Abstract: Disclosed are single-ended sensing circuits. Each of the sensing circuits comprises at least a sense amplifier connected to a sense node, an isolation field effect transistor (FET) connected in series between the sense node and a signal line node, and a pre-charged device connected to the sense node. In order to achieve a relatively fast pre-charge of both the sense and signal line nodes and to also achieve a relatively fast and accurate sense of the sense node, the single-ended circuits further incorporate a variable reference voltage generator connected to the gate of the isolation FET for selectively applying different reference voltages to the gate during pre-charging and sensing operations, respectively, and/or a second pre-charge device connected to the signal line node for facilitating pre-charging of that signal line node.

Abstract: A TCAM may have a plurality of rows of cells. Each row may have a match line. Each cell may have elements for storing first and second bits, and compare circuitry associated to determine matches between a bit of a search word and data stored in the cell. For at least one first row of the rows, the TCAM includes a valid row cell having at least one element to store a partial update indication. The valid row cell may cause the match line associated with the first row to signal that the first row does not match a search word when the partial update indication associated with the first row is enabled. When the partial update indication associated with the first row is disabled, the determination of matches with a search word is performed solely by the compare circuitry wi thout influence of the valid row cell.

Abstract: A TCAM may have a plurality of rows of cells. Each row may have a match line. Each cell may have elements for storing first and second bits, and compare circuitry associated to determine matches between a bit of a search word and data stored in the cell. For at least one first row of the rows, the TCAM includes a valid row cell having at least one element to store a partial update indication. The valid row cell may cause the match line associated with the first row to signal that the first row does not match a search word when the partial update indication associated with the first row is enabled. When the partial update indication associated with the first row is disabled, the determination of matches with a search word is performed solely by the compare circuitry without influence of the valid row cell.

Abstract: Methods and circuits for disrupting integrated circuit function. The circuits include finite state machines connected to memory arrays. The finite state machines are sensitive to a predetermined sequence of addresses sent to the memory array or the time between a series of memory array errors detected by an error detection circuit. Upon detection of the pre-set addresses or errors the finite state machines either (i) enable or disable specific circuit functions or (ii) disrupt the operation of the integrated circuit.

Abstract: An output driver circuit may include a electrically conductive medium, an output logic inverter having a first switch adapted to couple a first positive supply voltage to the electrically conductive medium and a second switch adapted to couple a ground supply voltage to the conductive medium. A first biasing network includes a first input that is coupled to the conductive medium, a second input that receives a clock signal, and a first output that is adapted to couple a second positive supply voltage to each input of the first and the second switch. Based on the second switch coupling the conductive medium to the ground supply voltage and the received clock signal generating a logic low, the biasing network reverse biases the first switch by coupling the second positive supply voltage to the respective input of the first switch causing a leakage current reduction in the first switch.

Abstract: An integrated circuit including a sense amplifier connected to a sense line is provided. The sense amplifier is configured to end a precharge phase of the sense line based on a state of the sense amplifier.

Abstract: A method for predicting the power consumption of a semiconductor chip is provided. A plurality of statistical distributions characterizing a plurality of power contributing parameters for a plurality of power consuming units included in the semiconductor chip is received. A statistical distribution characterizing the power consumption is determined based on the received plurality of statistical distributions and based on the correlation between the plurality of power contributing parameters.

Abstract: Low leakage CAMs and method of searching low leakage CAMs. The method includes performing a pre-search and compare on a small number of pre-search bits with pre-search CAM cells powered to normal voltage levels at all times while the main-search CAM cells are powered to a lower voltage level. Only if a match is detected on the pre-search bits are the main-search CAM cells powered-up to normal voltage levels and the search of the main-search bits activated. The main-search CAM cells are powered to normal voltage levels during read and write operations.

Abstract: A content-addressable memory (CAM) with computational capability is described. The CAM includes an array of CAM cells arranged in rows and columns with a pair of search lines associated with each column of the array and a match line associated with each row of the array. The array of CAM cells is configured to implement, for a given cycle, either a read operation of data contained in a single selected column, or one of a plurality of different bitwise logical operations on data contained in multiple selected columns. All of the pairs of search lines in the columns of the array are configured to a certain state to implement the read operation or one of the plurality of different bitwise logical operations. A result of the read operation or one of the plurality of different bitwise logical operations is outputted onto all of the match lines in the array.

Abstract: Disclosed are a memory system and an associated operating method. In the system, a first memory array comprises first memory cells requiring a range of time delays between wordline activating and bitline sensing. A delay signal generator delays an input signal by a selected time delay (i.e., a long time delay corresponding to statistically slow memory cells) and outputs a delay signal for read operation timing to ensure read functionality for statistically slow and faster memory cells. To accomplish this, the delay signal generator comprises a second memory array having second memory cells with the same design as the first memory cells. Transistors within the second memory cells are controlled by a lower gate voltage than transistors within the first memory cells in order to mimic the effect of higher threshold voltages, which result in longer time delays and which can be associated with the statistically slow first memory cells.

