Patents by Inventor Atul Gupta
Atul Gupta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8097866Abstract: An apparatus and a method for detecting particle beam characteristics are disclosed. In one embodiment, the apparatus may have a body including a first end and second end and at least one detector between the first and second ends. The apparatus may have a transparent state where a portion of the particles entering the apparatus may pass through the apparatus. The apparatus may also have a minimum transparency state where substantially all of the particles entering the apparatus may be prevented from passing through the apparatus and detected. Different transparency state may be achieved by rotating the apparatus or the detector contained therein. With the apparatus, it is possible to detect the beam properties such as the beam intensity, angle, parallelism, and a distribution of the particles in a particle beam.Type: GrantFiled: February 14, 2008Date of Patent: January 17, 2012Assignee: Varian Semiconductor Equipment Associates, Inc.Inventors: Joseph C. Olson, Atul Gupta
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Publication number: 20120006392Abstract: A first facet of each of a plurality of pyramids on a surface of a workpiece is doped to a first dose while a second facet and a third facet of each of the plurality of pyramids is simultaneously doped to a second dose different than the first dose. The first facets may enable low resistance contacts and the second and third facets may enable higher current generation and an improved blue response. Ion implantation may be used to perform the doping.Type: ApplicationFiled: July 1, 2011Publication date: January 12, 2012Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventor: Atul GUPTA
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Publication number: 20110315899Abstract: Glitches during ion implantation of a workpiece, such as a solar cell, can be compensated for. In one instance, a workpiece is implanted during a first pass at a first speed. This first pass results in a region of uneven dose in the workpiece. The workpiece is then implanted during a second pass at a second speed. This second speed is different from the first speed. The second speed may correspond to the entire workpiece or just the region of uneven dose in the workpiece.Type: ApplicationFiled: June 28, 2011Publication date: December 29, 2011Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventors: Russell J. LOW, Atul GUPTA, William T. WEAVER
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Patent number: 8084293Abstract: An improved, lower cost method of processing substrates, such as to create solar cells, is disclosed. The doped regions are created on the substrate, using a mask or without the use of lithography or masks. After the implantation is complete, visual recognition is used to determine the exact region that was implanted. This information can then be used by subsequent process steps to crate a suitable metallization layer and provide alignment information. These techniques can also be used in other ion implanter applications. In another aspect, a dot pattern selective emitter is created and imaging is used to determine the appropriate metallization layer.Type: GrantFiled: April 6, 2010Date of Patent: December 27, 2011Assignee: Varian Semiconductor Equipment Associates, Inc.Inventors: Benjamin Riordon, Russell Low, Atul Gupta, William Weaver
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Publication number: 20110272602Abstract: An improved method of producing solar cells utilizes a mask which is fixed relative to an ion beam in an ion implanter. The ion beam is directed through a plurality of apertures in the mask toward a substrate. The substrate is moved at different speeds such that the substrate is exposed to an ion dose rate when the substrate is moved at a first scan rate and to a second ion dose rate when the substrate is moved at a second scan rate. By modifying the scan rate, various dose rates may be implanted on the substrate at corresponding substrate locations. This allows ion implantation to be used to provide precise doping profiles advantageous for manufacturing solar cells.Type: ApplicationFiled: July 22, 2011Publication date: November 10, 2011Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventors: Nicholas P.T. Bateman, Steven M. Anella, Benjamin B. Riordon, Atul Gupta
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Publication number: 20110244625Abstract: An improved, lower cost method of processing substrates, such as to create solar cells, is disclosed. The doped regions are created on the substrate, using a mask or without the use of lithography or masks. After the implantation is complete, visual recognition is used to determine the exact region that was implanted. This information can then be used by subsequent process steps to crate a suitable metallization layer and provide alignment information. These techniques can also be used in other ion implanter applications. In another aspect, a dot pattern selective emitter is created and imaging is used to determine the appropriate metallization layer.Type: ApplicationFiled: April 6, 2010Publication date: October 6, 2011Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventors: Benjamin Riordon, Russell Low, Atul Gupta, William Weaver
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Patent number: 8008176Abstract: An improved method of producing solar cells utilizes a mask which is fixed relative to an ion beam in an ion implanter. The ion beam is directed through a plurality of apertures in the mask toward a substrate. The substrate is moved at different speeds such that the substrate is exposed to an ion dose rate when the substrate is moved at a first scan rate and to a second ion dose rate when the substrate is moved at a second scan rate. By modifying the scan rate, various dose rates may be implanted on the substrate at corresponding substrate locations. This allows ion implantation to be used to provide precise doping profiles advantageous for manufacturing solar cells.Type: GrantFiled: August 10, 2010Date of Patent: August 30, 2011Assignee: Varian Semiconductor Equipment Associates, Inc.Inventors: Nicholas P. T. Bateman, Steven M. Anella, Benjamin B. Riordon, Atul Gupta
