Abstract: A system, that includes: a memory unit adapted to store state duration statistics indicative of possible low power state durations and probabilities associates with the possible state durations; and a power controller, adapted to: receive a request to cause a circuit to enter a next state, and assist in causing the circuit to enter the next state if during a delay period that follows a reception of the request the power controller does not receive a request to cause the circuit to exit the next state; wherein the delay period is determined in response to: (i) the next state duration statistics, (ii) power saving gained from entering the next state; and (iii) power penalty associated with entering the next state and exiting the next state.

Abstract: A method for protecting a secured real time clock module, the method includes: locking multiple input ports of the secured real time clock module if the multiple input ports of the secured real time clock module are idle during at least a first duration; unlocking the multiple input ports of the secured real time clock module if a predefined high frequency code is received over a control input port of the secured real time clock module; and providing a secured real time clock signal when the multiple input ports of the secured real time clock module are locked and when the multiple input ports of the secured real time clock module are unlocked; wherein changes in a supply voltage results in a supply voltage induced changes of an input signal provided to an input port of the secured real time clock module; wherein a maximal frequency of the supply voltage induced changes of the input signal is lower then the high frequency of the predefined high frequency code.

Abstract: A method for evaluating a quiescent current, the method includes: measuring, when a module is at a first mode, a first voltage drop on a first resistor that is coupled between a supply pin of an integrated circuit that comprises the module and a first test pin of the integrated circuit; assessing, when the module is at a second mode, a second voltage drop on a second resistor that is coupled between the supply pin and a second test pin of the integrated circuit; and evaluating a quiescent current of the module in response to the first and second voltage drops; wherein expected values of quiescent current of the module differ from one mode to the other; and wherein a resistance of the first resistor differs from the resistance of the second resistor.

Abstract: A device having timing error management capabilities and a method for timing error management. The device includes a first input node adapted to receive input data; a first latch, a second latch and a comparator, rising a first multiplexer and a second multiplexer; wherein the second multiplexer is adapted to provide input data to the second latch from the first input mode during a first operational mode of the device and to provide a first latch output signal to the second latch during a second operational mode; wherein the comparator is adapted to compare, during a first clock phase, between the first latch output signal and between a second latch output signal and in response to the comparison selectively generate an error signal.

Abstract: A method and device for testing an integrated circuit. The method includes selecting between a shadow latch data retention mode and a shadow latch test mode; performing first test of an integrated circuit; storing, at the shadow latch if the shadow latch test mode is selected, information representative of a first test-imposed state; performing a second test of the integrated circuit; and generating a test equipment detectable signal if the first test-imposed state differs from a second test-imposed state of the tested latch.

Abstract: A method and device for managing metastable signals. The device includes: a first latch and a second latch, a multiple switching point circuit, connected between an output node of the first latch and an input node of the second latch, wherein the multiple switching point circuit includes at least one pull up transistor and at least one pull down transistor that are selectively activated in response to a feedback signal provided from the second latch and in response to a an output signal of the first latch such as to define at least a low switching point that is lower than a high switching point of the multiple-switching point circuit; wherein a switching point of an inverter within the first latch is between the high and low switching points.

Abstract: A system having voltage level shifting capabilities, the system includes a logic circuit and a multiple level voltage supply circuit; wherein the logic circuit comprises at least one PMOS transistor and at least one NMOS transistor; wherein the logic circuit receives an input signal, receives a voltage supply signal from the multiple level voltage supply circuit, and outputs an output signal via a first node; wherein the input signal has a low voltage swing between a low level supply voltage and a rail voltage; wherein the output signal has a high voltage swing between a high level supply voltage and the rail voltage; and wherein the multiple level voltage supply circuit selects, in response to a level of the output signal, whether to provide to the supply node of the logic circuit a high level supply voltage or a low level supply voltage.

Abstract: A device that has failure recovery capabilities and a method for power recovery. The method includes: detecting a potential power failure in response to a decrement rate of a supply voltage, and applying at least one failure recovery measure in response to a detected potential power failure. The device includes: a power source, an energy reservoir, at least one component, and a power failure circuit, adapted to detect a potential power failure in response to a decrement rate of a supply voltage.

Abstract: A method and a device for estimating parameter variations of transistors that belong to the same circuit. The method includes: providing the first circuit; providing a test circuit adapted to perform a first function and a stacked test circuit adapted to perform a second function that substantially equals the first function; wherein the test circuit, the stacked test circuit and the first circuit are processed under substantially the same processing conditions; determining a relationship between a parameter of the test circuit and a parameter of the stacked test circuit; and estimating parameter variations of transistors that belong to the first circuit in response to the determined relationship.

Abstract: A method for reducing power consumption of transistor-based circuit, the method includes: of receiving a low power mode indication; determining whether to supply power to at least a portion of the transistor-based circuit in response to a reset value of the transistor-based circuit and a state of the transistor-based circuit prior the receiving of the low power mode indication, and selectively providing power to at least a portion of the transistor-based circuit.

