Patents by Inventor In Kwang Yoo

In Kwang Yoo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190033909
    Abstract: A memory system including a memory controller with channel interfaces connecting memory groups via channels. Each channel interface communicates control, address and/or data (CAD) signals to a channel-connected memory group synchronously with a slave clock derived from an input clock. The various slave clocks being uniquely generated by application of channel interface specific phase/frequency modulation or temporal delay, such that the respective CAD signals are characterized by skewed transition timing.
    Type: Application
    Filed: October 2, 2018
    Publication date: January 31, 2019
    Inventors: YOUNG-JIN CHO, Jae-Geun Park, Young-Kwang Yoo, Soon-Suk Hwang
  • Publication number: 20180355814
    Abstract: Methods and systems are provided for providing passive boost pressure monitoring for slow response with higher confidence. A response time of a boost pressure feedback control loop following a boost pressure deviation that is triggered by either system disturbances or operator torque demand is monitored. Slow boost behavior is correlated with boost control degradation affecting drivability and emissions.
    Type: Application
    Filed: June 12, 2017
    Publication date: December 13, 2018
    Inventors: Stephen William Magner, Michiel J. Van Nieuwstadt, John Erik Mikael Hellstrom, In Kwang Yoo, Adarsh Appukuttan, Jason Ronald Smith
  • Patent number: 10133298
    Abstract: A memory system including a memory controller with channel interfaces connecting memory groups via channels. Each channel interface communicates control, address and/or data (CAD) signals to a channel-connected memory group synchronously with a slave clock derived from an input clock. The various slave clocks being uniquely generated by application of channel interface specific phase/frequency modulation or temporal delay, such that the respective CAD signals are characterized by skewed transition timing.
    Type: Grant
    Filed: January 14, 2016
    Date of Patent: November 20, 2018
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Young-Jin Cho, Jae-Geun Park, Young-Kwang Yoo, Soon-Suk Hwang
  • Publication number: 20180283248
    Abstract: Methods and systems are provided for detecting a missing exhaust catalyst based on water adsorption and related exothermic temperature rise by the catalyst. In one example, a method may include indicating an exhaust catalyst missing in response to an estimated exhaust temperature profile being different from an expected exhaust temperature profile. The estimated exhaust temperature profile may be based on exhaust temperature upstream and downstream of the catalyst.
    Type: Application
    Filed: March 31, 2017
    Publication date: October 4, 2018
    Inventors: Devesh Upadhyay, Michael Brendan Hopka, In Kwang Yoo, David John Kubinski
  • Publication number: 20180122434
    Abstract: Provided are a memory device and a memory system including the same. The memory device may include a first memory rank including at least one first memory chip, a memory controller configured to provide a command to the first memory rank, at least one data buffer configured to buffer data input to the at least one first memory chip or being output from the at least one first memory chip, and a second memory rank connected to the first memory rank and comprising at least one second memory chip. The first memory rank may provide training data and a data strobe signal to the second memory rank based on a data training command from the memory controller without the training data and the data strobe signal passing through the data buffer. The second memory rank may determine a delay of the data strobe signal based on the training data being detected by the second memory rank.
    Type: Application
    Filed: October 25, 2017
    Publication date: May 3, 2018
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Young Geun LEE, Young Jin CHO, Hee Hyun NAM, Hyo Deok SHIN, Young Kwang YOO
  • Patent number: 9753849
    Abstract: A method for manufacturing a memory device includes detecting, with a tester, whether memory cells included in a memory device are defective, and programming, with the tester, start addresses of defect-free memory regions for addressing modes of the memory device based on a result of the detection.
    Type: Grant
    Filed: July 7, 2015
    Date of Patent: September 5, 2017
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Kui Yon Mun, Young Jin Cho, Young Kwang Yoo
  • Publication number: 20170241321
    Abstract: Methods and systems are provided for detecting NOx sensor degradation based on results from a NOx sensor self-diagnostic (SD) test performed after a key-off event. In one example, a method may comprise waiting a duration to perform a SD test of a NOx sensor after a key-off event until engine operating conditions stabilize and reach a set of qualifying conditions. One or more SD tests may be performed after waiting the duration, but outputs generated under conditions where one or more of a temperature at the sensor is greater than a threshold, and an oxygen concentration is outside a threshold range, may be excluded when determining whether or not the NOx sensor is degraded.
