Patents by Inventor Hideki Morii
Hideki Morii has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12656100Abstract: An adjustment method for a shape measuring device that radiates light from a light source to a master for adjustment and a reference surface respectively as measurement light and reference light and measures a shape of a surface to be measured of a measurement target using multiplexed light of the measurement light and the reference light respectively reflected by the master for adjustment and the reference surface, the adjustment method including; measuring the master for adjustment in an adjusted state in which a focus position matches an interference position and calculating and storing a matching degree parameter indicating a matching degree between the focus position and the interference position as an adjustment matching degree parameter; when the measurement target is measured, measuring the master for adjustment, calculating the matching degree parameter and comparing the matching degree parameter with the adjustment matching degree parameter, to confirm the matching degree.Type: GrantFiled: August 6, 2024Date of Patent: June 16, 2026Assignee: TOKYO SEIMITSU CO., LTD.Inventors: Yoshiyuki Kawata, Katsufumi Moriyama, Hideki Morii
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Publication number: 20250383197Abstract: The spectroscope includes: a spectroscopic element configured to disperse incident light (reflected light) in accordance with wavelengths; a detector (line sensor) having a plurality of pixels and configured to receive wavelength-specific light components obtained through light dispersion by the spectroscopic element at ones different from each other of the pixels; and a low-emissivity member provided on at least one of a first-direction side and a second-direction side of the spectroscopic element and the detector in a case where a one-direction side of a light dispersion direction of the spectroscopic element is the first-direction side, and an other-direction side of the light dispersion direction is the second-direction side.Type: ApplicationFiled: June 11, 2025Publication date: December 18, 2025Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Yoshiyuki KAWATA, Hideki MORII
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Publication number: 20250297968Abstract: An inspection device includes: a camera configured to capture an image of an inspection object on a wafer; a first determining unit configured to detect the inspection object from the image captured by the camera and make a tentative determination of quality of the inspection object; a three-dimensional shape measuring machine configured to measure a three-dimensional shape of the inspection object determined to be abnormal by the tentative determination; and a second determining unit configured to make a formal determination of the quality of the inspection object based on the three-dimensional shape of the inspection object measured by the three-dimensional shape measuring machine and the image captured by the camera or based on the three-dimensional shape of the inspection object measured by the three-dimensional shape measuring machine.Type: ApplicationFiled: June 10, 2025Publication date: September 25, 2025Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Yoshiyuki KAWATA, Katsufumi MORIYAMA, Hideki MORII, Kazuyuki SANADA, Akira YAMAGUCHI, Tetsuo YOSHIDA, Hiroshi NISHIMURA
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Patent number: 12373974Abstract: A shape measurement device includes: a displacement detector configured to detect displacement of a contact; a relative movement mechanism configured to relatively move the displacement detector with respect to the measurement object, and allow the contact to trace a surface to be measured of the measurement object; a position detecting sensor configured to detect a relative position of the displacement detector with respect to the measurement object; a camera configured to image the contact, and output a captured image of the contact; and a synchronization controller configured to repetitively execute three actions in synchronization together while the relative movement is being performed by the relative movement mechanism, the actions including detection of the relative position by the position detecting sensor, detection of the displacement by the displacement detector, and imaging by the camera.Type: GrantFiled: November 10, 2022Date of Patent: July 29, 2025Assignee: TOKYO SEIMITSU CO., LTD.Inventors: Hikaru Masuta, Hideki Morii
