Abstract: The present invention provides a clock source for an integrated circuit, comprising a primary oscillator adapted to generate a primary clock signal based on a reference control signal, at least one secondary oscillator each secondary oscillator being adapted to generate a secondary clock signal based on the reference control signal, wherein for each secondary oscillator a frequency correction unit is provided and adapted to adjust the reference control signal for the associated secondary oscillator based on the primary clock signal and the secondary clock signal of the associated secondary oscillator such that the clock frequency of the secondary clock signal of the associated secondary oscillator essentially equals the clock frequency of the primary clock signal. The present invention furthermore provides a method for providing a clock signal, and an integrated circuit.

Abstract: A method of performing state retention, for example during power gating, for at least one functional block within an integrated circuit device. The method comprises enabling at least one scan chain within the at least one functional block, scanning out a set of scan chain values from the at least one scan chain, a subset of the set of scan chain values comprising validation values, and writing the set of scan chain values to at least one memory element. The method further comprises retrieving the set of scan chain values from the at least one memory element, and validating the validation values within the retrieved set of scan chain values.

Abstract: An integrated circuit includes an input/output “I/O” cell arranged to drive an output signal and an activity analysis unit arranged to generate an activity factor based on the output signal. The activity factor represents a switching activity intensity of the I/O cell. The switching activity intensity is associated with an ageing effect of the I/O cell. The circuit further includes a calibration unit arranged to generate a switching pattern signal based on the generated activity factor and an I/O calibration cell arranged to be driven by the switching pattern signal, wherein the switching pattern signal emulates the ageing effect of the I/O cell.

Abstract: An integrated circuit and a method. The integrated circuit includes an internal component having an output for providing a driven input signal; an output driver, connected to the internal component, for converting said driven input signal in an output signal; an output pad for outputting said output signal to a component outside the integrated circuit; a power grid configured to supply a supply voltage to the output driver; a controllable current consuming component connected to the power grid, said connectable current consuming component being controllable to consume current in accordance with a supply voltage change reduction pattern; a change detector connected to the internal component and the controllable current consuming component, for detecting a change in said driven input signal prior to said change resulting in a change in said output signal and to control said current consuming component to consume current in response to said detecting.

Abstract: A register file module comprising at least one register array comprising a plurality of latch devices is described. The plurality of latch devices is arranged to individually provide memory bit-cells when the register file module is configured to operate in a first, functional operating mode, and at least one clock control component is arranged to receive a clock signal and to propagate the clock signal to the latch devices within the at least one register array. The register file module is configurable to operate in a second, scan mode in which the latch devices within the at least one register array are arranged into at least one scan chain. The at least one clock control component is arranged to propagate the clock signal to the latch devices within the at least one register array such that alternate latch devices within the at least one scan chain receive an inverted form of the clock signal.

Abstract: A method and apparatus for selecting data path elements for cloning within an integrated circuit (IC) design is described. The method comprises performing timing analysis of at least one data path within the IC design to determine at least one timing slack value for the at least one data path, calculating at least one annotated delay value for cloning a candidate element within the at least one data path, calculating at least one modified slack value for the at least one data path in accordance with the at least one calculated annotated delay value, and validating the cloning of the candidate element based at least partly on the at least one modified slack value.

Abstract: An input/output (IO) driver circuit is described. The IO buffer driver circuit comprises: at least one input for receiving an input signal and at least one output for providing at least one output signal; and a plurality of switches arranged to provide a variable voltage level between a low voltage value and a high voltage value to the at least one output. The at least one first switch of the plurality of switches is arranged to initiate a voltage change to an intermediate voltage level between the low voltage value and the high voltage value in a first time period. The at least one second switch of the plurality of switches is arranged to continue the voltage change to the low voltage value or the high voltage value in a second time period.

Abstract: An apparatus for voltage ripple reduction on a power supply line of an integrated circuit device is provided to be operable in at least two modes. The apparatus includes: one or more clamping devices connectable to the power supply line; a clamp control unit; and a mode change detection unit arranged to monitor an interface of the integrated circuit device for one or more information indicating an upcoming mode change of the integrated circuit device and to provide a mode change signal to the clamp control unit when the one or more information is detected. The clamp control unit is arranged to connect at least one of the one or more clamping devices to the power supply line when receiving the mode change signal.

Abstract: An IO driver for an integrated circuit and a method for calibrating such an IO driver are provided. The IO driver comprises a plurality of IO driver cells, a plurality of IO partial driver cells and an external resistor. The IO driver cells control IO operations for a corresponding plurality of data channels of the integrated circuit. The IO partial driver cells are coupled to respective cells of the plurality of IO driver cells. The external resistor provides a reference impedance. The reference partial driver cell is coupled to the external resistor and is arranged to determine the reference impedance and to provide information depending on the reference impedance to the IO partial driver cells. The IO partial driver cells are arranged to calibrate the respective IO driver cells based on the provided information.

