Abstract: A domino logic circuit includes a pre-charge circuit pre-charging a first dynamic node in response to a clock signal, a first logic network determining a logic level of the first dynamic node in response to first data signals, an inverter receiving the clock signal, a discharge circuit discharging a second dynamic node in response to an output signal of the inverter, and a second logic network determining a logic level of the second dynamic node in response to at least one second data signal and an output signal of the first dynamic node.

Abstract: A scan flip-flop circuit includes an input unit and an output unit. The data output unit is configured to provide a data output terminal with a data output signal in response to a data input signal and a first control signal in a first operation mode, and the data output unit is configured to prohibit the data output terminal from being provided with a power supply voltage and a ground voltage applied to the scan flip-flop circuit in response to the data input signal and the first control signal in a second operation mode. The scan output unit is configured to provide a scan output terminal with a scan output signal in response to a scan input signal and a second control signal in the second operation mode.

Abstract: An integrated circuit for performing a design for testability (DFT) scan test is provided. The integrated circuit includes at least one scan chain including a plurality of flip-flops, at least one interface scan chain including a plurality of flip-flops, a decompressor configured to be connected with an input terminal of the at least one interface scan chain and to decompress a first input signal and then transmit it to the at least one scan chain, a compressor configured to be connected with an output terminal of the at least one scan chain and to compress an output signal of the at least one scan chain, and at least one multiplexer configured to be connected with the decompressor and to selectively output an output signal of the decompressor or a second input signal in response to a control signal.

Abstract: A pulse generation circuit includes storage elements disposed in a dispersed arrangement on a substrate and operating in response to a pulse signal, delay elements each proximate to a storage element receiving a clock signal and providing a delayed output signal, and a pulse generation logic circuit performing at least one logic operation on the clock signal and the plurality of delayed output signals to generate the pulse signal.

Abstract: The semiconductor integrated circuit includes a clock tree that transmits a clock signal to a plurality of tree branches, a plurality of pulse generators, and a plurality of pulse distribution networks. Each pulse generator generates a pulse in response to the clock signal transmitted through the tree branches. Each pulse distribution network is in communication with a pulse generator of the plurality of pulse generators, and is constructed and arranged to transmit the pulse generated by each pulse generator to a plurality of pulse sinks.

Abstract: A scan flip-flop circuit includes an input unit and an output unit. The input unit selects one of a data input signal and a scan input signal depending on an operation mode and generates an intermediate signal based on the selected signal. The output unit generates an output signal based on the intermediate signal and selects one of a data output terminal and a scan output terminal depending on the operation mode to provide the output signal through the selected output terminal. A voltage level at the selected output terminal bidirectionally transitions between a first voltage level and a second voltage level. A voltage level at a non-selected output terminal unidirectionally transitions between the first voltage level and the second voltage level.

Abstract: An adaptive body bias (ABB) circuit and a semiconductor integrated circuit (IC) having the ABB circuit include: a logic circuit performing logic calculations, a clock line through which a clock signal is transmitted to the logic circuit, and at least one bias line through which a bias voltage is applied to the logic circuit, wherein the bias voltage is applied to a body of a metal oxide semiconductor (MOS) transistor constituting the logic circuit, and the bias line is arranged at a predetermined distance from the clock line to shield the clock signal from crosstalk due to other adjacent signal lines.

Abstract: A semiconductor device including a first function block operating at a first operation voltage having a first range and for generating a data signal, a second function block operating at a second operation voltage having a second range, and a voltage level control unit for performing or not performing a level shifting operation on a voltage level of the data signal depending on the existence or non-existence of a difference between the first operation voltage and the second operation voltage, and for transmitting a level-shifted data signal or the data signal to the second function block.

Abstract: A cache phase detector included in a processor core according to example embodiments includes a counting unit and a signal generating unit. The counting unit generates a critical section miscount by counting a request from the processor core resulting in a tag miss and a valid cache line based on a tag miss signal and a cache line valid signal. The signal generating unit compares the critical section miscount from the counting unit with a reference value, and generates a cache phase change signal if the critical section miscount is greater than the reference value.

Abstract: A semiconductor device includes a power gating unit, a combinational logic unit and a clamping unit. The power gating unit is turned on to output an internal signal at an output electrode based on an input signal or turned off according to operation modes. The combinational logic unit includes an input electrode directly connected to the output electrode of the power gating unit through a data line, and generates an output signal based on the internal signal received through the data line. The clamping unit is turned on to clamp the internal signal at a logic high level or at a logic low level or turned off according to the operation modes. The semiconductor device clamps the output electrode of the power gating unit without degrading an operation speed of the semiconductor device.

