Patents by Inventor Hiromitsu Tanaka

Hiromitsu Tanaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160131802
    Abstract: An antireflection member, including a resin base member; and a particle layer having mesoporous-silica nanoparticles directly fixed to a surface of the resin base member, wherein the nanoparticles are at least partially embedded in the surface of the resin base member, and the nanoparticles are arranged in a mono-particle layer to form the particle layer.
    Type: Application
    Filed: November 4, 2015
    Publication date: May 12, 2016
    Inventors: Norihiro MIZOSHITA, Hiromitsu TANAKA
  • Publication number: 20160097978
    Abstract: A resist pattern-forming method includes applying a resist underlayer film-forming composition to a substrate to form a resist underlayer film. The resist underlayer film-forming composition includes (A) a polysiloxane. A radiation-sensitive resin composition is applied to the resist underlayer film to form a resist film. The radiation-sensitive resin composition includes (a1) a polymer that changes in polarity and decreases in solubility in an organic solvent due to an acid. The resist film is exposed. The exposed resist film is developed using a developer that includes an organic solvent.
    Type: Application
    Filed: October 7, 2015
    Publication date: April 7, 2016
    Applicant: JSR Corporation
    Inventors: Yusuke ANNO, Takashi MORI, Hirokazu SAKAKIBARA, Taiichi FURUKAWA, Kazunori TAKANASHI, Hiromitsu TANAKA, Shin-ya MINEGISHI
  • Patent number: 9268229
    Abstract: A composition for forming a resist underlayer film includes a polysiloxane, and a solvent composition. The solvent composition includes an organic solvent which includes a compound represented by the following formula (1) or a carbonate compound and which has a standard boiling point of no less than 150.0° C. R1 and R2 each independently represent a hydrogen atom, an alkyl group having 1 to 4 carbon atoms or an acyl group having 1 to 4 carbon atoms. R3 represents a hydrogen atom or a methyl group. n is an integer of 1 to 4. In a case where n is no less than 2, a plurality of R3s are identical or different.
    Type: Grant
    Filed: March 29, 2013
    Date of Patent: February 23, 2016
    Assignee: JSR CORPORATION
    Inventors: Hiromitsu Tanaka, Junya Suzuki, Masayuki Motonari, Tooru Kimura
  • Publication number: 20150376071
    Abstract: A nanoheterostructure includes a first inorganic component and a second inorganic component one of which is a matrix, and the other of which is three-dimensionally and periodically arranged in the matrix, and has a three-dimensional periodic structure whose average value of one unit length of a repeated structure is 1 nm to 100 nm.
    Type: Application
    Filed: September 9, 2015
    Publication date: December 31, 2015
    Inventors: Hiroaki WAKAYAMA, Hirotaka YONEKURA, Hiromitsu TANAKA
  • Patent number: 9194874
    Abstract: An object of the present invention is to provide a test/diagnosis method for fertility which allows the estimation of the possibility of leading to pregnancy based on the ability of sperm to fuse with an egg and the identification of a cause of infertility; and a polynucleotide and a fertility testing kit which are used in the method.
    Type: Grant
    Filed: March 15, 2010
    Date of Patent: November 24, 2015
    Assignees: TOPPAN PRINTING CO., LTD., OSAKA UNIVERSITY, KYUSHU BUNKA GAKUEN SCHOOL FOUNDATION
    Inventors: Shinji Irie, Akira Tsujimura, Yasushi Miyagawa, Hiromitsu Tanaka
  • Publication number: 20150295250
    Abstract: Provided is an electrode catalyst for a fuel cell including: a carbon support; and catalytic metal supported on the carbon support, the catalytic metal being selected from platinum or a platinum alloy, in which the carbon support has a crystallite size of (002) plane of carbon within a range of 5.0 nm or more and has a specific surface area within a range of 95 m2/g to 170 m2/g, and the catalytic metal has a crystallite size of (220) plane of platinum within a range of 4.5 nm or less.
