Abstract: A row of floating-body single transistor memory cells is written to in two phases.

Abstract: The present invention is in the field of memory architecture and management. More particularly, the present invention provides a method, apparatus, system, and machine-readable medium to hide refresh cycles of a memory array such as dynamic random access memory.

Abstract: A floating point adder circuit includes an exponent path and a mantissa path. The exponent path includes a comparator to compare two three-bit exponents. The two exponents are each incremented, and a resultant exponent is chosen from one of the two original exponents or one of the incremented exponents. The mantissa path includes an adder to add mantissas, and an adder bypass path to select one of the mantissas in lieu of performing an addition. The mantissa path also includes constant shifters that conditionally shift the mantissas right by thirty-two bit positions.

Abstract: An offset line to substantially cancel the capacitive coupling effects of a select line to a memory cell. When the select line transitions to cause a stored memory state in the memory cell to be placed onto a sense line, capacitive coupling from the select line to the sense line is substantially cancelled by capacitive coupling, of an opposite polarity, from an offset line to the sense line. Without the opposing effects of the offset line, the capacitive coupling from the select line would raise the pre-charge voltage level on the sense line, which would then require a longer time to discharge down to the input threshold of a sense gate that detects the stored state that was in the memory cell.

Abstract: A static random access memory (SRAM) is provided that includes a logic circuit coupled to a column select signal line and a leakage reduction circuit coupled to the logic circuit and a bit line pair of a column. The logic circuit may control the leakage reduction circuit so as to reduce leakage through a column select device that is not selected.

Abstract: According to some embodiments, provided are a memory cell, a bit-line coupled to the memory cell, a pre-charge circuit coupled to the bit-line to pre-charge the bit-line, and a discharge device coupled to the bit-line to discharge the bit-line prior to a read of the memory cell.

Abstract: A leakage compensation approach enabling full VCC precharge. An array of memory cells is coupled between a pair of bit lines. A precharge circuit precharges the pair of bit lines to substantially a supply voltage level and a leakage compensation circuit supplies a first compensation current to a first one of the bit lines to substantially compensate for leakage current supplied by the first bit line during a memory access operation directed to one of the plurality of memory cells.

Abstract: An apparatus is described having a plurality of storage cells coupled between a first bit line and a second bit line. The apparatus also has a first transistor that pre-charges the first bit line and provides a first supply of current for one or more leakage currents drawn from the first bit line by any of the plurality of storage cells. The apparatus also has a second transistor that pre-charges the second bit line and provides a second supply of current for one or more leakage currents drawn from the second bit line by any of the plurality of storage cells.

Abstract: A circuit is provided having a differential difference amplifier (DDA) having first and second inputs to receive a desired body bias signal, and a third input to receive a supply voltage, the DDA configured to generate an intermediate output signal, the intermediate output signal coupled to an output buffer generating an output signal having a desired gain, the DDA having a fourth input, to cause the output signal to reference to variations in the supply voltage.

Abstract: According to some embodiments, provided are a memory cell, a bit-line coupled to the memory cell, a pre-charge circuit coupled to the bit-line to pre-charge the bit-line, and a discharge device coupled to the bit-line to discharge the bit-line prior to a read of the memory cell.

Abstract: The present invention is in the field of memory architecture and management. More particularly, the present invention provides a method, apparatus, system, and machine-readable medium to hide refresh cycles of a memory array such as dynamic random access memory.

Abstract: An offset line to substantially cancel the capacitive coupling effects of a select line to a memory cell. When the select line transitions to cause a stored memory state in the memory cell to be placed onto a sense line, capacitive coupling from the select line to the sense line is substantially cancelled by capacitive coupling, of an opposite polarity, from an offset line to the sense line. Without the opposing effects of the offset line, the capacitive coupling from the select line would raise the pre-charge voltage level on the sense line, which would then require a longer time to discharge down to the input threshold of a sense gate that detects the stored state that was in the memory cell.

Abstract: A SRAM with reduced subthreshold leakage current, the SRAM comprising a pMOSFET with its gate at VSS and its source at VCC, and a diode-connected pMOSFET with its source at VCC, where the drains of the pMOSFET and the diode-connected pMOSFET are connected together to provide a voltage VCCL, where VSS<VCCL<VCC. The beta of the diode-connected pMOSFET is substantially larger than the beta of the pMOSFET. The wordline associated with each memory cell is driven to a voltage −VEE during a read operation, where −VEE<VSS and VEE≦VCC−VCCL. Each memory cell has cross-coupled inverters to store a data bit, where the cross-coupled inverters have pMOSFETs with their sources at VCCL.

Abstract: A leakage compensation approach enabling full Vcc precharge. An array of memory cells is coupled between a pair of bit lines. A precharge circuit precharges the pair of bit lines to substantially a supply voltage level and a leakage compensation circuit supplies a first compensation current to a first one of the bit lines to substantially compensate for leakage current supplied by the first bit line during a memory access operation directed to one of the plurality of memory cells.

Abstract: A power management device and static random access memory (SRAM) architecture with dynamic supply voltages reduce active power leakage in SRAM cells. When a cell is inactive, a low level supply voltage is applied to the source line connected to the cell to maintain the data stored in the cell. However, before a cell is accessed (e.g., during a read or write operation), the source line is raised to a high level supply voltage.

Abstract: Leakage current from non-selected memory cells is substantially eliminated by placing a negative voltage on the selection line of the non-selected cells. This negative voltage on the gate of the access transistors in the cells reduces the leakage current that would otherwise leak onto a shared sense line if the selection line were biased at 0 volts. In one embodiment the pre-charge voltage on the affected sense line is reduced so that the difference between the pre-charge voltage and the negative voltage does not exceed the design voltage of the transistors in the memory cells.

Abstract: According to some embodiments, a wide-range local bias generator provides a body bias voltage to transistors in an integrated circuit.

Abstract: An open bit line dynamic random access memory (DRAM) architecture uses a multiple layer bit line configuration to reduce coupling between switching bit lines in the device. In one approach, each successive cell within a row of DRAM cells is coupled to a bit line segment that is on a different metallization layer than a previous cell in the row. Shielding members are also provided between adjacent bit lines on a common metallization layer to further reduce noise coupling. Functionality is also provided for reducing the effect of word line to bit line coupling in the DRAM device using dummy signal injection techniques. In this manner, common mode noise that could otherwise saturate one or more sense amplifiers within the DRAM device is reduced or eliminated before such saturation can take place. In one approach, dummy cells and reference cells are provided for use in performing the signal injection.

Abstract: Domino circuits are used to drive cascode circuits in a driver circuit. An output of the driver circuit may be used to provide a high output voltage (higher than the power supply voltage) without overstressing the individual transistors in the driver circuit. In one embodiment, a protection circuit is used to prevent a short circuit between two voltage connections during a transition of the driver circuit output.

Abstract: An eight-cell for static random access memory, the memory cell comprising cross-coupled inverters to store the information bit, two access nMOSFETs connected to local bit lines to access the stored information bit, and two nMOSFETs each having a gate connected to ground and coupled to the local bit lines and the cross-coupled inverters so that sub-threshold leakage currents to and from the local bit lines for a memory cell not being read are balanced.