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Publication number: 20240393098Abstract: An adjustment method for a shape measuring device that radiates light from a light source to a master for adjustment and a reference surface respectively as measurement light and reference light and measures a shape of a surface to be measured of a measurement target using multiplexed light of the measurement light and the reference light respectively reflected by the master for adjustment and the reference surface, the adjustment method including; measuring the master for adjustment in an adjusted state in which a focus position matches an interference position and calculating and storing a matching degree parameter indicating a matching degree between the focus position and the interference position as an adjustment matching degree parameter; when the measurement target is measured, measuring the master for adjustment, calculating the matching degree parameter and comparing the matching degree parameter with the adjustment matching degree parameter, to confirm the matching degree.Type: ApplicationFiled: August 6, 2024Publication date: November 28, 2024Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Yoshiyuki KAWATA, Katsufumi MORIYAMA, Hideki MORII
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Publication number: 20240393097Abstract: A three-dimensional shape measuring device includes a holder that changes the reference light path length in response to temperature change, and a temperature adjusting unit that adjusts a temperature of the holder to a target temperature, so as to make a measurement light path length equal to a reference light path length with high accuracy at low cost regardless of a temperature of an installation environment. A three-dimensional shape measuring device includes a temperature adjusting unit that adjusts the temperature of the holder and a temperature control unit that controls the temperature adjusting unit so as to selectively switch a measurement mode between a first measurement mode in which the reference light path length is made equal to a measurement light path length and a second measurement mode in which the reference light path length is made different from the measurement light path length.Type: ApplicationFiled: August 6, 2024Publication date: November 28, 2024Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Yoshiyuki KAWATA, Katsufumi MORIYAMA, Hideki MORII
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Publication number: 20240393104Abstract: A surface shape measuring device includes a camera that captures the observation image acquired by the optical head, a drive unit that causes the optical head to scan relatively in a scanning direction perpendicular to the measurement target, an encoder for detecting a position of the optical head in the scanning direction with respect to the measurement target, an imaging instructing unit that instructs the camera to capture the observation image based on a position signal output from the encoder for each predetermined interval, a frame dropping occurrence rate calculating unit that calculates a frame dropping occurrence rate indicating an occurrence rate of frame dropping of the camera, and a measurement condition setting unit that sets a measurement condition for measuring a surface shape of the measurement target based on the frame dropping occurrence rate.Type: ApplicationFiled: August 6, 2024Publication date: November 28, 2024Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Yoshiyuki KAWATA, Katsufumi MORIYAMA, Hideki MORII
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Patent number: 11940463Abstract: The particle measurement device includes: an acquiring unit configured to acquire pad surface shape data indicating a surface shape of an electrode pad including a probe needle mark where a probe needle has contacted; a roughness calculating unit configured to calculate volume of a recessed portion recessed from a pad reference surface and volume of a protruding portion protruding from the pad reference surface based on the pad surface shape data; and a particle quantity calculating unit configured to calculate a particle quantity from a volume difference between the volume of the recessed portion and the volume of the protruding portion.Type: GrantFiled: August 31, 2023Date of Patent: March 26, 2024Assignee: TOKYO SEIMITSU CO., LTD.Inventors: Natsumi Hayashi, Hideki Morii, Tetsuo Yoshida, Toshiyuki Kimura
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Patent number: 11859969Abstract: A measurement device includes: a probe part including a probe configured to measure a surface of an object to be measured and is attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; and an arm part to which the probe part is attached, the arm part is attached so as to swing around the swing center integrally with the probe part, and the scale is attached to the arm part. When thermal expansion coefficients of the probe part, the arm part and the scale are ?, ? and ? respectively, the measurement device satisfies a condition of (?+?)?1/2????(?+?)+1/2?.Type: GrantFiled: October 28, 2022Date of Patent: January 2, 2024Assignee: TOKYO SEIMITSU CO., LTD.Inventors: Hideki Morii, Takuya Inoue
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Publication number: 20230417797Abstract: The particle measurement device includes: an acquiring unit configured to acquire pad surface shape data indicating a surface shape of an electrode pad including a probe needle mark where a probe needle has contacted; a roughness calculating unit configured to calculate volume of a recessed portion recessed from a pad reference surface and volume of a protruding portion protruding from the pad reference surface based on the pad surface shape data; and a particle quantity calculating unit configured to calculate a particle quantity from a volume difference between the volume of the recessed portion and the volume of the protruding portion.Type: ApplicationFiled: August 31, 2023Publication date: December 28, 2023Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Natsumi HAYASHI, Hideki MORII, Tetsuo YOSHIDA, Toshiyuki KIMURA