    Type: Application
    Filed: April 7, 2015
    Publication date: October 15, 2015
    Applicants: CATALER CORPORATION, TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Tetsuo NAGAMI, Hiromitsu TANAKA, Mikihiro KATAOKA, Tomohiro ISHIDA
  • Patent number: 9096736
    Abstract: Fine graphite particles include plate-like graphite particles; and an aromatic vinyl copolymer which is adsorbed on the plate-like graphite particles, and which contains a vinyl aromatic monomer unit represented by the following formula (1): —(CH2—CHX)—??(1) (in the formula (1), X represents a phenyl group, a naphthyl group, an anthracenyl group, or a pyrenyl group, provided that these groups may have each a substituent).
    Type: Grant
    Filed: June 7, 2011
    Date of Patent: August 4, 2015
    Assignee: KABUSHIKI KAISHA TOYOTA CHUO KENKYUSHO
    Inventors: Hiromitsu Tanaka, Makoto Kato, Osamu Watanabe
  • Publication number: 20150160556
    Abstract: A resist pattern-forming method includes applying a resist underlayer film-forming composition to a substrate to form a resist underlayer film. The resist underlayer film-forming composition includes (A) a polysiloxane. A radiation-sensitive resin composition is applied to the resist underlayer film to form a resist film. The radiation-sensitive resin composition includes (a1) a polymer that changes in polarity and decreases in solubility in an organic solvent due to an acid. The resist film is exposed. The exposed resist film is developed using a developer that includes an organic solvent.
    Type: Application
    Filed: February 20, 2015
    Publication date: June 11, 2015
    Applicant: JSR Corporation
    Inventors: Yusuke ANNO, Takashi MORI, Hirokazu SAKAKIBARA, Taiichi FURUKAWA, Kazunori TAKANASHI, Hiromitsu TANAKA, Shin-ya MINEGISHI
  • Patent number: 8993223
    Abstract: A resist pattern-forming method includes applying a resist underlayer film-forming composition to a substrate to form a resist underlayer film. The resist underlayer film-forming composition includes (A) a polysiloxane. A radiation-sensitive resin composition is applied to the resist underlayer film to form a resist film. The radiation-sensitive resin composition includes (a1) a polymer that changes in polarity and decreases in solubility in an organic solvent due to an acid. The resist film is exposed. The exposed resist film is developed using a developer that includes an organic solvent.
    Type: Grant
    Filed: January 17, 2014
    Date of Patent: March 31, 2015
    Assignee: JSR Corporation
    Inventors: Yusuke Anno, Takashi Mori, Hirokazu Sakakibara, Taiichi Furukawa, Kazunori Takanashi, Hiromitsu Tanaka, Shin-ya Minegishi
  • Publication number: 20150079348
    Abstract: An antireflection film comprises: mesoporous nanoparticles having a metal oxide framework and an average particle diameter of 30 to 200 nm; and a mesoporous transparent material having a metal oxide framework and filling voids among the nanoparticles.
    Type: Application
    Filed: August 29, 2014
    Publication date: March 19, 2015
    Inventors: Norihiro MIZOSHITA, Masahiko ISHII, Hiromitsu TANAKA
  • Publication number: 20150050600
    Abstract: A resist pattern-forming method includes applying a resist underlayer film-forming composition to a substrate to form a resist underlayer film. The resist underlayer film-forming composition includes (A) a polysiloxane. A radiation-sensitive resin composition is applied to the resist underlayer film to form a resist film. The radiation-sensitive resin composition includes (a1) a polymer that changes in polarity and decreases in solubility in an organic solvent due to an acid. The resist film is exposed. The exposed resist film is developed using a developer that includes an organic solvent.
