Abstract: An example analog-test-bus (ATB) apparatus includes a plurality of comparator circuits, each having an output port, and a pair of input ports of opposing polarity including an inverting port and a non-inverting port, a plurality of circuit nodes to be selectively connected to the input ports of a first polarity, and at least one digital-to-analog converter (DAC) to drive the input ports of the plurality of comparator circuits. The apparatus further includes data storage and logic circuitry that accounts for inaccuracies attributable to the plurality of comparator circuits by providing, for each comparator circuit, a set of calibration data indicative of the inaccuracies for adjusting comparison operations performed by the plurality of comparator circuits.

Abstract: Embodiments of a method, an IC device, and a circuit board are disclosed. In an embodiment, the method involves at an IC device of the system, monitoring activity on a bus interface of the IC device, wherein the bus interface is connected to a bus on the system that communicatively couples the IC device to at least one other IC device on the system, applying machine learning to data corresponding to the monitored activity to generate an activity profile, monitoring subsequent activity on the bus interface of the IC device, comparing data corresponding to the to subsequently monitored activity to the machine learning generated activity profile to determine if a system-level Trojan is detected, and generating a notification when it is determined from the comparison that a system-level Trojan has been detected.

Abstract: Certain aspects of the disclosure are directed to methods and apparatuses of intrusion detection for integrated circuits. An example apparatus can include a wired communications bus configured and arranged to carry data and a plurality of integrated circuits. The plurality of integrated circuits can include a first integrated circuit configured and arranged to operate in a scan mode during which the first integrated circuit performs a scan test to detect one or more faults in circuitry of the plurality of integrated circuits. The plurality of integrated circuits can further include a second integrated circuit configured and arranged to operate in a mission mode and supervise data traffic by monitoring communications including data patterns and accesses on the wired communications bus. In response to identifying a suspected illegitimate access, the second integrated circuit can perform a security action to mitigate a suspect illegitimate action in the plurality of integrated circuits.

Abstract: An apparatus includes integrated circuitry (IC) and a further circuit. The IC includes internal circuits having sensitive/secret data (SSD) to be maintained as confidential relative to a suspect Hardware Trojan (HT) and including access ports through which information associated with the internal circuits is accessible by external circuitry associated with the HT. The further circuit to learn behavior of the internal circuits that is unique to the integrated circuitry under different operating conditions involving the internal circuits, involving the SSD and involving other data that is functionally associated with an application of the integrated circuitry.

Abstract: An apparatus in accordance with embodiments includes front-end radar circuitry and storage circuitry. The front-end radar circuitry generates a digital data stream that represents received radar wave signals and provides a cryptographic hash using the digital data stream, timing information, and apparatus-specific data. The storage circuitry stores the digital data stream and the cryptographic hash indicative of authenticity of the digital data stream.

Abstract: A data transmission interface for use in a first integrated circuit, for encoding and sending a data packet from the first IC to a second IC via a data bus having three data wires, the data transmission interface being arranged to generate three time-dependent binary signals which jointly encode the data packet, each of the signals being associated with a unique data wire of the data bus and spanning a temporal cycle T within which are defined six consecutive time stamps T1 . . . T6 at which the signals are allowed to change logical state, the data transmission interface further arranged to transmit the signals to the second IC substantially in parallel on their respective data wires, wherein, irrespective of the data packet content: at each time stamp T1 . . .

Abstract: An apparatus embodiment includes a voltage regulator circuit that provides a regulated voltage supply signal, logic state circuitry, test control circuitry, and a supply-signal monitoring circuit. The logic state circuitry includes logic modules that are reconfigured between application controlled self-test modes in which data is shifted through the logic module and while being powered from the regulated voltage supply signal. The test control circuitry operates the controlled self-test mode by causing a predetermined set of the data to shift through the logic modules and that causes the logic state circuitry to load the voltage regulator circuit by stressing the voltage regulator circuit. The supply-signal monitoring circuit monitors a quality parameter of the regulated voltage supply signal and provides an indication of characteristics of the regulated voltage supply signal which bear on a likelihood that the voltage regulator circuit is associated with defective circuitry.