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Patent number: 11740074Abstract: The following are observed using a camera: a first position of a small hole of a workpiece, which is fixed to a linear-and-tilting-motion stage and rotating with a rotating body, and a second position thereof different from the first position, at a first rotation angle of the rotating body; and the first position and the second position of the small hole of the workpiece at a second rotation angle different from the first rotation angle of the rotating body. A position and a tilt of the small hole are calculated from coordinates of the respective observed positions, and small hole information, which includes the position and the tilt of the small hole, is outputted.Type: GrantFiled: September 7, 2022Date of Patent: August 29, 2023Assignee: TOKYO SEIMITSU CO., LTD.Inventors: Hideki Morii, Katsufumi Moriyama, Hiroaki Kimura
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Patent number: 11740072Abstract: The inner surface shape measurement device, which measures an inner surface shape of a small hole formed in a workpiece, includes: a rotating body for rotating the workpiece around a rotation axis, and a linear-and-tilting-motion stage; an elongated probe capable of being inserted into the small hole of the workpiece; a probe linear-and-tilting-motion mechanism capable of adjusting posture of the probe; a camera, configured to be rotatable integrally with the rotating body, for imaging the probe from at least three circumferential positions on a rotation trajectory centered on a rotation axis; and a controller for adjusting the posture of the probe using the probe linear-and-tilting-motion mechanism based on an image taken by the camera at each of the circumferential positions.Type: GrantFiled: September 7, 2022Date of Patent: August 29, 2023Assignee: TOKYO SEIMITSU CO., LTD.Inventors: Hideki Morii, Katsufumi Moriyama
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Publication number: 20230064860Abstract: A shape measurement device includes: a displacement detector configured to detect displacement of a contact; a relative movement mechanism configured to relatively move the displacement detector with respect to the measurement object, and allow the contact to trace a surface to be measured of the measurement object; a position detecting sensor configured to detect a relative position of the displacement detector with respect to the measurement object; a camera configured to image the contact, and output a captured image of the contact; and a synchronization controller configured to repetitively execute three actions in synchronization together while the relative movement is being performed by the relative movement mechanism, the actions including detection of the relative position by the position detecting sensor, detection of the displacement by the displacement detector, and imaging by the camera.Type: ApplicationFiled: November 10, 2022Publication date: March 2, 2023Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Hikaru MASUTA, Hideki MORII
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Publication number: 20230052870Abstract: A measurement device includes: a probe part including a probe configured to measure a surface of an object to be measured and is attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; and an arm part to which the probe part is attached, the arm part is attached so as to swing around the swing center integrally with the probe part, and the scale is attached to the arm part. When thermal expansion coefficients of the probe part, the arm part and the scale are ?, ? and ? respectively, the measurement device satisfies a condition of ? + ? ? 1 ? / ? 2 ? ? ? ? ? ? ? ? ? + ? + 1 ? / ? 2 ? .Type: ApplicationFiled: October 28, 2022Publication date: February 16, 2023Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Hideki MORII, Takuya INOUE
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Publication number: 20230028748Abstract: The following are observed using a camera: a first position of a small hole of a workpiece, which is fixed to a linear-and-tilting-motion stage and rotating with a rotating body, and a second position thereof different from the first position, at a first rotation angle of the rotating body; and the first position and the second position of the small hole of the workpiece at a second rotation angle different from the first rotation angle of the rotating body. A position and a tilt of the small hole are calculated from coordinates of the respective observed positions, and small hole information, which includes the position and the tilt of the small hole, is outputted.Type: ApplicationFiled: September 7, 2022Publication date: January 26, 2023Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Hideki MORII, Katsufumi MORIYAMA, Hiroaki KIMURA
