Abstract: A system and method for utilizing a security key stored in non-volatile memory, and for generating a PUF-based data set on an integrated circuit including non-volatile memory cells, such as flash memory cells, are described. The method includes storing a security key in a particular block in a plurality of blocks of the non-volatile memory array; utilizing, in a security logic circuit coupled to the non-volatile memory array, the security key stored in the particular block in a protocol to enable access via a port by external devices or communication networks to data stored in blocks in the plurality of blocks; and enabling read-only access to the particular block by the security logic for use in the protocol, and preventing access to the particular block via the port.

Abstract: A system and method for utilizing a security key stored in non-volatile memory, and for generating a PUF-based data set on an integrated circuit including non-volatile memory cells, such as flash memory cells, are described. The method includes storing a security key in a particular block in a plurality of blocks of the non-volatile memory array; utilizing, in a security logic circuit coupled to the non-volatile memory array, the security key stored in the particular block in a protocol to enable access via a port by external devices or communication networks to data stored in blocks in the plurality of blocks; and enabling read-only access to the particular block by the security logic for use in the protocol, and preventing access to the particular block via the port.

Abstract: A system and method for utilizing a security key stored in non-volatile memory, and for generating a PUF-based data set on an integrated circuit including non-volatile memory cells, such as flash memory cells, are described. The method includes storing a security key in a particular block in a plurality of blocks of the non-volatile memory array; utilizing, in a security logic circuit coupled to the non-volatile memory array, the security key stored in the particular block in a protocol to enable access via a port by external devices or communication networks to data stored in blocks in the plurality of blocks; and enabling read-only access to the particular block by the security logic for use in the protocol, and preventing access to the particular block via the port.

Abstract: An integrated circuit comprises a power supply input pin receiving an off-chip supply voltage having a variable current, an on-chip power source powered by the off-chip supply voltage and providing a regulated current, a memory array, and a set of one or more circuits coupled to the memory array and powered by the regulated current from the on-chip power source. The IC can include control circuitry performing memory operations on the memory array, said control circuitry powered by at least the off-chip supply voltage from the power supply pin.

Abstract: A decode switch and a method for controlling a decode switch are provided. The decode switch includes a power source providing a first voltage, a source capacitance coupled to the power source, and a target capacitance coupled to the power source. The power source charges the source capacitance to the first voltage. The source capacitance is connected to the target capacitance and the source capacitance charges the target capacitance to a second voltage. The power source charges the target capacitance from the second voltage to the first voltage.

Abstract: A method for reading data from memory cells of a target word line in a semiconductor memory includes determining a disturbance status of the target word line. The disturbance status reflects a disturbance of a neighboring word line on the memory cells of the target word line. The method further includes determining a read voltage for the target word line according to the disturbance status of the target word line and applying the read voltage to the memory cells of the target word line.

Abstract: The clock circuit of an integrated circuit operates with variations such as temperature, ground noise, and power noise. Various aspects of an improved clock integrated circuit address one or more of the variations in temperature, ground noise, and power noise.

Abstract: A memory device and an operating method thereof are provided. The memory device includes a first memory array, a first row decoder, a first column decoder, a second memory array, a second row decoder and a second column decoder. The first memory array and the second memory array are different type memories and formed in a single memory die of a wafer.

Abstract: An integrated circuit including a memory, an array cache, and a cache replacement store is described. The memory includes a primary array and a redundant array. The integrated circuit also includes circuitry configured to transfer data into or out of the primary array using the array cache. For defective locations in the array cache, the circuitry is configured to use the cache replacement store in the transfer of data in place of the defective locations in the array cache, and map addresses in the primary array corresponding to the defective locations in the cache array to the redundant array.

Abstract: A first read operation is performed using a first voltage level to read data from a memory array. An instant bit count corresponding to a number of bits in the data read from the memory array is determined. A recorded bit count corresponding to a number of bits in the data that was written at a time of writing the data to the memory array is accessed. A difference between the instant bit count and the recorded bit count is obtained. Conditioned on determining that the difference is less than or equal to a first threshold value, the data read from the memory array is output using the first read operation. Conditioned on determining that the difference is greater than the first threshold value, a second read operation is performed using a second voltage level that is distinct from the first voltage level.

