Patents by Inventor Douglas J. Cutter
Douglas J. Cutter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6445629Abstract: As part of a memory array, a circuit is provided for altering the drive applied to an access transistor that regulates electrical communication within the memory array. In one embodiment, the circuit is used to alter the drive applied to a sense amp's voltage-pulling transistor, thereby allowing modification of the voltage-pulling rate for components of the sense amp. A sample of test data is written to the memory array and read several times at varying drive rates in order to determine the sense amp's ability to accommodate external circuitry. In another embodiment, the circuit is used to alter the drive applied to a bleeder device that regulates communication between the digit lines of the memory array and its cell plate. Slowing said communication allows defects within the memory array to have a more pronounced effect and hence increases the chances of finding such defects during testing.Type: GrantFiled: December 11, 2000Date of Patent: September 3, 2002Assignee: Micron Technology, Inc.Inventors: Kurt D. Beigel, Douglas J. Cutter, Manny K. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce, Eric T. Stubbs
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Publication number: 20020102479Abstract: An electronically programmed mask is connected to an electronic device, such as a processor. In operation, a mask design is first entered into the processor. The processor controls a display of an image on the electronically programmed mask, wherein the display replicates conventional type masks. The electronically programmed mask is designed such that the display presented on its screen provides optical contrast and characteristics that are easily changed or reprogrammed by the processor. Electronically controlled masks provide the same patterns as mechanical type masks without requiring rigid, permanent type structures to form a desired pattern.Type: ApplicationFiled: March 28, 2002Publication date: August 1, 2002Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Christophe Pierrat
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Publication number: 20020098424Abstract: An electronically programmed mask is connected to an electronic device, such as a processor. In operation, a mask design is first entered into the processor. The processor controls a display of an image on the electronically programmed mask, wherein the display replicates conventional type masks. The electronically programmed mask is designed such that the display presented on its screen provides optical contrast and characteristics that are easily changed or reprogrammed by the processor. Electronically controlled masks provide the same patterns as mechanical type masks without requiring rigid, permanent type structures to form a desired pattern.Type: ApplicationFiled: March 28, 2002Publication date: July 25, 2002Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Christophe Pierrat
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Publication number: 20020050625Abstract: A method and apparatus for forming a junctionless antifuse semiconductor structure comprises forming an antifuse in non-active areas of a semiconductor wafer. In one embodiment, the antifuse is formed over a polysilicon layer, which is coupled to a field oxide layer. In a further embodiment, the polysilicon layer comprises a bottom conductor layer in the antifuse. In another embodiment, a refractory metal silicide layer is formed between the polysilicon layer and the antifuse. In yet a further embodiment, the refractory metal silicide layer comprises the bottom conductor layer in the antifuse.Type: ApplicationFiled: November 21, 2001Publication date: May 2, 2002Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Fan Ho, Kurt D. Beigel
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Patent number: 6379847Abstract: An electronically programmed mask is connected to an electronic device, such as a processor. In operation, a mask design is first entered into the processor. The processor controls a display of an image on the electronically programmed mask, wherein the display replicates conventional type masks. The electronically programmed mask is designed such that the display presented on its screen provides optical contrast and characteristics that are easily changed or reprogrammed by the processor. Electronically controlled masks provide the same patterns as mechanical type masks without requiring rigid, permanent type structures to form a desired pattern.Type: GrantFiled: October 25, 1999Date of Patent: April 30, 2002Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Christophe Pierrat
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Patent number: 6365421Abstract: An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.Type: GrantFiled: March 20, 2000Date of Patent: April 2, 2002Assignee: Micron Technology, Inc.Inventors: Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt Beigel, Fan Ho, Patrick J. Mullarkey, Dien Luong, Hua Zheng, Michael Shore, Jeffrey P. Wright, Adrian E. Ong, Todd A. Merritt