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Publication number: 20230003510Abstract: The inner surface shape measurement device, which measures an inner surface shape of a small hole formed in a workpiece, includes: a rotating body for rotating the workpiece around a rotation axis, and a linear-and-tilting-motion stage; an elongated probe capable of being inserted into the small hole of the workpiece; a probe linear-and-tilting-motion mechanism capable of adjusting posture of the probe; a camera, configured to be rotatable integrally with the rotating body, for imaging the probe from at least three circumferential positions on a rotation trajectory centered on a rotation axis; and a controller for adjusting the posture of the probe using the probe linear-and-tilting-motion mechanism based on an image taken by the camera at each of the circumferential positions.Type: ApplicationFiled: September 7, 2022Publication date: January 5, 2023Applicant: Tokyo Seimitsu Co., Ltd.Inventors: Hideki MORII, Katsufumi MORIYAMA
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Patent number: 11435175Abstract: Provided are a displacement detector, a surface shape measuring apparatus, and a roundness measuring apparatus capable of measuring displacement in a plurality of directions, having a simple configuration, and capable of highly accurate measurement. A displacement measurer includes: a detector body; a substantially L-shaped stylus having a contactor to be in contact with a measuring surface of an object to be measured; a stylus holding part that is provided in the detector body and holds the stylus in a swingable manner, with a swing plane being a plane including a first direction and a second direction that are perpendicular to each other; and a displacement detecting unit that is provided in the detector body and detects displacement of the contactor associated with contact between the contactor and the measuring surface.Type: GrantFiled: June 2, 2021Date of Patent: September 6, 2022Assignee: TOKYO SEIMITSU CO., LTD.Inventor: Hideki Morii
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Patent number: 11397073Abstract: Provided are a displacement detector, a surface shape measuring apparatus, and a roundness measuring apparatus capable of measuring displacement in a plurality of directions, having a simple configuration, and capable of highly accurate measurement. A displacement measurer includes: a detector body; a substantially L-shaped stylus having a contactor to be in contact with a measuring surface of an object to be measured; a stylus holding part that is provided in the detector body and holds the stylus in a swingable manner, with a swing plane being a plane including a first direction and a second direction that are perpendicular to each other; and a displacement detecting unit that is provided in the detector body and detects displacement of the contactor associated with contact between the contactor and the measuring surface.Type: GrantFiled: June 2, 2021Date of Patent: July 26, 2022Assignee: TOKYO SEIMITSU CO., LTD.Inventor: Hideki Morii
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Publication number: 20210285751Abstract: Provided are a displacement detector, a surface shape measuring apparatus, and a roundness measuring apparatus capable of measuring displacement in a plurality of directions, having a simple configuration, and capable of highly accurate measurement. A displacement measurer includes: a detector body; a substantially L-shaped stylus having a contactor to be in contact with a measuring surface of an object to be measured; a stylus holding part that is provided in the detector body and holds the stylus in a swingable manner, with a swing plane being a plane including a first direction and a second direction that are perpendicular to each other; and a displacement detecting unit that is provided in the detector body and detects displacement of the contactor associated with contact between the contactor and the measuring surface.Type: ApplicationFiled: June 2, 2021Publication date: September 16, 2021Applicant: Tokyo Seimitsu Co., Ltd.Inventor: Hideki MORII
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Patent number: 11112628Abstract: A charge pull-out period is set after power off, and an all-on control signal is set to a high level in the charge pull-out period. A high-level voltage which is output to a scanning line drive circuit formed on a liquid crystal panel is kept at a high level even after power off until a middle of the charge pull-out period. A common electrode control circuit for connecting a common electrode to a ground when the all-on control signal is at the high level and the high-level voltage is at an operation level is configured using two resistors, a NOT circuit, and two FETs, and is provided to a liquid crystal display device. With this, a liquid crystal display device which can lower a common electrode voltage to a ground level when power off and can prevent burn-in after power on is provided.Type: GrantFiled: June 8, 2018Date of Patent: September 7, 2021Assignee: SHARP KABUSHIKI KAISHAInventors: Yuta Ueyama, Masami Ozaki, Hideki Morii