Abstract: Devices and methods of forming a device are disclosed. The method includes providing a substrate defined with at least first and second regions and providing a plurality of interlevel dielectric (ILD) levels having tight pitch over the first and second regions of the substrate. An ILD level of which a two-terminal element disposed thereon corresponds to a first ILD level and its metal level corresponds to Mx, an immediate ILD level overlying the metal level Mx corresponds to a second ILD level includes via level Vx and metal level Mx+1 and the next overlying ILD level corresponds to a third ILD level includes via level Vx+1 and metal level Mx+2. The method includes forming a two-terminal device element is formed in between metal level Mx and via level Vx+1 in the first region.

Abstract: A method of making a semiconductor device begins with a semiconductor wafer that includes a first semiconductor layer overlying a second semiconductor layer. A first trench is etched in the semiconductor wafer. The first trench is filled with insulating material. A second trench is etched within the first trench and through the insulating material, such that insulating material remains along sidewalls of the first trench. The second trench exposes a portion of the second insulating layer. A semiconductor layer can then be grown within the second trench using the second semiconductor layer as a seed layer.

Abstract: Integrating magnetic random access memory with logic is disclosed. The magnetic tunnel junction stack of a magnetic memory cell is disposed within a dielectric layer which serves as a via level of an interlevel dielectric layer with a metal level above the via level. An integration scheme for forming dual damascene structures for interconnects can be formed to logic and memory cells easily.

Abstract: Integrated circuits with magnetic random access memory (MRAM) and dual encapsulation for double magnesium oxide tunnel barrier structures and methods for fabricating the same are disclosed herein. As an illustration, an integrated circuit includes a magnetic random access memory structure that includes a bottom electrode that has a bottom electrode width and has bottom electrode sidewalls and a fixed layer overlying the bottom electrode that has a fixed layer width that is substantially equal to the bottom electrode width and has fixed layer sidewalls. The MRAM structure of the integrated circuit further includes a free layer overlying a central area of the fixed layer. Still further, the MRAM structure of the integrated circuit includes a first encapsulation layer disposed along the free layer sidewalls and a second encapsulation layer disposed along the bottom electrode sidewalls and the fixed layer sidewalls.

Abstract: Emerging memory chips and methods for forming an emerging memory chip are presented. For example, magnetic random access memory (MRAM) chip magnetic shielding and methods of forming a magnetic shield processed at the wafer-level are disclosed. The method includes providing a magnetic shield at the front side of the chip, back side of the chip, and also in the deep trenches surrounding or adjacent to magnetic tunnel junction (MTJ) array within the prime die region. Magnetic shield in the deep trenches connects front side and back side magnetic shield. This magnetic shielding method is applicable for both in-plane and perpendicular MRAM chips. The MTJ array is formed in the prime die region and in between adjacent inter layer dielectric (ILD) levels of the upper ILD layer in the back end of line (BEOL) of the MRAM chip.

Abstract: Device and methods of forming a device are disclosed. The method includes providing a substrate defined with a memory cell region. A first upper dielectric layer is provided over the substrate. The first upper dielectric layer includes a first upper interconnect level with one or more metal lines in the memory cell region. A second upper dielectric layer is provided over the first upper dielectric layer. The second upper dielectric layer includes a via plug coupled to the metal line of the first upper interconnect level. An alignment trench which extends from a top surface of the second upper dielectric layer to a portion of the second upper dielectric layer is formed. Various layers of a MTJ stack are formed over the second upper dielectric layer. Profile of the alignment trench is transferred to surfaces of the various layers of the MTJ stack to form a topography feature which serves as an alignment mark.

Abstract: Embodiments of a simple and cost-free multi-time programmable (MTP) structure for non-volatile memory cells are presented. The memory cell includes a substrate. A floating gate is disposed over a transistor well. A control gate disposed over a control well is coupled to the floating gate. The control gate includes a control capacitor. A non-self-aligned source/drain (S/D) region is disposed within the transistor well and serves as an erase terminal.

Abstract: STT-MRAM integrated circuits employing aluminum metallization layers and methods for fabricating the same are disclosed. A method for fabricating an integrated circuit includes forming a first metallization layer including an aluminum material, forming a magnetic tunnel junction (MTJ) structure over the first metallization layer, and forming an encapsulation layer over the MTJ structure and over the first metallization layer. The method further includes etching the encapsulation layer and the first metallization layer to form an encapsulation segment overlying a first metal line, forming a contact plug to the MTJ structure, and forming a second metal line including an aluminum material over the contact plug.

Abstract: Device and methods of forming a device are disclosed. The method includes providing a substrate and a first upper dielectric layer over first, second and third regions of the substrate. The first upper dielectric layer includes a first upper interconnect level with a plurality of metal lines in the first and second regions. A MRAM cell which includes a MTJ element sandwiched between top and bottom electrodes is formed in the second region. The bottom electrode is in direct contact with the metal line in the first upper interconnect level of the second region. A dielectric layer which includes a second upper interconnect level with a dual damascene interconnect in the first region and a damascene interconnect in the second region is provided over the first upper dielectric layer. The dual damascene interconnect in the first region is coupled to the metal line in the first region and the damascene interconnect in the second region is coupled to the MTJ element.

Abstract: In one embodiment, a method of forming a semiconductor device is disclosed. A high-k dielectric is deposited of over a semiconductor body, and a portion of the high-k dielectric is wet etched an etchant selected from the group consisting of hot phos, piranha, and SC1.