Abstract: Embodiments are directed to apparatuses and methods for providing a logic built-in self-test (LBIST) using an LBIST logic circuit and an auxiliary logic circuit. An example method includes using switch circuitry in an integrated circuit (IC) to change modes of operation associated with functional logic circuit, the modes of operation including an LBIST mode and an application mode, and to provide an internally generated digital clock signal to the functional logic circuitry and an LBIST logic circuit in response to the LBIST mode. The method further includes performing an LBIST using the internally generated digital clock signal, the LBIST logic circuit to test select nodes in the IC via control of the functional logic circuitry and via application of digital logic sequences provided as inputs to the I/O pad cells of the IC.

Abstract: The disclosure relates to a data transmission interface for use in a first integrated circuit (IC) for encoding and sending a data packet from the first IC to a second IC via a data bus having four data wires, the data transmission interface arranged to generate four time-dependent binary signals which jointly encode the data packet in signal edges thereof, each of the signals being associated with a unique wire of the data bus and spanning a temporal cycle T within which are defined four consecutive time stamps T1 . . . T4 at which edges can occur in the signals, the data transmission interface further arranged to transmit the signals to the second IC substantially in parallel on their respective data wires, wherein: irrespective of the data packet content, at each time stamp T1 . . . T4 at least one of the four signals has an edge to enable clock recovery at the second IC.

Abstract: A self-test apparatus for use in an electronic system includes an inter-chip communication bus, a plurality of circuit devices, circuitry including memory, and test controller circuitry. The plurality of circuit devices each has a distributed self-test controller circuit and analog, mixed signal or digital circuit elements. The distributed self-test controller circuits are integrated communicatively via the inter-chip communication bus and negotiate a self-test protocol with each other. The circuitry including memory stores self-test properties of the circuit elements, the self-test properties corresponding to an identifier of each of the circuit elements and a manner or protocol in which the circuit elements are tested. The test controller circuitry collects the self-test properties of the circuit elements and controls execution of the self-test according to the negotiated self-test protocol and the self-test properties.

Abstract: This specification discloses devices and methods for a security concept that includes an immobile hardware token (e.g., a “wall token” that is fixed within a wall) which ensures that the more sensitive actions of electronic banking (e.g., money transfers of large sums to foreign bank accounts) can only be done from the account owner's home, but not from a remote place. However, other less sensitive (and lower security risk) actions can still be done from anywhere else. In some embodiments, the hardware token includes sensors to ensure that the token is not moved or tampered with, interfaces to provide distance bounding, and a crypto-processor to provide secure authentication. The distance bounding can be used to determine if the authentication device is in close proximity to the hardware token, which can in turn ensure that the authentication device is within the account owner's home.

Abstract: A test system is provided. The test system includes a printed circuit board (PCB) and a plurality of integrated circuits (ICs) mounted on the PCB. A first IC of the plurality includes a first test circuit having a first test access port (TAP) controller. A second IC of the plurality includes a second test circuit having a second TAP controller and an embedded tester having a test data output coupled to a test data input of the first TAP controller by way of a link circuit. The embedded tester is configured to provide test control signals to the first TAP controller and the second TAP controller.

Abstract: Embodiments are provided for a radar device and a method for operating a radar device, the radar device having a transmitter and a receiver, the method including: generating a noise signal; mixing the noise signal with a transmitter output radio frequency (RF) signal to produce an intermediate signal, wherein the transmitter output RF signal is a version of a local oscillator (LO) signal having linearly increasing frequency; attenuating the intermediate signal to produce a test signal; adding the test signal to a receiver input RF signal to produce a combined receiver input RF signal; downmixing an amplified version of the combined receiver input RF signal with the LO signal to produce a combined low frequency signal; and correlating the combined low frequency signal with the noise signal to produce an error detection signal.

