Abstract: Disclosed is a new plastic flooring that is assembled by concave portions and convex portions. The plastic flooring provides space between the concave portions and convex portions. The space absorbs the heat expansion of the plastic flooring such that the deformation of the plastic flooring is prevented. Also, the space stores an adhesive on a bottom floor such that crevices between the plastic flooring are prevented.

Abstract: A DTV receiver test stream generator which prevents discontinuity phenomenon of a video and an audio, a method for generating the DTV receiver test stream, and a recording medium where the DTV test stream having no discontinuity phenomenon is recorded. To this end, a test stream for a function test or a performance valuation of the DTV receiver is generated and a reproduction time is equalized on the basis of the least common multiple of a video frame time, an audio frame time, and a TS packet time when the test stream is repeatedly reproduced. According to this, when used at a DTV production field where a test pattern is used or at a broadcasting system which repeatedly transmits the DTV stream of a limited length such as a stationary image, a reliability of the DTV receiver test can be ensured.

Abstract: A method of controlling thicknesses of thin film layers in manufacturing semiconductor devices begins with loading monitoring wafers in a thin film forming apparatus. The apparatus has multiple film formation zones, and one of the zones is a reference zone. After forming thin films on the monitoring wafers, thicknesses of the thin films formed on the monitoring wafers are measured. Then, process time and process temperatures are adjusted so that the thicknesses of films are the same as a target film thickness. Finally, thin films are formed on semiconductor wafers using the adjusted process time and temperatures.

Abstract: A method of manufacturing a semiconductor device having a plurality of measuring steps performed by a plurality of measuring equipment comprising the steps of; (a) determining the operational state of each one of the plurality of measuring equipment, (b) selecting and performing a measuring step from the plurality of measuring steps in accordance with the determination made in step (a), and repeating steps (a) and (b) until the plurality of measuring steps is completed.

Abstract: A method for manufacturing a semiconductor device comprises the steps of extracting an optimal working condition by accumulatively averaging accumulated working conditions of lots previously performed in an expectation process to be currently performed in the manufacturing equipment, extracting a correction condition by extracting information for an alignment state of a lower layer performed by the expectation process, and setting the working condition by adding the correction condition to the optimal working condition.

Abstract: There is disclosed a digital audio signal reciever for preventing the generation of modulation noise in a D/A converted analog signal by eliminating Jitter effect occurring during transmission of digital audio data beforehand.