Abstract: In order to acquire high resolution ultrasound images while maintaining an appropriate frame rate in ultrasound diagnostic devices, the disclosed method generates high resolution ultrasound images by performing image reconstruction on the basis of multiple ultrasound frame images captured along a time series and the magnitudes of positional shifts, or forms high resolution ultrasound images by performing image reconstruction on the basis of multiple ultrasound frame images acquired by controlling the ultrasound probe and varying scan orientation or scan focal length frame by frame.

Abstract: A model based measurement method is capable of estimating a cross-sectional shape by matching various pre-created cross-sectional shapes with a library of SEM signal waveforms. The present invention provides a function for determining whether or not it is appropriate to create a model of a cross-sectional shape or a function for verifying the accuracy of estimation results to a conventional model based measurement method, wherein a solution space (expected solution space) is obtained by matching library waveforms and is displayed before measuring the real pattern by means of model based measurement. Moreover, after the real pattern is measured by means of model based measurement, the solution space (real solution space) is obtained by matching the real waveforms with the library waveforms and is displayed.

Abstract: In a panoramic image construction technology a wide-range imaging area (EP) of semiconductor patterns is divided into a plurality of imaging areas (SEP), and joined a group of images, which are obtained by imaging the SEPs using an SEM, through image processing. Although a pattern serving as a key to joining is not contained in an overlap area between some of the SEPs, all the images can be joined in some cases is noted so that: although the number of patterns serving as keys to joining is small, SEPs whose images are all joined can be determined; or even if such SEPs cannot be determined, SEPs satisfying user's request items as many as possible can be determined. The cases are extracted by optimizing an SEP arrangement, whereby the number of cases in which SEPs whose images are all joined can be determined is increased.

Abstract: A high-performance image quality improvement process, capable of improving the image quality of low-definition areas (lower layer patterns in a multilayer, bottoms of holes in a hole pattern, etc.), is performed to a captured image. Definition enhancement intensity is calculated using height information included in design data or estimate values of sample height information calculated from the captured image, and the image quality improvement process is performed to the captured image using the definition enhancement intensity.

Abstract: There is provided an image processing apparatus including a display configured to display a captured image and a representative icon, wherein the representative icon indicates a range of a focus area of the displayed image and the range encompasses a center of focus point located at an initial position within the displayed image, and a processor configured to adjust the range of the focus area of the displayed image according to a size of the representative icon.

Abstract: An apparatus for medical diagnostic imaging assistance includes memory that stores first feature information representing the feature of a lesion mask or non-lesion mask, a sampling unit that acquires a plurality of samples by making sampling form the memory based on the first feature information, a machine-learning unit that generates a first discrimination condition corresponding to each of samples by carrying out a machine-learning step on the multiple samples, and a statistical processing unit that generates a second discrimination condition by carrying out a statistical processing step under the first discrimination condition, in which a detection function determines whether a lesion candidate mask is an actual lesion by referring to second feature information representing the feature of a lesion candidate mask under a second discrimination condition.

Abstract: A plurality of images is captured, and the plurality of images is integrated and displayed after one or more ROIs included in the captured images are extracted and classified. At integration, an integration method is controlled according to a classification result of the ROI.

Abstract: A medical diagnostic device is characterized in that an image processing unit (22) includes an image noise removal part (211, 211?) which removes the noise in the generated image of a person to be examined, a signal component enhancement processing part (212, 212?) which generates an enhanced-signal component image by performing signal component enhancement processing of the image from which the noise is removed by the image noise removal part, and an image combining part (213, 213?) which generates a combined image by combining the image of the person to be examined, the image from which the noise is removed by the image noise removal part, and an enhanced-signal component image subjected to signal component enhancement processing by the signal component enhancement processing part.

Abstract: Provided is a surgical imaging apparatus that includes a multi-link, multi joint structure including a plurality of joints that interconnect a plurality of links to provide the multi-link, multi joint structure with a plurality of degrees of freedom, at least one video camera being disposed on a distal end of the multi-link, multi-joint structure; at least one actuator that drives at least one of the plurality of joints; and circuitry that detects a joint force experienced at the at least one of the plurality of joints in response to an applied external force, and controls the at least one actuator based on the joint force so as to position the video camera.

Abstract: A defect inspection method for inspecting a defect on a semiconductor wafer, using plural inspection methods includes: merging hot-spot coordinates as coordinates on the semiconductor wafer, designated by a user, or coordinates where a systematic defect can occur, with detected defect coordinates on the semiconductor wafer, acquired from inspection information, after information indicating the type of coordinates are added thereto; deciding an inspection sequence of the coordinates merged with each other; and defect inspection for executing selection using the information indicating the respective types of the coordinates merged with each other, and executing an inspection by selecting an inspection method for every coordinates to be inspected.

