Abstract: Methods, systems, and devices for memory device with enhanced data reliability capabilities are described. For a write operation, a memory device may receive a write command from a host device indicating a first set of data. The memory device may determine to operate in first mode of operation associated with a reliability above a threshold and generate a second set of data to store with the first set of data based on operating in the first mode of operation. For a read operation, the memory device may identify that a read command received from a host device is associated with the first mode of operation. Based on operating in the first mode of operation, the memory device may select one or more reference thresholds (e.g., a subset of reference thresholds) to retrieve the first set of data and transmit the first set of data to the host device.

Abstract: Methods, systems, and devices for enhanced data reliability in multi-level memory cells are described. For a write operation, a host device may identify a first set of data to be stored by a set of memory cells at a memory device. Based on a quantity of bits within the first set of data being less than a storage capacity of the set of memory cells, the host device may generate a second set of data and transmit a write command including the first and second sets of data to the memory device. For a read operation, the host device may receive a first set of data from the memory device in response to transmitting a read command. The memory device may extract a second set of data from the first set of data and validate a portion of the first set of data using the second set of data.

Abstract: Methods, systems, and devices for topology-based retirement in a memory system are described. In some examples, a memory system or memory device may be configured to evaluate error conditions relative to a physical or electrical organization of a memory array, which may support inferring the presence or absence of defects in one or more structures of a memory device. For example, based on various evaluations of detected errors, a memory system or a memory device may be able to infer a presence of a short-circuit, an open circuit, a dielectric breakdown, or other defects of a memory array that may be related to wear or degradation over time, and retire a portion of a memory array based on such an inference.

Abstract: Methods, systems, and devices for shallow hibernate power state are described. A memory system may include a memory array and a controller. The memory system may transition from a first power state having a first current to a second power state having a second current less than the first current, where the first power state is associated with executing received commands and the second power state is associated with deactivating one or more components of the memory array. The memory system may initiate a timer after transitioning from the first power state to the second power state. The memory system may determine the timer satisfies a threshold and transition from the second power state to a third power state having a third current less than the second current based on the timer satisfying the threshold.

Abstract: Methods, systems, and devices for write booster buffer and hibernate are described. The memory system may initiate a first operation to enter a first power mode having a lower power consumption than a second power mode. In some cases, the memory system may determine whether a quantity of data stored in a buffer of single-level cells associated with write booster information satisfies a threshold based on initiating the first operation. The memory system may determine whether to perform a second operation to transfer the quantity of data stored in the buffer of single-level cells to a portion of memory comprising multiple level cells based on determining whether the quantity of data satisfies the threshold. The memory system may enter the first power mode based on determining to perform the second operation to transfer the quantity of data from the buffer to the portion of memory.

Abstract: Methods, systems, and devices for dividing blocks for special functions are described. Some memory systems may be configured to assign a block of the memory system as a special function block configured with a first portion for storing information associated with a first function of the memory system and a second portion for storing information associated with a second function of the memory system; write a first set of information to the first portion of the block based at least in part on assigning the block as the special function block, the first set of information associated with the first function of the memory system; and write a second set of information to the second portion of the block based at least in part on assigning the block as the special function block, the second set of information associated with the second function of the memory system.

Abstract: Described are systems and methods related to a memory block erase protocol. An example system includes a memory device having a memory array including a plurality of memory cells. The system further includes a processing device coupled to the memory device. The processing device is to determine a value of a metric associated with the memory array. Responsive to determine that the value of the metric is below a predetermined threshold, the processing device is further to initiate an erase protocol of the memory device. The processing device is further to erase sets of memory cells associated with one or more memory blocks of the memory array. The processing device is further to receive a programming command directed to the first set of memory cells. The processing device is further to perform a programming operation with respect to a set of memory cells responsive to receiving the programming command.

Abstract: A memory sub-system to initiate an erase operation to erase a first set of memory cells of a first memory block and a second set of memory cells of a second memory block of a memory device. One or more erase pulses of the erase operation are caused to be applied to the first set of memory cells of the first memory block and the second set of memory cells of the second memory block concurrently. A first erase verify sub-operation of the erase operation is caused to be performed to verify the first memory block is erased and a second erase verify sub-operation of the erase operation is caused to be performed to verify the second memory block is erased.

Abstract: A system includes a memory device having an array of memory cells coupled with a plurality of page buffers. At least a portion of the array is configured as single-level cell memory. A processing device is coupled to the memory device and includes cache, the processing device to perform operations including: detecting demand for the cache during a memory operation requiring access to the single-level cell memory; and causing metadata associated with the memory operation to be stored in one or more page buffers of the plurality of page buffers, the one or more page buffers operating as an extension of the cache available to the processing device.

Abstract: Methods, systems, and devices for commands to support adaptive memory systems are described. A memory system may be configured to receive a command to perform an operation on an address of a memory system, the command including an indication of a count of program/erase cycles associated with the address; determine whether the count of program/erase cycles associated with the address satisfies a threshold; adjust a trim parameter for operating the memory system based at least in part on determining that the indication of the count of program/erase cycles satisfies the threshold; and perform the operation associated with the command using the adjusted trim parameter.

