrying out a machine-learning step on the multiple samples, and a statistical processing unit that generates a second discrimination condition by carrying out a statistical processing step under the first discrimination condition, in which a detection function determines whether a lesion candidate mask is an actual lesion by referring to second feature information representing the feature of a lesion candidate mask under a second discrimination condition.
    Type: Grant
    Filed: January 29, 2013
    Date of Patent: April 19, 2016
    Assignee: Hitachi, Ltd.
    Inventors: Atsushi Miyamoto, Junichi Miyakoshi
  • Patent number: 9305343
    Abstract: A plurality of images is captured, and the plurality of images is integrated and displayed after one or more ROIs included in the captured images are extracted and classified. At integration, an integration method is controlled according to a classification result of the ROI.
    Type: Grant
    Filed: April 11, 2014
    Date of Patent: April 5, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kenji Nakahira, Atsushi Miyamoto, Takehiro Hirai
  • Patent number: 9245323
    Abstract: A medical diagnostic device is characterized in that an image processing unit (22) includes an image noise removal part (211, 211?) which removes the noise in the generated image of a person to be examined, a signal component enhancement processing part (212, 212?) which generates an enhanced-signal component image by performing signal component enhancement processing of the image from which the noise is removed by the image noise removal part, and an image combining part (213, 213?) which generates a combined image by combining the image of the person to be examined, the image from which the noise is removed by the image noise removal part, and an enhanced-signal component image subjected to signal component enhancement processing by the signal component enhancement processing part.
    Type: Grant
    Filed: April 2, 2009
    Date of Patent: January 26, 2016
    Assignee: HITACHI MEDICAL CORPORATION
    Inventors: Jie Bai, Kenji Nakahira, Atsushi Miyamoto
  • Publication number: 20150313679
    Abstract: Provided is a surgical imaging apparatus that includes a multi-link, multi joint structure including a plurality of joints that interconnect a plurality of links to provide the multi-link, multi joint structure with a plurality of degrees of freedom, at least one video camera being disposed on a distal end of the multi-link, multi-joint structure; at least one actuator that drives at least one of the plurality of joints; and circuitry that detects a joint force experienced at the at least one of the plurality of joints in response to an applied external force, and controls the at least one actuator based on the joint force so as to position the video camera.
    Type: Application
    Filed: July 15, 2015
    Publication date: November 5, 2015
    Applicant: SONY OLYMPUS MEDICAL SOLUTIONS INC.
    Inventors: Tetsuharu FUKUSHIMA, Wataru KOKUBO, Toshimitsu TSUBOI, Atsushi MIYAMOTO, Kenichiro NAGASAKA, Kenji HIROSE
  • Patent number: 9165356
    Abstract: A defect inspection method for inspecting a defect on a semiconductor wafer, using plural inspection methods includes: merging hot-spot coordinates as coordinates on the semiconductor wafer, designated by a user, or coordinates where a systematic defect can occur, with detected defect coordinates on the semiconductor wafer, acquired from inspection information, after information indicating the type of coordinates are added thereto; deciding an inspection sequence of the coordinates merged with each other; and defect inspection for executing selection using the information indicating the respective types of the coordinates merged with each other, and executing an inspection by selecting an inspection method for every coordinates to be inspected.
    Type: Grant
    Filed: July 6, 2012
    Date of Patent: October 20, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Minoru Harada, Atsushi Miyamoto, Takehiro Hirai, Fumihiko Fukunaga
  • Publication number: 20150272552
    Abstract: In order to acquire high resolution ultrasound images while maintaining an appropriate frame rate in ultrasound diagnostic devices, the disclosed method generates high resolution ultrasound images by performing image reconstruction on the basis of multiple ultrasound frame images captured along a time series and the magnitudes of positional shifts, or forms high resolution ultrasound images by performing image reconstruction on the basis of multiple ultrasound frame images acquired by controlling the ultrasound probe and varying scan orientation or scan focal length frame by frame.
    Type: Application
    Filed: June 15, 2015
    Publication date: October 1, 2015
    Applicant: HITACHI MEDICAL CORPORATION
    Inventors: Go Kotaki, Atsushi Miyamoto, Kenji Nakahira
  • Publication number: 20150250547
    Abstract: Provided is a medical robot arm apparatus including a plurality of joint units configured to connect a plurality of links and implement at least 6 or more degrees of freedom in driving of a multi-link structure configured with the plurality of links, and a drive control unit configured to control driving of the joint units based on states of the joint units. A front edge unit attached to a front edge of the multi-link structure is at least one medical apparatus.
    Type: Application
    Filed: September 19, 2014
    Publication date: September 10, 2015
    Applicant: SONY OLYMPUS MEDICAL SOLUTIONS INC.