Abstract: A computer determines a component optimal yield point for each component of the plurality of components, where the component optimal yield point represents the process parameter values where maximum yield is achieved for a component. The computer determines a weight factor for each component of the plurality of components, where the weight factor represents an importance of a component to the semiconductor device. The computer then determines an overall optimal yield point based on the component yield point and weight factor determined for each component of the plurality of components, the overall optimal yield point representing the process parameter values where maximum yield is achieved for the semiconductor device.

Abstract: A system and method of allocating a job submission for a computational task to a set of distributed server farms each having at least one processing entity comprising; receiving a workload request from at least one processing entity for submission to at least one of the set of distributed server farms; using at least one or more conditions associated with the computational task for accepting or rejecting at least one of the server farms to which the job submission is to be allocated; determining a server farm that can optimize the one or more conditions; and dispatching the job submission to the server farm which optimizes the at least one of the one or more conditions associated with the computational task and used for selecting the at least one of the server farms.

Abstract: Methods and circuits for disrupting integrated circuit function. The circuits include finite state machines connected to memory arrays. The finite state machines are sensitive to a predetermined sequence of addresses sent to the memory array or the time between a series of memory array errors detected by an error detection circuit. Upon detection of the pre-set addresses or errors the finite state machines either (i) enable or disable specific circuit functions or (ii) disrupt the operation of the integrated circuit.

Abstract: Low leakage CAMs and method of searching low leakage CAMs. The method includes performing a pre-search and compare on a small number of pre-search bits with pre-search CAM cells powered to normal voltage levels at all times while the main-search CAM cells are powered to a lower voltage level. Only if a match is detected on the pre-search bits are the main-search CAM cells powered-up to normal voltage levels and the search of the main-search bits activated. The main-search CAM cells are powered to normal voltage levels during read and write operations.

Abstract: Disclosed are a memory system and an associated operating method. In the system, a first memory array comprises first memory cells requiring a range of time delays between wordline activating and bitline sensing. A delay signal generator delays an input signal by a selected time delay (i.e., a long time delay corresponding to statistically slow memory cells) and outputs a delay signal for read operation timing to ensure read functionality for statistically slow and faster memory cells. To accomplish this, the delay signal generator comprises a second memory array having second memory cells with the same design as the first memory cells. Transistors within the second memory cells are controlled by a lower gate voltage than transistors within the first memory cells in order to mimic the effect of higher threshold voltages, which result in longer time delays and which can be associated with the statistically slow first memory cells.

Abstract: An integrated circuit structure comprises a static random access memory (SRAM) structure and a logic circuit. A power supply is operatively connected to the SRAM structure, and provides a first voltage to the SRAM structure. A voltage limiter is operatively connected to the power supply. The voltage limiter comprises a switching device operatively connected to the power supply. The switching device receives the first voltage and a second voltage supplied to structures external to the SRAM structure. A resistive element is operatively connected to the switching device. The switching device connects the resistive element to the power supply. The resistive element is selected to enable an output from the switching device to the logic circuit when a difference between the first voltage and the second voltage is greater than a voltage threshold value of the switching device.

Abstract: Circuits and methods for performing search operations in a content addressable memory (CAM) array are provided. A system for searching a CAM includes a circuit that selectively activates a main-search of a two stage CAM search while a pre-search of the two stage CAM search is still active.

Abstract: Methods and structures for configuring an integrated circuit including repeated cells that are divided into banks having a respective power assist and a respective operational assist are provided. A method includes configuring the banks without power assist and operational assist. The method further includes selecting the power assist for a bank based on a determination that a weak cell remains in the bank after configuring the bank with the respective operational assist.

Abstract: Methods of setting wordline up-level voltage in as-fabricated SRAM. In one example, the method includes determining the relative speed, or strength, of 1) the combination of the pass-gate and pull-down devices and 2) the pull-up devices in the bitcells of the SRAM. These relative strengths are then used to adjust the wordline up-level voltage, if needed, to decrease the likelihood of the SRAM experiencing a stability failure. Corresponding systems are provided for determining the relative strengths of the devices of interest, for determining the amount of up-level voltage adjustment needed, and for selecting and setting the up-level voltage.

Abstract: Methods and structures for configuring an integrated circuit including repeated cells that are divided into banks having a respective power assist and a respective operational assist are provided. A method includes configuring the banks without power assist and operational assist. The method further includes selecting the power assist for a bank based on a determination that a weak cell remains in the bank after configuring the bank with the respective operational assist.