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Publication number: 20110201188Abstract: An improved method of doping a substrate is disclosed. The method is particularly beneficial to the creation of interdigitated back contact (IBC) solar cells. A paste having a dopant of a first conductivity is applied to the surface of the substrate. This paste serves as a mask for a subsequent ion implantation step, allowing ions of a dopant having an opposite conductivity to be introduced to the portions of the substrate which are exposed. After the ions are implanted, the mask can be removed and the dopants may be activated. Methods of using an aluminum-based and phosphorus-based paste are disclosed.Type: ApplicationFiled: February 16, 2011Publication date: August 18, 2011Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventors: Atul Gupta, Nicholas Bateman
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Patent number: 8001081Abstract: One embodiment of the invention enables nodes or endpoints that have been involved with synchronization of data items to determine which version of a data item (if any) has priority over another version of that same data item. For example, one embodiment of the invention can include a method that can include the determination as to whether any data items have matching identities and conflicting priorities after the synchronization process. Provided a first and second data items have matching identities and conflicting priorities, a determination is made as to whether an indication had been made that the first data item is desirable over the second data item. Provided the indication had been made that the first data is desirable over the second data item, it is indicated that the first data item has priority over the second data item.Type: GrantFiled: October 21, 2004Date of Patent: August 16, 2011Assignee: Access Co., Ltd.Inventors: William L. Mills, Thomas C. Butler, Uma D. Gouru, Atul Gupta, Jayita Poddar, Gerard G. Pallipuram, Alvin I. Pivowar
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Publication number: 20110177652Abstract: An improved bifacial solar cell is disclosed. In some embodiments, the front side includes an n-type field surface field, while the back side includes a p-type emitter. In other embodiments, the p-type emitter is on the front side. To maximize the diffusion of majority carriers and lower the series resistance between the contact and the substrate, the regions beneath the metal contacts are more heavily doped. Thus, regions of higher dopant concentration are created in at least one of the FSF or the emitter. These regions are created through the use of selective implants, which can be performed on one or two sides of the bifacial solar cell to improve efficiency.Type: ApplicationFiled: January 20, 2011Publication date: July 21, 2011Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventors: Atul Gupta, Nicholas P.T. Bateman
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Publication number: 20110124186Abstract: A plasma processing apparatus comprises a plasma source configured to produce a plasma in a plasma chamber, such that the plasma contains ions for implantation into a workpiece. The apparatus also includes a focusing plate arrangement having an aperture arrangement configured to modify a shape of a plasma sheath of the plasma proximate the focusing plate such that ions exiting an aperture of the aperture arrangement define focused ions. The apparatus further includes a processing chamber containing a workpiece spaced from the focusing plate such that a stationary implant region of the focused ions at the workpiece is substantially narrower that the aperture. The apparatus is configured to create a plurality of patterned areas in the workpiece by scanning the workpiece during ion implantation.Type: ApplicationFiled: November 16, 2010Publication date: May 26, 2011Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventors: Anthony Renau, Ludovic Godet, Timothy J. Miller, Joseph C. Olson, Vikram Singh, James Buonodono, Frank Sinclair, Deepak A. Ramappa, Russell Low, Atul Gupta, Kevin M. Daniels
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Publication number: 20110039367Abstract: An improved method of producing solar cells utilizes a mask which is fixed relative to an ion beam in an ion implanter. The ion beam is directed through a plurality of apertures in the mask toward a substrate. The substrate is moved at different speeds such that the substrate is exposed to an ion dose rate when the substrate is moved at a first scan rate and to a second ion dose rate when the substrate is moved at a second scan rate. By modifying the scan rate, various dose rates may be implanted on the substrate at corresponding substrate locations. This allows ion implantation to be used to provide precise doping profiles advantageous for manufacturing solar cells.Type: ApplicationFiled: August 10, 2010Publication date: February 17, 2011Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventors: Nicholas P.T. Bateman, Steven M. Anella, Benjamin B. Riordon, Atul Gupta
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Patent number: 7888249Abstract: The manufacture of solar cells is simplified and cost reduced through by performing successive ion implants, without an intervening thermal cycle. In addition to reducing process time, the use of chained ion implantations may also improve the performance of the solar cell. In another embodiment, two different species are successively implanted without breaking vacuum. In another embodiment, the substrate is implanted, then flipped such that it can be and implanted on both sides before being annealed. In yet another embodiment, one or more different masks are applied and successive implantations are performed without breaking the vacuum condition, thereby reducing the process time.Type: GrantFiled: April 14, 2010Date of Patent: February 15, 2011Assignee: Varian Semiconductor Equipment Associates, Inc.Inventors: Nicholas P. T. Bateman, Atul Gupta, Paul Sullivan, Paul J. Murphy
