Abstract: Provided are a memory device and a memory module, which perform both an ECC operation and a redundancy repair operation. The memory device repairs a single-bit error due to a ‘fail’ cell by using an error correction code (ECC) operation, and also repairs the ‘fail’ cell by using a redundancy repair operation when the ‘fail’ cell is not repairable by the ECC operation. The redundancy repair operation includes a data line repair and a block repair. The ECC operation may change a codeword corresponding to data per one unit of memory cells including the ‘fail’ cell, and may also change the size of parity bits regarding the changed codeword.

Abstract: At least one refresh without scrubbing is performed on a corresponding portion of the memory device with a first frequency. In addition, at least one refresh with scrubbing is performed on a corresponding portion of the memory device with a second frequency less than the first frequency. Accordingly, refresh operations with data scrubbing are performed to prevent data error accumulation. Furthermore, refresh operations without data scrubbing are also performed to reduce undue power consumption from the data scrubbing.

Abstract: An electronic device is provided. The electronic device includes a battery, a power management integrated circuit (PMIC), that is electrically connected to the battery, adjusts at least part of power received from the battery, and outputs a controlled power, a processor electrically connected to the PMIC, at least one power sensor that is one of electrically connected between the battery and the PMIC and constitutes a part of the PMIC, and a control circuit electrically connected to the at least one power sensor. The control circuit acquires at least one of a current value and a power value input into the PMIC from the battery, determines whether at least one of the acquired current value and power value is greater than or equal to a threshold, and generates a first signal for controlling at least one of the PMIC and the processor, at least partially based on the determination.

Abstract: A random number generating includes a light source to emit a luminous flux having light intensity distribution symmetrical about a center axis, and a plurality of single-photon detectors arranged at an equal radial distance from an extending line of the central axis of the light source to generate a bit value of either 0 or 1 according to whether a photon is detected or not.

Abstract: In a method of operating a memory device, a command and a first address from a memory controller are received. A read code word including a first set of data corresponding to the first address, a second set of data corresponding to a second address and a read parity data is read from a memory cell array of the memory device. Corrected data are generated by operating error checking and correction (ECC) using an ECC circuit based on the read cord word.

Abstract: An apparatus for wired and wireless charging of an electronic device are provided. The electronic device includes a housing, a display on a surface of the housing, a battery mounted in the housing, a circuit electrically connected with the battery, a conductive pattern positioned in the housing, electrically connected with the circuit, and configured to wirelessly transmit power to an external device, a connector on another surface of the housing and electrically connected with the circuit, a memory, and a processor electrically connected with the display, the battery, the circuit, the connector, and/or the memory. The circuit is configured to electrically connect the battery with the conductive pattern to wirelessly transmit power to the external device and electrically connect the battery with the connector to transmit power to the external device by wire, simultaneously or selectively, with wirelessly transmitting power to the external device.

Abstract: According to various embodiments, an electronic device for charging a battery of an external device may include a coil and a first circuit configured to wirelessly transmit power to the external device through the coil. A second circuit may be configured to wirelessly receive information from the external device. A fan may be disposed adjacent to the coil to discharge heat to the exterior of the electronic device. A control circuit may adjust the driving speed of the fan based at least in part on the received information.

Abstract: A memory module includes a plurality of memory devices and a buffer chip. The buffer chip manages the memory devices. The buffer chip includes a refresh control circuit that groups a plurality of memory cell rows of the memory devices into a plurality of groups according to a data retention time of tire memory cell rows. The buffer chip selectively refreshes each of the plurality of groups in each of a plurality of refresh time regions that are periodically repeated and applies respective refresh periods to the plurality of groups, respectively.

Abstract: A semiconductor memory device includes a control logic and a memory cell array in which a plurality of memory cells are arranged. The memory cell array includes a plurality of bank arrays, and each of the plurality of bank arrays includes a plurality of sub-arrays. The control logic controls an access to the memory cell array based on a command and an address signal. The control logic dynamically sets a keep-away zone that includes a plurality of memory cell rows which are deactivated based on a first word-line when the first word-line is enabled. The first word-line is coupled to a first memory cell row of a first sub-array of the plurality of sub-arrays. Therefore, increased timing parameters may be compensated, and parallelism may be increased.

Abstract: A memory device includes a memory cell array, an intensively accessed row detection circuit, and a refresh control circuit. The memory cell array includes a plurality of memory cell rows. The intensively accessed row detection circuit generates an intensively accessed row address indicating an intensively accessed memory cell row among the plurality of memory cell rows based on an accumulated access time for each of the plurality of memory cell rows. The refresh control unit preferentially refreshes neighboring memory cell rows adjacent to the intensively accessed memory cell row indicated by the intensively accessed row address when receiving the intensively accessed row address from the intensively accessed row detection unit. The memory device effectively reduces a rate of data loss.