    Inventors: Tetsuharu Fukushima, Wataru Kokubo, Toshimitsu Tsuboi, Atsushi Miyamoto, Kenichiro Nagasaka, Kenji Hirose
  • Publication number: 20150202777
    Abstract: A robot apparatus includes an output unit that displays an image including an object on a screen, an input unit that receives an operation performed by a user for specifying information relating to an approximate range including the object in the image, an object extraction unit that extracts information regarding a two-dimensional contour of the object on the basis of the specification received by the input unit, and a position and attitude estimation unit that estimates information regarding a three-dimensional position and attitude of the object on the basis of the information regarding the two-dimensional contour.
    Type: Application
    Filed: March 30, 2015
    Publication date: July 23, 2015
    Applicant: Sony Corporation
    Inventors: Genta Kondo, Atsushi Miyamoto, Satoru Shimizu
  • Patent number: 9082585
    Abstract: An imaging region of a high-magnification reference image capable of being acquired in a low-magnification field without moving a stage from a position at which a defective region has been imaged at a low magnification is searched for and if the search is successful, an image of the imaging region itself is acquired and the high-magnification reference image is acquired. If the search is unsuccessful, the imaging scheme is switched to that in which the high-magnification reference image is acquired from a chip adjacent to the defective region.
    Type: Grant
    Filed: November 27, 2009
    Date of Patent: July 14, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Go Kotaki, Atsushi Miyamoto, Ryo Nakagaki, Takehiro Hirai
  • Patent number: 9057873
    Abstract: In order to provide a technique for performing global alignment (detecting position shift and rotation of a wafer) stably and automatically using an optical microscope, as a pattern for global alignment, multiple alignment pattern candidates are calculated (107), multiple data for matching are created for each alignment pattern (108), matching is performed with respect to the data for matching for each alignment pattern in descending order of appropriateness as an alignment pattern with an image (113) based on an image signal from the optical microscope (114), and the amount of position shift and the amount of rotation of the wafer are calculated (116) on the basis of the results of matching (115).
    Type: Grant
    Filed: November 22, 2011
    Date of Patent: June 16, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Atsushi Miyamoto, Naoki Hosoya, Toshikazu Kawahara, Akihiro Onizawa
  • Patent number: 9044856
    Abstract: A robot apparatus includes a plurality of arm sections; a grasping-easiness calculation section configured to calculate an index value of grasping easiness quantitatively evaluating easiness of assuming a grasping posture for grasping an object or assuming a transition posture leading to the grasping posture for each of the plurality of arm sections; and an arm-section selection section configured to select an arm section to be used for actually grasping the object on the basis of the index value of the grasping easiness calculated for each of the arm sections.
    Type: Grant
    Filed: November 19, 2012
    Date of Patent: June 2, 2015
    Assignee: SONY CORPORATION
    Inventors: Kenichiro Nagasaka, Takashi Kito, Hirokazu Shirado, Atsushi Miyamoto
  • Publication number: 20150146967
    Abstract: The present invention relates to a setting method for an image capture area on the occasion of evaluation of a circuit pattern using a scanning charged particle microscope. A circuit pattern that is to be evaluated using an actual image or design data is determined, a plurality of image capture areas are set such that the circuit pattern to be evaluated is included in a section of the field of vision, and images are captured of the plurality of image capture areas. When setting the image capture areas, a permissible value for the distance between adjacent first and second images is set, and the positions of the image capture areas are optimized so as to correspond as closely as possible with the permissible value for distance. As a result, it is possible to improve the throughput of image capture of wide inspection areas that do not fit in the field of vision of the scanning charge particle microscope, and to efficiently carry out determination of an inspection area that may cause electrical failure.
    Type: Application
    Filed: April 24, 2013
    Publication date: May 28, 2015
    Inventors: Atsushi Miyamoto, Toshikazu Kawahara, Akihiro Onizawa, Yutaka Hojo
  • Publication number: 20150149475
    Abstract: The present invention provides a data harmonic analysis method and a data analysis device for data analysis in which a plurality of data items to be analyzed are acquired; similarities among a plurality of data sources that generate the data values of the acquired plurality of data items are obtained; a hierarchical graph is generated as a graph structure indicating the acquired plurality of data items, with a plurality of child nodes corresponding to the plurality of data items being located in a lower layer and a parent node that has no data item being located in an upper layer; the connection rate between the parent node and each of the plurality of child nodes is calculated by using the information of the obtained similarities in the generated hierarchical graph; and harmonic analysis is applied, on the basis of the generated hierarchical graph, to the data values in the graph.
    Type: Application
    Filed: July 5, 2013
    Publication date: May 28, 2015
    Applicant: HITACHI, LTD.
