Abstract: A semiconductor circuit is provided including circuitry for producing a pulse. A plurality, n, of delay elements are provided each enabled and disabled in parallel by the pulse. Each delay element is adapted to transmit the pulse from an input to an output, with the pulse reaching the respective outputs at different times. A plurality, n−1, of detectors is provided each having an input coupled to an input of a corresponding delay element. Each detector is adapted to set a state of its output to a predetermined state, from a plurality of states, in response to receiving a portion of the pulse. The outputs of the detectors are coupled to output pins of the semiconductor circuit. A tester is provided that is adapted to couple to the semiconductor output pins and detect the state of the detector outputs.

Abstract: A dynamic logic circuit having a charging circuit, comprising a first transistor having a first source/drain electrode adapted for coupling to a voltage supply and a second source/drain electrode connected to a node. The charging circuit couples the voltage supply to the node to place an initial charge on the node. A data transfer circuit is provided comprising a second transistor having a gate adapted for coupling to an input strobe pulse, a first source/drain electrode connected to the node, and a second source/drain electrode responsive to an input data and the input strobe pulse, for transferring the input data to the node to the node such that the pre-charged node is either discharged or remains depending on the input data. An output circuit is responsive to an output strobe pulse for coupling the data at the node to an output.