Abstract: The disclosure relates to voltage regulators and more specially voltage regulators including error detection and correction mechanisms. Example embodiments include a voltage regulator comprising: an input arranged to receive a trim signal used to specify a target voltage at an output of the regulator; a comparator arranged to compare a voltage derived from the trim signal to the voltage at the output of the regulator; a filter arranged to filter an output of the comparator; a checksum module comprising first and second portions arranged to calculate first and second checksums respectively from a plurality of states associated with the voltage regulator and to provide an error signal equal to the difference between the first and second checksums; and an adjustment module arranged to receive the error signal and adjust one or more of the plurality of states if the error signal is non-zero.

Abstract: A method for detecting defeat devices in an engine control unit (ECU) includes storing with a key-data collection unit, a first key-data determined during an environmental test of a vehicle. The key-data collection unit stores a second key-data determined before the environmental test. Wherein, one of the first key-data is determined by the ECU modified by a characteristic only present before the environmental test and the second key-data is determined by the ECU modified by a characteristic only present during the environmental test. An environmental testing device compares the first key-data with the second key-data to detect an anomaly, wherein the anomaly indicates the presence of the defeat device in the ECU.

Abstract: Embodiments in accordance with the present disclosure are directed to a self-test apparatus for use in an electronic system. The self-test apparatus includes an inter-chip communication bus, a plurality of circuit devices, circuitry including memory, and test controller circuitry. The plurality of circuit devices each has a distributed self-test controller circuit and analog, mixed signal or digital circuit elements. The distributed self-test controller circuits are integrated communicatively via the inter-chip communication bus and negotiate a self-test protocol with each other. The circuitry including memory stores self-test properties of the circuit elements, the self-test properties corresponding to an identifier of each of the circuit elements and a manner or protocol in which the circuit elements are tested.

Abstract: A method is provided for detecting an attack on a keyless entry system for a vehicle. The method includes receiving a wireless transmission by the keyless entry system. The wireless transmission is filtered in a first filter to produce a filtered wireless transmission. The wireless transmission is filtered in a second filter to produce a reference filtered wireless transmission. A frequency band of the filtered wireless transmission is compared to a frequency band of the reference filtered wireless transmission. Based on the comparison, it is determined if the wireless transmission is from a key fob that complies with the specification of the wireless transmission. In another embodiment, a wireless receiver is provided for performing the method.

Abstract: A method of detecting faults in a register bank is disclosed. The register bank includes at least one chain of registers. The method comprises sequentially shifting parameters stored in each register of the chain to an output node of the chain and inverting each parameter and feeding each parameter back to an input node of that chain, and sequentially shifting the inverted parameters through the chain until all the non-inverted parameters have been output at the output node. A first checksum of the parameters output at the output node is calculated. The inverted parameters in each register of the chain are sequentially shifted to the output node of the chain. A second checksum of the inverted parameters output at the output node is calculated, and the first and second checksums are compared.

Abstract: An apparatus includes a linear analog circuit and data-check circuit. The linear analog circuit receives analog input signals and provides processed analog output signals. The linear analog circuit includes voltage-changing and voltage-impedance circuitry that perform processing of the analog input signals by the linear analog circuit and an analog test bus circuit (ATB) that selectively passes different ones of a plurality of input ports to at least one output port. A data-check circuit is communicatively coupled to the ATB and includes a data-processing circuit that detects an error conveyed by the linear analog circuit by applying a control signal, while the linear analog circuit and the data-check circuit facilitate testing of the linear analog circuit, to cause the ATB to selectively pass the different ones of the plurality of input ports.

Abstract: An integrated circuit device is disclosed. The device includes a circuit configured to perform a function, a fault management component, at least one user register, an analog test bus component, a built-in self-test component, a safety monitor component, and gating logic. Additionally, the circuit is separated from the fault management component, the at least one user register, the analog test bus component, the built-in self-test component, the safety monitor, and the gating logic.