Abstract: A circuit includes a write driver, a data circuit, a memory cell, a tracking write buffer, a tracking write driver, and a tracking cell. The circuit is configured that, during a write operation of the memory cell based on a clock signal, the write driver circuit is configured to generate a write control signal to control the memory cell; the data circuit is configured to provide write data to the memory cell; the tracking write buffer is configured to generate a tracking write control signal; and the tracking write driver is configured to generate a tracking write data signal to be transferred to the tracking cell. The tracking cell is configured to adjust a signal at a first node of the tracking cell based on a logical value of the tracking write data signal in response to the tracking write control signal.

Abstract: A memory array includes an array of memory cells. The memory array further includes at least two read tracking cells in a read tracking column. The memory array further includes a read tracking circuit coupled to the at least two read tracking cells, wherein the read tracking circuit is configured to generate a global tracking result signal based on outputs from the at least two read tracking cells. The memory array further includes memory control circuitry, wherein the memory control circuitry is configured to reset a memory clock based on the global tracking result signal.

Abstract: A method includes using a first tracking circuit corresponding to a first set of access ports of a memory macro to cause a signal transition of a first tracking signal based on an edge of a clock signal. Using a second tracking circuit corresponding to a second set of access ports of the memory macro, a signal transition of a second tracking signal is caused based on the edge of the clock signal. A reset signal is generated based on the signal transition of the first tracking signal and the signal transition of the second tracking signal. A read operation or a write operation on the memory macro is performed based on the edge of the clock signal and the reset signal.

Abstract: Methods and systems for efficient retrieval of neighboring measurement values in order to enable fast execution of rule-based error correction are disclosed. In one aspect, a method for data normalization using multi-key sorting is disclosed. In some embodiments, the method includes receiving, by a data organization engine, a set of uncorrected data including corresponding neighboring data. In various embodiments, the data organization engine organizes the uncorrected data by construction of a directed acyclic graph (DAG), where the DAG includes a plurality of nodes. In some embodiments, the data organization engine may traverse the plurality of nodes to retrieve the corresponding neighboring data. Upon retrieval of the neighboring data, a rule-based correction engine may correct the uncorrected data utilizing the retrieved corresponding neighboring data.

Abstract: A memory includes a plurality of memory cells. A first line is over the plurality of memory cells. The first line in a first layout section includes a first metal layer and a second metal layer. The second metal layer is over the first metal layer. A second line is over the plurality of memory cells. The second line in the first layout section includes the first metal layer and a third metal layer. The third metal layer is over the second metal layer The first line is electrically isolated from the second line. The first line and the second line extend in a same direction.

Abstract: A memory macro includes a first data line, a second data line, a first switch and a voltage keeper. The first switch is configured between the first data line and the second data line. The voltage keeper is electrically coupled to the second data line. The voltage keeper is configured to control a voltage level at the second data line in response to the voltage level at the second data line during the first switch electrically couples the second data line to the first data line.

Abstract: A method of designing a semiconductor circuit includes generating a model of the semiconductor circuit. The model includes a functional area corresponding to a first block of the semiconductor circuit, and a loading area corresponding to a second block of the semiconductor circuit, wherein the first block is connected to the second block by a signal line. The method further includes extracting, in the functional area, parasitic parameters of the signal line and a device of the first block. The method further includes extracting, in the loading area, parasitic parameters of the signal line, without extracting parasitic parameters of a device of the second block.

Abstract: A circuit is in a memory macro and comprises a write path, a read path, a selection circuit, and a clock generator circuit. The write path includes a first signal generated based on a first edge of a clock signal in a write operation of the memory macro. The read path includes a second signal generated based on a first edge of the clock signal in a read operation of the memory macro. The selection circuit is configured to select the first signal as a third signal in the write operation of the memory macro, and to select the second signal as the third signal in the read operation of the memory macro. The clock generator circuit is configured to generate a second edge of the clock signal in the write operation or in the read operation based on the third signal.

Abstract: A memory array includes an array of memory cells. The memory array further includes at least two read tracking cells in a read tracking column. The memory array further includes a read tracking circuit coupled to the at least two read tracking cells, wherein the read tracking circuit is configured to generate a global tracking result signal based on outputs from the at least two read tracking cells. The memory array further includes memory control circuitry, wherein the memory control circuitry is configured to reset a memory clock based on the global tracking result signal.

Abstract: A circuit includes a signal generating circuit that generates a pre-charge signal based on a clock signal and a column select signal for a column of memory cells associated with the signal generating circuit. A first state of the pre-charge signal depends on a first state of the column select signal, and the first state of the column select signal corresponds to selection of the column of memory cells. The circuit also includes a charge circuit associated with the signal generating circuit and a first data line coupled to the charge circuit. The charge circuit charges the first data line in response to the first state of the pre-charge signal and allows the first data line to float in response to a second state of the pre-charge signal.