    Type: Application
    Filed: May 8, 2017
    Publication date: August 24, 2017
    Inventors: In Kwang Yoo, Michiel J. Van Nieuwstadt, James Joseph Reynolds, Mark Robert Laleman
  • Patent number: 9670817
    Abstract: Methods and systems are provided for detecting NOx sensor degradation based on results from a NOx sensor self-diagnostic (SD) test. In one example, a method may comprise: determining that a nitrogen oxide (NOx) sensor is degraded if outputs received from the sensor via a CAN bus during a self-diagnostic test are outside a threshold range. Additionally, only outputs received from the sensor during a self-diagnostic (SD) test performed after a first completed SD test after a key-off event, where the outputs are generated under conditions where a temperature at the sensor is less than a threshold, and an oxygen concentration is within a threshold range may be used to determine if the sensor is degraded.
    Type: Grant
    Filed: June 15, 2015
    Date of Patent: June 6, 2017
    Assignee: Ford Global Technologies, LLC
    Inventors: In Kwang Yoo, Michiel J. Van Nieuwstadt, Garth Michael Meyer
  • Publication number: 20160363030
    Abstract: Methods and systems are provided for detecting NOx sensor degradation based on results from a NOx sensor self-diagnostic (SD) test. In one example, a method may comprise: determining that a nitrogen oxide (NOx) sensor is degraded if outputs received from the sensor via a CAN bus during a self-diagnostic test are outside a threshold range. Additionally, only outputs received from the sensor during a self-diagnostic (SD) test performed after a first completed SD test after a key-off event, where the outputs are generated under conditions where a temperature at the sensor is less than a threshold, and an oxygen concentration is within a threshold range may be used to determine if the sensor is degraded.
    Type: Application
    Filed: June 15, 2015
    Publication date: December 15, 2016
    Inventors: In Kwang Yoo, Michiel J. Van Nieuwstadt, Garth Michael Meyer
  • Publication number: 20160299525
    Abstract: A memory system including a memory controller with channel interfaces connecting memory groups via channels. Each channel interface communicates control, address and/or data (CAD) signals to a channel-connected memory group synchronously with a slave clock derived from an input clock. The various slave clocks being uniquely generated by application of channel interface specific phase/frequency modulation or temporal delay, such that the respective CAD signals are characterized by skewed transition timing.
    Type: Application
    Filed: January 14, 2016
    Publication date: October 13, 2016
    Inventors: YOUNG-JIN CHO, JAE-GEUN PARK, YOUNG-KWANG YOO, SOON-SUK HWANG
  • Publication number: 20160005454
    Abstract: A method for manufacturing a memory device includes detecting, with a tester, whether memory cells included in a memory device are defective, and programming, with the tester, start addresses of defect-free memory regions for addressing modes of the memory device based on a result of the detection.
    Type: Application
    Filed: July 7, 2015
    Publication date: January 7, 2016
    Inventors: Kui Yon MUN, Young Jin CHO, Young Kwang YOO
  • Publication number: 20160004655
    Abstract: A computing system includes a first unified module including a first storage device and a second storage device that are different from each other, and a unified module interface configured to provide a direct memory access (DMA) request signal to control a first DMA with respect to the first storage device and to perform a second DMA on the second storage device. An application processor is configured to receive the DMA request signal from the unified module interface, and provide a DMA request response signal to the unified module interface and control the second DMA with respect to the second storage device.
    Type: Application
    Filed: July 3, 2015
    Publication date: January 7, 2016
    Inventors: YOUNG-KWANG YOO, JIN-HYEOK CHOI, SUN-YOUNG LIM, YOUNG-JIN CHO
  • Patent number: 9217350
    Abstract: Various systems and methods for detecting exhaust reductant injector degradation based on an exhaust NOx sensor are disclosed. In one example, degradation of the reductant injector is indicated when an actual NOx sensor output differs from an expected NOx sensor output by more than a threshold amount under engine off conditions.
