Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.

Abstract: A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal and store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the selected acquisition in the data store against one or more criteria, and identify whether the acquisition meets the one or more criteria. When the acquisition meets the one or more criteria, the acquisition may be stored in a secondary memory of the instrument as a curated or selected history of measurements, on which measurements or other analysis may be made.

Abstract: A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal, store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the acquisition in the data store to one or more criteria, and identify whether the compared acquisition meets the one or more criteria. When the selected acquisition meets the one or more criteria, the selected acquisition may be stored in a secondary memory of the instrument as a curated or selected history of measurements. After storing the selected acquisition in the secondary memory, the stored, selected acquisitions may be copied to a separate storage device as a storage file.

Abstract: A computing device includes a port to allow the computing device to connect to a network, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to determine that a new waveform has been added to a repository connected to the computing device, perform a set of measurements on the new waveform, attach results from the measurements to the new waveform as metadata, and store the new waveform and attached metadata to the repository. A method of managing waveform data includes determining that a new waveform has been added to a repository, performing a set of measurements on the new waveform, attaching results from the measurements to the new waveform as metadata, and storing the new waveform and attached metadata to the repository.

Abstract: A test and measurement device has a communications port configured to connect the test and measurement device to a network, a memory, and one or more processors configured to execute code to cause the processors to receive an original waveform through the communications port, the original waveform having an identified file type, store the original waveform in the memory, the original waveform having an original file size, compress the original waveform to a compressed waveform having a compressed file size that is smaller than the original file size, notify one or more users that the compressed waveform is available, and upon receiving a request, transmitting the compressed waveform to a user device.

Abstract: A test and measurement instrument, comprising a display and one or more processors configured to display a waveform viewing area, receive a selection of a viewing mode. When an overlay viewing mode is selected, display two or more waveforms overlaid in a single graticule in the waveform viewing area, and when a stacked viewing mode is selected, display a first waveform in a first slice having a first graticule in the waveform viewing area and display a second waveform in a second slice having a second graticule below the first slice in the waveform viewing area.

Abstract: A test and measurement instrument including a digital down converter configured to receive a bus signal and output in-phase and quadrature-phase baseband component waveform data, a trace generator configured to receive the in-phase and quadrature-phase baseband component waveform data and generate at least one radio frequency versus time trace, a decoder configured to receive the at least one radio frequency versus time trace and decode the bus signal based on the at least one radio frequency versus time trace and a wireless modulation scheme, and a trigger configured to capture at least a portion of the bus signal based on the decoded bus signal.

Abstract: A test and measurement instrument having an input configured to acquire waveforms from a device under test, a memory configured to store the acquired waveforms, a user input configured to receive a selection, and one or more processors. The one or more processors can render on a display the acquired waveforms, receive the selection from the user input indicating a filter criterium, such as a region of interest in the displayed acquired waveforms, determine which waveforms of the acquired waveforms are within the region of interest, and render only waveforms associated with the region of interest on the display.

Abstract: A test and measurement instrument including a digital down converter configured to receive a bus signal and output in-phase and quadrature-phase baseband component waveform data, a trace generator configured to receive the in-phase and quadrature-phase baseband component waveform data and generate at least one radio frequency versus time trace, a decoder configured to receive the at least one radio frequency versus time trace and decode the bus signal based on the at least one radio frequency versus time trace and a wireless modulation scheme, and a trigger configured to capture at least a portion of the bus signal based on the decoded bus signal.

Abstract: A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.

Abstract: Embodiments of the invention include methods and instruments for performing combinatorial mask triggering. One or more mask triggers can be configured. Combinatorial mask triggering logic can make various determinations about the relationship between a digitized signal and the one or more mask triggers. The various determinations about the relationship can include considerations of both space and time. When the combinatorial trigger criteria have been satisfied, a trigger signal is generated, and the digital data associated with an incoming signal is stored to memory. The combinatorial mask triggering logic can operate on signals in the frequency domain, the time domain, or both.

Abstract: A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.

Abstract: A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to process an input signal to generate a time domain waveform for display in the time domain graticule, the input signal being correlated to a time base. The processor is also configured to process a second input signal and generate a frequency domain waveform for display in the frequency domain graticule, the second input signal being correlated to the same time base. The frequency domain waveform is correlated to a selected time period of the time base. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a transform parameter, a location and the selected time period in the time domain graticule with respect to the frequency domain waveform.

Abstract: A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.

Abstract: Disclosed is a test and measurement instrument that includes a signal input structured to receive a modulated radio frequency (RF) signal under test and a demodulator structured to extract a digital signal from the received modulated RF signal. The extracted digital signal has a measurable parameter. The instrument also includes a display controller structured to display the extracted demodulated signal at one of at least two different intensities based on the measured parameter of the digital signal. In other embodiments the signal need not be an RF signal. Methods of operation are also described.

Abstract: A locking foldable foot includes a mounting plate, a first member, and a second member. The proximal end of the first member is attached to the mounting plate at a pivot. The second member is coupled to the first member and is structured to move parallel to the first member. The proximal end of the second member is structured to be capable of engaging the mounting plate to prevent rotation of the first and second members about the pivot. A test and measurement instrument includes the locking foldable foot. A method of preventing unintentional closure of a foldable foot on a test and measurement instrument includes locking the foldable foot in an open position in response to the weight of the test and measurement instrument being applied to the foldable foot.

Abstract: Embodiments of the invention include devices and methods for searching IQ-based time-domain traces for events, marking the events, and analyzing intervals of interest at or around the events on a display unit of a test and measurement instrument. The test and measurement instrument can include an input terminal to receive an RF signal, an ADC to digitize the RF signal, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized RF signal, an acquisition memory to acquire and store a record, a trace generation section to generate one or more IQ-based time-domain traces, and a search unit to scan the IQ-based time-domain traces for one or more events. The search unit can locate and mark the events for display on a display unit of the test and measurement instrument.