Abstract: A device and a method for biasing a transistor connected to a voltage converter, the method includes: (i) providing at least one bias voltage to at least one well of at least one transistor of a test circuitry; (ii) measuring at least one parameter of a test circuitry representative of at least one characteristic of the transistor and of at least one characteristic of the voltage converter; (iii) altering at least one bias voltage and repeating the stages of providing and measuring until a predefined control criteria is fulfilled; and (iv) providing a voltage bias to a well of the transistor in response to the measurements.

Abstract: The present invention relates to multi-bit exclusive-or (XOR) gates (60), including those where N parallel input bits (36, 38) are XORed with one data input bit (52). A modular approach is made using only one basic cell (30) for various implementations with different propagation delays. An N-bit XOR comprises basic cells (30) of adjacent first and second XOR gates (32, 34). Each first XOR gate (32) processes as input two of said N primary input bits (36, 38) and each second XOR gate (34) processes as input bits output bits of first or second XOR gates (32, 34) or the input data bit (52). This structure makes it possible to create an array of identical basic cells which is very suitable for VLSI implementation. There are few lines of connections between the different cells in the cell array which leads to substantial reduction in propagation delay without adding substantial wiring or layout complexity.