    Inventors: Kenji Nakahira, Atsushi Miyamoto
  • Patent number: 9043804
    Abstract: There is provided a parallel computer system for performing barrier synchronization using a master node and a plurality of worker nodes based on the time to allow for an adaptive setting of the synchronization time. When a task process in a certain worker node has not been completed by a worker determination time, the particular worker node performs a communication to indicate that the process has not been completed, to a master node. When the communication has been received by a master determination time, the master node performs a communication to indicate that the process time is extended by a correction process time, in order to adjust and extend the synchronization time. In this way, it is possible to reduce the synchronization overhead associated with the execution of an application with a relatively large variation in the process time from a synchronization point to the next synchronization point.
    Type: Grant
    Filed: April 2, 2012
    Date of Patent: May 26, 2015
    Assignee: HITACHI, LTD.
    Inventors: Masaki Hamamoto, Tetsuya Yamada, Atsushi Tomoda, Atsushi Miyamoto
  • Patent number: 9019362
    Abstract: The invention relates to a technique of improving a contrast of a lower-layer pattern in a multi layer by synthesizing detected signals from a plurality of detectors by using an appropriate allocation ratio in accordance with pattern arrangement. In a charged particle beam device capable of improving image quality by using detected images obtained from a plurality of detectors and in a method of improving the image quality, a method of generating one or more output images from detected images corresponding to respective outputs of the detectors that are arranged at different locations is controlled by using information of a pattern direction, an edge strength, or others calculated from a design data or the detected image.
    Type: Grant
    Filed: November 8, 2010
    Date of Patent: April 28, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Jie Bai, Kenji Nakahira, Atsushi Miyamoto, Chie Shishido, Hideyuki Kazumi
  • Patent number: 8996176
    Abstract: A robot apparatus includes an output unit that displays an image including an object on a screen, an input unit that receives an operation performed by a user for specifying information relating to an approximate range including the object in the image, an object extraction unit that extracts information regarding a two-dimensional contour of the object on the basis of the specification received by the input unit, and a position and attitude estimation unit that estimates information regarding a three-dimensional position and attitude of the object on the basis of the information regarding the two-dimensional contour.
    Type: Grant
    Filed: February 26, 2013
    Date of Patent: March 31, 2015
    Assignee: Sony Corporation
    Inventors: Genta Kondo, Atsushi Miyamoto, Satoru Shimizu
  • Patent number: 8953868
    Abstract: A defect inspection method comprising: picking up an image of a subject under inspection to thereby acquire an inspection image; extracting multiple templates corresponding to multiple regions, respectively from design data of the subject under inspection; finding a first misregistration amount between the inspection image and the design data using a first template as any one template selected from among the plural templates; finding a second misregistration amount between the inspection image and the design data using a second template other than the first template, the second template being selected from among the plural templates, and the first misregistration-amount; and converting the design data, misregistration thereof being corrected using the first misregistration-amount, and the second misregistration-amount, into a design data image, and comparing the design data image with the inspection image to thereby detect a defect of the subject under inspection.
    Type: Grant
    Filed: May 30, 2013
    Date of Patent: February 10, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Shinya Murakami, Chie Shishido, Takashi Hiroi, Taku Ninomiya, Tsuyoshi Minakawa, Atsushi Miyamoto
  • Patent number: 8881067
    Abstract: To enable SEM-based management of a cross-sectional shape or manufacturing process parameters of a semiconductor device pattern to be measured, the association between the shape or parameters and SEM image characteristic quantities effective for estimating the shape or parameters is saved as learning data. The image characteristic quantities are collated with learning data to estimate the shape or to monitor the process parameters. Accuracy and reliability is achievable by calculating three kinds of reliability (reliability of the image characteristic quantities, reliability of estimation engines, and reliability of estimating results) based on the distribution of the image characteristic quantities and then judging whether additional learning is necessary, or selecting and adjusting image characteristic quantities and estimation engine based on the reliability.
    Type: Grant
    Filed: January 10, 2013
    Date of Patent: November 4, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Wataru Nagatomo, Atsushi Miyamoto, Hidetoshi Morokuma
  • Publication number: 20140320627
    Abstract: An pattern evaluation method includes a step of estimating imaging deviation allowed to evaluate an overlay position on one or more evaluation point candidates based on pattern layout information, a step of deciding one or more evaluation points from among the evaluation point candidates based on the allowed imaging deviation, a step of deciding an imaging sequence for imaging the selected evaluation point, and a step of evaluating an overlay position between first and second patterns based on an image obtained by imaging the evaluation point according to the imaging sequence.
    Type: Application
    Filed: January 30, 2013
    Publication date: October 30, 2014
    Inventors: Atsushi Miyamoto, Mayuka Osaki, Maki Kimura, Chie Shishido