Housing for a test and measurement instrument
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- COMBINED HIGHER ORDER STATISTICS AND ARTIFICIAL INTELLIGENCE SIGNAL ANALYSIS
The portions of the housing for a test and measurement instrument shown in broken lines form no part of the claimed design.
The ornamental design for a housing for a test and measurement instrument, as shown and described.
Filed: Jan 25, 2019
Date of Patent: Feb 9, 2021
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventors: Neil Clayton (Hillsboro, OR), Robert R. Kreitzer (Tigard, OR), Gary J. Waldo (Hillsboro, OR), Jonah S. Griffith (Seattle, WA), Aaron Piazza (Lake Forest Park, WA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/678,101