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Publication number: 20020027815Abstract: The cancellation of a redundant element of an integrated circuit with a cancel bank is disclosed. In one embodiment, a fuse or antifuse bank is coupled to the redundant element and permanently programmed to respond to the address of a defective primary element. If the redundant element is found to be defective, the fuise or antifuse bank is canceled, and a result the redundant element is also canceled. A cancel line of the fuse or antifuse bank, along with the cancel line of each of a plurality of other fuse or antiflise banks, is coupled to a cancel bank. The cancel bank comprises a multiplexer and a plurality of cancel antifuses less in number than the number of fuise or antifise banks. The cancel antifises are selectively enabled such that the fuse or antifuise bank coupled to the defective redundant element may be canceled.Type: ApplicationFiled: August 15, 2001Publication date: March 7, 2002Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Fan Ho, Kurt D. Beigel
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Patent number: 6351424Abstract: The cancellation of a redundant element of an integrated circuit with a cancel bank is disclosed. In one embodiment, a fuse or antifuse bank is coupled to the redundant element and permanently programmed to respond to the address of a defective primary element. If the redundant element is found to be defective, the fuse or antifuse bank is canceled, and a result the redundant element is also canceled. A cancel line of the fuse or antifuse bank, along with the cancel line of each of a plurality of other fuse or antifuse banks, is coupled to a cancel bank. The cancel bank comprises a multiplexer and a plurality of cancel antifuses less in number than the number of fuse or antifuse banks. The cancel antifuses are selectively enabled such that the fuse or antifuse bank coupled to the defective redundant element may be canceled.Type: GrantFiled: August 8, 2000Date of Patent: February 26, 2002Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Fan Ho, Kurt D. Beigel
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Patent number: 6351140Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: GrantFiled: February 27, 2001Date of Patent: February 26, 2002Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Publication number: 20020006676Abstract: An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.Type: ApplicationFiled: March 20, 2000Publication date: January 17, 2002Inventors: Brett Debenham, Kim Pierce, Douglas J. Cutter, Kurt Beigel, Fan Ho, Patrick J. Mullarkey, Dien Luong, Hua Zheng, Michael Shore, Jeffrey P. Wright, Adrian E. Ong, Todd A. Merritt
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Patent number: 6335888Abstract: As part of a memory array, a circuit is provided for altering the drive applied to an access transistor that regulates electrical communication within the memory array. In one embodiment, the circuit is used to alter the drive applied to a sense amp's voltage-pulling transistor, thereby allowing modification of the voltage-pulling rate for components of the sense amp. A sample of test data is written to the memory array and read several times at varying drive rates in order to determine the sense amp's ability to accommodate external circuitry. In another embodiment, the circuit is used to alter the drive applied to a bleeder device that regulates communication between the digit lines of the memory array and its cell plate. Slowing said communication allows defects within the memory array to have a more pronounced effect and hence increases the chances of finding such defects during testing.Type: GrantFiled: December 11, 2000Date of Patent: January 1, 2002Assignee: Micron Technology, Inc.Inventors: Kurt D. Beigel, Douglas J. Cutter, Manny K. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce, Eric T. Stubbs
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Publication number: 20010049063Abstract: An electronically programmed mask is connected to an electronic device, such as a processor. In operation, a mask design is first entered into the processor. The processor controls a display of an image on the electronically programmed mask, wherein the display replicates conventional type masks. The electronically programmed mask is designed such that the display presented on its screen provides optical contrast and characteristics that are easily changed or reprogrammed by the processor. Electronically controlled masks provide the same patterns as mechanical type masks without requiring rigid, permanent type structures to form a desired pattern.Type: ApplicationFiled: October 25, 1999Publication date: December 6, 2001Inventors: DOUGLAS J. CUTTER, CHRISTOPHE PIERRAT
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Patent number: 6323536Abstract: A method and apparatus for forming a junctionless antifuse semiconductor structure comprises forming an antifuse in non-active areas of a semiconductor wafer. In one embodiment, the antifuse is formed over a polysilicon layer, which is coupled to a field oxide layer. In a further embodiment, the polysilicon layer comprises a bottom conductor layer in the antifuse. In another embodiment, a refractory metal silicide layer is formed between the polysilicon layer and the antifuse. In yet a further embodiment, the refractory metal silicide layer comprises the bottom conductor layer in the antifuse.Type: GrantFiled: August 7, 1998Date of Patent: November 27, 2001Assignee: Micron Technology, Inc.Inventors: Douglas J. Cutter, Fan Ho, Kurt D. Beigel