Abstract: In order to acquire high resolution ultrasound images while maintaining an appropriate frame rate in ultrasound diagnostic devices, the disclosed method generates high resolution ultrasound images by performing image reconstruction on the basis of multiple ultrasound frame images captured along a time series and the magnitudes of positional shifts, or forms high resolution ultrasound images by performing image reconstruction on the basis of multiple ultrasound frame images acquired by controlling the ultrasound probe and varying scan orientation or scan focal length frame by frame.

Abstract: Provided is a medical robot arm apparatus including a plurality of joint units configured to connect a plurality of links and implement at least 6 or more degrees of freedom in driving of a multi-link structure configured with the plurality of links, and a drive control unit configured to control driving of the joint units based on states of the joint units. A front edge unit attached to a front edge of the multi-link structure is at least one medical apparatus.

Abstract: A robot apparatus includes an output unit that displays an image including an object on a screen, an input unit that receives an operation performed by a user for specifying information relating to an approximate range including the object in the image, an object extraction unit that extracts information regarding a two-dimensional contour of the object on the basis of the specification received by the input unit, and a position and attitude estimation unit that estimates information regarding a three-dimensional position and attitude of the object on the basis of the information regarding the two-dimensional contour.

Abstract: An imaging region of a high-magnification reference image capable of being acquired in a low-magnification field without moving a stage from a position at which a defective region has been imaged at a low magnification is searched for and if the search is successful, an image of the imaging region itself is acquired and the high-magnification reference image is acquired. If the search is unsuccessful, the imaging scheme is switched to that in which the high-magnification reference image is acquired from a chip adjacent to the defective region.

Abstract: In order to provide a technique for performing global alignment (detecting position shift and rotation of a wafer) stably and automatically using an optical microscope, as a pattern for global alignment, multiple alignment pattern candidates are calculated (107), multiple data for matching are created for each alignment pattern (108), matching is performed with respect to the data for matching for each alignment pattern in descending order of appropriateness as an alignment pattern with an image (113) based on an image signal from the optical microscope (114), and the amount of position shift and the amount of rotation of the wafer are calculated (116) on the basis of the results of matching (115).

Abstract: A robot apparatus includes a plurality of arm sections; a grasping-easiness calculation section configured to calculate an index value of grasping easiness quantitatively evaluating easiness of assuming a grasping posture for grasping an object or assuming a transition posture leading to the grasping posture for each of the plurality of arm sections; and an arm-section selection section configured to select an arm section to be used for actually grasping the object on the basis of the index value of the grasping easiness calculated for each of the arm sections.

Abstract: The present invention relates to a setting method for an image capture area on the occasion of evaluation of a circuit pattern using a scanning charged particle microscope. A circuit pattern that is to be evaluated using an actual image or design data is determined, a plurality of image capture areas are set such that the circuit pattern to be evaluated is included in a section of the field of vision, and images are captured of the plurality of image capture areas. When setting the image capture areas, a permissible value for the distance between adjacent first and second images is set, and the positions of the image capture areas are optimized so as to correspond as closely as possible with the permissible value for distance. As a result, it is possible to improve the throughput of image capture of wide inspection areas that do not fit in the field of vision of the scanning charge particle microscope, and to efficiently carry out determination of an inspection area that may cause electrical failure.

Abstract: The present invention provides a data harmonic analysis method and a data analysis device for data analysis in which a plurality of data items to be analyzed are acquired; similarities among a plurality of data sources that generate the data values of the acquired plurality of data items are obtained; a hierarchical graph is generated as a graph structure indicating the acquired plurality of data items, with a plurality of child nodes corresponding to the plurality of data items being located in a lower layer and a parent node that has no data item being located in an upper layer; the connection rate between the parent node and each of the plurality of child nodes is calculated by using the information of the obtained similarities in the generated hierarchical graph; and harmonic analysis is applied, on the basis of the generated hierarchical graph, to the data values in the graph.

Abstract: There is provided a parallel computer system for performing barrier synchronization using a master node and a plurality of worker nodes based on the time to allow for an adaptive setting of the synchronization time. When a task process in a certain worker node has not been completed by a worker determination time, the particular worker node performs a communication to indicate that the process has not been completed, to a master node. When the communication has been received by a master determination time, the master node performs a communication to indicate that the process time is extended by a correction process time, in order to adjust and extend the synchronization time. In this way, it is possible to reduce the synchronization overhead associated with the execution of an application with a relatively large variation in the process time from a synchronization point to the next synchronization point.

Abstract: The invention relates to a technique of improving a contrast of a lower-layer pattern in a multi layer by synthesizing detected signals from a plurality of detectors by using an appropriate allocation ratio in accordance with pattern arrangement. In a charged particle beam device capable of improving image quality by using detected images obtained from a plurality of detectors and in a method of improving the image quality, a method of generating one or more output images from detected images corresponding to respective outputs of the detectors that are arranged at different locations is controlled by using information of a pattern direction, an edge strength, or others calculated from a design data or the detected image.