Abstract: Embodiments of a simple and cost-free multi-time programmable (MTP) structure for non-volatile memory cells are presented. The memory cell includes a substrate prepared with an isolation well, a HV well region and first and second wells disposed in the substrate. The memory cell further includes a first transistor having a select gate and a second transistor having a floating gate adjacent to one another and disposed over the second well. The transistors include first and second diffusion regions disposed adjacent to the sides of the gates. A control gate is disposed over the first well and coupled to the floating gate. The control and floating gates include the same gate layer extending across the first and second wells. The control gate includes a capacitor.

Abstract: Devices and methods of forming a device are disclosed. The method includes providing a substrate defined with at least first and second regions. A first upper dielectric layer is provided over the substrate. The first upper dielectric layer comprises a first upper interconnect level with a plurality of metal lines. A dielectric layer is formed over the first upper dielectric layer. The dielectric layer includes a second upper interconnect level with a plurality of metal lines. A magnetic random access memory (MRAM) cell is formed between the first and second upper interconnect levels in the first region. An inductor is formed in the second region. The inductor includes a lower inductor level formed from metal lines in the first upper interconnect level and an upper inductor level formed from metal lines in the second upper interconnect level. The metal lines in the lower inductor level and upper inductor level are coupled by via contacts to form loops of the inductor.

Abstract: Integrated circuits with magnetic random access memory (MRAM) and dual encapsulation for double magnesium oxide tunnel barrier structures and methods for fabricating the same are disclosed herein. As an illustration, an integrated circuit includes a magnetic random access memory structure that includes a bottom electrode that has a bottom electrode width and has bottom electrode sidewalls and a fixed layer overlying the bottom electrode that has a fixed layer width that is substantially equal to the bottom electrode width and has fixed layer sidewalls. The MRAM structure of the integrated circuit further includes a free layer overlying a central area of the fixed layer. Still further, the MRAM structure of the integrated circuit includes a first encapsulation layer disposed along the free layer sidewalls and a second encapsulation layer disposed along the bottom electrode sidewalls and the fixed layer sidewalls.

Abstract: A device and a method of forming a device are presented. A substrate is provided. Front end of line processing is performed to form circuit component on the substrate and back end of line processing is performed to include the uppermost inter level dielectric (ILD) layer. The uppermost ILD layer includes first and second interconnects. A pad level is formed over the uppermost ILD layer. A storage unit of a memory cell is provided in the pad level. The storage unit is coupled to the first interconnect of the uppermost ILD layer. A cell interconnect and a pad interconnect are formed in the pad level. The cell interconnect is formed on top of and coupled to the storage unit and the pad interconnect is coupled to the second interconnect in the uppermost ILD layer.

Abstract: STT-MRAM integrated circuits employing aluminum metallization layers and methods for fabricating the same are disclosed. A method for fabricating an integrated circuit includes forming a first metallization layer including an aluminum material, forming a magnetic tunnel junction (MTJ) structure over the first metallization layer, and forming an encapsulation layer over the MTJ structure and over the first metallization layer. The method further includes etching the encapsulation layer and the first metallization layer to form an encapsulation segment overlying a first metal line, forming a contact plug to the MTJ structure, and forming a second metal line including an aluminum material over the contact plug.

Abstract: One or more embodiments are related to a semiconductor device, comprising: a high-K dielectric material; and a nitrogen-doped silicon material disposed over said high-k dielectric material.

Abstract: Device and methods of forming a device are disclosed. The method includes providing a substrate defined with a memory cell region. A first upper dielectric layer is provided over the substrate. The first upper dielectric layer includes a first upper interconnect level with one or more metal lines in the memory cell region. A second upper dielectric layer is provided over the first upper dielectric layer. The second upper dielectric layer includes a via plug coupled to the metal line of the first upper interconnect level. An alignment trench which extends from a top surface of the second upper dielectric layer to a portion of the second upper dielectric layer is formed. Various layers of a MTJ stack are formed over the second upper dielectric layer. Profile of the alignment trench is transferred to surfaces of the various layers of the MTJ stack to form a topography feature which serves as an alignment mark.

Abstract: One-transistor volatile memory devices and manufacturing methods thereof are provided. The device includes a substrate having top and bottom surfaces and an isolation well disposed below the top substrate surface. An area of the substrate between the isolation buffer layer and the top substrate surface serves as a body region of a transistor. The isolation well isolates the body region from the substrate. The device includes a band engineered (BE) floating body disposed over the isolation well and within the body region. The device also includes a transistor disposed over the substrate. The transistor includes a gate disposed on the top substrate surface, and first and second diffusion regions disposed in the body region adjacent to first and second sides of the gate.

Abstract: Devices and methods for forming a device are presented. The device includes a substrate having a well of a first polarity type and a thyristor-based memory cell. The thyristor-based memory cell includes at least a first region of a second polarity type adjacent to the well, a gate which serves as a second word line disposed on the substrate, at least a first layer of the first polarity type disposed adjacent to the first region of the second polarity type and adjacent to the gate, and at least a heavily doped first layer of the second polarity type disposed on the first layer of the first polarity type and adjacent to the gate. At least the heavily doped first layer of the second polarity type is self-aligned with side of the gate.

Abstract: One-transistor (1T) volatile memory devices and manufacturing methods thereof are provided. The device includes a substrate having top and bottom surfaces and an isolation buffer layer disposed below the top substrate surface. The isolation buffer layer is an amorphized portion of the substrate. An area of the substrate between the isolation buffer layer and the top substrate surface serves as a body region of a transistor. The device also includes a transistor disposed over the substrate. The transistor includes a gate disposed on the top substrate surface, and first and second diffusion regions disposed in the body region adjacent to first and second sides of the gate.