Abstract: In one example embodiment, a memory device includes a cell array configured to receive data at an associated address in response to a write command. The memory device further includes a storage unit configured to receive the associated address and the data in response to the write command and output the data to the associated address of the cell array in response to a rewrite command. The memory device further includes a violation determining unit configured to determine violation data, count a number of the violation data and determine data written to the storage unit as the violation data if a storage duration of the written data is less than a write recovery time (tWR).

Abstract: A memory device includes a memory cell array, an intensively accessed row detection circuit, and a refresh control circuit. The memory cell array includes a plurality of memory cell rows. The intensively accessed row detection circuit generates an intensively accessed row address indicating an intensively accessed memory cell row among the plurality of memory cell rows based on an accumulated access time for each of the plurality of memory cell rows. The refresh control unit preferentially refreshes neighboring memory cell rows adjacent to the intensively accessed memory cell row indicated by the intensively accessed row address when receiving the intensively accessed row address from the intensively accessed row detection unit. The memory device effectively reduces a rate of data loss.

Abstract: A low voltage DC/DC converter (LDC) control apparatus for controlling an LDC including a transformer and a PWM controller is provided. The low voltage DC/DC converter (LDC) control apparatus includes an input current calculating unit calculating an input current of the LDC by using magnetization inductance information on the transformer and effective duty information on the PWM controller; an output current calculating unit calculating the instantaneous value and average value of an output current based on the input current calculated by the input current calculating unit; and an LDC control unit generating a control signal for over current protection (OCP) or power limit based on the instantaneous value and average value of the output current calculated by the output current calculating unit, wherein the LDC control unit outputs the generated control signal to the PWM controller.

Abstract: A memory device used with a relaxed timing requirement specification according to temperatures, an operation method thereof, and a memory controller and a memory system using the memory device are provided. The memory device has a first timing characteristic at a first temperature and a second timing characteristic that is longer than the first timing characteristic at a second temperature. If a temperature of the memory device is higher than a reference temperature, the memory controller controls the first timing characteristic as a timing requirement specification of the memory device. If the temperature of the memory device is lower than the reference temperature, the memory controller controls the second timing characteristic as the timing requirement specification of the memory device.

Abstract: The semiconductor memory device includes a memory cell array and an error correction code (ECC) circuit. The memory cell array is divided into a first memory region and a second memory region. Each of the first and second memory regions includes a plurality of pages each page including a plurality of memory cells connected to a word line. The ECC circuit corrects single-bit errors of the first memory region using parity bits. The first memory region provides a consecutive address space to an external device by correcting the single-bit errors using the ECC circuit and the second memory region is reserved for repairing at least one of a first failed page of the first memory region or a second failed page of the second memory region.

Abstract: A driving device of a synchronous rectification apparatus is provided. The driving device includes a voltage detection part disposed on a power input terminal to detect a voltage value of a power inputted through the power input terminal, an adjustment part receiving the voltage value detected through the voltage detection part, the adjustment part adjusting the receive voltage value to output the adjusted voltage value, and a comparison part receiving the voltage value adjusted through the adjustment part into a positive terminal and a synchronous rectification starting value into a negative terminal, the comparison part outputting an command value of the synchronous rectification apparatus, which is obtained by comparing the received voltage value with the synchronous rectification starting value.

Abstract: A memory system includes a memory device and a memory controller. The memory device includes a plurality of memory cells. The memory controller is configured to continuously perform a plurality of write commands on the memory device between an active command and a precharge command. In the memory system, when after a first write operation having a last write command of the plurality of write commands is performed and then the precharge command is issued, the last write command is issued for a second write operation after the precharge command. The first write operation and the second write operation write a same data to memory cells of plurality of memory cells having a same address.

Abstract: A semiconductor memory device includes a memory cell array, sub word-line drivers and power selection switches. The memory cell array includes memory cell rows coupled to word lines. The sub word line drivers are coupled to the word lines. The power selection switches are coupled to the sub word-line drivers. Each power selection switch controls a deactivation voltage level of a first word-line activated from the word-lines and an off-voltage level of a second word line adjacent to the first word line so that the deactivation voltage level and the off-voltage level have at least one of a ground voltage, a first negative voltage and a second negative voltage. The ground voltage, the first negative voltage and the second negative voltage have different voltage levels from each other.

Abstract: A method of performing a charging function by using different types of energy sources and an electronic device thereof are provided. The electronic device includes different types of circuits configured to acquire different types of energy sources, and a processor configured to determine an energy source for charging among the different types of energy sources based on respective current values for the different types of energy sources, and control the determined energy source for charging so as to be used in battery charging of the electronic device or in a system operation of the electronic device.

Abstract: A semiconductor memory device includes a memory cell array and a test circuit. The test circuit reads data stream from the memory cell array, configured to, on comparing bits of each first unit in the data stream, compares corresponding bits in the first units as each second unit and outputs a fail information signal including pass/fail information on the data stream and additional information on the data stream, in a test mode of the semiconductor memory device.