Abstract: A test and measurement instrument includes a first channel input for accepting a first input signal, a second channel input for accepting a second input signal, a spectrogram processor for producing a first spectrogram from the first input signal and for producing a second spectrogram from the second input signal, and a display for simultaneously showing the first spectrogram and the second spectrogram. Methods are also described.

Abstract: A test and measurement instrument includes a spectrogram generator for producing a first spectrogram image from an input signal, a display for showing the spectrogram image, and a user interface operating in conjunction with the display, the user interface including one or more user controllable inputs and the user interface configured to detect a user action, where the spectrogram generator is structured to produce a second spectrogram image, different from the first spectrogram image, based on the detected user action by the user interface. Methods of automatically generating spectrograms based on user actions are also described.

Abstract: A test and measurement instrument includes an input port for accepting an input signal for measurement, a display having a first window for showing measurements of the input signal in a time domain, and having a second window for showing measurements of the input signal in a frequency domain, where the time domain of the first window and the frequency domain of the second window are related through a transform having a pre-determined resolution bandwidth, a cursor generator structured to generate a cursor at a specific location in time in the first window, a spectral generator to produce a spectral display of a portion of the input signal that is centered around the cursor and has the pre-determined resolution bandwidth, and an image generator configured to present the generated spectral display in the second window. Methods of generating spectral displays based on user-defined cursor locations are also described.

Abstract: A test and measurement instrument including a display and one or more processors configured to display on the display a waveform viewing area with a vertical dimension and an adjustable horizontal dimension, the test and measurement instrument configured to display one or more waveforms in the waveform viewing area, a global settings readout bar located vertically adjacent to the waveform viewing area, the global settings readout bar including a first selectable information badge, wherein when the first selectable information badge is selected, displaying a first menu originating from the first selectable information badge to modify a setting of the test and measurement instrument related to the first selectable information badge. The first selectable information badge including a warning indicator when an error or safety condition occurs.

Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.

Abstract: A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal, store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the acquisition in the data store to one or more criteria, and identify whether the compared acquisition meets the one or more criteria. When the selected acquisition meets the one or more criteria, the selected acquisition may be stored in a secondary memory of the instrument as a curated or selected history of measurements. After storing the selected acquisition in the secondary memory, the stored, selected acquisitions may be copied to a separate storage device as a storage file.

Abstract: A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal and store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the selected acquisition in the data store against one or more criteria, and identify whether the acquisition meets the one or more criteria. When the acquisition meets the one or more criteria, the acquisition may be stored in a secondary memory of the instrument as a curated or selected history of measurements, on which measurements or other analysis may be made.

Abstract: A computing device includes a port to allow the computing device to connect to a network, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to determine that a new waveform has been added to a repository connected to the computing device, perform a set of measurements on the new waveform, attach results from the measurements to the new waveform as metadata, and store the new waveform and attached metadata to the repository. A method of managing waveform data includes determining that a new waveform has been added to a repository, performing a set of measurements on the new waveform, attaching results from the measurements to the new waveform as metadata, and storing the new waveform and attached metadata to the repository.

Abstract: A test and measurement device has a communications port configured to connect the test and measurement device to a network, a memory, and one or more processors configured to execute code to cause the processors to receive an original waveform through the communications port, the original waveform having an identified file type, store the original waveform in the memory, the original waveform having an original file size, compress the original waveform to a compressed waveform having a compressed file size that is smaller than the original file size, notify one or more users that the compressed waveform is available, and upon receiving a request, transmitting the compressed waveform to a user device.

Abstract: A test and measurement instrument, comprising a display and one or more processors configured to display a waveform viewing area, receive a selection of a viewing mode. When an overlay viewing mode is selected, display two or more waveforms overlaid in a single graticule in the waveform viewing area, and when a stacked viewing mode is selected, display a first waveform in a first slice having a first graticule in the waveform viewing area and display a second waveform in a second slice having a second graticule below the first slice in the waveform viewing area.

Abstract: A test and measurement instrument including a digital down converter configured to receive a bus signal and output in-phase and quadrature-phase baseband component waveform data, a trace generator configured to receive the in-phase and quadrature-phase baseband component waveform data and generate at least one radio frequency versus time trace, a decoder configured to receive the at least one radio frequency versus time trace and decode the bus signal based on the at least one radio frequency versus time trace and a wireless modulation scheme, and a trigger configured to capture at least a portion of the bus signal based on the decoded bus signal.

Abstract: A test and measurement instrument having an input configured to acquire waveforms from a device under test, a memory configured to store the acquired waveforms, a user input configured to receive a selection, and one or more processors. The one or more processors can render on a display the acquired waveforms, receive the selection from the user input indicating a filter criterium, such as a region of interest in the displayed acquired waveforms, determine which waveforms of the acquired waveforms are within the region of interest, and render only waveforms associated with the region of interest on the display.

Abstract: A test and measurement instrument including a digital down converter configured to receive a bus signal and output in-phase and quadrature-phase baseband component waveform data, a trace generator configured to receive the in-phase and quadrature-phase baseband component waveform data and generate at least one radio frequency versus time trace, a decoder configured to receive the at least one radio frequency versus time trace and decode the bus signal based on the at least one radio frequency versus time trace and a wireless modulation scheme, and a trigger configured to capture at least a portion of the bus signal based on the decoded bus signal.

Abstract: A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.

Abstract: Embodiments of the invention include methods and instruments for performing combinatorial mask triggering. One or more mask triggers can be configured. Combinatorial mask triggering logic can make various determinations about the relationship between a digitized signal and the one or more mask triggers. The various determinations about the relationship can include considerations of both space and time. When the combinatorial trigger criteria have been satisfied, a trigger signal is generated, and the digital data associated with an incoming signal is stored to memory. The combinatorial mask triggering logic can operate on signals in the frequency domain, the time domain, or both.

Abstract: A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.

Abstract: A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.