Abstract: A method of operating a memory device storing ECCs for corresponding data is provided. The method includes writing an extended ECC during a first program operation, the extended ECC including an ECC and an extended bit derived from the ECC. The method includes overwriting the extended ECC with a pre-determined state during a second program operation to indicate the second program operation. The method includes, setting the ECC to an initial ECC state before the first program operation; during the first program operation, computing the ECC, changing the ECC to the initial ECC state if the computed ECC equals the pre-determined state; and changing the extended bit to an initial value if the ECC equals the initial ECC state. The method includes reading an extended ECC including an extended bit and an ECC for corresponding data, and determining whether to enable ECC logic using the extended ECC.

Abstract: A serial peripheral interface of an integrated circuit includes: a first transfer pin for receiving an instruction and an address; and a clock pin for inputting a plurality of timing pulses each having a rising edge and a falling edge. After the first transfer pin receives the instruction, the integrated circuit receives the address through the first transfer pin in continuity with the receipt of the instruction. The first transfer pin receives the instruction at either of the rising edges and the falling edges of the timing pulses and receives the address at both of the rising edges and falling edges of the timing pulses.

Abstract: A method for reading data from memory cells of a target word line in a semiconductor memory includes determining a disturbance status of the target word line. The disturbance status reflects a disturbance of a neighboring word line on the memory cells of the target word line. The method further includes determining a read voltage for the target word line according to the disturbance status of the target word line and applying the read voltage to the memory cells of the target word line.

Abstract: A device includes a memory array storing data and error correcting codes ECCs corresponding to the data, and a multi-level buffer structure between the memory array and an input/output data path. The memory array includes a plurality of data lines for page mode operations. The buffer structure includes a first buffer having storage cells connected to respective data lines in the plurality of data lines for a page of data, a second buffer coupled to the storage cells in the first buffer for storing at least one page of data, and a third buffer coupled to the second buffer and to the input/output data path. The device includes logic coupled to the multi-level buffer to perform a logical process over pages of data during movement between the memory array and the input/output path through the multi-level buffer for at least one of page read and page write operations.

Abstract: A sensing method for a memory is provided. The memory includes: a memory cell; a reference circuit generating a reference voltage and a clamp voltage; and a current supplying circuit receiving the clamp voltage to develop a cell current passing through the memory cell to form a cell voltage, wherein the cell voltage is used for incorporating with the reference voltage to determine the information stored in the memory.

Abstract: Methods for protecting data on an integrated circuit including a memory are described. One method includes storing protection codes on the integrated circuit. Each protection code has a first value indicating a protected state and a second value indicating an unprotected state for a corresponding sector in a plurality of sectors of the memory. The method includes storing protection mask codes on the integrated circuit. Each mask code has a first value indicating a masked state or a second value indicating an unmasked state for a corresponding sector in the plurality of sectors. The method includes blocking modification in a particular sector of the memory using circuitry on the integrated circuit when the protection code for the particular sector has the first value and the mask code for the particular sector has the second value, else allowing modification in the particular sector.

Abstract: A power drop detector circuit includes a detect element, for coupling to a first source voltage, for detecting a voltage level of the first source voltage, and a memory element coupled to the detect element and switchable between a first memory state and a second memory state based on the voltage level of the first source voltage.

Abstract: Counting status circuits are electrically coupled to corresponding status elements. The status elements selectably store a bit status of a bit line coupled to a memory array. The bit status can indicate one of at least pass and fail. The counting status circuits are electrically coupled to each other in a sequential order. Control logic causes processing of the counting status circuits in the sequential order to determine a total of the memory elements that store the bit status. The total number of memory elements that store the bit status indicate the number of error bits or non-error bits, which can help determine whether there are too many errors to be fixed by error correction codes.

Abstract: A page buffer circuit includes a plurality of page buffers including a first page buffer. The first page buffer is configured to load input data of the first page buffer, and input data of at least one neighboring page buffer. The first page buffer is also configured to apply a bias corresponding to the input data of the first page buffer, and the input data of the at least one neighboring page buffer to a bit line.

Abstract: A memory circuit with a word line driver and control circuitry is disclosed. The word line driver receives a first voltage reference signal, a second voltage reference signal, and an input signal. The word line driver has an output coupled to a word line. The control circuitry is configured to deselect the word line by applying the input signal to the input of the word line driver. For example, in a program operation the word line is deselected to indicate that the word line is not programmed, and another word line is selected to be programmed. During an operation in which the word line is deselected and another word line is selected, the word line discharges through both of a first p-type transistor and a first n-type transistor of the word line driver.