Abstract: A scan flip-flop circuit includes an input unit and an output unit. The input unit selects one of a data input signal and a scan input signal depending on an operation mode and generates an intermediate signal based on the selected signal. The output unit generates an output signal based on the intermediate signal and selects one of a data output terminal and a scan output terminal depending on the operation mode to provide the output signal through the selected output terminal. A voltage level at the selected output terminal bidirectionally transitions between a first voltage level and a second voltage level. A voltage level at a non-selected output terminal unidirectionally transitions between the first voltage level and the second voltage level.

Abstract: A semiconductor device comprises a plurality of flip-flops, a clock tree for transferring an externally input clock signal to the flip-flops, and a shield tree configured to shield the clock tree. The shield tree transmits a control signal to activate the flip-flops in a test operation mode of the semiconductor device.

Abstract: An integrated circuit for performing a design for testability (DFT) scan test is provided. The integrated circuit includes at least one scan chain including a plurality of flip-flops, at least one interface scan chain including a plurality of flip-flops, a decompressor configured to be connected with an input terminal of the at least one interface scan chain and to decompress a first input signal and then transmit it to the at least one scan chain, a compressor configured to be connected with an output terminal of the at least one scan chain and to compress an output signal of the at least one scan chain, and at least one multiplexer configured to be connected with the decompressor and to selectively output an output signal of the decompressor or a second input signal in response to a control signal.

Abstract: A system on chip (SOC) may include function blocks, and a scan chain in each of the function blocks, the scan chains being adapted to conduct scan test operations in sync with a respective one of a plurality of clock signals having a different phase relative to each other, wherein during an isolation mode, the scan chains test combination circuits of the function blocks, and during an interface mode, the scan chains of adjacent ones of the function blocks test combination circuits between the adjacent ones of the function blocks.

Abstract: High speed multiplexers include a first N-to-1 selection circuit, where N is an integer greater than one, a second N-to-1 selection circuit and an output driver. The first N-to-1 selection circuit is configured to route a true or complementary version of a selected first input signal (from amongst N input signals) to an output thereof in response to a first multi-bit selection signal, where N is an integer greater than one. The second N-to-1 selection circuit is configured to route a true or complementary version of the selected first input signal to an output thereof in response to a second multi-bit selection signal. The output driver includes a pull-up circuit, which is responsive to a signal generated at the output of the first N-to-1 selection circuit, and a pull-down circuit, which is responsive to a signal generated at the output of the second N-to-1 selection circuit.

Abstract: An integrated circuit includes first and second power domains, a power supply control unit, and a switch block. The power supply control unit supplies a first voltage to the first power domain and a second voltage to the second power domain. The switch block provides at least one current path between the first and second power domains during a predetermined operating mode such as by connecting a first power line of the first power domain to a second power line of the second power domain.

Abstract: A semiconductor chip may include an internal circuit, at least one power gating transistor, a system manager, and/or at least one current regulator. The at least one power gating transistor may be configured to switch a supply of at least one drive voltage into the internal circuit. The system manager may be configured to generate a control signal corresponding to an activation state of the internal circuit. At least one current regulator may be configured to control an amount of a current flowing through the at least one power gating transistor in response to the control signal.

Abstract: High speed multiplexers include a first N-to-1 selection circuit, where N is an integer greater than one, a second N-to-1 selection circuit and an output driver. The first N-to-1 selection circuit is configured to route a true or complementary version of a selected first input signal (from amongst N input signals) to an output thereof in response to a first multi-bit selection signal, where N is an integer greater than one. The second N-to-1 selection circuit is configured to route a true or complementary version of the selected first input signal to an output thereof in response to a second multi-bit selection signal. The output driver includes a pull-up circuit, which is responsive to a signal generated at the output of the first N-to-1 selection circuit, and a pull-down circuit, which is responsive to a signal generated at the output of the second N-to-1 selection circuit.

Abstract: A processor with cache way prediction and method thereof. The processor includes a cache way prediction unit for predicting at least one cache way for selection from a plurality of cache ways. The processor may further include an instruction cache for accessing the selected at least one cache way, where the selected at least one cache way is less than all of the plurality of cache ways. The method includes predicting less than all of a plurality of cache ways for selection and accessing the selected less than all of the plurality of cache ways. In both the process and method thereof, by accessing less than all of the plurality of cache ways, a power consumption and delay may be reduced.

Abstract: For a processor having a plurality of sequential stages, variable (or idiosyncratic) wake-up latencies and a method for managing power in such a processor are provided. Each sequential stage includes one or more logic blocks and one or more power switches. A power controller can measure wake-up latencies for the logic blocks and control the power switches of the logic blocks by referring to the measured wake-up latencies, respectively.