    Type: Grant
    Filed: November 13, 2013
    Date of Patent: December 22, 2015
    Assignee: Ford Global Technologies, LLC
    Inventors: Devesh Upadhyay, In Kwang Yoo, David John Kubinski, Jacobus Hendrik Visser, Garth Michael Meyer, Michiel J. Van Nieuwstadt
  • Publication number: 20150128565
    Abstract: Various systems and method for detecting exhaust NOx sensor degradation are disclosed. In one example, degradation of the NOx sensor is indicated responsive to reductant injection in an exhaust passage under engine off conditions. For example, degradation of the NOx sensor is indicated when an actual NOx sensor output differs from an expected NOx sensor output by more than a threshold amount.
    Type: Application
    Filed: November 13, 2013
    Publication date: May 14, 2015
    Applicant: Ford Global Technologies, LLC
    Inventors: Devesh Upadhyay, In Kwang Yoo, Michiel J. Van Nieuwstadt, David John Kubinski
  • Publication number: 20150128564
    Abstract: Various systems and methods for detecting exhaust reductant injector degradation based on an exhaust NOx sensor are disclosed. In one example, degradation of the reductant injector is indicated when an actual NOx sensor output differs from an expected NOx sensor output by more than a threshold amount under engine off conditions.
    Type: Application
    Filed: November 13, 2013
    Publication date: May 14, 2015
    Applicant: Ford Global Technologies, LLC
    Inventors: Devesh Upadhyay, In Kwang Yoo, David John Kubinski, Jacobus Hendrik Visser, Garth Michael Meyer, Michiel J. Van Nieuwstadt
  • Patent number: 9010087
    Abstract: Various systems and method for detecting exhaust NOx sensor degradation are disclosed. In one example, degradation of the NOx sensor is indicated responsive to reductant injection in an exhaust passage under engine off conditions. For example, degradation of the NOx sensor is indicated when an actual NOx sensor output differs from an expected NOx sensor output by more than a threshold amount.
    Type: Grant
    Filed: November 13, 2013
    Date of Patent: April 21, 2015
    Assignee: Ford Global Technologies, LLC
    Inventors: Devesh Upadhyay, In Kwang Yoo, Michiel J. Van Nieuwstadt, David John Kubinski
  • Patent number: 8856621
    Abstract: A nonvolatile memory device comprises a memory controller having a memory cell status estimator that generates status estimation information indicating the status of a memory cell based on status register data, a coupling group index selector configured to generate a select signal for selecting a page and coupling group index from the status estimation information, and a memory cell status value generator configured to map the status estimation information to the data reliability decision bits and the coupling group index and generate a status value of the memory cell for error correction code decoding.
    Type: Grant
    Filed: September 7, 2012
    Date of Patent: October 7, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hee Seok Eun, Jae Hong Kim, Hyung Joon Park, Young Kwang Yoo
  • Publication number: 20130275030
    Abstract: Embodiments for estimating intake air humidity in an engine are provided. In one example, an engine method comprises adjusting an engine parameter in response to intake air humidity estimated based on a concentration of one or more engine-out emissions. In this way, one or more exhaust emission sensors may be used to estimate intake air humidity.
    Type: Application
    Filed: April 16, 2012
    Publication date: October 17, 2013
    Applicant: FORD GLOBAL TECHNOLOGIES, LLC
    Inventors: Yong-Wha Kim, In Kwang Yoo, Michiel J. Van Nieuwstadt, Brien Lloyd Fulton
  • Patent number: 8459105
    Abstract: A fuel injector diagnostic is disclosed. In one example, the diagnostic can determine if that amount of fuel injected or the timing of start of injection is degraded. Thus, the fuel injector diagnostic method can distinguish between different types of injector degradation.
    Type: Grant
    Filed: October 20, 2011
    Date of Patent: June 11, 2013
    Assignee: Ford Global Technologies, LLC
    Inventors: Yong-Wha Kim, Michiel J. Van Nieuwstadt, In Kwang Yoo
  • Publication number: 20130124944
    Abstract: A nonvolatile memory device comprises a memory controller having a memory cell status estimator that generates status estimation information indicating the status of a memory cell based on status register data, a coupling group index selector configured to generate a select signal for selecting a page and coupling group index from the status estimation information, and a memory cell status value generator configured to map the status estimation information to the data reliability decision bits and the coupling group index and generate a status value of the memory cell for error correction code decoding.
    Type: Application
    Filed: September 7, 2012
    Publication date: May 16, 2013
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hee Seok EUN, Jae Hong KIM, Hyung Joon PARK, Young Kwang YOO