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Patent number: 7868305Abstract: A technique for ion beam angle spread control is disclosed. In one particular exemplary embodiment, the technique may be realized as a method for ion beam angle spread control. The method may comprise directing one or more ion beams at a substrate surface at two or more different incident angles, thereby exposing the substrate surface to a controlled spread of ion beam incident angles.Type: GrantFiled: June 7, 2005Date of Patent: January 11, 2011Assignee: Varian Semiconductor Equipment Associates, Inc.Inventors: Atul Gupta, Joseph C. Olson
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Patent number: 7842604Abstract: The present invention provides a low dielectric constant copper diffusion barrier film composed, at least in part, of boron-doped silicon carbide suitable for use in a semiconductor device and methods for fabricating such a film. The copper diffusion barrier maintains a stable dielectric constant of less than 4.5 in the presence of atmospheric moisture.Type: GrantFiled: May 22, 2007Date of Patent: November 30, 2010Assignee: Novellus Systems, Inc.Inventors: Yongsik Yu, Atul Gupta, Karen Billington, Michael Carris, William Crew, Thomas W. Mountsier
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Patent number: 7820985Abstract: The present invention comprises a method for high tilt angle implantation, with angular precision not previously achievable. An ion beam, having a width and height dimension, is made up of a number of individual beamlets. These beamlets typically display a higher degree of parallelism in one of these two dimensions. Thus, to minimize angular error, the workpiece is tilted about an axis substantially perpendicular to the dimension having the higher degree of parallelism. The workpiece is then implanted at a high tilt angle and rotated about a line orthogonal to the surface of the workpiece. This process can be repeated until the high tilt implantation has been performed in all required regions.Type: GrantFiled: December 28, 2007Date of Patent: October 26, 2010Assignee: Varian Semiconductor Equipment Associates, Inc.Inventors: Atul Gupta, Joseph C. Olson
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Publication number: 20100224240Abstract: Methods of counterdoping a solar cell, particularly an IBC solar cell are disclosed. One surface of a solar cell may require portions to be n-doped, while other portions are p-doped. Traditionally, a plurality of lithography and doping steps are required to achieve this desired configuration. In contrast, one lithography step can be eliminated by the use of a blanket doping of one conductivity and a mask patterned counterdoping process of the opposite conductivity. The areas dosed during the masked patterned doping receive a sufficient dose so as to completely reverse the effect of the blanket doping and achieve a conductivity that is opposite the blanket doping. In another embodiment, the counterdoping is performed by means of a direct patterning technique, thereby eliminating the remaining lithography step. Various methods of direct counterdoping processes are disclosed.Type: ApplicationFiled: May 17, 2010Publication date: September 9, 2010Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventors: Nicholas BATEMAN, Atul GUPTA, Paul SULLIVAN
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Publication number: 20100197126Abstract: The manufacture of solar cells is simplified and cost reduced through by performing successive ion implants, without an intervening thermal cycle. In addition to reducing process time, the use of chained ion implantations may also improve the performance of the solar cell. In another embodiment, two different species are successively implanted without breaking vacuum. In another embodiment, the substrate is implanted, then flipped such that it can be and implanted on both sides before being annealed. In yet another embodiment, one or more different masks are applied and successive implantations are performed without breaking the vacuum condition, thereby reducing the process time.Type: ApplicationFiled: April 14, 2010Publication date: August 5, 2010Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.Inventors: Nicholas BATEMAN, Atul Gupta, Paul Sullivan, Paul Murphy
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Publication number: 20100197125Abstract: An improved technique for processing a substrate is disclosed. In one particular exemplary embodiment, the technique may be realized as a method for processing a substrate. The method may comprise ion implanting a substrate disposed downstream of the ion source with ions generated in an ion source; and disposing a first portion of a mask in front of the substrate to expose the first portion of the mask to the ions, the mask being supported by the first and second mask holders, the mask further comprising a second portion wound in the first mask holder.Type: ApplicationFiled: January 28, 2010Publication date: August 5, 2010Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOICTES, INC.Inventors: Russell J. Low, William Weaver, Nicholas P.T. Bateman, Atul Gupta
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Patent number: 7747561Abstract: A method and system thereof for synchronizing a data set comprising a first data set residing on a first node with a second data set residing on a second node. Packets are exchanged with the second node. A packet comprises one or more messages and a message comprises a plurality of elements. At least one of the elements identifies the data set. Other information in the packets is used to identify any data from the first data set that needs to be sent to the second node and any data from the second data set that needs to be received from the second node, in order to synchronize the data set on both nodes. The data so identified can then be exchanged.Type: GrantFiled: May 31, 2002Date of Patent: June 29, 2010Assignee: PalmSource Inc.Inventors: Atul Gupta, William L. Mills, Gerard Pallipuram