Abstract: Methods, systems, and devices for assigning blocks of memory systems are described. Some memory systems may be configured to initiate an operation to characterize a plurality of blocks of a memory system; identify a first quantity of complete blocks of the plurality of blocks and a second quantity of reduced blocks of the plurality of blocks based at least in part on initiating the operation; determine, for a block of the second quantity of reduced blocks, whether a quantity of planes available for use to store the information in the block satisfies a threshold; and assign the block as a special function block configured to store data associated with a function of the memory system based at least in part on determining that the quantity of planes available for use to store the information in the block of the second quantity of reduced blocks satisfies the threshold.

Abstract: Methods, systems, and devices for suspension during a multi-plane write procedure are described. A memory system may perform a multi-plane write procedure by writing to a set of planes in parallel. Upon detecting a defective plane in the set of planes, the memory system may suspend writing to the defective plane until writing to the other planes in the set of planes is finished. The memory system may then resume writing to the defective plane.

Abstract: Methods, systems, and devices for dynamic power control are described. In some examples, a memory device may be configured to adjust a first duration for transitioning power modes. For example, the memory device may be configured to operate in a first power mode, a second power mode, and a third power mode. When operating in a second power mode, the memory device may be configured to increase or decrease the first duration for transitioning to a third power mode based on a second duration between received commands. If no commands are received during the first duration, the memory device may transition from the second power mode to the third power mode.

Abstract: A fluid management apparatus and a heat management system are provided. The fluid management apparatus includes a connecting piece and a liquid storage part. The connecting piece and the liquid storage part are arranged separately, and a first mating part of a liquid storage part shell is sealedly connected to a first connecting port portion of the connecting piece. A liquid storage cavity of the liquid storage part is in communication with a flow channel of the connecting piece, and the connecting piece, which is provided with a flow channel, is arranged separately from the liquid storage part.

Abstract: Systems and methods for adapting garbage collection (GC) operations in a memory device to a host write activity are described. A host write progress can be represented by an actual host write count relative to a target host write count. The host write activity may be estimated in a unit time such as per day, or accumulated over a specified time period. A memory controller can adjust an amount of memory space to be freed by a GC operation according to the host write progress. The memory controller can also dynamically reallocate a portion of the memory cells between a single level cell (SLC) cache and a multi-level cell (MLC) storage according to the host write progress.

Abstract: A memory device includes a memory array comprising memory cells associated with a plurality of wordlines control logic that is to perform operations including: causing memory cells of a physical unit of the memory array to be programmed starting at a second wordline, which is adjacent to a first wordline of the memory array, and proceeding sequentially through a plurality of sequentially-ordered wordlines of the physical unit, wherein the first wordline is associated with memory cells that are adjacent to one or more select gate (SG) transistors of the memory array, and the sequentially-ordered wordlines are numbered according to a distance away from the one or more SG transistors; and at least one of after the memory cells associated with the second wordline are programmed or after completion of programming the physical unit, causing the memory cells associated with the first wordline to be programmed.

Abstract: Methods, systems, and devices for memory block utilization in memory systems are described. A system configured to allow a memory device to group or segment a memory block into two or more sub-memory blocks, which can be independently programmed is described herein. For example, a host system may determine a configuration of a memory array, and communicate the configuration information to the memory system, and transmit a command for an operation to the memory system. In some examples, the memory system may utilize the memory array configuration information and determine to segment the blocks of memory cells into sub-blocks. By segmenting the memory block into sub-blocks, the memory device may maintain its memory block density while supporting efficient programming of blocks of the memory array.

Abstract: A method includes receiving, by a processing device, signaling indicative of a power cycle (PC) to a memory device (MD) having a first signal indicative of a Power On Operation and a second signal indicative of a Power Off Operation, and determining an Average Power On Time (APOT) of the MD based, at least in part, on a quantity of power cycles (n) to the MD over a predetermined time interval (PTI), and for each PC over the PTI, an amount of time between receipt of the first signal and the second signal. A sum of each of the amount of time between receipt of the first signal and the second signal in the PTI provides a total power on time (T) to the MD, and the APOT is equal to T/n. When the APOT is less than (<) a threshold APOT value, determining a frequency at which to perform media scan operations and performing media scan operations involving the MD at the determined frequency.

Abstract: Methods, systems, and devices for memory write performance techniques are described. A memory system may receive a sequence of commands, for example from a host system. Based on a relationship between logical block addresses of the sequence of commands, the memory system may delay performing a memory management operation (e.g., a garbage collection procedure, a power operation, a cache synchronization operation, a data relocation operation, or the like) for a duration. For example, the memory system may determine whether a quantity of write commands in the sequence that include non-consecutive logical block addresses exceeds a threshold. In some cases, the memory system may perform one or more commands in the sequence during the duration. Subsequently (e.g., at the end of the duration), the memory system may perform the memory management operation.

Abstract: Methods, systems, and devices for a dynamic error control configuration for memory systems are described. The memory system may receive a read command and retrieve a set of data from a location of the memory system based on the read command. The memory system may perform a first type of error control operation on the set of data to determine whether the set of data includes one or more errors. If the set of data includes the one or more errors, the memory system may retrieve a second set of data from the location of the memory system and determine whether a syndrome weight satisfies a threshold. The memory system may perform a second type of error control operation on the second set of data based on determining that the syndrome weight satisfies the threshold.