Abstract: A memory array includes a memory segment having at least one memory bank. The at least one memory bank includes an array of memory cells, and wherein at least two first read tracking cells are disposed in a read tracking column of the at least one memory bank. The memory array further includes a read tracking circuit coupled to the at least two first read tracking cells. Outputs of the at least two first read tracking cells are connected to a tracking bit connection line (TBCL). A tracking circuit connected to the TBCL is configured to output a tracking-cells output signal to generate a global tracking result signal to a memory control circuitry. The memory control circuitry is configured to reset a memory clock based on the global tracking result signal.

Abstract: In response to a write operation to a memory cell that causes a data line of the memory cell to have a first voltage direction, causing the data line to have a second voltage direction opposite the first voltage direction.

Abstract: A control circuit includes a data driver, a charge circuit, and a first data line coupled with the data driver and the charge circuit. The charge circuit is configured to charge the first data line when the first data line is selected for accessing a memory cell corresponding to the first data line and to not charge the first data line when the first data line is not selected for accessing the memory cell. The data driver, based on a first control signal, is configured to transfer a signal on the first data line to an output of the data driver.

Abstract: A memory compiler includes a processor configured to perform a simulation of an operation of an input stage coupled to an input terminal of a memory circuit, wherein the simulation of the operation of the input stage is performed for various slew rate values at the input terminal to obtain corresponding extrinsic input timing delays. The processor is further configured to perform a simulation of an operation of an output stage coupled to an output terminal of the memory circuit, wherein the simulation of the operation of the output stage is performed for various capacitance loading values at the output terminal to obtain corresponding extrinsic output timing delays. The processor is further configured to perform a simulation of an operation of a section of the memory circuit between the input stage and the output stage to obtain an intrinsic timing delay.

Abstract: A memory macro includes a first data line, a second data line, a first switch and a voltage keeper. The first switch is configured between the first data line and the second data line. The voltage keeper is electrically coupled to the second data line. The voltage keeper is configured to control a voltage level at the second data line in response to the voltage level at the second data line during the first switch electrically couples the second data line to the first data line.

Abstract: A circuit includes a write driver, a data circuit, a memory cell, a tracking write buffer, a tracking write driver, and a tracking cell. The circuit is configured that, during a write operation of the memory cell based on a clock signal, the write driver circuit is configured to generate a write control signal to control the memory cell; the data circuit is configured to provide write data to the memory cell; the tracking write buffer is configured to generate a tracking write control signal; and the tracking write driver is configured to generate a tracking write data signal to be transferred to the tracking cell. The tracking cell is configured to adjust a signal at a first node of the tracking cell based on a logical value of the tracking write data signal in response to the tracking write control signal.

Abstract: A write tracking control circuit includes an input node, and a first transistor configured to pre-charge a word bit line connected to at least two memory cells. The write tracking control circuit further includes a second transistor configured to pre-charge a read bit line connected to the at least two memory cells. The write tracking control circuit further includes a first delay circuit between the input node and the first transistor, the first delay circuit configured to introduce a first delay time, wherein a gate of the first transistor is connected to the first delay circuit. The write tracking control circuit further includes a second delay circuit between the input node and the second transistor, the second delay circuit configured to introduce a second delay time different from the first delay time, wherein a gate of the second transistor is connected to the second delay circuit.

Abstract: A method of designing a semiconductor circuit includes generating a model of the semiconductor circuit. The model includes a functional area corresponding to a first block of the semiconductor circuit, and a loading area corresponding to a second block of the semiconductor circuit, wherein the first block is connected to the second block by a signal line. The method further includes extracting, in the functional area, parasitic parameters of the signal line and a device of the first block. The method further includes extracting, in the loading area, parasitic parameters of the signal line, without extracting parasitic parameters of a device of the second block.

Abstract: In a timing delay characterization method, a signal path between an input terminal and an output terminal of a semiconductor circuit is divided into an input stage, a processing stage, and an output stage. An operation of the input stage is simulated at various input parameter values of an input parameter at the input terminal to obtain corresponding extrinsic input timing delays associated with the input stage. An operation of the processing stage is simulated to obtain an intrinsic timing delay associated with the processing stage. An operation of the output stage is simulated at various output parameter values of an output parameter at the output terminal to obtain corresponding extrinsic output timing delays associated with the output stage. A timing delay data store is generated or populated based on the extrinsic input timing delays, the extrinsic output timing delays and the intrinsic timing delay.

Abstract: A memory macro comprises a data line, a first interface circuit comprising a first node coupled to the data line, and a voltage keeper configured to control a voltage level at the first node, and a second interface circuit comprising a second node coupled with the data line, wherein the voltage keeper is configured to control a voltage level at the second node via the data line.