Abstract: An integrated circuit comprises clock gating circuitry comprising at least one gating component located within a clock distribution network and arranged to enable at least one part of the clock distribution network to be gated, and gating control circuitry arranged to cause the at least one gating component to disable the at least one part of the clock distribution network upon certain conditions being fulfilled. The clock gating circuitry further comprises clock gating disabling circuitry configurable to enable the gating of the at least one part of the clock distribution network to be disabled.

Abstract: An integrated circuit for bias stress condition removal comprising at least one input/output (IO) buffer driver circuit comprising at least one input signal is described. A primary buffer driver stage receives the at least one input signal and providing an output signal in a first time period; and a secondary buffer driver stage receives the at least one input signal and providing an output signal in a second time period. The primary buffer driver stage and the secondary buffer driver stage cooperate and an operational mode of the primary buffer driver stage and an operational mode of the secondary buffer driver stage is varied to produce a varying output signal.

Abstract: An asymmetric multi-core processing module is described. The asymmetric multi-core processing module comprises at least one processing core of a first type, at least one processing core of at least one further type, and at least one core identifier configuration component. The at least one core identifier configuration component is arranged to enable dynamic configuration of a value of a core identifier of at least one of the processing cores of the first and at least one further types.

Abstract: A method of controlling a thermal budget of an integrated circuit device is described. The method comprises obtaining a first junction temperature measurement value for the integrated circuit device at a first time instant, and a further junction temperature measurement value for the integrated circuit device at a further time instant. The method further comprises calculating a prospective junction temperature value for the integrated circuit device at a future time instant based at least partly on the first and further junction temperature measurement values; and configuring an operating condition of the integrated circuit device based at least partly on the calculated prospective junction temperature value.

Abstract: A device and a method for protecting a cryptographic module of which the method includes: estimating a functionality of a circuit that is adapted to malfunction when a physical parameter has a first value different from a nominal parameter value at which the cryptographic module functions correctly. The cryptographic module malfunctions when the physical parameter has a second value different from the nominal parameter value and a difference between the first value and the nominal parameter value being smaller than a difference between the second value and the nominal parameter value. A cryptographic module protective measure is applied if estimating that the circuit malfunctions.

Abstract: An integrated circuit device comprising at least one instruction processing module, at least one memory comprising at least one memory bank configurable to operate in a first functional mode and at least one further, lower-power mode, and at least one memory mode control module arranged to control switching of the at least one memory bank between the first functional mode and the at least one further, lower-power modes.

Abstract: An integrated circuit comprises reference voltage generation circuitry for providing a reference voltage for use within a transmission of electrical signals. The reference voltage generation circuitry comprises a reference voltage node operably coupled via a plurality of resistance elements to a plurality of signal nodes such that the reference voltage node assumes as the reference voltage an average of the voltage values of the signal nodes to which it is coupled.

Abstract: A voltage regulating circuit is provided for regulating an output voltage in order to minimize an absolute difference between a level of said output voltage and a reference level. The voltage regulating circuit comprises a voltage regulator and a reference level generator. The reference level generator generates an internal reference level on the basis of said output voltage level and said reference level such that said internal reference level does not exceed said output voltage level by more than a maximum allowed increment. The voltage regulator regulates said output voltage in order to minimize an absolute difference between said output voltage level and said internal reference level. A method of regulating an output voltage is also disclosed.

Abstract: A device and a method for protecting a cryptographic module of which the method includes: estimating a functionality of a circuit that is adapted to malfunction when a physical parameter has a first value different from a nominal parameter value at which the cryptographic module functions correctly. The cryptographic module malfunctions when the physical parameter has a second value different from the nominal parameter value and a difference between the first value and the nominal parameter value being smaller than a difference between the second value and the nominal parameter value. A cryptographic module protective measure is applied if estimating that the circuit malfunctions.

Abstract: An integrated circuit is provided that includes a plurality of modules, comprising at least one clock-gated module; and a controller unit, which is arranged to enable and disable provision of a clock signal to the at least one clock-gated module. The at least one clock-gated module includes one or more electronic circuits arranged to be, in a first state of an electrical stress condition during a first portion of a period of time and in a second state of less electrical stress than in the first state during a second portion of the period of time. The at least one clock-gated module is further arranged to, switch the one or more electronic circuits between the first state and the second state such that a change of a characteristic of at least one of the one or more electronic circuits caused by the electrical stress condition is at least partially reduced.

Abstract: An integrated circuit device comprising at least one memory module comprising a plurality of memory sub-modules, and at least one power management module arranged to provide power management for the at least one memory module. The at least one power management module is arranged to determine when content of at least one memory sub-module is redundant, and place the at least one memory sub-module into a powered-down state upon determining that content of the at least one memory sub-module is redundant.