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Publication number: 20010040269Abstract: A method and apparatus for forming a junctionless antifuse semiconductor structure comprises forming an antifuse in non-active areas of a semiconductor wafer. In one embodiment, the antifuse is formed over a polysilicon layer, which is coupled to a field oxide layer. In a further embodiment, the polysilicon layer comprises a bottom conductor layer in the antifuse. In another embodiment, a refractory metal silicide layer is formed between the polysilicon layer and the antifuse. In yet a further embodiment, the refractory metal silicide layer comprises the bottom conductor layer in the antifuse.Type: ApplicationFiled: August 7, 1998Publication date: November 15, 2001Inventors: DOUGLAS J. CUTTER, FAN HO, KURT D. BEIGEL
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Publication number: 20010013805Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: ApplicationFiled: July 18, 1997Publication date: August 16, 2001Inventors: DOUGLAS J. CUTTER, KURT D. BEIGEL, FAN HO
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Publication number: 20010009522Abstract: As part of a memory array, a circuit is provided for altering the drive applied to an access transistor that regulates electrical communication within the memory array. In one embodiment, the circuit is used to alter the drive applied to a sense amp's voltage-pulling transistor, thereby allowing modification of the voltage-pulling rate for components of the sense amp. A sample of test data is written to the memory array and read several times at varying drive rates in order to determine the sense amp's ability to accommodate external circuitry. In another embodiment, the circuit is used to alter the drive applied to a bleeder device that regulates communication between the digit lines of the memory array and its cell plate. Slowing said communication allows defects within the memory array to have a more pronounced effect and hence increases the chances of finding such defects during testing.Type: ApplicationFiled: December 11, 2000Publication date: July 26, 2001Inventors: Kurt D. Beigel, Douglas J. Cutter, Manny K. Ma, Gordon D. Roberts, James E. Miller, Daryl L. Habersetzer, Jeffrey D. Bruce, Eric T. Stubbs
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Publication number: 20010008382Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: ApplicationFiled: February 27, 2001Publication date: July 19, 2001Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Patent number: 6262927Abstract: As part of a memory array, a circuit is provided for altering the drive applied to an access transistor that regulates electrical communication within the memory array. In one embodiment, the circuit is used to alter the drive applied to a sense amp's voltage-pulling transistor, thereby allowing modification of the voltage-pulling rate for components of the sense amp. A sample of test data is written to the memory array and read several times at varying drive rates in order to determine the sense amp's ability to accommodate external circuitry. In another embodiment, the circuit is used to alter the drive applied to a bleeder device that regulates communication between the digit lines of the memory array and its cell plate. Slowing said communication allows defects within the memory array to have a more pronounced effect and hence increases the chances of finding such defects during testing.Type: GrantFiled: January 7, 2000Date of Patent: July 17, 2001Assignee: Micron Technology, Inc.Inventors: Kurt D. Beigel, Douglas J. Cutter
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Publication number: 20010007431Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: ApplicationFiled: February 27, 2001Publication date: July 12, 2001Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho
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Publication number: 20010006351Abstract: A programmable circuit includes a first node and provides a programmed signal based on the state of the first node. A first anti-fuse has a programmed state and an unprogrammed state and couples the first node to a first power supply when in the programmed state and decouples the first node from the first power supply when in the unprogrammed state. A second anti-fuse has a programmed state and an unprogrammed state and couples the first node to a second power supply when in the programmed state and decouples the first node from the second power supply when in the unprogrammed state. The state of the programmed signal can be used to replace a primary circuit element of an integrated circuit with a redundant circuit element.Type: ApplicationFiled: February 27, 2001Publication date: July 5, 2001Applicant: Micron Technology, Inc.Inventors: Douglas J. Cutter, Kurt D. Beigel, Fan Ho