Abstract: A method for synchronizing a transmission of information over a bus, and a device having synchronization capabilities.

Abstract: A system that includes a clock tree and multiple variable delay components. The system is characterized by including a first set of fuses indicative of identities of variable delay components that belong to a first set of variable delay components, a second set of fuses indicative of delay values of the variable delay components that belong to the first set of variable delay components, and a second set of variable delay components that are set to at least one default delay value. A method for reducing clock skews, the method includes providing a clock tree that includes a set of variable delay components. The method is characterized by selecting a first set of variable delay components in view of timing violations occurring due clock skews, setting delay values of variable delay components that form a first set of variable delay components by programming fuses, and setting delay values of variable delay components that form a second set of variable delay components to at least one default value.

Abstract: A method for configuring IO pads, the method includes determining a current configuration of multiple IO pads of an integrated circuit and whereas the method is characterized by generating multiple boundary scan register words that comprise Configuration information; and repeating the stage of serially writing a certain boundary scan register word to a boundary scan register and outputting the boundary scan register word to multiple IO pad control circuits. A device that includes a core, connected to a boundary scan register, a TAP controller and multiple IO pad circuits, the device is characterized by including a control circuit adapted to determine a current configuration of the IO pads, to generate multiple boundary scan register words that comprise configuration information; and to control a repetition of: writing a certain boundary scan register word to the boundary scan register and outputting the boundary scan register word to multiple IO pad control circuits.

Abstract: A method for storing state information, the method includes storing, at a first circuit, state information representative of a state of a second circuit while the second circuit enters a low power mode; characterized by receiving an indication that a task switching from a first task to a second task should occur; storing a state information representative of a state of the second circuit, at the first circuit; receiving an indication that the first task should be resumed; and writing the stored state information from the first circuit to the second circuit. A system includes a first circuit and a second circuit, whereas the first circuit is connected to the second circuit and is adapted to store state information representative of a state of a second circuit; characterized by including a controller adapted to control a storage of the state information if at least a portion of the second circuit is powered down or if the second circuit is associated with a task switching operation.

Abstract: A method for analyzing an design of an integrated circuit, the method includes defining possible timings of signals to be provided to the integrated circuit and calculating hold violations; characterized by including a stage of determining relationships between clock events and corresponding data/control events that ideally precede the clock events, in response to the possible timing of signals; and determining hold parameters in response to the relationships. A computer readable medium having stored thereon a set of instructions, the set of instructions, when executed by a processor, cause the processor to define at least one internal delay of a designed component, characterized by causing the processor to define a cell that is characterized by multiple hold times and multiple setup values for a certain clock skew value.

Abstract: A method for power reduction, the method includes determining whether to power down the at least portion of the component in response to a relationship between an estimated power gain and an estimated power loss resulting from powering down the at least portion of the component during the low power mode, and selectively providing power to at least a portion of a component of an integrated circuit during a low power mode. A device having power reduction capabilities, the device includes power switching circuitry adapted to selectively provide power to at least a portion of a component of the device during a low power mode, and a power management circuitry adapted to determine whether to power down at least the portion of the component during a low power mode in response to a relationship between an estimated power gain and an estimated power loss resulting from powering down the at least portion of the component during the low power.

Abstract: A method for reducing power consumption, and a system having power reduction capabilities, the method includes: storing, at a first circuit, data representative of a state of a second circuit, entering a low power mode, exiting low power mode, providing a default data value to the second circuit after exiting from the low power mode, and selectively providing data from the first circuit to the second circuit in response to the value of data and to a characteristic of a third circuit coupled to the first and second circuits. The system includes: a first circuit, a second circuit and a third circuit. The third circuit is connected between the first circuit and the second circuit. The first circuit is adapted to store data representative of a state of the second circuit. The first circuit is activated during a low power mode while the second circuit is deactivated during the low power mode. The second circuit is adapted to enter a default state after exiting from the low power mode.

Abstract: A method and an apparatus for controlling voltage level and clock signal frequency supplied to a system.

Abstract: Biasing a transistor connected to a voltage converter, the method includes: (i) providing at least one bias voltage to at least one well of at least one transistor of a test circuitry; (ii) measuring at least one parameter of a test circuitry representative of at least one characteristic of the transistor and of at least one characteristic of the voltage converter; (iii) altering at least one bias voltage and repeating the stages of providing and measuring until a predefined control criteria is fulfilled; and (iv) providing a voltage bias to a well of the transistor in response to the measurements.

Abstract: A device and a method for biasing a transistor connected to a voltage converter, the method includes: (i) providing at least one bias voltage to at least one well of at least one transistor of a test circuitry; (ii) measuring at least one parameter of a test circuitry representative of at least one characteristic of the transistor and of at least one characteristic of the voltage converter; (iii) altering at least one bias voltage and repeating the stages of providing and measuring until a predefined control criteria is fulfilled; and (iv) providing a voltage bias to a well of the transistor in response to the measurements.