Abstract: A regulator circuit includes a power transistor, a current minor, a first NMOS transistor, a second NMOS transistor and a current source. The power transistor has a source connected to external power supply voltage supply, a gate connected to a first node having a first voltage and a drain connected to a second node outputting an internal power supply voltage. A current minor provides a first current to a third node having a second voltage and provides a first node with a second current. A first NMOS transistor has a drain connected to a first node, a gate receiving a first reference voltage and a source connected to a fourth node. A second NMOS transistor has a drain connected to a third node, a gate connected to a second node and a source connected to the fourth node.

Abstract: A semiconductor chip, a test system, and a method of testing the semiconductor chip. The semiconductor chip includes a pulse generator configured to generate a test pulse in response to a test request; a logic chain comprising a plurality of logic devices serially connected to each other and transferring the test pulse sequentially; and a detector configured to detect a logic level of an output signal of each of the logic devices and output a detection result indicating a degree of an inter-symbol interference (ISI).

Abstract: An equalizer circuit may include an equalizer controller and a plurality of equalizers. The equalizer controller may prove separate sets of enable signals, delay control signals and voltage control signals to the separate equalizers based on a control signal. The equalizers provide equalizer signals to separate connection nodes between separate pairs of logic circuits. An equalizer may be selectively activated based on a received enable signal. An equalizer may include a delay control circuit and a voltage control circuit. The delay control circuit may delay a received transfer signal to generate a delayed transfer signal based on a received delay control signal. The voltage control circuit may generate an equalizer signal based on the delayed transfer signal and a received voltage control signal. The equalizer circuit may reduce inter-symbol interference in the integrated circuit based on providing the equalizer signals to the connection nodes between the logic circuits.

Abstract: A buffer circuit includes first and second current generators, a comparator, a differential driver, and an inverter. The first current generator outputs a first current corresponding to a reference voltage. The second current generator generates a limit current corresponding to an input limit voltage, and outputs a second current having a size equal to about half of the limit current. The sizes of the first current and the limit current are controlled by the feedback voltage. The comparator generates the feedback voltage by comparing the first and second currents. The differential driver generates an internal current, and controls the internal current based on the feedback voltage. The magnitudes of an upper limit value and a lower limit value of the internal current are substantially equal to each other with respect to a reference value. The inverter generates an output current by inverting the internal current based on supply voltage.

Abstract: A semiconductor package includes an external electrode, an interface chip, and a semiconductor chip. The interface chip includes an external interface pad bonded to the external electrode, a plurality of internal interface pads, and an interface circuit coupled between the external interface pad and the plurality of internal interface pads. The semiconductor chip includes a signal pad that is selectively bonded to one of the plurality of internal interface pads. The interface circuit activates a connection between a selected pad, which corresponds to a pad that is bonded to the signal pad among the plurality of internal interface pads, and the external interface pad, and deactivates connections between unselected pads, which correspond to pads that are not bonded to the signal pad among the plurality of internal interface pads, and the external interface pad.

Abstract: An injection-locked phase-locked loop (ILPLL) circuit includes a delay-locked loop (DLL) and an ILPLL. The DLL is configured to generate a DLL clock by performing a delay-locked operation on a reference clock. The ILPLL includes a voltage-controlled oscillator (VCO), and is configured to generate an output clock by performing an injection synchronous phase-locked operation on the reference clock. The DLL clock is injected into the VCO as an injection clock of the VCO.

Abstract: An injection-locked phase-locked loop (ILPLL) circuit includes a delay-locked loop (DLL) and an ILPLL. The DLL is configured to generate a DLL clock by performing a delay-locked operation on a reference clock. The ILPLL includes a voltage-controlled oscillator (VCO), and is configured to generate an output clock by performing an injection synchronous phase-locked operation on the reference clock. The DLL clock is injected into the VCO as an injection clock of the VCO.

Abstract: There is provided a circuit for controlling the setup/hold time of a semiconductor device, including: a setup/hold on signal generator for generating a setup/hold on signal of the semiconductor device; a comparison signal generator for converting the difference between pulse widths of the setup on signal and hold on signal of the setup/hold on signal generator into the voltage difference across an inner capacitor, to generate a comparison signal for the setup/hold time; a comparison signal detector for detecting the comparison signal generated by the comparison signal generator and amplifying it to a predetermined level; a clock delay path selection signal generator for generating a clock delay path selection signal according to the level of the signal detected by the comparison signal detector; and a clock/command signal processor for outputting a clock signal and command signal applied to input pads as an inner clock signal and inner command signal whose delays are compensated according to the clock delay p