    Type: Application
    Filed: January 17, 2014
    Publication date: February 19, 2015
    Applicant: JSR Corporation
    Inventors: Yusuke ANNO, Takashi MORI, Hirokazu SAKAKIBARA, Taiichi FURUKAWA, Kazunori TAKANASHI, Hiromitsu TANAKA, Shin-ya MINEGISHI
  • Patent number: 8956807
    Abstract: A resist pattern-forming method capable of forming a resist pattern excellent in pattern collapse resistance in the case of development with the organic solvent in multilayer resist processes. The method has the steps of: (1) providing a resist underlayer film on a substrate using a composition for forming a resist underlayer film; (2) providing a resist film on the resist underlayer film using a photoresist composition; (3) exposing the resist film; and (4) developing the exposed resist film using a developer solution containing no less than 80% by mass of an organic solvent, in which the composition for forming a resist underlayer film contains (A) a component that includes a polysiloxane chain and that has a carboxyl group, a group that can generate a carboxyl group by an action of an acid, an acid anhydride group or a combination thereof.
    Type: Grant
    Filed: September 28, 2012
    Date of Patent: February 17, 2015
    Assignee: JSR Corporation
    Inventors: Hiromitsu Tanaka, Kazunori Takanashi, Shinya Minegishi, Takashi Mori, Tomoaki Seko, Jyunya Suzuki
  • Patent number: 8767283
    Abstract: An electrophoretic display device includes a first substrate including switching elements and driving electrodes, an electrophoretic display element layer fixed on a predetermined display region of the first substrate, a sealing member formed to surround the display element layer on the first substrate, the sealing member being thicker than the display element layer, and a second substrate fixed on an opposite end of the sealing member to the first substrate, the second substrate having a wider area than the display element layer. The first substrate, the sealing member, and the second substrate constitute a closed inner space around the display element layer, thereby enclosing the display element layer in the space. The space is filled with an inert gas having a pressure approximately equal to an atmospheric pressure or is set in a predetermined vacuum state.
    Type: Grant
    Filed: January 28, 2013
    Date of Patent: July 1, 2014
    Assignee: NLT Technologies, Ltd.
    Inventor: Hiromitsu Tanaka
  • Patent number: D705851
    Type: Grant
    Filed: December 20, 2012
    Date of Patent: May 27, 2014
    Assignee: Brother Industries, Ltd.
    Inventors: Hiromitsu Tanaka, Nobuyuki Iwai
  • Patent number: D714290
    Type: Grant
    Filed: June 11, 2013
    Date of Patent: September 30, 2014
    Assignee: Brother Industries, Ltd.
    Inventors: Hiromitsu Tanaka, Ai Kishimoto
  • Patent number: D714291
    Type: Grant
    Filed: June 11, 2013
    Date of Patent: September 30, 2014
    Assignee: Brother Industries, Ltd.
    Inventors: Hiromitsu Tanaka, Ai Kishimoto
  • Patent number: D715356
    Type: Grant
    Filed: June 10, 2013
    Date of Patent: October 14, 2014
    Assignee: Brother Industries, Ltd.
    Inventors: Ryoichi Nakagawa, Nobuyuki Iwai, Hiromitsu Tanaka
  • Patent number: D744031
    Type: Grant
    Filed: December 18, 2014
    Date of Patent: November 24, 2015
    Assignee: BROTHER INDUSTRIES, LTD.
    Inventors: Hiromitsu Tanaka, Yukihiko Sato, Yusaku Seki
  • Patent number: D745599
    Type: Grant
    Filed: January 31, 2014
    Date of Patent: December 15, 2015
    Assignee: BROTHER INDUSTRIES, LTD.
    Inventors: Hiromitsu Tanaka, Nobuyuki Iwai, Jihoon Kil
  • Patent number: D752140
    Type: Grant
    Filed: June 11, 2014
    Date of Patent: March 22, 2016
    Assignee: BROTHER INDUSTRIES, LTD.
    Inventors: Hiromitsu Tanaka, Nobuyuki Iwai, Tomoyuki Nanno